JPH0444595Y2 - - Google Patents
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- Publication number
- JPH0444595Y2 JPH0444595Y2 JP14876987U JP14876987U JPH0444595Y2 JP H0444595 Y2 JPH0444595 Y2 JP H0444595Y2 JP 14876987 U JP14876987 U JP 14876987U JP 14876987 U JP14876987 U JP 14876987U JP H0444595 Y2 JPH0444595 Y2 JP H0444595Y2
- Authority
- JP
- Japan
- Prior art keywords
- silicon oxide
- temperature
- section
- oxide film
- treatment liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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- 239000007788 liquid Substances 0.000 claims description 71
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 29
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 28
- 238000004519 manufacturing process Methods 0.000 claims description 18
- 238000007654 immersion Methods 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims description 14
- 238000010438 heat treatment Methods 0.000 claims description 11
- 239000007864 aqueous solution Substances 0.000 claims description 7
- 239000002253 acid Substances 0.000 claims description 4
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical class [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 claims description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 29
- 239000000463 material Substances 0.000 description 7
- 230000005855 radiation Effects 0.000 description 6
- 239000000243 solution Substances 0.000 description 6
- 238000007598 dipping method Methods 0.000 description 5
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 4
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 4
- 239000004327 boric acid Substances 0.000 description 4
- 238000001914 filtration Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- LRCFXGAMWKDGLA-UHFFFAOYSA-N dioxosilane;hydrate Chemical compound O.O=[Si]=O LRCFXGAMWKDGLA-UHFFFAOYSA-N 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229910002027 silica gel Inorganic materials 0.000 description 1
- 239000000741 silica gel Substances 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
Landscapes
- Silicon Compounds (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Devices For Use In Laboratory Experiments (AREA)
Description
【考案の詳細な説明】
(産業上の利用分野)
本考案は、基材の表面に酸化珪素被膜を形成す
る酸化珪素被膜の製造装置に関し、詳しくは、珪
弗化水素酸の酸化飽和水溶液ホウ酸水溶液を添加
した処理液(以下、処理液と称す)の温度を適温
に保ち、処理液中に浸漬した基材の表面に均一な
酸化珪素被膜を形成するのに適した処理液循環流
動型の酸化珪素被膜の製造装置に関するものであ
る。[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to a silicon oxide film manufacturing device for forming a silicon oxide film on the surface of a substrate. A treatment liquid circulating flow type suitable for maintaining the temperature of a treatment liquid containing an acid aqueous solution (hereinafter referred to as treatment liquid) at an appropriate temperature and forming a uniform silicon oxide film on the surface of a substrate immersed in the treatment liquid. The present invention relates to an apparatus for manufacturing a silicon oxide film.
(従来の技術)
本出願人は、先の出願(特開昭60−33233号、
実開昭60−168574号)において、酸化珪素被膜の
製造方法及び製造装置を開示した。(Prior art) The present applicant has filed an earlier application (Japanese Patent Application Laid-Open No. 60-33233
In Japanese Utility Model Application Publication No. 168574/1983), a method and apparatus for manufacturing a silicon oxide film were disclosed.
これらは、恒温槽内に処理槽を設け、処理槽
を、基材を浸漬する浸漬部、浸漬部に流れ込む処
理液の流れを整える整流部および浸漬部から流れ
出た処理液を調整する処理液調整部に区分し、処
理液を前記各部を循環させながら、浸漬部に浸漬
した基材の表面に均一な酸化珪素被膜を形成する
製造方法及び製造装置に関するもので、これらに
よつて基材表面にヘイズ率の小さい酸化珪素被膜
を効率よく製造することが可能となつた。 These include a processing tank installed in a thermostatic chamber, and the processing tank is divided into an immersion section for immersing the substrate, a rectification section for adjusting the flow of the processing liquid flowing into the immersion section, and a processing liquid adjustment section for regulating the processing solution flowing out from the immersion section. The present invention relates to a manufacturing method and a manufacturing apparatus for forming a uniform silicon oxide film on the surface of a substrate immersed in the immersion section while circulating the treatment liquid through each section. It has become possible to efficiently produce a silicon oxide film with a low haze rate.
また、上述の酸化珪素被膜の製造装置にあつて
は、処理槽内の各部を循環する処理液の温度は、
恒温槽内に貯溜した温水によつて適温(35℃)に
保たれている。 In addition, in the above-mentioned silicon oxide film manufacturing apparatus, the temperature of the processing liquid circulating through each part in the processing tank is as follows:
The temperature is maintained at an appropriate temperature (35℃) by hot water stored in a constant temperature bath.
(考案が解決しようとする問題点)
しかしながら、上述の製造装置にあつては、処
理槽は珪弗化水素酸と接触することを考慮して塩
化ビニル等の樹脂材料を使用しているため、恒温
槽内の温水の温度を50℃以上に加熱することは好
ましくなく(理想的には40℃以下が好ましい)、
製造装置の大型化に伴つて処理槽の容積が拡大す
ると、処理槽開口部からの処理液の放熱量が多く
なり、特に周囲の温度が低下する冬場にあつて
は、恒温槽内の温水による加熱のみでは処理液の
温度を適温に維持することが難しくなり、処理液
中に浸漬した基材の表面に析出する酸化珪素被膜
の成膜レートが不安定になるという問題点があつ
た。(Problems to be solved by the invention) However, in the above-mentioned manufacturing equipment, since the treatment tank uses a resin material such as vinyl chloride in consideration of contact with hydrosilicic acid, It is not recommended to heat the hot water in the thermostatic chamber above 50℃ (ideally, 40℃ or below is preferable).
As the volume of the processing tank expands as manufacturing equipment becomes larger, the amount of heat dissipated from the processing liquid from the opening of the processing tank increases.Especially in the winter when the surrounding temperature drops, the amount of heat released by the heated water in the constant temperature tank increases. There was a problem in that it was difficult to maintain the temperature of the treatment liquid at an appropriate temperature by heating alone, and the rate of formation of the silicon oxide film deposited on the surface of the substrate immersed in the treatment liquid became unstable.
本考案は、上述の問題点を鑑みてなされたもの
で、その目的とする処は、周囲の温度が10℃以下
であつても、恒温槽内の温水を40℃以下に保つた
ままで、処理液の温度を適温に維持することがで
きる酸化珪素被膜の製造装置を提供するにある。 The present invention was developed in view of the above-mentioned problems, and its purpose is to maintain the hot water in the thermostatic chamber at 40°C or lower even when the surrounding temperature is 10°C or lower. It is an object of the present invention to provide a silicon oxide film manufacturing apparatus that can maintain the temperature of a liquid at an appropriate temperature.
(問題点を解決するための手段)
前記目的を達成するため本考案は、恒温槽内に
珪弗化水素酸の酸化珪素飽和水溶液(以下、処理
液と称す)を貯溜する処理槽を備え、前記処理槽
は基材を浸漬して基材表面に酸化珪素被膜を形成
するための浸漬部と、前記浸漬部に流れ込む処理
液の流れを整えるために前記浸漬部に連なつて設
けられた整流部と、前記浸漬部から流れ出た処理
液を調整するために前記浸漬部に連なって設けら
れた処理液調整部とから成り、かつ処理液を循環
させる循環装置を備えた酸化珪素被膜の製造装置
において、前記処理液の温度を適温に保つための
加熱手段および/または保温手段を前記処理槽上
方に備えたことを特徴とする。(Means for Solving the Problems) In order to achieve the above object, the present invention includes a treatment tank for storing a saturated silicon oxide aqueous solution of hydrosilicofluoric acid (hereinafter referred to as treatment liquid) in a constant temperature bath, The treatment tank includes an immersion section for immersing the substrate to form a silicon oxide film on the surface of the substrate, and a rectifier connected to the immersion section for adjusting the flow of the treatment liquid flowing into the immersion section. A silicon oxide film manufacturing apparatus comprising a processing liquid adjustment section connected to the immersion section for adjusting the processing liquid flowing out from the immersion section, and a circulation device for circulating the processing liquid. The method is characterized in that heating means and/or heat retention means for keeping the temperature of the processing liquid at an appropriate temperature are provided above the processing tank.
(作用)
本考案に係る酸化珪素被膜の製造装置によれ
ば、処理液を適温に保つための加熱手段および/
または保温手段を処理槽上方に備えたため、周囲
の温度が10℃以下になつたときでも恒温槽内の温
水の温度を40℃以下に保つたままで、処理液の温
度を適温に保つことができるとともに、処理槽の
材料は塩化ビニルで充分に対応できる。(Function) According to the silicon oxide film manufacturing apparatus according to the present invention, the heating means and/or
Alternatively, since a heat-retaining means is installed above the processing tank, even when the surrounding temperature drops below 10°C, the temperature of the processing liquid can be maintained at an appropriate temperature by keeping the temperature of the hot water in the constant temperature tank below 40°C. In addition, vinyl chloride can be used as the material for the treatment tank.
(実施例)
以下、添付図面にしたがつて本考案の一実施例
を説明する。(Example) An example of the present invention will be described below with reference to the accompanying drawings.
第1図は本考案の一実施例に係る酸化珪素被膜
の製造装置の構成を示す模式図である。第2図は
第1図の側面模式図である。 FIG. 1 is a schematic diagram showing the configuration of a silicon oxide film manufacturing apparatus according to an embodiment of the present invention. FIG. 2 is a schematic side view of FIG. 1.
第1図および第2図によれば、酸化珪素被膜の
製造装置は、恒温槽1と処理槽2の2重の槽から
成り、恒温槽1と処理槽2との間には処理槽2に
貯溜した処理液3を加熱するための温水4が貯溜
されている。恒温槽1には温水4の温度を調節す
るためのヒータ5及び温水4の攪拌に使用するス
ターラー6が設けられている。 According to FIGS. 1 and 2, the silicon oxide coating manufacturing apparatus consists of a double tank, a constant temperature bath 1 and a treatment bath 2. Hot water 4 for heating the stored processing liquid 3 is stored. The constant temperature bath 1 is provided with a heater 5 for adjusting the temperature of the hot water 4 and a stirrer 6 used for stirring the hot water 4.
処理槽2は、基材7を浸漬する浸漬部8、浸漬
部8と壁9をへだてて浸漬部8横に設けられた処
理液調整部10、浸漬部8と壁11をへだてると
ともに浸漬部8の底板として設けられた多数のス
リツトを持つた板状の整流板12を境にして設け
られた整流部13とから成つている。 The processing tank 2 includes a dipping section 8 in which the substrate 7 is immersed, a treatment liquid adjustment section 10 provided next to the dipping section 8 with the dipping section 8 and a wall 9 separated, and a dipping section 10 separating the dipping section 8 and the wall 11 and immersing the substrate 7 therein. It consists of a rectifying section 13 provided with a tabular rectifying plate 12 having a large number of slits provided as a bottom plate of the section 8 as a boundary.
処理液調整部10には処理液3の均一化を行な
うスターラー14及び処理液3にホウ酸水溶液を
添加するのに使用される処理液調整装置15aが
設けられている。処理液調整部10の底部から
は、処理液調整部10で調整された処理液3を整
流部13へ導くための送水管15が設けられてい
る。 The processing liquid adjusting section 10 is provided with a stirrer 14 for homogenizing the processing liquid 3 and a processing liquid adjusting device 15a used for adding an aqueous boric acid solution to the processing liquid 3. A water pipe 15 is provided from the bottom of the treatment liquid adjustment section 10 to guide the treatment liquid 3 adjusted in the treatment liquid adjustment section 10 to the rectification section 13 .
送水管15は、一旦恒温槽1を通り抜け、外部
へ導かれその整流部13の上部に接続されてい
る。送水管15の途中には、恒温槽1の外部に突
出した位置に処理液ろ過フイルター16及び送水
ポンプ17が設けられている。 The water pipe 15 once passes through the thermostatic chamber 1, is led to the outside, and is connected to the upper part of the rectifier 13. A processing liquid filtration filter 16 and a water pump 17 are provided in the middle of the water pipe 15 at positions that protrude to the outside of the thermostatic chamber 1 .
上述の構成によれば、処理液調整部10に貯溜
されている処理液3は、送水管15中を通つて処
理液ろ過フイルター16中を通り、整流部13の
上部に導かれ、さらに、浸漬部8、処理液調整部
10へと循環する。 According to the above-described configuration, the processing liquid 3 stored in the processing liquid adjustment section 10 passes through the water pipe 15, the processing liquid filtration filter 16, is guided to the upper part of the rectification section 13, and is further section 8 and the processing liquid adjusting section 10.
処理液3を適温に保つための手段として、恒温
槽1及び処理槽2の開口部には処理液3及び温水
4の放熱を防止するための蓋体18が設けられて
いるとともに、蓋体18の上方には蓋体18を輻
射による加熱する赤外線ランプ19が設けられて
いる。 As a means for keeping the processing liquid 3 at an appropriate temperature, a lid 18 is provided at the openings of the constant temperature bath 1 and the processing tank 2 to prevent heat radiation from the processing liquid 3 and hot water 4. An infrared lamp 19 is provided above the lid 18 to heat the lid 18 by radiation.
尚、20は整流部10内に設けられた熱交換器
であり、熱交換器20には熱媒体を導く導管21
が接続されており、導管21の途中には熱媒体を
熱交換器20へ送るためのポンプ22が設けられ
ている。熱媒体としては一般に温水、スチーム、
シリコンオイル等が使用されているが本実施例で
は恒温槽23に貯溜した温水24を使用し、温水
24をポンプ22の力により熱交換器20へ送
り、熱交換器20で熱交換を行なつて処理液3を
加熱している。 Note that 20 is a heat exchanger provided in the rectifier 10, and the heat exchanger 20 has a conduit 21 for guiding the heat medium.
A pump 22 is provided in the middle of the conduit 21 to send the heat medium to the heat exchanger 20. Generally, hot water, steam,
Although silicone oil or the like is used, in this embodiment, hot water 24 stored in a constant temperature bath 23 is used, and the hot water 24 is sent to a heat exchanger 20 by the power of a pump 22, and heat exchange is performed in the heat exchanger 20. The processing liquid 3 is heated.
次に本実施例の酸化珪素被膜製造装置の動作を
説明する。 Next, the operation of the silicon oxide film manufacturing apparatus of this embodiment will be explained.
まず、処理液3として2モル/の珪弗化水素
酸に酸化珪素(シリカゲル)を飽和した珪弗化水
素酸溶液を作成した。この処理液3を処理槽2に
入れ、送水ポンプ21を作動させて、処理液全量
に対する1分間あたりの送水量(循環量)を8%
に設定した。 First, as treatment liquid 3, a hydrosilicofluoric acid solution in which silicon oxide (silica gel) was saturated with 2 mol/hydrosilicic acid was prepared. This treatment liquid 3 is put into the treatment tank 2, and the water supply pump 21 is operated to increase the water supply amount (circulation amount) per minute to 8% of the total amount of treatment liquid.
It was set to
処理液3は、処理槽2の処理液調整部10の下
部から送水ポンプ17の力によつて送水管15内
へ導かれ、処理液ろ過フイルター16を通り、さ
らに、送水管15を通つて処理槽2中の整流部1
3の上部へ送られる。整流部13へ送られた処理
液3は整流部13と浸漬部8との境にある整流板
12の穴を通過して浸漬部8へ流れ込む。浸漬部
8内で処理液3はほぼ層流となつて鉛直下方から
上方へ向つて流れ、その後浸漬部8と処理液調整
部10との間に壁9を乗りこえて処理液調整部1
0へ流れ込む。処理液調整部10において、0.5
モル/の濃度のホウ酸水溶液を処理液調整装置
15を用いて0.2ml/分で連続的に滴下するとと
もに、スターラー14を用いて攪拌して処理液3
の濃度を均一化する。 The processing liquid 3 is guided from the lower part of the processing liquid adjustment section 10 of the processing tank 2 into the water pipe 15 by the force of the water pump 17, passes through the processing liquid filtration filter 16, and then passes through the water pipe 15 for treatment. Rectifier 1 in tank 2
Sent to the top of 3. The processing liquid 3 sent to the rectifying section 13 passes through the hole in the rectifying plate 12 located at the boundary between the rectifying section 13 and the immersing section 8 and flows into the immersing section 8 . The processing liquid 3 becomes a substantially laminar flow in the immersion part 8 and flows vertically from below to above, and then crosses the wall 9 between the immersion part 8 and the processing liquid adjustment part 10 and flows into the processing liquid adjustment part 1.
Flows into 0. In the processing liquid adjustment section 10, 0.5
A boric acid aqueous solution having a concentration of 1 mol/molar is continuously added dropwise at a rate of 0.2 ml/min using the treatment liquid adjusting device 15, and is stirred using the stirrer 14 to form the treatment liquid 3.
equalize the concentration of
また、恒温槽1内のヒーター5及びスターラー
6を作動させるとともに、蓋体18の上方に設け
られた赤外線ランプ19を作動させて輻射により
蓋体18の温度を35℃〜40℃に加熱し、さらに、
ポンプ22を作動させて整流部13内に設けられ
た熱交換器20を作動させて処理液3の温度を35
℃とし、均一化させた。 In addition, the heater 5 and stirrer 6 in the thermostatic chamber 1 are operated, and the infrared lamp 19 provided above the lid 18 is activated to heat the lid 18 to 35°C to 40°C by radiation. moreover,
The pump 22 is operated and the heat exchanger 20 provided in the rectifier 13 is operated to raise the temperature of the processing liquid 3 to 35
℃ and homogenized.
上述のホウ酸水溶液添加の状態を15時間保ち、
処理液3を酸化珪素過飽和溶液とした。この処理
液3中に、0.5wt%のHF水溶液中に10分間浸漬
した後に十分に洗浄・乾燥した基材7を浸漬し、
処理液3の循環及びホウ酸水溶液の添加を続けな
がら4時間保持した。 Maintain the above-mentioned state of addition of the boric acid aqueous solution for 15 hours,
The treatment liquid 3 was a supersaturated silicon oxide solution. In this treatment liquid 3, the base material 7, which had been thoroughly washed and dried after being immersed in a 0.5 wt% HF aqueous solution for 10 minutes, was immersed.
The temperature was maintained for 4 hours while continuing to circulate the treatment solution 3 and add the boric acid aqueous solution.
4時間経過後、浸漬中の基材7を引きあげると
基材7の表面には酸化珪素被膜が形成されてい
た。 After 4 hours had elapsed, when the substrate 7 that had been immersed was pulled up, a silicon oxide film had been formed on the surface of the substrate 7.
以上のように本実施例においては、処理液循環
流動型の酸化珪素被膜の製造装置において、恒温
槽1及び処理槽2の開口部を閉塞する蓋体18を
設け、また、蓋体18の上方に赤外線ランプ19
を設けて輻射により蓋体18の温度を35℃〜40℃
に加熱しているため、恒温槽1及び処理槽2の上
部からの処理液3及び温水4の放熱が防止でき
る。 As described above, in this embodiment, the processing liquid circulating flow type silicon oxide coating manufacturing apparatus is provided with a lid 18 that closes the openings of the constant temperature bath 1 and the processing bath 2. infrared lamp 19
The temperature of the lid body 18 is set at 35℃ to 40℃ by radiation.
Since the heating is performed at a temperature of 100.degree., heat radiation of the processing liquid 3 and hot water 4 from the upper portions of the constant temperature bath 1 and the processing bath 2 can be prevented.
従つて、周囲の温度が10℃以下になつた場合で
も処理液3の温度を35℃に保つことができるとと
もに、浸漬部8に貯留した処理液3の温度も上層
部と下層部とで均一となり、基材7の表面に析出
される酸化珪素被膜の成膜レートが安定したもの
となつた。 Therefore, even if the ambient temperature drops below 10°C, the temperature of the processing liquid 3 can be maintained at 35°C, and the temperature of the processing liquid 3 stored in the immersion section 8 is also uniform between the upper and lower parts. Therefore, the film formation rate of the silicon oxide film deposited on the surface of the base material 7 became stable.
また、恒温槽1内の温水の温度を40℃以下に保
持した場合であつても、処理液3の温度を35℃に
保つことができるため、処理槽2の材料は塩化ビ
ニルで充分に対応することができる。 In addition, even if the temperature of the hot water in thermostatic bath 1 is kept below 40℃, the temperature of processing liquid 3 can be maintained at 35℃, so vinyl chloride is sufficient as the material for treatment bath 2. can do.
尚、本実施例にあつては、処理液3の温度を適
温に保つための加熱手段および/または保温手段
として、蓋体18、赤外線ランプ19を使用して
いるが、他の加熱手段および/または保温手段と
しては、送水管15を保温して処理液3の放熱を
防止したり、あるいは、送水管15を加熱して処
理液3を加熱する手段が考えられる。 In the present embodiment, the lid 18 and the infrared lamp 19 are used as heating means and/or heat retention means to keep the temperature of the processing liquid 3 at an appropriate temperature, but other heating means and/or heat retention means are used. Alternatively, the heat-retaining means may include keeping the water pipe 15 warm to prevent heat radiation from the processing liquid 3, or heating the water pipe 15 to heat the processing liquid 3.
(考案の効果)
以上の説明で明らかなように、本考案にかかる
酸化珪素被膜の製造装置によれば、処理槽内の処
理液を適温に保つための加熱手段および/または
保温手段を処理槽上方に備えたため、周囲の温度
が10℃以下になつたときでも恒温槽内の温水の温
度を40℃以下に保つたままで、処理槽内の処理液
の温度を適温に保つことができるとともに、処理
液の温度も上層部と下層部で均一となり、基材表
面に析出する酸化珪素被膜の成膜レートが安定す
るとともに、処理槽の材料は、塩化ビニルで充分
に対応することができる。(Effects of the invention) As is clear from the above explanation, according to the silicon oxide film manufacturing apparatus according to the present invention, the heating means and/or heat retention means for keeping the processing liquid in the processing tank at an appropriate temperature are installed in the processing tank. Because it is installed above, even when the surrounding temperature drops to 10℃ or less, the temperature of the hot water in the constant temperature bath can be kept below 40℃, and the temperature of the processing liquid in the treatment tank can be maintained at an appropriate temperature. The temperature of the treatment solution becomes uniform between the upper layer and the lower layer, the rate of formation of the silicon oxide film deposited on the surface of the substrate becomes stable, and vinyl chloride can be used as the material for the treatment tank.
第1図は本考案の一実施例に係る酸化珪素被膜
の製造装置の構成を示す模式図であり、第2図は
第1図の側面模式図である。
尚図面中、1は恒温槽、2は処理槽、3は処理
液、7は基材、8は浸漬部、10は処理液調整
部、13は整流部、15は送水管、16は処理液
ろ過フイルター、17は送水ポンプ、18は蓋
体、19は赤外線ランプである。
FIG. 1 is a schematic diagram showing the configuration of a silicon oxide film manufacturing apparatus according to an embodiment of the present invention, and FIG. 2 is a schematic side view of FIG. 1. In the drawing, 1 is a constant temperature bath, 2 is a treatment tank, 3 is a treatment liquid, 7 is a base material, 8 is an immersion part, 10 is a treatment liquid adjustment part, 13 is a rectification part, 15 is a water pipe, and 16 is a treatment liquid. A filtration filter, 17 a water pump, 18 a lid, and 19 an infrared lamp.
Claims (1)
液(以下、処理液と称す)を貯溜する処理槽を
備え、前記処理槽は基材を浸漬して基材表面に
酸化珪素被膜を形成するための浸漬部と、前記
浸漬部に流れ込む処理液の流れを整えるために
前記浸漬部に連なつて設けられた整流部と、前
記浸漬部から流れ出た処理液を調整するために
前記浸漬部に連なつて設けられた処理液調整部
とから成り、かつ処理液を循環させる循環装置
を備えた酸化珪素被膜の製造装置において、前
記処理液の温度を適温に保つための加熱手段お
よび/または保温手段を前記処理槽上方に備え
たことを特徴とする酸化珪素被膜の製造装置。 (2) 前記加熱手段は赤外線ランプであることを特
徴とする実用新案登録請求の範囲第1項記載の
酸化珪素被膜の製造装置。 (3) 前記保温手段は前記恒温槽開口部及び処理槽
開口部を閉塞する蓋体であることを特徴とする
実用新案登録請求の範囲第1項記載の酸化珪素
被膜の製造装置。[Scope of Claim for Utility Model Registration] (1) A treatment tank is provided in which a saturated silicon oxide aqueous solution of hydrosilicofluoric acid (hereinafter referred to as treatment liquid) is stored in a constant temperature bath, and the treatment tank is used to immerse a substrate. an immersion section for forming a silicon oxide film on the surface of the substrate; a rectification section connected to the immersion section to regulate the flow of the processing liquid flowing into the immersion section; In a silicon oxide coating manufacturing apparatus comprising a treatment liquid adjusting section connected to the immersion section for adjusting the treatment liquid and a circulation device for circulating the treatment liquid, the temperature of the treatment liquid is controlled. An apparatus for producing a silicon oxide film, characterized in that it is equipped with a heating means and/or a heat retaining means above the processing tank for maintaining the temperature at an appropriate temperature. (2) The apparatus for producing a silicon oxide film according to claim 1, wherein the heating means is an infrared lamp. (3) The apparatus for producing a silicon oxide film according to claim 1, wherein the heat retaining means is a lid that closes the opening of the thermostatic chamber and the processing chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14876987U JPH0444595Y2 (en) | 1987-09-28 | 1987-09-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14876987U JPH0444595Y2 (en) | 1987-09-28 | 1987-09-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6453721U JPS6453721U (en) | 1989-04-03 |
| JPH0444595Y2 true JPH0444595Y2 (en) | 1992-10-21 |
Family
ID=31420388
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14876987U Expired JPH0444595Y2 (en) | 1987-09-28 | 1987-09-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0444595Y2 (en) |
-
1987
- 1987-09-28 JP JP14876987U patent/JPH0444595Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6453721U (en) | 1989-04-03 |
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