JPH0442910Y2 - - Google Patents
Info
- Publication number
- JPH0442910Y2 JPH0442910Y2 JP12544484U JP12544484U JPH0442910Y2 JP H0442910 Y2 JPH0442910 Y2 JP H0442910Y2 JP 12544484 U JP12544484 U JP 12544484U JP 12544484 U JP12544484 U JP 12544484U JP H0442910 Y2 JPH0442910 Y2 JP H0442910Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- crucible
- jig
- saucer
- introduction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 239000011538 cleaning material Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Sampling And Sample Adjustment (AREA)
Description
【考案の詳細な説明】
〔産業上の利用分野〕
本考案は、分子線エピタキシヤル装置(以下
MBEと称す)等の真空装置内へ比較的低融点の
物質を、装置の真空を破ることなくエアーロツク
で導入しようとする治具の改良に関する。[Detailed description of the invention] [Industrial application field] The present invention uses a molecular beam epitaxial device (hereinafter referred to as
This invention relates to an improvement in a jig for introducing a substance with a relatively low melting point into a vacuum device such as an MBE (MBE) using an air lock without breaking the vacuum of the device.
第2図に従来の試料導入治具を示す。 Figure 2 shows a conventional sample introduction jig.
1はマグネツト、2はゲートバルブ、3は試料受
皿、4は試料、5は試料入れ用るつぼである。1 is a magnet, 2 is a gate valve, 3 is a sample tray, 4 is a sample, and 5 is a crucible for holding the sample.
ゲートバルブを閉じた状態で、試料導入治具を
取り外し、試料4を、試料受皿3に入れる。再び
治具を装置に取りつけ所定の排気を行なう。排気
後ゲートバルブ2を開け、マグネツト1を操作し
て試料受皿を試料入れ用るつぼ5の近くまで移動
させる。試料を試料受皿から試料入れ用るつぼに
移すには、マグネツトを回転させ、受皿を傾ける
ことにより行なつていた。 With the gate valve closed, the sample introduction jig is removed and the sample 4 is placed in the sample tray 3. Attach the jig to the device again and perform the specified evacuation. After evacuation, the gate valve 2 is opened and the magnet 1 is operated to move the sample tray close to the sample crucible 5. The sample was transferred from the sample tray to the sample crucible by rotating the magnet and tilting the tray.
しかるに、この様に構成された従来の試料導入
治具では、以下の如き問題があつた。
However, the conventional sample introduction jig configured in this manner has the following problems.
(a) 試料受皿を試料入れ用るつぼの入口に接近さ
せるには、高度の熟練技術を要すると共に、る
つぼ入口が水平でない場合、受皿からるつぼへ
試料を移すのが容易ではない。手間どればるつ
ぼ入口付近についていた異物が試料が付着し、
コンタミの原因となる。(a) A highly skilled technique is required to bring the sample tray close to the entrance of the sample crucible, and if the entrance to the crucible is not horizontal, it is not easy to transfer the sample from the tray to the crucible. If you take too much time, foreign matter near the entrance to the crucible will stick to the sample.
May cause contamination.
(b) 受皿からるつぼへ試料を移す場合、試料がる
つぼの底へ徐々に落ちてゆかず、一度に落下す
ることが多く、PBNなどの材質で作られたる
つぼの場合、るつぼ底部が割れる。(b) When transferring a sample from a saucer to a crucible, the sample does not fall gradually to the bottom of the crucible, but often falls all at once, and in the case of crucibles made of materials such as PBN, the bottom of the crucible cracks.
本考案は、上述した欠点を取り除き、試料に異
物を付着させることなく、試料を迅速に受皿から
るつぼに移す治具を提供することを目的としてい
る。 The present invention aims to eliminate the above-mentioned drawbacks and provide a jig for quickly transferring a sample from a saucer to a crucible without adhering foreign matter to the sample.
MBE等の真空装置内へGa,In,Al等の比較的
低融点の物質を導入する際、試料導入治具先端の
受皿外周に、試料を加熱溶解さすためのヒーター
と、かつ溶解した試料を、試料入れ用るつぼに導
く導管を受皿底部に設けた。
When introducing a substance with a relatively low melting point such as Ga, In, Al, etc. into a vacuum device such as MBE, a heater is installed around the outer periphery of the saucer at the tip of the sample introduction jig to heat and melt the sample. A conduit leading to a sample crucible was provided at the bottom of the saucer.
〔作用〕
導入管を受皿底部に設けた事によりるつぼ入口
へ、受皿底部導入管を容易に移動出来る。かつ受
皿外周にヒーター線を設けた事により、試料を溶
解させ、導入管を通して、試料を容易にるつぼへ
移すことが出来る。[Function] By providing the introduction pipe at the bottom of the saucer, the introduction pipe at the bottom of the saucer can be easily moved to the crucible entrance. In addition, by providing a heater wire around the outer periphery of the saucer, the sample can be melted and easily transferred to the crucible through the introduction tube.
本考案による一実施例の断面図を図1に示す。
6は試料受皿3の外周に設けられたヒーター、7
は受皿3の底部から下方に設けられた導入管、8
は電流導入端子である。なお、(1)〜(5)は、従来の
ものと同様である。
A sectional view of an embodiment of the present invention is shown in FIG.
6 is a heater provided on the outer periphery of the sample tray 3;
8 is an introduction pipe provided downward from the bottom of the saucer 3;
is the current introduction terminal. Note that (1) to (5) are the same as the conventional ones.
本考案による動作は、試料を受皿に入れてから
受皿をるつぼ近くまで移動させるのは、従来のも
のと同様である。受皿底部の導入管7をるつぼ入
口まで近づけた後、電流導入端子8よりヒーター
線6に通電し、試料を溶解させる。溶解した試料
は導入管を通つてるつぼ内部へ入る。 The operation according to the present invention is similar to that of the conventional method in that the sample is placed in a receiving tray and then the receiving tray is moved close to the crucible. After bringing the introduction tube 7 at the bottom of the saucer close to the entrance of the crucible, electricity is applied to the heater wire 6 from the current introduction terminal 8 to dissolve the sample. The dissolved sample enters the crucible through the introduction tube.
以上の実施例からも明らかな様に、本考案の構
成による試料導入治具を用いれば、るつぼ入口の
断面積に対し、導入管の方が小さいので、るつぼ
と受皿の位置合せが容易である。またるつぼが水
平に近い状態であつても、導入管から試料を入れ
るので、試料の移動が容易である。ヒーターで試
料を溶解させるので、るつぼに対し機械的な振
動、力がかからないのでるつぼが割れない。試料
にるつぼ入口周辺の異物が付着しない、試料表面
の酸化物は受皿内部の壁面に付着して残り、試料
内部の洗浄なもののみるつぼへ入るという利点を
有する。 As is clear from the above examples, if the sample introduction jig with the structure of the present invention is used, the introduction pipe is smaller than the cross-sectional area of the crucible entrance, so it is easy to align the crucible and the saucer. . Furthermore, even if the crucible is in a nearly horizontal state, the sample is introduced through the introduction tube, making it easy to move the sample. Since the sample is melted using a heater, no mechanical vibration or force is applied to the crucible, so the crucible does not crack. This has the advantage that foreign matter around the crucible entrance does not adhere to the sample, oxides on the sample surface remain attached to the wall inside the saucer, and the cleaning material inside the sample enters the crucible.
この考案によれば治具先端部の受皿の外周に、
試料を加熱溶解するヒーターを設け、さらに、受
皿の底部に導入管を設け、ヒーターにより溶解し
た試料を受皿の底部から導入管により下方のるつ
ぼに導くようにしたので、試料を汚染することな
く、迅速にるつぼに導くことができるという優れ
た効果を有する。
According to this invention, on the outer periphery of the saucer at the tip of the jig,
A heater is provided to heat and melt the sample, and an introduction tube is also provided at the bottom of the saucer, so that the sample melted by the heater is guided from the bottom of the saucer to the crucible below, without contaminating the sample. It has the excellent effect of being able to be quickly introduced into a crucible.
第1図は、本考案による試料導入治具の断面
図、第2図は、従来のものを示す。
図において、1はマグネツト、2はゲートバル
ブ、3は試料受皿、4は試料、5は試料入れ用る
つぼ、6はヒーター、7は導入管、8は電流導入
端子である。なお図中同一符号は同一もしくは相
当部分を示す。
FIG. 1 is a sectional view of a sample introduction jig according to the present invention, and FIG. 2 shows a conventional one. In the figure, 1 is a magnet, 2 is a gate valve, 3 is a sample tray, 4 is a sample, 5 is a crucible for holding the sample, 6 is a heater, 7 is an introduction tube, and 8 is a current introduction terminal. Note that the same reference numerals in the figures indicate the same or corresponding parts.
Claims (1)
具において、治具先端部の試料受皿の外周にヒー
ターを設け、試料を加熱溶解させるようにし、さ
らに、受皿の底部から下方に導入管を設け、溶解
した試料を受皿底部から導入管により、真空室内
に配設された下方の試料入れ用るつぼに導くよう
にしたことを特徴とする試料導入治具。 In a jig that introduces a sample into a vacuum device using an air lock, a heater is installed around the outer periphery of the sample tray at the tip of the jig to heat and melt the sample, and an introduction tube is installed downward from the bottom of the tray to melt the sample. 1. A sample introduction jig, characterized in that the sample is guided from the bottom of the saucer through an introduction tube to a lower sample holding crucible arranged in a vacuum chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12544484U JPS6140646U (en) | 1984-08-17 | 1984-08-17 | Sample introduction jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12544484U JPS6140646U (en) | 1984-08-17 | 1984-08-17 | Sample introduction jig |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6140646U JPS6140646U (en) | 1986-03-14 |
| JPH0442910Y2 true JPH0442910Y2 (en) | 1992-10-12 |
Family
ID=30684133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12544484U Granted JPS6140646U (en) | 1984-08-17 | 1984-08-17 | Sample introduction jig |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6140646U (en) |
-
1984
- 1984-08-17 JP JP12544484U patent/JPS6140646U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6140646U (en) | 1986-03-14 |
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