JPH044755U - - Google Patents

Info

Publication number
JPH044755U
JPH044755U JP4436490U JP4436490U JPH044755U JP H044755 U JPH044755 U JP H044755U JP 4436490 U JP4436490 U JP 4436490U JP 4436490 U JP4436490 U JP 4436490U JP H044755 U JPH044755 U JP H044755U
Authority
JP
Japan
Prior art keywords
under test
direction changing
changing mechanism
moving rail
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4436490U
Other languages
Japanese (ja)
Other versions
JP2520774Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4436490U priority Critical patent/JP2520774Y2/en
Publication of JPH044755U publication Critical patent/JPH044755U/ja
Application granted granted Critical
Publication of JP2520774Y2 publication Critical patent/JP2520774Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Chutes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図はこの考案の実施例を略線的に示す側面
図、第２図は従来のＩＣ搬送装置を略線的に示す
側面図である。 FIG. 1 is a side view schematically showing an embodiment of this invention, and FIG. 2 is a side view schematically showing a conventional IC transfer device.

Claims (1)

【実用新案登録請求の範囲】 被試験ＩＣ素子をチヤンバ装置へ供給して、そ
の被試験ＩＣ素子を設定した試験温度にしてその
被試験ＩＣ素子を試験し、その試験が終了した被
試験ＩＣ素子を自然落下を利用して方向変換機構
へ供給し、その方向変換機構により方向変換され
た被試験ＩＣ素子を収容部側へ供給するＩＣ搬送
装置において、 上記チヤンバ装置のＩＣ素子排出口と連結する
第１位置と、上記チヤンバ装置の直下から横方向
に外れた第２位置との間を移動することができる
移動レールと、 その移動レールを上記第１位置および第２位置
間を往復移動させる移動機構とが設けられ、 上記方向変換機構は、上記第２位置にある上記
移動レールから被試験ＩＣ素子が供給される位置
に設けられていることを特徴とするＩＣ搬送装置
。[Scope of Claim for Utility Model Registration] An IC device under test that is supplied to a chamber device, is brought to a set test temperature, and is tested, and the test is completed. In an IC transport device that supplies IC elements under test to a direction changing mechanism using natural fall, and supplies the IC elements under test whose direction has been changed by the direction changing mechanism to the storage section side, the device is connected to the IC element outlet of the chamber device. a moving rail capable of moving between a first position and a second position laterally removed from directly below the chamber device; and movement of reciprocating the moving rail between the first position and the second position. mechanism, wherein the direction changing mechanism is provided at a position where IC elements to be tested are supplied from the moving rail at the second position.
JP4436490U 1990-04-25 1990-04-25 IC carrier Expired - Fee Related JP2520774Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4436490U JP2520774Y2 (en) 1990-04-25 1990-04-25 IC carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4436490U JP2520774Y2 (en) 1990-04-25 1990-04-25 IC carrier

Publications (2)

Publication Number Publication Date
JPH044755U true JPH044755U (en) 1992-01-16
JP2520774Y2 JP2520774Y2 (en) 1996-12-18

Family

ID=31557599

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4436490U Expired - Fee Related JP2520774Y2 (en) 1990-04-25 1990-04-25 IC carrier

Country Status (1)

Country Link
JP (1) JP2520774Y2 (en)

Also Published As

Publication number Publication date
JP2520774Y2 (en) 1996-12-18

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