JPH0434329B2 - - Google Patents
Info
- Publication number
- JPH0434329B2 JPH0434329B2 JP62106030A JP10603087A JPH0434329B2 JP H0434329 B2 JPH0434329 B2 JP H0434329B2 JP 62106030 A JP62106030 A JP 62106030A JP 10603087 A JP10603087 A JP 10603087A JP H0434329 B2 JPH0434329 B2 JP H0434329B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- circuit
- output
- reset
- level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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- Manipulation Of Pulses (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明はPLL制御に用いる2信号間の位相差
を検出する位相検波回路に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a phase detection circuit that detects a phase difference between two signals used for PLL control.
(従来の技術)
従来この種の回路は第5図のように2つの信号
検出回路16,17と、リセツト回路18とから
構成されており、2つの信号R1とV1が到来した
ことを検出したリセツト信号(NANDゲート9
の出力信号)を、2つの信号到来検出出力にそれ
ぞれゲート合成(NANDゲート2及び8に加え
る)して位相検波出力U1,D1を出力していた。(Prior Art) Conventionally, this type of circuit consists of two signal detection circuits 16, 17 and a reset circuit 18 as shown in FIG. 5, and detects the arrival of two signals R1 and V1 . Detected reset signal (NAND gate 9
(output signal) to the two signal arrival detection outputs (added to NAND gates 2 and 8), respectively, to output phase detection outputs U 1 and D 1 .
(発明が解決しようとする問題点)
しかしそのような構成に於ては、先に信号が到
来した側の出力にのみ検出信号が現われ、同時に
到来した場合は何れにも検出信号が現われない。(Problems to be Solved by the Invention) However, in such a configuration, the detection signal appears only at the output of the side where the signal arrived first, and if they arrive at the same time, the detection signal does not appear at either output.
第2図aは従来回路の入力信号R1,V1、
NANDゲート9の出力信号及び出力信号U1,D1
の波形について例示したものである。同図に於
て、入力信号R1が点線の如く入力信号V1より僅
かに早いときは、出力信号U1は点線の如く出力
するが、同時に到来するときは実線の如く出力信
号U1,D1は出力しない。 Figure 2a shows the input signals R 1 , V 1 ,
Output signal and output signal U 1 , D 1 of NAND gate 9
This is an example of the waveform. In the figure, when the input signal R 1 is slightly earlier than the input signal V 1 as shown by the dotted line, the output signal U 1 is output as shown by the dotted line, but when they arrive at the same time, the output signal U 1 , D 1 is not output.
従つて、2つのパルスの積分差を位相検波出力
とする位相検波特性は第3図のaのように位相差
0の近くに不感帯が現われ、PLL制御が不安定
となる欠点があつた。 Therefore, the phase detection characteristic in which the integral difference between two pulses is used as the phase detection output has the drawback that a dead zone appears near the phase difference of 0, as shown in a in FIG. 3, and the PLL control becomes unstable.
(問題点を解決するための手段)
本発明は2つの信号到来検出出力を何れも十分
飽和させた後リセツトさせ、2つの信号が到来し
たことを検出したリセツト信号を、2つの信号到
来検出出力何れにもゲート合成しないことによ
り、位相差0の近くの不感帯をなくし、更に、位
相差に対する検出のリニアリテイを改善するよう
にししたものである。以下本発明の実施例を図面
により詳細に説明する。(Means for Solving the Problems) The present invention resets the two signal arrival detection outputs after sufficiently saturating them, and outputs the reset signal that detected the arrival of the two signals to the two signal arrival detection outputs. By not performing gate synthesis on any of them, the dead zone near the phase difference of 0 is eliminated, and the linearity of detection with respect to the phase difference is further improved. Embodiments of the present invention will be described in detail below with reference to the drawings.
(実施例)
第1図は本発明の一実施例で1,2,3,4,
5,6,7,8及び9はNANDゲートで、10
は遅延回路、R1及びV1は入力信号、U1及びD1は
位相検波出力である。(Example) Figure 1 shows an example of the present invention.
5, 6, 7, 8 and 9 are NAND gates, 10
is a delay circuit, R 1 and V 1 are input signals, and U 1 and D 1 are phase detection outputs.
NANDゲート1,2,3及び4で信号検出回
路11を構成し、NANDゲート5,6,7及び
8でもう1つの信号検出回路12を構成し、更
に、NANDゲート9及び遅延回路10でリセツ
ト回路13を構成している。 NAND gates 1, 2, 3, and 4 constitute a signal detection circuit 11, NAND gates 5, 6, 7, and 8 constitute another signal detection circuit 12, and NAND gate 9 and delay circuit 10 constitute a reset circuit. It constitutes the circuit 13.
入力信号R1がHレベルのときにNANDゲート
1の出力はLレベルとなり、従つて、NANDゲ
ート3及び4により構成されたSRフリツプフロ
ツプの動作によりNANDゲート3の出力はHレ
ベルになり、NANDゲート2の出力U1はHレベ
ルとなる。 When the input signal R1 is at H level, the output of NAND gate 1 goes to L level. Therefore, the output of NAND gate 3 goes to H level due to the operation of the SR flip-flop constituted by NAND gates 3 and 4, and the output of NAND gate 1 goes to H level. The output U1 of 2 becomes H level.
次に、入力信号R1がLレベルとなると、
NANDゲート1及び3の出力は共にHレベルと
なることで信号を検出する。また、このとき
NANDゲート2の出力U1はLレベルに変わる。 Next, when the input signal R1 becomes L level,
A signal is detected when the outputs of NAND gates 1 and 3 both go to H level. Also, at this time
The output U1 of the NAND gate 2 changes to L level.
同様に、入力信号V1がHレベルからLレベル
に変化するとNANDゲート6及び7の出力は共
にHレベルとなることで信号を検出する。また、
このときNANDゲート8の出力D1はLレベルに
変わる。 Similarly, when the input signal V1 changes from H level to L level, the outputs of NAND gates 6 and 7 both go to H level, thereby detecting the signal. Also,
At this time, the output D1 of the NAND gate 8 changes to L level.
2つのL信号が到来したことで、NANDゲー
ト1,3,6及び7の出力が共にHレベルとなる
ことから、リセツト回路13のNANDゲート9
の出力はLレベルに変わり、これを遅延回路10
で遅延させて信号検出回路11,12の共通リセ
ツト端子Aを経てNANDゲート4及び5に加え
ることでリセツト動作させる。 With the arrival of the two L signals, the outputs of NAND gates 1, 3, 6, and 7 all become H level, so the NAND gate 9 of the reset circuit 13
The output of changes to L level, which is sent to delay circuit 10.
A reset operation is performed by delaying the signal and applying it to the NAND gates 4 and 5 via the common reset terminal A of the signal detection circuits 11 and 12.
リセツト動作によりNANDゲート3及び6の
出力をLレベルとし、従つてリセツト動作は解除
され、また、NANDゲート2及び8の出力U1及
びD1は共にHレベルに戻る。 The reset operation sets the outputs of NAND gates 3 and 6 to the L level, so the reset operation is canceled, and the outputs U1 and D1 of the NAND gates 2 and 8 both return to the H level.
リセツト信号の遅延には、バツフア回路を多段
に接続するか或はR,C(抵抗コンデンサ)によ
る遅延回路を用いる。 To delay the reset signal, buffer circuits are connected in multiple stages, or a delay circuit using R and C (resistance capacitors) is used.
このように構成することにより、第3図のbの
ように不感帯のないリニアリテイの良い位相検波
特性が得られる。 With this configuration, phase detection characteristics with good linearity and no dead zone can be obtained as shown in FIG. 3b.
第2図bは入力信号R1が入力信号V1より僅か
に早く到来した場合の位相検波出力U1及びD1の
波形、リセツト検出のNANDゲート9の出力波
形及び遅延後のリセツト信号波形を現わしたもの
である。又同時到来の場合も示してあり、その場
合も出力信号U1,D1は実線の如く出力する。 Figure 2b shows the waveforms of the phase detection outputs U1 and D1 when the input signal R1 arrives slightly earlier than the input signal V1 , the output waveform of the NAND gate 9 for reset detection, and the reset signal waveform after the delay. It is what has appeared. The case where they arrive simultaneously is also shown, and in that case as well, the output signals U 1 and D 1 are output as shown by solid lines.
第4図は本発明の他の実施例で、第1図回路に
対し、リセツト信号をNORゲートで作り出した
ものである。個別の動作は周知であるので説明は
略す。 FIG. 4 shows another embodiment of the present invention, in which the reset signal for the circuit of FIG. 1 is generated by a NOR gate. Since the individual operations are well known, their explanation will be omitted.
(発明の効果)
以上説明したように、本発明によれば不感帯の
ない、リニアリテイの良い位相検波特性が得られ
るため、安定なPLL制御が可能となる。(Effects of the Invention) As described above, according to the present invention, phase detection characteristics with no dead zone and good linearity can be obtained, so stable PLL control is possible.
第1図は本発明の一実施例を示す回路図、第2
図は各部の波形説明図、第3図は検波出力特性説
明図、第4図は他の実施例、第5図は従来の回路
図である。
10……遅延回路、11,12……信号検出回
路、13……リセツト回路。
Figure 1 is a circuit diagram showing one embodiment of the present invention, Figure 2 is a circuit diagram showing an embodiment of the present invention.
3 is an explanatory diagram of waveforms of each part, FIG. 3 is an explanatory diagram of detected output characteristics, FIG. 4 is another embodiment, and FIG. 5 is a conventional circuit diagram. 10... Delay circuit, 11, 12... Signal detection circuit, 13... Reset circuit.
Claims (1)
回路と、該2つの信号検出回路の両者への信号の
到来を受けてリセツト信号を発生するリセツト回
路とを有し、前記2つの信号検出回路を共にリセ
ツトして繰り返し2つの信号の到来を検出するよ
うに構成した位相検出回路に於て、前記リセツト
回路に前記2つの信号検出回路の共通リセツト端
子へ接続する遅延回路を設け、該遅延回路を経た
リセツト信号により、前記2つの信号検出回路の
出力を共に十分飽和レベルに達するようにしたこ
とを特徴とする位相検波回路。1. It has two signal detection circuits that detect and output the arrival of a signal, and a reset circuit that generates a reset signal in response to the arrival of a signal to both of the two signal detection circuits, and the two signal detection circuits In a phase detection circuit configured to repeatedly detect the arrival of two signals by resetting both signals, the reset circuit is provided with a delay circuit connected to a common reset terminal of the two signal detection circuits, and the delay circuit is connected to a common reset terminal of the two signal detection circuits. A phase detection circuit characterized in that the outputs of the two signal detection circuits are both made to sufficiently reach a saturation level by a reset signal that has passed through the phase detection circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62106030A JPS63269822A (en) | 1987-04-28 | 1987-04-28 | Phase detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62106030A JPS63269822A (en) | 1987-04-28 | 1987-04-28 | Phase detection circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63269822A JPS63269822A (en) | 1988-11-08 |
| JPH0434329B2 true JPH0434329B2 (en) | 1992-06-05 |
Family
ID=14423239
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62106030A Granted JPS63269822A (en) | 1987-04-28 | 1987-04-28 | Phase detection circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63269822A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01125125A (en) * | 1987-11-10 | 1989-05-17 | Nippon Telegr & Teleph Corp <Ntt> | Phase frequency comparator |
| JP3437143B2 (en) | 2000-04-24 | 2003-08-18 | ファナック株式会社 | Injection mechanism of injection molding machine |
-
1987
- 1987-04-28 JP JP62106030A patent/JPS63269822A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63269822A (en) | 1988-11-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |