JPH0443816Y2 - - Google Patents
Info
- Publication number
- JPH0443816Y2 JPH0443816Y2 JP13365786U JP13365786U JPH0443816Y2 JP H0443816 Y2 JPH0443816 Y2 JP H0443816Y2 JP 13365786 U JP13365786 U JP 13365786U JP 13365786 U JP13365786 U JP 13365786U JP H0443816 Y2 JPH0443816 Y2 JP H0443816Y2
- Authority
- JP
- Japan
- Prior art keywords
- faucet
- light
- detected object
- defect
- pixel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007547 defect Effects 0.000 claims description 36
- 238000001514 detection method Methods 0.000 claims description 16
- 238000010586 diagram Methods 0.000 description 10
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
【考案の詳細な説明】
(産業上の利用分野)
本考案は、水栓等の表面特に端部に存在するピ
ンホール、割れ傷等の欠陥を光学的に検出する欠
陥検出装置に関する。[Detailed Description of the Invention] (Industrial Field of Application) The present invention relates to a defect detection device that optically detects defects such as pinholes and cracks existing on the surface of faucets, particularly at the edges.
(従来の技術)
水栓等の製造過程においてピンホール欠陥や割
れ傷などが発生する場合があり、これら欠陥品を
製造ラインから除去する必要がある。(Prior Art) Pinhole defects, cracks, etc. may occur during the manufacturing process of water faucets, etc., and it is necessary to remove these defective products from the manufacturing line.
水栓等の欠陥には胴体部に発生するピンホール
欠陥や割れ傷の他に端部に発生する欠けや割れ傷
等の欠陥がある。このような端部の欠陥は、水栓
等を回転させて全周を一次元CCDイメージセン
サカメラで受光させた場合の端部に位置する
CCDイメージセンサの画素出力の変化により検
出する方法が知られている。 Defects such as faucets include pinhole defects and cracks that occur on the body, as well as defects such as chips and cracks that occur on the ends. Such edge defects are located at the edges when a faucet, etc. is rotated and the entire circumference is captured by a one-dimensional CCD image sensor camera.
A method is known in which detection is performed based on changes in pixel output of a CCD image sensor.
(考案が解決しようとする問題点)
しかしながら、このような従来の欠陥検出方法
では、水栓等の胴体部の欠陥検出は高精度でなさ
れる反面、水栓等の端部における欠陥検出は精度
がそれ程得られず、特別の検出処理を必要とし煩
雑化するのみならず、高精度な欠陥検出が困難で
あつた。(Problem that the invention aims to solve) However, with such conventional defect detection methods, defects in the body of a faucet etc. can be detected with high accuracy, but defects in the end part of a faucet etc. can be detected with high accuracy. However, this method not only requires special detection processing and is complicated, but also makes it difficult to detect defects with high precision.
本考案は、上記問題点に鑑みてなされたもので
高精度且つ容易に水栓等端部の欠陥を検出するこ
とのできる欠陥検出装置を提供することを目的と
する。 The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to provide a defect detection device that can easily detect defects in the end of a faucet or the like with high precision.
本考案について、以下水栓を例にして説明す
る。 The present invention will be explained below using a water faucet as an example.
(問題点を解決するための手段)
前述の問題点を解決し、上記目的を達成するた
めに本考案が提供する手段は、水栓表面からの光
を複数画素を有する光検出手段に収束して入射
し、該複数画素を所定周期毎に走査して各画素の
入射光量に相応した受光出力に基づいて水栓表面
のピンホール等の欠陥を検出する水栓欠陥検出装
置であつて、前記水栓表面の光反射係数に略等し
い光反射係数を有する治具を該水栓端部に密着状
態で結合し、該水栓端部の欠陥検出を水栓中央部
と同様に処理することを特徴とする。(Means for Solving the Problems) In order to solve the above-mentioned problems and achieve the above objects, the present invention provides means for converging light from the faucet surface onto a light detection means having a plurality of pixels. A faucet defect detection device that detects defects such as pinholes on the faucet surface based on the received light output corresponding to the amount of incident light of each pixel by scanning the plurality of pixels at predetermined intervals, A jig having a light reflection coefficient approximately equal to the light reflection coefficient of the surface of the faucet is tightly coupled to the end of the faucet, and defects at the end of the faucet are detected in the same way as for the center of the faucet. Features.
(実施例)
第1図は本考案で使用する治具30を水栓31
に密着状態で結合した場合を示した図である。治
具30の表面は、白色塗料又はメツキ処理を施
し、水栓31の表面の光反射係数と同等の光反射
係数に設定される。また、治具30と水栓31の
端部33との接触部で影が生じないように治具3
0の接触端部30aの径を治具30の中央部の径
と同等か又は大となるテーパ状に形成し、水栓3
1の端部33を光学的に胴体部32の一部として
見なすことができるようにしている。34は回転
軸であり、治具30と水栓31を一体に回転す
る。この回転は、後で説明するCCDセンサの走
査周期に同期して速度が調整される。(Example) Fig. 1 shows a jig 30 used in this invention with a faucet 31.
FIG. The surface of the jig 30 is coated with white paint or plating, and is set to have a light reflection coefficient equivalent to that of the surface of the faucet 31. In addition, the jig 30 is designed so that a shadow does not appear at the contact area between the jig 30 and the end 33 of the faucet 31.
The diameter of the contact end 30a of the water faucet 30 is formed into a tapered shape that is equal to or larger than the diameter of the center part of the jig 30.
The end portion 33 of 1 can be optically regarded as a part of the body portion 32. Reference numeral 34 denotes a rotating shaft, which rotates the jig 30 and faucet 31 together. The speed of this rotation is adjusted in synchronization with the scanning period of the CCD sensor, which will be explained later.
第2図は本考案の一実施例の欠陥検出装置を示
したブロツク図、第3図aは正常な水栓表面から
得られる受光レベルの波形図、第3図bは水栓端
部に割れ傷等の欠陥が存在する場合の受光レベル
の波形図、第3図cはピンホール等の欠陥が水栓
端部と水栓胴体部とに存在する場合の受光レベル
の波形図である。 Fig. 2 is a block diagram showing a defect detection device according to an embodiment of the present invention, Fig. 3a is a waveform diagram of the received light level obtained from a normal faucet surface, and Fig. 3b is a crack at the end of the faucet. A waveform diagram of the light reception level when a defect such as a scratch exists. FIG. 3c is a waveform diagram of the light reception level when a defect such as a pinhole exists on the faucet end and the faucet body.
第2図および第3図a,b,cを参照して本考
案による欠陥検出を説明する。1は複数画素を備
え、各画素に入射した光量に相応したアナログ量
の受光信号を出力する光検出手段としての一次元
カメラ(CCDセンサ)である。一次元カメラ
(CCDセンサ)1を具体的に説明すると、例えば
2048個の画素を直線的に配列し、第1図に示した
治具30と水栓31で成る全長約80mm程度の被検
知物体表面からの光をレンズ等を介して2048個の
画素に収束して入射することから、隣合う画素間
隔に対応する分解能、即ち、約40ミクロンの分解
能を有する。また、2048個の画素は、所定周期毎
に順次走査され、該走査周期のタイミングに同期
して各画素の受光出力を取り出すとともに、この
走査周期毎に各画素を初期設定する。第2図に示
すように一次元カメラ(CCDセンサ)1の受光
信号は、A/D(アナログ/デイジタル)変換器
2に入力して順次各画素毎に多値レベル(例えば
256階調)のデイジタル値に変換される。このデ
イジタル値のデータは、所定数、例えばN個の画
素データをシフトするシフトレジスタ3と引算回
路4に送出される。引算回路4では、現在の画素
データDAとシフトレジスタ3を介して得られる
N画素前の過去のデータDBとの差△D(=DB−
DA)を演算する。符号判別回路5は、差△Dの
符号を判別しており、△Dの符号が正の場合だけ
比較回路6に出力する。比較回路6では判定値回
路7の判定値と△Dとの値を比較し、△Dの値が
判定値以上の時、即ち第3図bのA点に対応する
位置で欠陥が始まつた判定し、画素カウンタ8の
カウント数をN画素分差し引き、即ち第3図bの
A点に対応する画素アドレスをメモリ9に記憶す
る。画素カウンタ8には、図示しない発振器から
の走査周期に同期した信号が与えられている。ま
た、この時のDB値を閾値DSとして設定し、該DS
値と現在画素データDAとを比較回路10で順次
比較する。第3図bに示すように
DS≦DA
となる画素位置Bを欠陥の終わりとして判定す
る。引算回路20では、画素位置Bに相応する画
素アドレスXEとメモリ9に記憶した画素位置A
に相応する画素アドレスXSとの差△Xを欠陥幅
として算出する。幅比較回路11では欠陥幅△X
の程度を判別しており、△Xの値が所定値以上の
ときだけ欠陥有りと判別し欠陥信号を出力する。
21は論理積回路である。 Defect detection according to the present invention will be explained with reference to FIG. 2 and FIGS. 3a, b, and c. Reference numeral 1 denotes a one-dimensional camera (CCD sensor) that is equipped with a plurality of pixels and serves as a light detection means that outputs an analog light reception signal corresponding to the amount of light incident on each pixel. To specifically explain the one-dimensional camera (CCD sensor) 1, for example,
2,048 pixels are arranged linearly, and the light from the surface of the object to be detected, which is approximately 80 mm in total length and consists of the jig 30 and water faucet 31 shown in Figure 1, is converged onto the 2,048 pixels via a lens, etc. Since the light is incident on the light beam, it has a resolution corresponding to the interval between adjacent pixels, that is, a resolution of approximately 40 microns. Further, the 2048 pixels are sequentially scanned at each predetermined period, and the light reception output of each pixel is extracted in synchronization with the timing of the scanning period, and each pixel is initialized at each scanning period. As shown in FIG. 2, the light reception signal from the one-dimensional camera (CCD sensor) 1 is input to an A/D (analog/digital) converter 2, and is sequentially converted to a multi-value level (e.g.
256 gradations) is converted into a digital value. This digital value data is sent to a shift register 3 that shifts a predetermined number of pixel data, for example N pieces, and a subtraction circuit 4. The subtraction circuit 4 calculates the difference ΔD ( =D B −
D A ) is calculated. The sign discrimination circuit 5 discriminates the sign of the difference ΔD, and outputs the signal to the comparison circuit 6 only when the sign of ΔD is positive. The comparison circuit 6 compares the judgment value of the judgment value circuit 7 with the value of △D, and when the value of △D is greater than the judgment value, that is, the defect has started at the position corresponding to point A in Fig. 3b. Then, the count number of the pixel counter 8 is subtracted by N pixels, that is, the pixel address corresponding to point A in FIG. 3b is stored in the memory 9. The pixel counter 8 is supplied with a signal synchronized with the scanning period from an oscillator (not shown). Also, set the D B value at this time as the threshold D S , and
The comparison circuit 10 sequentially compares the value and the current pixel data D A. As shown in FIG. 3b, the pixel position B where D S ≦D A is determined to be the end of the defect. The subtraction circuit 20 uses the pixel address XE corresponding to the pixel position B and the pixel position A stored in the memory 9.
The difference ΔX from the pixel address X S corresponding to is calculated as the defect width. In the width comparison circuit 11, the defect width △X
Only when the value of ΔX is greater than or equal to a predetermined value, it is determined that there is a defect and a defect signal is output.
21 is an AND circuit.
尚、第3図cに示すように水栓の胴体部にピン
ホール等の欠陥が存在する場合も、前述した水栓
端部における欠陥検出と同様に確実に検出するこ
とができる。 Note that even if there is a defect such as a pinhole in the body of the faucet as shown in FIG. 3c, it can be detected reliably in the same manner as the defect detection at the end of the faucet described above.
(考案の効果)
以上説明したように本考案によれば、水栓端部
の欠陥を容易、且つ高精度に検出することができ
るという効果が得られる。(Effects of the Invention) As explained above, according to the present invention, defects in the faucet end can be detected easily and with high precision.
なお、本考案は、水栓に限らず端部をもつ物体
にも使用できる装置である。 Note that the present invention is a device that can be used not only for faucets but also for objects with ends.
第1図は本考案で使用する治具を水栓に密着状
態で結合した場合を示した図、第2図は本考案の
一実施例の欠陥検出装置を示したブロツク図、第
3図aは正常な水栓表面から得られる受光レベル
の波形図、第3図bは水栓端部に欠陥が存在する
場合の受光レベルの波形図、第3図cは水栓端部
と水栓胴体部とに欠陥が存在する場合の受光レベ
ルの波形図である。
1……一次元カメラ(CCDセンサ)、2……
A/D変換器、3……シフトレジスタ、4……引
算回路、5……符号判別回路、6,10,11…
…比較回路、7……判定値回路、8……画素カウ
ンタ、9……メモリ、30……治具、31……水
栓、32……胴体部、33……端部、34……回
転軸。
Figure 1 is a diagram showing the jig used in the present invention when it is tightly connected to a faucet, Figure 2 is a block diagram showing a defect detection device according to an embodiment of the present invention, and Figure 3 a. is a waveform diagram of the received light level obtained from a normal faucet surface, Figure 3b is a waveform diagram of the received light level when there is a defect in the faucet end, and Figure 3c is a waveform diagram of the faucet end and faucet body. FIG. 4 is a waveform diagram of the received light level when there is a defect in both parts. 1... One-dimensional camera (CCD sensor), 2...
A/D converter, 3...shift register, 4...subtraction circuit, 5...sign discrimination circuit, 6, 10, 11...
... Comparison circuit, 7 ... Judgment value circuit, 8 ... Pixel counter, 9 ... Memory, 30 ... Jig, 31 ... Faucet, 32 ... Body part, 33 ... End part, 34 ... Rotation shaft.
Claims (1)
検出手段に収束して入射し、該複数画素を所定周
期毎に走査して各画素の入射光量に相応した受光
出力に基づいて被検知物体表面の欠陥を検出する
被検知物体欠陥検出装置において、 前記被検知物体表面の光反射係数に略等しい光
反射係数を有する治具を該被検知物体端部に密着
状態で結合し、該被検知物体端部の欠陥検出を被
検知物体中央部と同様に処理することを特徴とす
る被検知物体欠陥検出装置。[Claims for Utility Model Registration] Light from the surface of an object to be detected is converged and incident on a light detection means having a plurality of pixels, and the plurality of pixels are scanned at predetermined intervals to receive light corresponding to the amount of light incident on each pixel. In a detected object defect detection device that detects defects on the surface of the detected object based on output, a jig having a light reflection coefficient approximately equal to the light reflection coefficient of the surface of the detected object is brought into close contact with an end of the detected object. What is claimed is: 1. A defect detection device for a detected object, characterized in that defect detection at an end of the detected object is processed in the same manner as at the center of the detected object.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13365786U JPH0443816Y2 (en) | 1986-08-31 | 1986-08-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13365786U JPH0443816Y2 (en) | 1986-08-31 | 1986-08-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6339662U JPS6339662U (en) | 1988-03-15 |
| JPH0443816Y2 true JPH0443816Y2 (en) | 1992-10-15 |
Family
ID=31034169
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13365786U Expired JPH0443816Y2 (en) | 1986-08-31 | 1986-08-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0443816Y2 (en) |
-
1986
- 1986-08-31 JP JP13365786U patent/JPH0443816Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6339662U (en) | 1988-03-15 |
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