JPH0441673A - Vacuum device and leaking method therefor - Google Patents
Vacuum device and leaking method thereforInfo
- Publication number
- JPH0441673A JPH0441673A JP14634190A JP14634190A JPH0441673A JP H0441673 A JPH0441673 A JP H0441673A JP 14634190 A JP14634190 A JP 14634190A JP 14634190 A JP14634190 A JP 14634190A JP H0441673 A JPH0441673 A JP H0441673A
- Authority
- JP
- Japan
- Prior art keywords
- vacuum
- vacuum device
- leak
- diffusion member
- particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
〔概 要〕
、装置内部を真空から大気圧に戻すとき、リークの流れ
により装置内部の汚染物及びパーティクルの巻き上がり
を防止した真空装置及びリーク方法に関し、
装置内部の汚染物及びパーティクルの巻き上がりを防止
することを目的とし、
真空装置内に挿入されたリーク用パイプの先端に、リー
クの流れを拡散させるた約の多孔質なステンレス・スチ
ールからなる拡散部材を設けるように構成する。[Detailed Description of the Invention] [Summary] This invention relates to a vacuum device and a leakage method that prevent contaminants and particles inside the device from being rolled up due to leakage flow when the inside of the device is returned from vacuum to atmospheric pressure. In order to prevent contaminants and particles from being stirred up, a diffusion member made of porous stainless steel is installed at the tip of the leak pipe inserted into the vacuum device to diffuse the leak flow. Configure it as follows.
本発明は装置内部を真空から大気圧に戻すとき、リーク
の流れにより装置内部の汚染物及びパーティクルの巻き
上がりを防止した真空装置及びリーク方法に関する。The present invention relates to a vacuum device and a leakage method that prevent contaminants and particles inside the device from being rolled up due to leakage flow when the inside of the device is returned from vacuum to atmospheric pressure.
第3図は従来の真空装置の一例を示す図である。 FIG. 3 is a diagram showing an example of a conventional vacuum device.
同図において、1は例えば半導体装置製造用のCVD装
置等の真空装置であり、2はその真空排気口、3はリー
ク用パイプ、4はフィルタ、5はリーク口である。そし
てこの装置は基板等の被処理物6を装置1内に挿入して
おき、排気口2から排気した後、被処理物をCVD等の
処理を行ない、その後リーク用パイプ3から窒素ガス等
をフィルタ4を通してリーク口5から送入し、装置1内
を大気圧に戻した後、被処理物6を取り出すようになっ
ている。In the figure, 1 is a vacuum device such as a CVD device for manufacturing semiconductor devices, 2 is a vacuum exhaust port thereof, 3 is a leak pipe, 4 is a filter, and 5 is a leak port. In this apparatus, a workpiece 6 such as a substrate is inserted into the apparatus 1, and after exhausting air from the exhaust port 2, the workpiece is subjected to a process such as CVD. The material to be processed 6 is introduced from the leak port 5 through the filter 4, and after returning the inside of the apparatus 1 to atmospheric pressure, the material to be processed 6 is taken out.
上記従来の真空装置では、装置1内部を大気圧に戻す場
合、清浄度の高い気体を送り込んでも、送り込まれる気
体はリーク口5から一方向へのみリークされ、その勢で
装置内部を矢印の如く循環する。このとき装置1の内部
が汚染されていると、送入された気体が汚染物質やパー
ティクルを巻き上げ被処理物6上に付着させ、被処理物
を汚染してしまうという問題があった。In the above-mentioned conventional vacuum device, when returning the inside of the device 1 to atmospheric pressure, even if highly clean gas is fed, the fed gas leaks only in one direction from the leak port 5, and its force causes the inside of the device to flow in the direction shown by the arrow. circulate. If the inside of the apparatus 1 is contaminated at this time, there is a problem in that the introduced gas stirs up contaminants and particles and deposits them on the object to be processed 6, thereby contaminating the object to be processed.
本発明は上記従来の問題点に鑑み、装置内部の汚染物及
びパーティクルの巻き上がりを防止した真空装置及び真
空装置でのリーク方法を提供することを目的とする。SUMMARY OF THE INVENTION In view of the above-mentioned conventional problems, it is an object of the present invention to provide a vacuum device and a leakage method in a vacuum device that prevent contaminants and particles from rolling up inside the device.
上記目的を達成するために本発明の真空装置では、
真空装置1内に挿入されたリーク用パイプ3の先端に、
リークの流れを拡散させるための多孔質なステンレス・
スチールよりなる拡散部材7を設けたことを特徴とする
。In order to achieve the above object, in the vacuum device of the present invention, at the tip of the leak pipe 3 inserted into the vacuum device 1,
Porous stainless steel to diffuse leak flow
A feature is that a diffusion member 7 made of steel is provided.
また本発明の真空装置でのリーク方法では、真空装置1
において、装置内部を真空から大気圧へ戻すとき、該真
空装置1内に挿入されたリーク用パイプ3の先端に取り
付けられた多孔質な拡散部材7を通してリーク用気体を
装置内に送入し、リーク用気体の流れを拡散させること
で装置内部の汚染物及びパーティクルの巻き上がりを防
止することを特徴とする。Further, in the leakage method in a vacuum device of the present invention, the vacuum device 1
When returning the inside of the device from vacuum to atmospheric pressure, leak gas is introduced into the device through the porous diffusion member 7 attached to the tip of the leak pipe 3 inserted into the vacuum device 1, It is characterized by preventing contaminants and particles from rolling up inside the device by diffusing the flow of leak gas.
真空装置1内に挿入したリーク用パイプ3の先端に多孔
質な拡散部材7を取り付け、装置内を真空状態から大気
圧に戻すときに、リーク用気体を拡散部材7を通して装
置内に送入することにより、リーク用気体は拡散部材7
で四方に拡散される。A porous diffusion member 7 is attached to the tip of the leak pipe 3 inserted into the vacuum device 1, and when returning the inside of the device from a vacuum state to atmospheric pressure, leak gas is introduced into the device through the diffusion member 7. As a result, the leakage gas flows through the diffusion member 7.
It is spread in all directions.
従って強い一方向の流れは生じないため、装置内の汚染
物質やパーティクルを巻き上げることが少なくなり、基
板等の被処理物の汚染を防止することができる。Therefore, since no strong unidirectional flow occurs, there is less chance of stirring up contaminants and particles within the apparatus, and it is possible to prevent contamination of objects to be processed, such as substrates.
第1図は本発明の真空装置の実施例を示す図である。 FIG. 1 is a diagram showing an embodiment of the vacuum apparatus of the present invention.
本実施例は、同図に示すように、基板等の被処理物6を
処理する真空装置1、該装置内を真空排気するための真
空排気口2、フィルタ4を通して装置内にリーク用気体
を送入するリーク用ノ々イブ3等を具備していることは
第3図で説明した従来例と同様であり、本実施例の要点
は、真空装置1内にリーク用パイプ3を挿入し、その先
端に、底部及び側壁が一単位の無数の孔を有する多孔質
なステンレス・スチールで形成された四角な箱状の拡散
部材7を設けたことである。なおこの拡散部材7の形状
は四角形とは限らず、球状又は牢球状等他の形状であっ
ても良く、要はリーク用気体を四方に拡散できる形状で
あれば良い。As shown in the figure, this embodiment includes a vacuum device 1 for processing a workpiece 6 such as a substrate, a vacuum exhaust port 2 for evacuating the inside of the device, and a filter 4 for leaking gas into the device. It is the same as the conventional example explained in FIG. At its tip, a square box-shaped diffusion member 7 made of porous stainless steel and having numerous holes in its bottom and side walls is provided. Note that the shape of the diffusion member 7 is not limited to a rectangular shape, and may be other shapes such as a spherical shape or a spherical shape, and in short, any shape is sufficient as long as it can diffuse the leak gas in all directions.
このように構成された本実施例を用いた真空装置のリー
ク方法を第2図により説明する。同図において第1図と
同一部分は同一符号を付して示した。A leakage method of the vacuum apparatus using this embodiment configured as described above will be explained with reference to FIG. 2. In this figure, the same parts as in FIG. 1 are designated by the same reference numerals.
真空装置1が真空状態で基板等の被処理物6の処理を行
なった後、処理済の被処理物6を取り出すた給に装置内
を大気圧に戻す場合は、リーク用パイプ3からフィルタ
4を通して清浄化した窒素等のリーク用気体を拡散部材
7に送ることにより、拡散部材7に送り込んだリーク用
気体を、拡散部材7の庫単位の無数の穴から矢印の如く
装置内に均一に拡散させるのである。After the vacuum apparatus 1 processes a workpiece 6 such as a substrate in a vacuum state, when the inside of the apparatus is returned to atmospheric pressure before taking out the processed workpiece 6, the filter 4 is removed from the leak pipe 3. By sending purified leak gas such as nitrogen to the diffusion member 7, the leak gas sent to the diffusion member 7 can be uniformly diffused into the device as shown by the arrow from the countless holes in each compartment of the diffusion member 7. Let it happen.
これにより、装置内にはリーク用気体の一方向の強い気
流は生ぜず、従って装置内の汚染物やパーティクルを巻
き上げることがなく、基板等の被処理物を汚染すること
もない。As a result, a strong unidirectional flow of leakage gas is not generated within the apparatus, so that contaminants and particles within the apparatus are not stirred up, and objects to be processed such as substrates are not contaminated.
以上説明した様に、本発明によれば、真空装置内に挿入
されたリーク用パイプの先端に多孔質の拡散部材を設け
ることにより、リーク時に装置内の汚染物やパーティク
ルの巻き上がりを防止して、装置内の被処理物の汚染を
防止することができ、製品の歩留り向上に寄与するとこ
ろ大である。As explained above, according to the present invention, by providing a porous diffusion member at the tip of a leak pipe inserted into a vacuum device, it is possible to prevent contaminants and particles from rolling up inside the device when a leak occurs. Therefore, it is possible to prevent contamination of the objects to be processed within the apparatus, which greatly contributes to improving the yield of products.
第1図は本発明の真空装置の実施例を示す図、第2図は
本発明の真空装置のリーク方法を説明するための図、
第3図は従来の真空装置の1例を示す図である。
図において、
lは真空装置、 2は真空排気口、3はリーク
用パイプ、 4はフィルタ、6は被処理物、
7は拡散部材を示す。
本発明の真空装置のリーク方法を説明するための図第2
図
1・・・真空装置
4・・・フィルタ
6・・・被処理物
7・・・拡散部材
本発明の真空装置の実施例を示す図
第1図
7・・・真空装置
2・・・真空排気口
3・・・リーク用パイプ
4・・・フィルタ
6・・・被処理物
7・・・拡散部材
従来の真空装置の1例を示す図
第3図FIG. 1 is a diagram showing an embodiment of the vacuum device of the present invention, FIG. 2 is a diagram for explaining the leakage method of the vacuum device of the present invention, and FIG. 3 is a diagram showing an example of a conventional vacuum device. be. In the figure, l is the vacuum device, 2 is the vacuum exhaust port, 3 is the leak pipe, 4 is the filter, 6 is the object to be processed,
7 indicates a diffusion member. Figure 2 for explaining the leakage method of the vacuum device of the present invention
Figure 1... Vacuum device 4... Filter 6... Processed object 7... Diffusion member Figure 1 showing an embodiment of the vacuum device of the present invention. Figure 7... Vacuum device 2... Vacuum Exhaust port 3...Leak pipe 4...Filter 6...Workpiece 7...Diffusion member Fig. 3 is a diagram showing an example of a conventional vacuum device.
Claims (2)
)の先端に、リークの流れを拡散させるための多孔質な
ステンレス・スチールよりなる拡散部材(7)を設けた
ことを特徴とする真空装置。1. Leak pipe (3) inserted into the vacuum device (1)
) is provided with a diffusion member (7) made of porous stainless steel for diffusing the flow of leakage.
圧へ戻すとき、該真空装置(1)内に挿入されたリーク
用パイプ(3)の先端に取り付けられた多孔質な拡散部
材(7)を通してリーク用気体を装置内に送入し、リー
ク用気体の流れを拡散させることで装置内部の汚染物及
びパーティクルの巻き上がりを防止することを特徴とす
る真空装置でのリーク方法。2. In a vacuum device (1), when returning the inside of the device from vacuum to atmospheric pressure, the air is passed through a porous diffusion member (7) attached to the tip of a leak pipe (3) inserted into the vacuum device (1). 1. A leakage method in a vacuum device, characterized in that a leakage gas is introduced into the device and the flow of the leakage gas is diffused to prevent contaminants and particles from being rolled up inside the device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14634190A JPH0441673A (en) | 1990-06-06 | 1990-06-06 | Vacuum device and leaking method therefor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14634190A JPH0441673A (en) | 1990-06-06 | 1990-06-06 | Vacuum device and leaking method therefor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0441673A true JPH0441673A (en) | 1992-02-12 |
Family
ID=15405512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14634190A Pending JPH0441673A (en) | 1990-06-06 | 1990-06-06 | Vacuum device and leaking method therefor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0441673A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019161120A (en) * | 2018-03-15 | 2019-09-19 | シンフォニアテクノロジー株式会社 | Efem |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60253225A (en) * | 1984-05-30 | 1985-12-13 | Hitachi Ltd | Vacuum treatment device |
| JPS6367241B2 (en) * | 1981-12-17 | 1988-12-23 | Matsushita Electric Ind Co Ltd |
-
1990
- 1990-06-06 JP JP14634190A patent/JPH0441673A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6367241B2 (en) * | 1981-12-17 | 1988-12-23 | Matsushita Electric Ind Co Ltd | |
| JPS60253225A (en) * | 1984-05-30 | 1985-12-13 | Hitachi Ltd | Vacuum treatment device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019161120A (en) * | 2018-03-15 | 2019-09-19 | シンフォニアテクノロジー株式会社 | Efem |
| JP2022162003A (en) * | 2018-03-15 | 2022-10-21 | シンフォニアテクノロジー株式会社 | EFEM |
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