JPH0442888A - Apparatus for growing crystal - Google Patents
Apparatus for growing crystalInfo
- Publication number
- JPH0442888A JPH0442888A JP15114590A JP15114590A JPH0442888A JP H0442888 A JPH0442888 A JP H0442888A JP 15114590 A JP15114590 A JP 15114590A JP 15114590 A JP15114590 A JP 15114590A JP H0442888 A JPH0442888 A JP H0442888A
- Authority
- JP
- Japan
- Prior art keywords
- reservoir
- container
- heater
- diameter part
- heat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
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- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は単結晶製造技術さらには垂直ブリッジマン法も
しくは垂直徐冷法による結晶成長技術に関し、例えばC
dTeのような構成元素の蒸気圧が大きく異なる化合物
半導体単結晶の成長に利用して効果的な技術に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to single crystal manufacturing technology and crystal growth technology by vertical Bridgman method or vertical slow cooling method, such as C
The present invention relates to a technique that is effective for growing compound semiconductor single crystals such as dTe, in which constituent elements have greatly different vapor pressures.
[従来の技術]
従来、CdTeのようなII−VT族化合物半導体単結
晶の製造方法としては、水平ブリッジマン法(HB法)
や垂直ブリッジマン法、垂直徐冷法等が用いられている
。上記いずれの方法を用いてもCdTe融液から結晶を
育成させる際、Cd蒸気圧がTe蒸気圧に比べて1桁近
く高いため、化学当量比に合うように原料として化学当
量比の多結晶CdTeと純Cdを用いたとしても、融液
からCdがぬけてしまう。その結果、Te過剰な組成と
なりやすく、結晶中にこの過剰なTeが集まったクラス
ターが形成される場合がある。このクラスターを含んた
結晶を基板としてエピタキシャル成長を行なうとエピタ
キシャル層に欠陥を発生させるという欠点があった。そ
こで、融液を入れる容器と、Cd蒸気の補給源(以下、
Cdリザーバーと称する)を同一系内に設け、Cdリザ
ーバーの温度を制御することでCcl蒸気圧をコントロ
ールし、融液の組成を制御する方法が提案されている。[Prior Art] Conventionally, as a method for manufacturing a II-VT group compound semiconductor single crystal such as CdTe, the horizontal Bridgman method (HB method) is used.
The vertical Bridgman method, the vertical slow cooling method, etc. are used. When growing crystals from a CdTe melt using any of the above methods, the Cd vapor pressure is nearly an order of magnitude higher than the Te vapor pressure, so polycrystalline CdTe with a chemical equivalent ratio is used as a raw material to match the chemical equivalence ratio. Even if pure Cd is used, Cd will escape from the melt. As a result, the composition tends to have an excess of Te, and clusters in which the excess Te gathers may be formed in the crystal. When epitaxial growth is performed using a crystal containing such clusters as a substrate, there is a drawback that defects are generated in the epitaxial layer. Therefore, we needed a container to hold the melt and a supply source for Cd vapor (hereinafter referred to as
A method has been proposed in which a Cd reservoir (referred to as a Cd reservoir) is provided in the same system and the Ccl vapor pressure is controlled by controlling the temperature of the Cd reservoir, thereby controlling the composition of the melt.
[発明が解決しようとする課題]
この方法を用いればTeクラスターの少ない結晶を製造
することが可能であるが、第3図に示すような垂直徐冷
法を適用した結晶製造装置でCdTe単結晶を育成する
場合は、Teの蒸気圧も比較的高いため、融液から多少
のTeが抜け、このTe蒸気とリザーバーから供給され
たCd蒸気が、融液を配置した部分とCdリザーバーと
の間で反応して管壁に付着することがある。この異常成
長した付着物(CdTe)8が自重によってCdリザー
バ一部11に落ちて蒸気補給源4 (Cd)中にTeが
含まれることがあり、蒸気圧が変動しTeクラスタが発
生し易くなるという欠点があることが分かった。[Problem to be solved by the invention] Using this method, it is possible to produce a crystal with few Te clusters, but it is not possible to grow a CdTe single crystal using a crystal production apparatus that applies the vertical slow cooling method as shown in Fig. 3. In this case, since the vapor pressure of Te is relatively high, some Te will escape from the melt, and this Te vapor and Cd vapor supplied from the reservoir will react between the part where the melt is placed and the Cd reservoir. and may adhere to pipe walls. This abnormally grown deposit (CdTe) 8 may fall into the Cd reservoir part 11 due to its own weight, and Te may be included in the steam replenishment source 4 (Cd), causing fluctuations in vapor pressure and making Te clusters more likely to occur. It turns out that there is a drawback.
本発明は、上記のような問題点に着目してなされたもの
でその目的とするところは、リザーバーを有する縦型の
結晶製造装置により化合物半導体単結晶を育成する場合
において、リザーバー内の蒸気供給源たる元素に他の構
成元素が混入するのを防止し、高品質の単結晶を育成可
能な結晶製造技術を提供することにある。The present invention has been made in view of the above-mentioned problems, and its purpose is to improve the vapor supply in the reservoir when growing a compound semiconductor single crystal using a vertical crystal manufacturing apparatus having a reservoir. It is an object of the present invention to provide a crystal manufacturing technology that can prevent other constituent elements from being mixed into a source element and can grow a high-quality single crystal.
[課題を解決するための手段]
上記目的を達成するためこの発明は、リザーバーを備え
た縦型の結晶製造装置において、原料融液の入った容器
を載置する部分とリザーバーとの間に、例えば互いに貫
通部が重ならないように形成された複数の遮蔽板を有す
る生成物落下防止具を設けるようにしたものである。[Means for Solving the Problems] In order to achieve the above object, the present invention provides a vertical crystal manufacturing apparatus equipped with a reservoir, in which between the part where a container containing the raw material melt is placed and the reservoir, For example, a product fall prevention device is provided that has a plurality of shielding plates formed so that the through parts do not overlap with each other.
[作用コ
上記した手段によれば、融液容器載置部とリザーバーと
の間の壁面に付着した反応生成物が剥がれても落下防止
具によってリザーバー内に落下するのを防止することが
でき、これによってリザーバー内の蒸気補給源としての
元素へ他の元素が混入して蒸気圧のバランスがずれるの
を防止し、高品質の単結晶を製造することができるよう
になる。[Operation] According to the above-described means, even if the reaction product adhering to the wall between the melt container placement part and the reservoir comes off, it can be prevented from falling into the reservoir by the fall prevention device, This prevents the vapor pressure from becoming unbalanced due to mixing of other elements with the element serving as the vapor supply source in the reservoir, making it possible to produce high-quality single crystals.
[実施例]
第1図には垂直徐冷法を適用して結晶の成長を行なう結
晶成長装置の一実施例が示されている。[Example] FIG. 1 shows an example of a crystal growth apparatus that grows crystals by applying a vertical slow cooling method.
この実施例では、円筒状の石英製耐熱容器1が垂直に配
置され、その外周にはヒータ2が配置されている。上記
耐熱容器1は上部の大径部1aとその下部に一体に設け
られた小径部1bとからなり、大径部1aの下部に原料
融液を入れる容器3が載置され、小径部1bの下部には
蒸気補給源としての元素4が封入され、小径部1bと外
側のヒータ2とによってリザーバー11が構成されるよ
うになっている。In this embodiment, a cylindrical heat-resistant container 1 made of quartz is arranged vertically, and a heater 2 is arranged around its outer periphery. The heat-resistant container 1 consists of an upper large-diameter part 1a and a small-diameter part 1b integrally provided at the lower part of the large-diameter part 1a.A container 3 for holding the raw material melt is placed in the lower part of the large-diameter part 1a, and a small-diameter part 1b is placed in the lower part of the large-diameter part 1a. An element 4 as a steam supply source is sealed in the lower part, and a reservoir 11 is constituted by the small diameter portion 1b and the heater 2 on the outside.
一方、上記ヒータ2は、垂直方向に沿って複数に分割さ
れ、最上部のヒータ2aは上方が高く、下方が低い温度
分布を形成できるように構成されている。On the other hand, the heater 2 is divided into a plurality of parts along the vertical direction, and the uppermost heater 2a is configured to form a temperature distribution that is high at the top and low at the bottom.
また、最下部のヒータ2bは耐熱容器1内が所望の蒸気
圧となるように蒸気補給源としての元素4を所定の温度
に独立して加熱できるようになっている。Furthermore, the heater 2b at the bottom can independently heat the element 4 as a steam replenishment source to a predetermined temperature so that the inside of the heat-resistant container 1 reaches a desired steam pressure.
なお、耐熱容器1の上部には、内部を気密にするための
石英製キャップ5が嵌合されており、このキャップ5は
バーナー等で耐熱容器lの内壁に溶着されるようになっ
ている。A quartz cap 5 is fitted onto the top of the heat-resistant container 1 to make the inside airtight, and the cap 5 is welded to the inner wall of the heat-resistant container 1 using a burner or the like.
また、原料保持用容器3を所定の位置に設置したとき、
下方のりザーバ−11からガスが大径部la内に供給さ
れるようにするため、大径部1aの底壁上面には溝もし
くは凹凸を形成して、容器3の底面との間に隙間が生じ
るようにされている。Moreover, when the raw material holding container 3 is installed at a predetermined position,
In order to supply gas from the lower glue reservoir 11 into the large diameter section la, a groove or an uneven surface is formed on the upper surface of the bottom wall of the large diameter section 1a, so that a gap is formed between it and the bottom surface of the container 3. It is made to occur.
この実施例では、容器1の小径部1bの途中、すなわち
蒸気補給用元素4の設置されたりザーバー11と原料保
持用容器3との間に、石英からなるほぼ円筒状の生成物
落下防止具6が挿入されるようになっている。In this embodiment, a substantially cylindrical product drop prevention device 6 made of quartz is installed in the middle of the small diameter portion 1b of the container 1, that is, between the steam replenishment element 4 is installed and the reservoir 11 and the raw material holding container 3. is now inserted.
この生成物落下防止具6は第2図に示すようにその内壁
から軸と直交する方向に複数の遮蔽板6aが等間隔をお
いて突出するように設けられており、各遮蔽板6aは先
端が中心部よりも外側に突出したほぼ半円状をなし、か
つ各遮蔽板6aの先端と内壁面との隙間すなわち貫通孔
6bが互いに重なり合わないように各遮蔽板6aは交互
に逆向きに設けられている。これによって、リザーバー
11で加熱され発生した構成元素の蒸気は生成物落下防
止板6の隙間を通って耐熱容器1の上部空間へ速やかに
供給されるが、容器3内の融液から抜けた他の構成元素
ガスと蒸気圧補給用ガスとが生成物落下防止板6と容器
3の載置部との間の空間で反応して生じた生成物が壁面
に付着し、それが自重や振動で剥がれて落下したとして
も、生成物落下防止具6があるためリザーバー11内の
元素4に混入するおそれがない。なお、小径部1bに挿
入された生成物落下防止具6が途中で係止されるように
、小径部1bの内壁に突起を形成するか、小径部1bを
円錐状に形成しておくとよい。As shown in FIG. 2, this product fall prevention device 6 is provided with a plurality of shielding plates 6a protruding from its inner wall at equal intervals in a direction perpendicular to the axis, and each shielding plate 6a has a tip. The shielding plates 6a have a substantially semicircular shape that protrudes outward from the center, and the shielding plates 6a are alternately arranged in opposite directions so that the gaps between the tips of the shielding plates 6a and the inner wall surface, that is, the through holes 6b do not overlap with each other. It is provided. As a result, the vapor of the constituent elements heated and generated in the reservoir 11 is quickly supplied to the upper space of the heat-resistant container 1 through the gap between the product fall prevention plates 6. The constituent element gas and the vapor pressure replenishment gas react in the space between the product drop prevention plate 6 and the container 3 placement part, and the resulting product adheres to the wall surface, and is caused by its own weight and vibration. Even if it peels off and falls, there is no risk of it getting mixed into the element 4 in the reservoir 11 because of the product fall prevention device 6. In addition, it is preferable to form a protrusion on the inner wall of the small diameter part 1b or to form the small diameter part 1b in a conical shape so that the product fall prevention tool 6 inserted into the small diameter part 1b is stopped halfway. .
第1図の装置を用いて一例として、CdTe単結晶の成
長を行なった。As an example, a CdTe single crystal was grown using the apparatus shown in FIG.
先ず、耐熱容器lの小径部1bの底に、純度6NのCd
を1og入れ、生成物落下防止具6を挿入してから、予
め合成したCdTe多結晶約1゜5kgを入れた容器3
を大径部1aの下部に載置した。その後、耐熱容器1内
を真空にしてから石英製キャップ5を大径部1aの上部
に嵌合させ、バーナーで溶着した。First, Cd with a purity of 6N is placed on the bottom of the small diameter part 1b of the heat-resistant container l.
After putting in 1 og of CdTe polycrystal and inserting the product fall prevention device 6, the container 3 containing about 1.5 kg of pre-synthesized CdTe polycrystal.
was placed on the lower part of the large diameter portion 1a. Thereafter, the inside of the heat-resistant container 1 was evacuated, and the quartz cap 5 was fitted onto the upper part of the large diameter portion 1a, and welded with a burner.
しかる後、上記耐熱容器1を、ヒータ2を有する炉内に
設置してからヒータ2に給電して、大径部1a近傍が1
〜1.5℃/CT11の温度勾配を有し、かつCdTe
の融点以上で、上部が下部より高くなるような温度分布
を有するように昇温した。また、リザーバー11は77
5〜805℃となるようにヒータ2bで加熱し、耐熱容
器l内のCd蒸気圧が1.2〜1.5atmとなるよう
にした。上記条件でヒータへの給電開始後50時間かけ
て炉内温度分布を安定させてから、上記温度勾配を保持
したまま順次降温し、約200時間かけて結晶化させた
。After that, the heat-resistant container 1 is placed in a furnace having a heater 2, and power is supplied to the heater 2 so that the vicinity of the large diameter portion 1a becomes 1.
It has a temperature gradient of ~1.5°C/CT11, and CdTe
The temperature was raised so that the temperature distribution was such that the upper part was higher than the lower part above the melting point. Also, reservoir 11 is 77
It was heated with the heater 2b to a temperature of 5 to 805°C, and the Cd vapor pressure in the heat-resistant container 1 was set to 1.2 to 1.5 atm. Under the above conditions, the temperature distribution in the furnace was stabilized over 50 hours after the start of power supply to the heater, and then the temperature was gradually lowered while maintaining the above temperature gradient, and crystallization was performed over about 200 hours.
その結果、直径3インチ、長さ60mmのCdTe単結
晶が得られた。また、リザーバー11内のCdを取り呂
して分析したところ、Teは含まれていなかった。比較
のため、生成物落下防止具を用いない第3図の従来装置
を用いて同一条件で結晶成長後、リザーバーからCdを
取り出して分析したところ原子比で97:3の割合でT
eが含まれていた。As a result, a CdTe single crystal with a diameter of 3 inches and a length of 60 mm was obtained. Further, when the Cd in the reservoir 11 was analyzed, it was found that Te was not contained therein. For comparison, after crystal growth under the same conditions using the conventional apparatus shown in Figure 3, which does not use a device to prevent product fall, Cd was taken out from the reservoir and analyzed.
It contained e.
なお、上記実施例の生成物落下防止具6は一体物として
形成してもよいが、軸方向に沿って2分割できるように
形成したものを接合した状態で耐熱容器l内にセットす
るようにしてもよい。Note that the product fall prevention device 6 of the above embodiment may be formed as a single piece, but it is preferable that the product fall prevention device 6 is formed into two parts along the axial direction and set in the heat-resistant container l in a joined state. You can.
また、遮蔽板6aに傾斜をつけたレバ遮蔽板6aを半円
板とする代わりに互いに重ならない位置に1つまたは2
つ以上の貫通孔を形成した円板とするようにしてもよい
。In addition, instead of using a semicircular plate as the lever shielding plate 6a with an inclination to the shielding plate 6a, one or two semicircular plates may be used at positions that do not overlap with each other.
It may also be a circular plate with three or more through holes formed therein.
さらに、生成物落下防止具6を耐熱容器1と一体に形成
するようにしてもよい。Furthermore, the product fall prevention device 6 may be formed integrally with the heat-resistant container 1.
上記実施例では、−例としてCdTe単結晶の成長を例
にとって説明したが、この発明はそれに限定されるもの
でなく、GaAsその他蒸気圧の大きく異なる構成元素
からなる化合物半導体単結晶を垂直ブリッジマン法もし
くは垂直徐冷法で製造する場合に適用できる。In the above embodiment, the growth of a CdTe single crystal was explained as an example, but the present invention is not limited thereto. It can be applied when manufacturing by method or vertical slow cooling method.
また、この発明は蒸気圧制御法を適用したLEC法によ
る結晶引上げ装置にも利用することができる。Further, the present invention can also be used in a crystal pulling apparatus using the LEC method to which the vapor pressure control method is applied.
[!@明の効果]
以上説明したようにこの発明は、リザーバーを備えた縦
型の結晶製造装置において、原料融液の入った容器を載
置する部分とりザーバーとの間に、例えば互いに貫通部
が重ならないように配置された複数の遮蔽板を有する生
成物落下防止具を設けるようにしたので、融液容器載置
部とリザーバーとの間の壁面に付着した反応生成物が剥
がれても落下防止具によってリザーバー内に落下するの
が防止され、これによってリザーバー内の蒸気補給源と
しての元素へ他の元素が混入して蒸気圧のバランスがず
れるのを防止し、高品質の単結晶を製造することができ
るという効果がある。[! [Effect of Akira] As explained above, the present invention provides a vertical crystal manufacturing apparatus equipped with a reservoir, in which there is, for example, a penetrating portion between the partial reservoir and the container on which the container containing the raw material melt is placed. Since a product fall prevention device is provided that has a plurality of shielding plates arranged so as not to overlap, even if the reaction products attached to the wall between the melt container placement part and the reservoir come off, they will not fall. The tool prevents the element from falling into the reservoir, which prevents other elements from mixing with the element in the reservoir as a vapor supply source and causing an imbalance in vapor pressure, producing high-quality single crystals. It has the effect of being able to
第1図は本発明に係る結晶成長装置の一実施例を示す断
面正面図、
第2図(A)、(B)はそれに用いられる生成物落下防
止具の一例を示す断面正面図および平面図、
第3図は従来の結晶成長装置の一例を示す断面正面図で
ある。
l・・・・耐熱容器、2・・・・ヒータ、3・・・融液
保持用容器、4・・・・蒸気補給用元素(Cd)、5・
・・・キャップ、6・・・・生成物落下防止具、11・
・・・リザーバー
第
図FIG. 1 is a cross-sectional front view showing an embodiment of a crystal growth apparatus according to the present invention, and FIGS. 2 (A) and (B) are a cross-sectional front view and a plan view showing an example of a product fall prevention device used therein. , FIG. 3 is a cross-sectional front view showing an example of a conventional crystal growth apparatus. l... Heat-resistant container, 2... Heater, 3... Container for holding melt, 4... Element for steam replenishment (Cd), 5...
...Cap, 6.Product fall prevention device, 11.
...Reservoir diagram
Claims (1)
接続され、該蒸気補給手段により構成元素の蒸気を供給
しつつ上記耐熱容器内に設置された原料保持用容器を加
熱して原料を溶融させた後、単結晶の成長を行なう結晶
成長装置において、上記蒸気補給手段の上方に生成物落
下防止手段を設けたことを特徴とする結晶成長装置。(1) A steam replenishing means is connected to a heat-resistant container arranged vertically, and the steam replenishing means supplies vapor of the constituent elements while heating a raw material holding container installed in the heat-resistant container to supply raw materials. A crystal growth apparatus for growing a single crystal after melting, characterized in that a product fall prevention means is provided above the steam supply means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15114590A JPH0686350B2 (en) | 1990-06-08 | 1990-06-08 | Crystal growth equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15114590A JPH0686350B2 (en) | 1990-06-08 | 1990-06-08 | Crystal growth equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0442888A true JPH0442888A (en) | 1992-02-13 |
| JPH0686350B2 JPH0686350B2 (en) | 1994-11-02 |
Family
ID=15512355
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15114590A Expired - Lifetime JPH0686350B2 (en) | 1990-06-08 | 1990-06-08 | Crystal growth equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0686350B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2806100A1 (en) * | 2000-03-10 | 2001-09-14 | Commissariat Energie Atomique | Crystallisation device using temperature control for regulating excess pressure in the crucible during solidification of the crystal to eliminate crystal defects |
-
1990
- 1990-06-08 JP JP15114590A patent/JPH0686350B2/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2806100A1 (en) * | 2000-03-10 | 2001-09-14 | Commissariat Energie Atomique | Crystallisation device using temperature control for regulating excess pressure in the crucible during solidification of the crystal to eliminate crystal defects |
| WO2001068956A1 (en) * | 2000-03-10 | 2001-09-20 | Commissariat A L'energie Atomique | Crystal growth device and method |
| US6652647B2 (en) | 2000-03-10 | 2003-11-25 | Commissariat A L'energie Atomique | Crystal growth device and method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0686350B2 (en) | 1994-11-02 |
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