JPH0444928B2 - - Google Patents

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Publication number
JPH0444928B2
JPH0444928B2 JP58214143A JP21414383A JPH0444928B2 JP H0444928 B2 JPH0444928 B2 JP H0444928B2 JP 58214143 A JP58214143 A JP 58214143A JP 21414383 A JP21414383 A JP 21414383A JP H0444928 B2 JPH0444928 B2 JP H0444928B2
Authority
JP
Japan
Prior art keywords
straightness
measured
guide surface
measurement
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58214143A
Other languages
Japanese (ja)
Other versions
JPS60107511A (en
Inventor
Hiroaki Shimazutsu
Kanji Hayashi
Tsuneo Egawa
Kazuo Ideue
Masashi Ooya
Tadahisa Myaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP21414383A priority Critical patent/JPS60107511A/en
Publication of JPS60107511A publication Critical patent/JPS60107511A/en
Publication of JPH0444928B2 publication Critical patent/JPH0444928B2/ja
Granted legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Description

【発明の詳細な説明】 本発明は、測定対象物の真直度と移動案内面の
真直度及び移動時の縦ゆれ量(ピツチング)とを
同時に測定しうる実用化に供し得る方法に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method that can be put to practical use and can simultaneously measure the straightness of an object to be measured, the straightness of a moving guide surface, and the amount of pitching during movement.

近年、工作機械に対する高精度化への要求が高
まりつつある中で、案内面(摺動面)の真直度管
理は重要な課題の一つとなつており、その測定の
容易化が望まれている。従来から行なわれている
真直度の測定方法としては、ストレートエツジ等
の基準バーやピアノ線を基準直線としたり、ある
いはオートコリメータを利用する方法が知られて
おり、最近ではレーザ光による独立光学座標系を
用いた方法も開発されている。
In recent years, with the increasing demand for higher precision in machine tools, the straightness control of guide surfaces (sliding surfaces) has become one of the important issues, and it is hoped that it will be easier to measure. . Conventional straightness measurement methods include using a reference bar such as Straight Edge, a piano wire as a reference straight line, or using an autocollimator. Methods using systems have also been developed.

ところが、これらの方法ではいずれも、測定作
業に相当な準備と熟練度が要求され、しかも能率
が悪い上に種々の雑音による悪影響を受け易い欠
点があり、現場での実用化という点で多くの問題
点を残している。
However, all of these methods require a considerable amount of preparation and skill for measurement work, are inefficient, and are susceptible to adverse effects from various noises. Problems remain.

これらの問題を解決しうる真直度の新しい測定
方法として、3台の変位検出器を測定対象物に沿
つて移動させ、これら変位検出器による測定値か
ら、逐次測定対象物の真直度と変位検出器の移動
案内面の真直度とを同時に測定する方法が本発明
者等により報告されている、(特願昭57−167561
「真直度測定方法」)この先に出願した「真直度測
定方法」(特願昭57−167561)はその原理を表わ
す第1図に示すように、測定対象物1に沿つて設
けられた案内面2に沿つて移動する検出器取付台
3を設け、この検出器取付台3に測定対象物1と
の距離を測定する3個の変位検出器A,B,Cを
検出器取付台3の移動方向に等間隔lで設置す
る。そして、検出器取付台3を図中矢印方向に移
動させながら変位検出器A,B,Cの間隔lと等
しい移動距離l毎に測定対象物1表面との隔りを
測定し、その値をそれぞれDKA,DKB,DKC(K=
0,1,2,…)とする。この時の距離l毎の代
表点を用いて測定対象物1の真直度、案内面2の
真直度および検出器取付台3のピツチングがそれ
ぞれYK,XK,θK(K=0,1,2,…)で表わさ
れているとする。
As a new method for measuring straightness that can solve these problems, three displacement detectors are moved along the object to be measured, and the straightness and displacement of the object to be measured are sequentially detected from the measured values by these displacement detectors. The present inventors have reported a method for simultaneously measuring the straightness of the moving guide surface of a device (Patent Application No. 57-167561).
``Straightness Measuring Method'') The previously filed ``Straightness Measuring Method'' (Patent Application 167561/1982) is based on a guide surface provided along the object 1 to be measured, as shown in Figure 1, which shows its principle. 2, and three displacement detectors A, B, and C are installed on this detector mount 3 to measure the distance to the object 1. Install them at equal intervals l in the direction. Then, while moving the detector mounting base 3 in the direction of the arrow in the figure, the distance from the surface of the object to be measured 1 is measured every movement distance l equal to the distance l between the displacement detectors A, B, and C, and the value is calculated. D KA , D KB , D KC (K=
0, 1, 2,...). At this time, the straightness of the measuring object 1 , the straightness of the guide surface 2, and the pitching of the detector mount 3 are determined by using the representative points for each distance l, respectively. , 2, ...).

尚、検出器取付台3のピツチングは変位検出器
Aを基準として考える。
Note that the pitching of the detector mount 3 is based on the displacement detector A.

ここで、第1図に示すように、測定開始位置に
おける案内面2の真直度誤差をX0、1番目の位
置のそれをX1、1番目の位置における測定対象
物1の真直度誤差をY1、2番目の位置のそれぞ
れをY2とし、測定開始位置における各変位検出
器A,B,Cの測定値をD0A,D0B,D0Cとすると
共にK番目の測定位置における測定値をDKA
DKB,DKC,K+i番目の位置での測定値をDK+iA
DK+iB,DK+iCとすると、同図から、次式(1)(2)(3)が
成立する。
Here, as shown in Fig. 1, the straightness error of the guide surface 2 at the measurement start position is X 0 , that at the first position is X 1 , and the straightness error of the measurement object 1 at the first position is Let Y 1 and the second position be Y 2 , and let the measurement values of each displacement detector A, B, and C at the measurement start position be D 0A , D 0B , and D 0C , and the measurement value at the K-th measurement position. D KA ,
D KB , D KC , the measured value at the K+i-th position is D K+iA ,
Assuming D K+iB and D K+iC , the following equations (1), (2), and (3) are established from the same figure.

DKA−YK−XK=D0A ……(1) DKB−YK+1−XK−l・θK =D0B−Y1−X0 ……(2) DKC−YK+2−XK−2l・θK =D0C−Y2−X0 ……(3) また、(2)式および(3)式を変形すると次式(4)が得
られる。
D KA −Y K −X K =D 0A …(1) D KB −Y K+1 −X K −l・θ K =D 0B −Y 1 −X 0 …(2) D KC −Y K +2 −X K −2l·θ K =D 0C −Y 2 −X 0 (3) Furthermore, by transforming equations (2) and (3), the following equation (4) is obtained.

2DKB−2・D0B−DKC+D0C=XK+2YK+1−YK+2
2Y1+Y2−X0……(4) また、(1)式において、K→K+1、K→K+2
とすることによつて得たYK+1、YK+2を(4)式に代
入すると次式(5)が得られる。
2D KB −2・D 0B −D KC +D 0C =X K +2Y K+1 −Y K+2
2Y 1 +Y 2 −X 0 ...(4) Also, in equation (1), K→K+1, K→K+2
By substituting Y K+1 and Y K+2 obtained by , into equation (4), the following equation (5) is obtained.

XK+2=2・XK+1−XK−2DK+1A+DK+2A+2DKB−DKC
D0A−2・D0B+D0C+X0+2Y1−Y2……(5) さらに、(2)式、(5)式および(1)式から求めた
YK+2を用いて次式(6)、(7)が得られる。
X K+2 =2・X K+1 −X K −2D K+1A +D K+2A +2D KB −D KC +
D 0A −2・D 0B +D 0C +X 0 +2Y 1 −Y 2 ...(5) Furthermore, it was calculated from equations (2), (5), and
The following equations (6) and (7) are obtained using Y K+2 .

YK+2=−XK+2+DK+2A−D0A ……(6) θK+2=−XK+2−YK+3+DK+2B−D0B+Y1+X0
l……(7) すなわち、K=0,1,2,…の位置での変位
検出器A,B,Cの測定値DKA,DKB,DKCを用い
て、上記(5)式、(6)式および(7)式から逐次、測定対
象物1の真直度曲線Y、案内面2の真直度曲線X
および検出器取付台3のピツチングθを算出する
ことができるのである。
Y K+2 = −X K+2 +D K+2A −D 0A …(6) θ K+2 = −X K+2 −Y K+3 +D K+2B −D 0B +Y 1 +X 0 /
l...(7) That is, using the measured values D KA , D KB , and D KC of the displacement detectors A, B, and C at the positions of K = 0, 1, 2,..., the above equation (5), From equations (6) and (7), the straightness curve Y of the measuring object 1, the straightness curve X of the guide surface 2,
And the pitching θ of the detector mount 3 can be calculated.

このように本方法によれば、検出器取付台3が
案内面に沿つて移動して行く場合の検出器取付台
3の浮き沈み(真直度変化)のみならず、前後方
向の縦ゆれ(ピツチング)の影響をも考慮した高
精度の測定が可能となるのである。
In this way, according to the present method, not only the ups and downs (change in straightness) of the detector mount 3 when it moves along the guide surface, but also the longitudinal sway (pitching) in the front and rear direction can be prevented. This makes it possible to perform highly accurate measurements that take into account the effects of

尚、本例では測定対象物1が静止し、検出器取
付台3が移動する場合について説明したが、逆に
検出器取付台3が静止し、測定対象物1が移動す
る場合にも上記(5)式、(6)式および(7)式を適用する
ことができる。
In this example, the case where the object to be measured 1 is stationary and the detector mount 3 is moved has been explained, but conversely, the above-mentioned (( Equations 5), 6) and 7 can be applied.

次に、具体的な計算法について説明する、上記
(5)式、(6)式および(7)式からわかるように、(5)式か
ら求めたXK(K=2,3,4,…)を用いてYK
が算出されそれらの値からピツチングθKが求めら
れる。そこで、この(5)式の具体的適用法について
説明する。
Next, we will explain the specific calculation method.
As can be seen from equations (5), (6), and (7), Y K
is calculated, and pitching θ K is obtained from these values. Therefore, a specific application method of this equation (5) will be explained.

(5)式において、X0は測定開始位置での真直度
誤差であり、D0A,D0B,D0Cはいずれも測定開始
位置での変位量測定値である。したがつて、各変
位検出器A,B,Cの初期設定値を0とすれば
X0=D0A=D0B=D0C=0と仮定することができ
る。
In equation (5), X 0 is the straightness error at the measurement start position, and D 0A , D 0B , and D 0C are all displacement measurement values at the measurement start position. Therefore, if the initial setting values of each displacement detector A, B, and C are set to 0, then
It can be assumed that X 0 =D 0A =D 0B =D 0C =0.

この仮定のもとで、K=0,1,2,…,nに
対してXK+2は次のようになる。
Under this assumption, for K=0, 1, 2, . . . , n, X K+2 is as follows.

X2=2X1−0−2・D1A+D2A+0−0+2Y1
Y2 X3=2X2−X1−2・D2A+D3A+2・D1B−D1C
+2Y1−Y2 〓 〓 Xo+2=2Xo+1−Xo−2・Do+1A+Do+2A+2・D
oB−DoC+2Y1−Y2 しかし、X1,Y1,Y2は(5)式および(6)式の漸化
式からは求めることはできない値であり、真直度
曲線Xを求めるためには、何んらかの方法で、こ
れらの値を推定するか、または、その影響分を除
去する必要がある。
X 2 =2X 1 -0-2・D 1A +D 2A +0-0+2Y 1 -
Y 2 X 3 =2X 2 −X 1 −2・D 2A +D 3A +2・D 1B −D 1C
+2Y 1 −Y 2 〓 〓 X o+2 =2X o+1 −X o −2・D o+1A +D o+2A +2・D
oB −D oC +2Y 1 −Y 2However, X 1 , Y 1 , and Y 2 are values that cannot be obtained from the recurrence formulas (5) and (6), so in order to obtain the straightness curve To do this, it is necessary to estimate these values or remove their influence in some way.

そこで、(5)式において、X1=α、2Y1−Y2
βとおくと、次式(8)が成立する。
Therefore, in equation (5), X 1 = α, 2Y 1 −Y 2 =
If β is set, the following equation (8) holds true.

XK=K・α+K(K−1)/2・β +CK(K=2,3,…) ……(8) XK:K番目の位置での真直度誤差(真の値) CK:K番目の位置での真直度誤差(計算値) また、このCKはα=β=0と仮定して(5)式に
よつて測定値DKA,DKB,DKCから求めた値であ
る。
X K = K・α+K(K−1)/2・β +C K (K=2, 3,…) …(8) X K : Straightness error at Kth position (true value) C K : Straightness error at the Kth position (calculated value) Also, this C K is the value obtained from the measured values D KA , D KB , and D KC by equation (5) assuming α = β = 0. It is.

ここで、真直度誤差を『各測定点での誤差の二
乗平均値が最小になるような仮想直線からのへだ
たり』としてとらえることとすれば上記(8)式を用
いて真直度誤差を次の手順で求めることができ
る。
Here, if we consider the straightness error as ``the deviation from the virtual straight line that minimizes the root mean square value of the error at each measurement point,'' then we can calculate the straightness error using equation (8) above. It can be obtained using the following steps.

() K=2,3,4,…,nに対してCKを求め
ておく。
() Calculate C K for K=2, 3, 4,..., n.

() (8)式で示されたXKの二乗平均値を最小とす
るα,βを求める。
() Find α and β that minimize the root mean square value of X K shown in equation (8).

このα,βは最小2乗法によつて比較的簡単
に次式(9)(10)で求めることができる。
These α and β can be relatively easily determined using the following equations (9) and (10) using the least squares method.

α=δ1(γ4−2γ3+γ2)−(δ2−δ1
(γ3−γ2)/(γ3−γ22−γ2(γ4−2γ3+γ2
……(9) β=2・(δ2−δ1)・γ2−2δ1(γ3−γ2
/(γ3−γ22−γ2(γ4−2γ3+γ2)……(10) 但し γ2oK=2 K2,γ3oK=2 K3,γ4oK=2 K4, δ1oK=2 (K・CK),δ2oK=2 (K2・CK) () (9)式および(10)式で求めたα,βおよび
()で求めたCKから(8)式によつてXKを求め
る。
α=δ 14 −2γ 32 )−(δ 2 −δ 1 )
3 −γ 2 )/(γ 3 −γ 2 ) 2 −γ 24 −2γ 32 )
...(9) β=2・(δ 2 − δ 1 )・γ 2 −2δ 13 − γ 2 )
/(γ 3 −γ 2 ) 2 −γ 24 −2γ 32 )……(10) However, γ 2 = oK=2 K 2 , γ 3 = oK=2 K 3 , γ 4 = oK=2 K 4 , δ 1 = oK=2 (K・C K ), δ 2 = oK=2 (K 2・C K ) () (9) and (10) Calculate X K using equation (8) from α and β obtained using equations and C K obtained using ().

このXKが各測定での誤差の二乗平均値が最
小となるような仮想直線からのへだたりとして
の真直度誤差となる。
This X K becomes the straightness error as the deviation from the virtual straight line that minimizes the root mean square value of the error in each measurement.

一方、測定対象物1の真直度曲線はXKを(6)式
に代入することによつて求まり、検出器取付台3
のピツチングはYK,XK(7)を式に代入して求める
ことができる。
On the other hand, the straightness curve of the object to be measured 1 can be found by substituting X K into equation (6), and
The pitching of can be found by substituting Y K and X K (7) into the equation.

以上の説明からわかるように、第1図を基に説
明した方法は、測定対象物1の真直度形状と案内
面2の真直度形状を同時に測定できる有益な方法
であるが、その測定、演算方式の制約から、距離
l毎のとびとびの点での値(真直度誤差)しか把
握できないという欠点がある。すなわち、測定対
象物1あるいは案内面2の詳細な真直度形状を把
握する為には、3台の変位検出器A,B,Cの取
付間隔lを小さくし、細かいステツプで測定、演
算を行う必要がある。しかし、取付間隔lを小さ
くするには、検出器の寸法、検出器取付台3の寸
法等からの制約があり、lを十分小さくすること
は困難である。
As can be seen from the above explanation, the method explained based on FIG. Due to the limitations of the method, there is a drawback that only values (straightness errors) can be determined at discrete points for each distance l. In other words, in order to grasp the detailed straightness shape of the measurement object 1 or the guide surface 2, the mounting interval l of the three displacement detectors A, B, and C should be made small, and measurements and calculations should be performed in small steps. There is a need. However, in order to reduce the mounting interval l, there are restrictions from the dimensions of the detector, the dimensions of the detector mounting base 3, etc., and it is difficult to make l sufficiently small.

本発明は、前述の欠点を解消し、詳細な真直度
把握を可能とする真直度測定方法を提供すること
を目的とする。かかる目的を達成する本発明の構
成は、検出器取付台と測定対象物とのいずれか一
方が案内面に沿つて移動する該検出器取付台に前
記測定対象物との距離を測定する3個の検出器を
前記移動方向に等間隔lで設置し、測定開始位置
に於ける前記3個の検出器の測定値をそれぞれ
D0A,D0B,D0Cとし、前記検出器取付台もしくは
測定対象物を前記間隔l毎に移動してその都度前
記検出器の測定値を得、K番目の測定位置におけ
る前記測定値とD0A,D0B,DOCとの偏差をそれぞ
れDKA,DKB,DKCとし、測定開始位置での案内面
真直度誤差をX0、1番目の位置のそれをX1、1
番目の位置での測定対象物の真直度誤差をY1
2番目の位置でのそれをY2とし、測定開始位置
の案内面真直度誤差X0を基準としたK+2番目
の位置での前記案内面の真直度誤差XK+2を XK+2=2・K+1−XK-2・DK+1A+DK+2A+2・DKB−DK
C
+2・Y1−Y2 によつて算出し、K=0,1,2,…について算
出したXK+2の値を、真直度誤差の二乗平均値が
最小となるように演算して求めたX1及びY1,Y2
に関係する数値によつて補正して前記案内面の真
直度を推定・算出し、この位置に於ける前記測定
対象物の真直度XK+2(K=0,1,2…)YK+2
び移動による前後方向の縦ゆれ量θK+2をそれぞれ YK+2=−XK+2+DK+2A θK+2=−XK+2−YK+3+DK+2B/l によつて算出する真直度の測定方法において、前
記検出器取付台もしくは測定対象物の移動距離
l/N毎に前記検出器の測定値を得、これによつ
てDKA,DKB,DKC(K=0,1,2…)からなる
N組のデータ群を得、それぞれのデータ群にか
ら、N組の案内面真直度XK及び測定対象物の真
直度YKを求め、これらのN組の真直度形状XK
YKから全体の詳細な真直度形状を把握すること
を特徴とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a straightness measuring method that eliminates the above-mentioned drawbacks and makes it possible to grasp straightness in detail. The configuration of the present invention that achieves this object is such that one of the detector mount and the object to be measured moves along a guide surface, and the detector mount includes three sensors for measuring the distance to the object to be measured. Detectors are installed at equal intervals l in the movement direction, and the measured values of the three detectors at the measurement start position are respectively
D 0A , D 0B , D 0C , the detector mounting base or the object to be measured is moved every interval l to obtain the measured value of the detector each time, and the measured value at the Kth measurement position and D The deviations from 0A , D 0B , and D OC are respectively D KA , D KB , and D KC , the guide surface straightness error at the measurement start position is X 0 , and that at the first position is X 1 , 1
The straightness error of the measured object at the th position is Y 1 ,
The value at the second position is defined as Y 2 , and the straightness error of the guide surface at the measurement start position X 0 is taken as the reference K + the straightness error of the guide surface at the second position X K+2 is X K+2 = 2・K+1 −X K-2・D K+1A +D K+2A +2・D KB −D K
Calculate by C +2・Y 1 −Y 2 and calculate the value of X K+2 calculated for K=0, 1, 2,... so that the root mean square value of the straightness error is minimized. Obtained X 1 and Y 1 , Y 2
The straightness of the guide surface is estimated and calculated by correcting it by the numerical value related to , and the straightness of the measurement target at this position is calculated . Y K +2 = −X K+2 +D K+2A θ K +2 = −X K+2 −Y K+3 +D K+2B In the method of measuring straightness calculated by D KA , D KB , D KA , D KB , D KA , D KB , Obtain N data groups consisting of D KC (K = 0, 1, 2...), and from each data group, determine N groups of guide surface straightness X K and straightness Y K of the object to be measured, These N sets of straightness shapes X K ,
It is characterized by grasping the overall detailed straightness shape from YK .

以下本発明の実施例に係る真直度測定方法を第
2図によつて説明する。第2図aは本発明での測
定方法を示す図であり第1図と同一記号を付した
ものは同一のものであることを示している。なお
簡単の為、案内面2は省略した。第2図aに於
て、ai(i=0,1,2,…)は測定対象物1上
の1組の測定対象点列であり、等間隔lで設定さ
れている。bi(i=0,1,2,…)は別の1組
の測定対象点列であり、同様に等間隔lで設定さ
れている。aiとbiのへだたりは、図に示したよう
にl/2に設定してある。
A straightness measuring method according to an embodiment of the present invention will be explained below with reference to FIG. FIG. 2a is a diagram showing the measuring method according to the present invention, and the same symbols as in FIG. 1 indicate the same items. Note that for simplicity, the guide surface 2 has been omitted. In FIG. 2a, a i (i=0, 1, 2, . . . ) is a set of measurement object points on the measurement object 1, which are set at equal intervals l. b i (i=0, 1, 2, . . . ) is another set of measurement target point sequences, which are similarly set at equal intervals l. The separation between a i and b i is set to l/2 as shown in the figure.

図のように検出器取付台3上に3ケの変位検出
器A,B,Cを配置し、図中の矢印方向に移動さ
せながら移動距離l/2毎に測定値を得る。測定
対象点列ai(i=0,1,2…)に対する1組の
測定データ群に対して、特願昭57−167561の方法
を適用することによつて、測定対象点ai(i=2,
3,4,…)での真直度誤差を求めることができ
る。同様に測定対象点列bi(i=0,1,2,…)
に対する1組の測定データ群から、測定対象点bi
(i=2,3,4…)での真直度誤差を求めるこ
とができる。
As shown in the figure, three displacement detectors A, B, and C are arranged on the detector mount 3 and are moved in the direction of the arrow in the figure to obtain measured values every 1/2 of the moving distance. By applying the method of Japanese Patent Application No. 57-167561 to a set of measurement data for the sequence of measurement points a i (i = 0, 1, 2...), the measurement points a i (i =2,
3, 4,...) can be found. Similarly, the measurement target point sequence b i (i=0, 1, 2,...)
From one set of measurement data group for , the measurement target point b i
The straightness error at (i=2, 3, 4...) can be found.

かくて第2図bに示したように、これら2組の
測定対象点での真直度誤差から、測定対象物1の
詳細な真直度形状を把握することができる。2組
の測定対象点での真直度誤差の合成方法として
は、例えば、測定対象点aiでの真直度誤差から、
測定対象点biの始点と終点(真直度誤差が算出さ
れている最初の点と最後の点、例えばb2とbo)に
対応する位置での真直度誤差を内そうし、biの始
点と終点での真直度誤差がその内そう値になるう
ように換算してbi点の真直度誤差を求める方法が
考えられる。また、第2図aに於ては、2組の測
定対象点列ai,biの場合について説明したが、
l/Nのへだたりで設定されたN組の測定対象点
列ai,bi,ci,…についても同様な測定・演算処
理が可能である。もちろんこの場合には移動距離
l/N毎にN組の測定データ群を得、N組のデー
タ群に対して特願昭57−167561の方法を適用すれ
ばよい。
Thus, as shown in FIG. 2b, the detailed straightness shape of the measurement object 1 can be grasped from the straightness errors at these two sets of measurement object points. As a method for synthesizing straightness errors at two sets of measurement target points, for example, from the straightness error at measurement target point a i ,
Include the straightness error at the positions corresponding to the start and end points of the measurement target point b i (the first and last points for which the straightness error is calculated, e.g. b 2 and b o ), and calculate the straightness error of b i . One possible method is to calculate the straightness error at point b i by converting the straightness errors at the start point and end point to a certain value. In addition, in FIG. 2a, the case of two sets of measurement target point sequences a i and b i was explained, but
Similar measurement and calculation processing is also possible for N sets of measurement object point sequences a i , b i , c i , . . . set with a separation of l/N. Of course, in this case, N sets of measurement data groups may be obtained for each moving distance l/N, and the method disclosed in Japanese Patent Application No. 57-167561 may be applied to the N sets of data groups.

以上説明したように、本発明によれば、測定対
象物1の真直度形状を細かいピツチで詳細に把握
することが可能となる。
As explained above, according to the present invention, it is possible to grasp the straightness shape of the object to be measured 1 in detail at a fine pitch.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の技術を説明するための説明図、
第2図a,bは本発明の実施例を説明するための
説明図である。 図面中、1は測定対象物、2は案内面、3は検
出器取付台、A,B,Cは変位検出器である。
FIG. 1 is an explanatory diagram for explaining the conventional technology,
FIGS. 2a and 2b are explanatory diagrams for explaining an embodiment of the present invention. In the drawings, 1 is an object to be measured, 2 is a guide surface, 3 is a detector mounting base, and A, B, and C are displacement detectors.

Claims (1)

【特許請求の範囲】 1 検出器取付台と測定対象物とのいずれか一方
が案内面に沿つて移動する該検出器取付台に前記
測定対象物との距離を測定する3個の検出器を前
記移動方向に等間隔lで設置し、測定開始位置に
於ける前記3個の検出器の測定値をそれぞれ
D0A,D0B,D0Cとし、前記検出器取付台もしくは
測定対象物を前記間隔l毎に移動してその都度前
記検出器の測定値を得、K番目の測定位置におけ
る前記測定値とD0A,D0B,D0Cとの偏差をそれぞ
れDKA,DKB,DKCとし、測定開始位置での案内面
真直度誤差をX0、1番目の位置のそれをX1、1
番目の位置での測定対象物の真直度誤差をY1
2番目の位置でのそれをY2とし、測定開始位置
の案内面真直度誤差X0を基準としたK+2番目
の位置での前記案内面の真直度誤差XK+2を XK+2=2・XK+1−XK−2・DK+1A+DK+2A +2・DKB−DKC+2・Y1−Y2 によつて算出し、K=0,1,2,…について算
出したXK+2の値を、真直度誤差の二乗平均値が
最小となるように演算して求めたX1及びY1,Y2
に関係する数値によつて補正して前記案内面の真
直度XK+2(K=0,1,2,…)を推定・算出
し、この位置に於ける前記測定対象物の真直度
YK+2及び移動による前後方向の縦ゆれ量θK+2をそ
れぞれ YK+2=−XK+2+DK+2A θK+2=−XK+2−YK+3+DK+2B/l によつて算出する真直度の測定方法において、前
記検出器取付台もしくは測定対象物の移動距離
l/N毎に前記検出器の測定値を得、これによつ
てDKA,DKB,DKC(K=0,1,2,…)からな
るN組のデータ群を得、それぞれのデータ群か
ら、N組の案内面真直度XK及び測定対象物の真
直度YKを求め、これらN組の真直度形状XK,YK
から全体の詳細な真直度形状を把握することを特
徴とする真直度測定方法。
[Claims] 1. Either the detector mount or the object to be measured moves along a guide surface, and the detector mount is provided with three detectors for measuring the distance to the object to be measured. The three detectors are installed at equal intervals l in the movement direction, and the measured values of the three detectors at the measurement start position are measured.
D 0A , D 0B , D 0C , the detector mounting base or the object to be measured is moved every interval l to obtain the measured value of the detector each time, and the measured value at the Kth measurement position and D The deviations from 0A , D 0B , and D 0C are respectively D KA , D KB , and D KC , the guide surface straightness error at the measurement start position is X 0 , and that at the first position is X 1 , 1
The straightness error of the measured object at the th position is Y 1 ,
The value at the second position is defined as Y 2 , and the straightness error of the guide surface at the measurement start position X K+2 with reference to the guide surface straightness error X 0 at the second position is defined as X K+2 = Calculated by 2・X K+1 −X K −2・D K+1A +D K+2A +2・D KB −D KC +2・Y 1 −Y 2 , and for K=0, 1, 2,... X 1 , Y 1 , Y 2 calculated by calculating the calculated value of X K+2 so that the root mean square value of the straightness error is minimized
The straightness of the guide surface X K+2 (K=0, 1, 2,...) is estimated and calculated by correcting it by the numerical value related to the straightness of the object to be measured at this position.
Y K+2 and longitudinal vibration amount θ K+2 due to movement are respectively Y K+2 = −X K+2 +D K+2A θ K+2 = −X K+2 −Y K+3 +D K In the method of measuring straightness calculated by +2B /l, the measured value of the detector is obtained every distance l/N of movement of the detector mount or the object to be measured, and thereby D KA , D Obtain N data groups consisting of KB , D KC (K = 0, 1, 2,...), and from each data group, calculate N groups of guideway straightness X K and straightness Y K of the object to be measured. Find the straightness shapes of these N sets X K , Y K
A straightness measurement method characterized by grasping the detailed straightness shape of the whole.
JP21414383A 1983-11-16 1983-11-16 Measuring method of straightness Granted JPS60107511A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21414383A JPS60107511A (en) 1983-11-16 1983-11-16 Measuring method of straightness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21414383A JPS60107511A (en) 1983-11-16 1983-11-16 Measuring method of straightness

Publications (2)

Publication Number Publication Date
JPS60107511A JPS60107511A (en) 1985-06-13
JPH0444928B2 true JPH0444928B2 (en) 1992-07-23

Family

ID=16650935

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21414383A Granted JPS60107511A (en) 1983-11-16 1983-11-16 Measuring method of straightness

Country Status (1)

Country Link
JP (1) JPS60107511A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4935289B2 (en) * 2006-10-12 2012-05-23 Jfeスチール株式会社 Method and apparatus for measuring bent shape
CN105737731A (en) * 2016-03-03 2016-07-06 安徽理工大学 Handheld angular displacement probe

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53109660A (en) * 1977-03-04 1978-09-25 Osaka Kiko Co Ltd Measuring method of straightness in three points
JPS57156512A (en) * 1981-03-20 1982-09-27 Tokyo Daigaku Detector for turning angle of inspection table

Also Published As

Publication number Publication date
JPS60107511A (en) 1985-06-13

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