JPH0447654Y2 - - Google Patents
Info
- Publication number
- JPH0447654Y2 JPH0447654Y2 JP11847686U JP11847686U JPH0447654Y2 JP H0447654 Y2 JPH0447654 Y2 JP H0447654Y2 JP 11847686 U JP11847686 U JP 11847686U JP 11847686 U JP11847686 U JP 11847686U JP H0447654 Y2 JPH0447654 Y2 JP H0447654Y2
- Authority
- JP
- Japan
- Prior art keywords
- birefringence
- stretching
- relaxation
- constant temperature
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【考案の詳細な説明】
〔産業上の利用分野〕
本考案は主に光学用樹脂の複屈折緩和現象の測
定に用いられる複屈折緩和測定装置に関するもの
である。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a birefringence relaxation measuring device mainly used for measuring the birefringence relaxation phenomenon of optical resins.
ここで光学用樹脂とは、光を透過するプラスチ
ツクであり、成形品の光学的異方性が小さい、特
殊な屈折率−分散率の関係をもつ等の性質を有す
るもので、具体的には、ポリカーボネート、ポリ
メチルメタアクリレート、ポリステレン、エポキ
シ樹脂、ポリオレフイン樹脂、共重合ポリカーボ
ネートなどがあげられる。 Here, optical resin is a plastic that transmits light and has properties such as having a small optical anisotropy of molded products and a special refractive index-dispersion relationship. , polycarbonate, polymethyl methacrylate, polysterene, epoxy resin, polyolefin resin, and copolymerized polycarbonate.
従来、固体、溶融体の複屈折の緩和現象を測定
する装置としては実用上満足し得るものは見当た
らず、特に通常、固体である試験片のガラス転位
温度付近での複屈折緩和を測定できる装置はなか
つた。
Until now, there has not been a device that is practically satisfactory for measuring the relaxation phenomenon of birefringence in solids and melts, and in particular, there is no device that can measure the relaxation of birefringence near the glass transition temperature of test pieces, which are usually solids. I stopped talking.
本考案者らは、光学用樹脂の複屈折緩和時間を
迅速かつ簡便に測定し得る装置を開発するために
鋭意検討の結果、クロスニコル下での透過光強度
の変化から複屈折を測定できる補償器を有する複
屈折測定装置に、延伸器を有する恒温槽を組み合
わせることにより初めて固体サンプルの複屈折緩
和時間を容易に測定できることを見出し、本考案
を完成するに至つた。
The inventors of the present invention have conducted intensive studies to develop a device that can quickly and easily measure the birefringence relaxation time of optical resins, and have found a compensation system that can measure birefringence from changes in transmitted light intensity under crossed Nicols conditions. They discovered that the birefringence relaxation time of a solid sample could be easily measured for the first time by combining a birefringence measuring device with a thermostatic chamber with a stretching device, and completed the present invention.
即ち本考案は、試験片を水平方向に任意に延伸
しうる延伸器を具備する恒温槽と補償器を有する
複屈折測定装置を組み合わせてなることを特徴と
する複屈折緩和測定装置である。 That is, the present invention is a birefringence relaxation measuring device characterized by combining a constant temperature bath equipped with a stretcher capable of stretching a test piece in the horizontal direction and a birefringence measuring device having a compensator.
以下添付図面により本考案を具体的に説明す
る。 The present invention will be explained in detail below with reference to the accompanying drawings.
第１図は本考案に用いる恒温槽内の延伸器の斜
視図である。第２図は延伸器を組み込んだ恒温槽
の斜視図、第３図は本考案の複屈折緩和測定装置
の斜視図である。 FIG. 1 is a perspective view of a stretching device in a constant temperature bath used in the present invention. FIG. 2 is a perspective view of a constant temperature bath incorporating a stretcher, and FIG. 3 is a perspective view of the birefringence relaxation measuring device of the present invention.
第１図において２つのサンプルホルダー２は延
伸レバー３と連動した軸で結ばれており、軸は中
央を境にして互いに逆ねじａ，a′が切られてい
る。これにより、延伸レバー３の回転からサンプ
ルホルダー２がそれぞれ外側に動き、試験片１を
延伸するようになつている。第２図に示した恒温
槽１６は、第１図の延伸器を組み込んだもので、
恒温槽のフタの内側には電熱線とフアンが取り付
けられており、恒温槽内は室温から300℃まで任
意の温度に、温度コントロール用センサー７と、
温度制御装置１５によつてコントロールできる。
また恒温槽には測定光（レーザービーム）透過用
の穴Ｘと、内部観察用のガラス窓Ｙが取り付けら
れている。第３図に示す複屈折緩和測定装置は、
第２図に示した延伸器を備えた恒温槽を複屈折測
定装置に組み込んだものである。複屈折測定装置
は、He−Neレーザー４、1/4波長板５、ポララ
イザー６、補償器１０、アナライザー１１、光検
出器１２、増幅器１３、レコーダー１４から成つ
ている。1/4波長板は任意の振動方向をもつ直線
偏光を得るために、He−Neレーザーから出力さ
れた直線偏光を一端円偏光に変換している。そし
てポラライザーによつて水平から45°の角度をも
つ直線偏光が取り出され、またアナライザーは、
ポラライザーを通過した直線偏光に対する直角方
向成分のみを通過させるクロスニコルとなつてい
る。クロスニコル下での透過光強度Ｉと複屈折
Δnの関係は次式で表わされる。 In FIG. 1, two sample holders 2 are connected by a shaft that interlocks with a stretching lever 3, and the shafts have opposite threads a and a' cut with respect to each other with the center as a boundary. As a result, the sample holders 2 move outward as the stretching lever 3 rotates, and the test piece 1 is stretched. The constant temperature bath 16 shown in FIG. 2 incorporates the stretching machine shown in FIG.
A heating wire and a fan are attached to the inside of the lid of the thermostatic oven, and a temperature control sensor 7 is installed to control the temperature inside the thermostatic oven from room temperature to 300℃.
It can be controlled by a temperature control device 15.
Furthermore, a hole X for transmitting measurement light (laser beam) and a glass window Y for internal observation are attached to the thermostatic chamber. The birefringence relaxation measuring device shown in Fig. 3 is
This is a birefringence measuring device in which a constant temperature bath equipped with the stretching device shown in FIG. 2 is incorporated. The birefringence measuring device includes a He--Ne laser 4, a quarter-wave plate 5, a polarizer 6, a compensator 10, an analyzer 11, a photodetector 12, an amplifier 13, and a recorder 14. The quarter-wave plate converts the linearly polarized light output from the He-Ne laser into circularly polarized light at one end in order to obtain linearly polarized light with an arbitrary vibration direction. Then, the polarizer extracts linearly polarized light at an angle of 45° from the horizontal, and the analyzer
It is a crossed nicol structure that allows only the component in the direction perpendicular to the linearly polarized light that has passed through the polarizer to pass through. The relationship between transmitted light intensity I and birefringence Δn under crossed Nicols is expressed by the following equation.
Ｉ＝k2Sin2（2θ）Sin2（πdΔn／λ）
ここでｋは入射光の振幅、θは入射光の振動方
向とサンプルの主軸とのなす角、ｄはサンプルの
厚さ、λは入射光の波長である。実験において
は、入射光の振動方向と延伸方向が45°にしてあ
るのでθ＝45°であり、またｄはマイクロメータ
ーにより実測できるので、透過光強度から複屈折
を求めるためには、振幅の自乗を知ればよい。こ
こで補償器１０により測定前にｄ・Δn＝λ／２
となる複屈折を与えて振幅の自乗が求められる。 I=k 2 Sin 2 (2θ) Sin 2 (πdΔn/λ) where k is the amplitude of the incident light, θ is the angle between the vibration direction of the incident light and the main axis of the sample, d is the thickness of the sample, and λ is It is the wavelength of the incident light. In the experiment, the vibration direction and the stretching direction of the incident light were set at 45°, so θ = 45°, and d can be measured using a micrometer, so in order to find the birefringence from the transmitted light intensity, the amplitude All you need to know is square. Here, before measurement using the compensator 10, d・Δn=λ/2
The square of the amplitude can be found by giving the birefringence as follows.
透過光強度の測定はサンプルホルダー２に試験
片１を固定後、恒温槽１６内の温度が任意の一定
温度に温度制御器１５によつてコントロールさ
れ、延伸レバー３によつて一定の延伸を与えると
きに生ずる透過光を光検出器１２で検出し、増幅
器１３で増幅後、レコーダー１４に記録すること
によつて行われる。したがつて、一定温度におけ
る透過光強度の変化を連続的に測定することによ
り、さきにもとめた定数から、複屈折量に換算す
ると、複屈折の緩和時間が求められる。 To measure the transmitted light intensity, after fixing the test piece 1 to the sample holder 2, the temperature in the thermostatic chamber 16 is controlled to an arbitrary constant temperature by the temperature controller 15, and a constant stretching is applied by the stretching lever 3. This is done by detecting the transmitted light that sometimes occurs with a photodetector 12, amplifying it with an amplifier 13, and then recording it on a recorder 14. Therefore, by continuously measuring the change in the intensity of transmitted light at a constant temperature, the relaxation time of birefringence can be determined from the constant determined above by converting it into the amount of birefringence.
本考案は光学用樹脂の複屈折緩和測定装置にお
いて、特に光デイスク基板用樹脂を高速射出によ
り高剪断応力下で生成した樹脂の分子配向がどの
ようなタイムスケールで緩和するかを測定するた
めに格別に有用に複屈折緩和測定装置である。
This invention is a birefringence relaxation measurement device for optical resins, in particular, for measuring the time scale in which the molecular orientation of resins produced under high shear stress by high-speed injection of resins for optical disk substrates relaxes. It is an exceptionally useful birefringence relaxation measurement device.
第１図は延伸器の斜視図、第２図は延伸器を組
み込んだ恒温槽の斜視図、第３図は本考案の複屈
折緩和測定装置の斜視図を示す。
１……試験片、２……サンプルホルダー、３…
…延伸レバー、４……He−Neレーザー、５……
１／４波長板、６……ポラライザー、７……温度コ
ントロール用センサー、８……恒温槽内フアン、
９……温度検出用センサー、１０……補償器、１
１……アナライザー、１２……光検出器、１３…
…増幅器、１４……レコーダー、１５……温度制
御装置、１６……恒温槽。
FIG. 1 is a perspective view of a stretcher, FIG. 2 is a perspective view of a constant temperature bath incorporating the stretcher, and FIG. 3 is a perspective view of the birefringence relaxation measuring device of the present invention. 1...Test piece, 2...Sample holder, 3...
...Stretching lever, 4...He-Ne laser, 5...
1/4 wavelength plate, 6... Polarizer, 7... Temperature control sensor, 8... Fan in constant temperature chamber,
9...Temperature detection sensor, 10...Compensator, 1
1...analyzer, 12...photodetector, 13...
... Amplifier, 14 ... Recorder, 15 ... Temperature control device, 16 ... Constant temperature bath.
Claims (1)
具備する恒温槽と補償器を有する複屈折測定装置
を組み合わせてなることを特徴とする複屈折緩和
測定装置。 1. A birefringence relaxation measurement device comprising a combination of a constant temperature bath equipped with a stretcher capable of stretching a test piece in the horizontal direction and a birefringence measurement device equipped with a compensator.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11847686U JPH0447654Y2 (en) | 1986-08-01 | 1986-08-01 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11847686U JPH0447654Y2 (en) | 1986-08-01 | 1986-08-01 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6325356U JPS6325356U (en) | 1988-02-19 |
| JPH0447654Y2 true JPH0447654Y2 (en) | 1992-11-10 |
Family
ID=31004963
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11847686U Expired JPH0447654Y2 (en) | 1986-08-01 | 1986-08-01 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0447654Y2 (en) |
-
1986
- 1986-08-01 JP JP11847686U patent/JPH0447654Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6325356U (en) | 1988-02-19 |
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