JPH044285U - - Google Patents
Info
- Publication number
- JPH044285U JPH044285U JP4595890U JP4595890U JPH044285U JP H044285 U JPH044285 U JP H044285U JP 4595890 U JP4595890 U JP 4595890U JP 4595890 U JP4595890 U JP 4595890U JP H044285 U JPH044285 U JP H044285U
- Authority
- JP
- Japan
- Prior art keywords
- pin probe
- test object
- poor contact
- prevent
- signals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000012360 testing method Methods 0.000 claims description 4
- 238000002788 crimping Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000011990 functional testing Methods 0.000 description 2
- 230000002265 prevention Effects 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図はこの考案の一実施例による機能試験装
置の一実施例の全体構成図、第２図は第１図によ
る装置の接触不良時のピンプローブの拡大図、第
３図は第１図による装置のピンプローブ接触不良
時のフローチヤート、第４図は従来の機能試験装
置を示す全体構成図である。
図において、１……試験対象物、３……ピンプ
ローブ、５……加圧装置、９……接触不良防止手
段である。なお、図中、同一符号は同一、または
相当部分を示す。
Fig. 1 is an overall configuration diagram of an embodiment of a functional test device according to an embodiment of this invention, Fig. 2 is an enlarged view of a pin probe when the device according to Fig. 1 has a contact failure, and Fig. 3 is a diagram similar to that shown in Fig. 1. FIG. 4 is a flowchart showing a pin probe contact failure of an apparatus according to the present invention, and FIG. 4 is an overall configuration diagram showing a conventional functional test apparatus. In the figure, 1... test object, 3... pin probe, 5... pressurizing device, 9... poor contact prevention means. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.
Claims (1)
信号を検出するためのピンプローブと、このピン
プローブを圧着させるための加圧装置と、ピンプ
ローブの接触不良により計測異常とならない様に
するための接触不良防止手段を備えた機能試験装
置。 A pin probe for supplying signals to the test object or detecting signals from the test object, a pressurizing device for crimping the pin probe, and a device to prevent measurement errors due to poor contact between the pin probe. A functional testing device equipped with means to prevent poor contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4595890U JPH044285U (en) | 1990-04-27 | 1990-04-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4595890U JPH044285U (en) | 1990-04-27 | 1990-04-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH044285U true JPH044285U (en) | 1992-01-16 |
Family
ID=31560606
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4595890U Pending JPH044285U (en) | 1990-04-27 | 1990-04-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH044285U (en) |
-
1990
- 1990-04-27 JP JP4595890U patent/JPH044285U/ja active Pending