JPH0451409A - Ito sintered body - Google Patents
Ito sintered bodyInfo
- Publication number
- JPH0451409A JPH0451409A JP16009990A JP16009990A JPH0451409A JP H0451409 A JPH0451409 A JP H0451409A JP 16009990 A JP16009990 A JP 16009990A JP 16009990 A JP16009990 A JP 16009990A JP H0451409 A JPH0451409 A JP H0451409A
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- Prior art keywords
- tin
- sintered body
- composition
- powder
- resistance value
- Prior art date
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Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、透明導電膜作成に使用するスパッタリング用
ターゲット、即ちITO焼結体に関する。DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to a sputtering target used for producing a transparent conductive film, that is, an ITO sintered body.
(従来技術)
スパッタリングによって得られる透明導電膜として、イ
ンジウム、スズ及び酸素から成る、所謂ITOは、その
比抵抗値の低さから有望な膜として注目されている。(Prior Art) As a transparent conductive film obtained by sputtering, so-called ITO, which is made of indium, tin, and oxygen, is attracting attention as a promising film because of its low specific resistance value.
(発明が解決しようとする課題)
従来、TTOターゲットを用いてスパッタリングを行う
場合、その成膜中に生しる異常放電現象によってプラズ
マ状態が不安定となり、安定した成膜が行われず、スパ
ッタされた膜の構造か悪化し、膜の特性値が劣化すると
いう不都合を生じることが知られている。(Problems to be Solved by the Invention) Conventionally, when sputtering is performed using a TTO target, the plasma state becomes unstable due to an abnormal discharge phenomenon that occurs during film formation, and stable film formation cannot be performed, resulting in sputtering. It is known that the structure of the film deteriorates and the characteristic values of the film deteriorate.
また、異常放電現象が頻繁に発生する状況下において長
時間ITOターゲットを使用していると、ターゲット表
面に変質層が生じ(所謂黒化)、これにより成膜速度が
低下し、生産性が低下するという問題も生じている。In addition, if an ITO target is used for a long time under conditions where abnormal discharge phenomena occur frequently, a degraded layer will form on the target surface (so-called blackening), which will slow down the film formation rate and reduce productivity. There is also the problem of doing so.
従って本発明は、上述したITOターゲットのスパッタ
リングに係わる問題点を解消し、異常放電現象の発生を
存効に抑制することが可能なITO焼結体を提供するこ
とを目的とする。Therefore, an object of the present invention is to provide an ITO sintered body that can eliminate the above-described problems related to sputtering of an ITO target and can effectively suppress the occurrence of abnormal discharge phenomena.
(課題を達成するための手段)
本発明の■TO焼結体は、実質的にインジウム、スズ及
び酸素から成り、相対密度か80%以上であって、電子
線マイクロアナライザー(EPMA)の線分析における
スズ組成か、平均組成の0.8〜1.2倍の範囲内にあ
り、且つ、表面抵抗値が1mΩ/ cnr以下であるこ
とを特徴とする。(Means for Achieving the Object) The TO sintered body of the present invention consists essentially of indium, tin, and oxygen, has a relative density of 80% or more, and is analyzed by electron beam microanalyzer (EPMA). The tin composition is within the range of 0.8 to 1.2 times the average composition, and the surface resistance value is 1 mΩ/cnr or less.
即ぢスパッタリング中の異常放電現象は、ターゲットに
アルゴンイオンか衝突した際に、ターゲットから二次電
子が放出され、ターゲット内に正の電荷か蓄積すること
に起因するものである。本発明は、ITO焼結体を上記
のように高密度とし、スズを均一に分散させ、且つ焼結
体の電気型導度を良好なものとすることによって、電荷
の蓄積を防止し、その結果として異常放電現象を有効に
抑制することに成功したちのである。The abnormal discharge phenomenon during sputtering is caused by secondary electrons being emitted from the target when argon ions collide with the target, and positive charges accumulating within the target. The present invention prevents the accumulation of charges by making the ITO sintered body high in density as described above, dispersing tin uniformly, and making the sintered body have good electric type conductivity. As a result, we succeeded in effectively suppressing abnormal discharge phenomena.
ITO焼結体
本発明のTTO焼結体は、実質的にインジウム、スズ及
び酸素から成るものであり、InJ)3−3nL系のも
のである。この組成自体は公知のITO焼結体と同様で
あり、一般に、スズの平均組成が4〜12重量96てあ
り、インジウムの平均組成か70〜78重量96の範囲
にある。ITO Sintered Body The TTO sintered body of the present invention consists essentially of indium, tin, and oxygen, and is of the InJ)3-3nL type. The composition itself is the same as that of a known ITO sintered body, and generally the average composition of tin is 4 to 12% by weight, and the average composition of indium is in the range of 70 to 78% by weight.
本発明のIT○焼結体においては、まず相対密度か80
%以上、好ましくは8596以上の範囲にあることか重
要である。この相対密度が80%よりも低い場合には、
部分的に密度かかなり低い部分か存在するようになって
局所的に電荷が蓄積し易い部分が形成され、異常放電を
発生し易くなる。In the IT○ sintered body of the present invention, first, the relative density is 80
% or more, preferably in the range of 8596 or more. If this relative density is lower than 80%,
There are some parts where the density is quite low, forming parts where electric charges are likely to accumulate locally, making it easy to generate abnormal discharge.
また本発明において、電子線マイクロアナライザーの線
分析におけるスズ組成のバラツキ範囲が、平均組成の0
.8〜1.2倍の範囲内にあることも重要である。例え
ば、上記線分析におけるスズ組成のバラツキ範囲か上記
範囲外となるような場合には、スズ量が集中的にかなり
多量に存在する部分があることを意味する。このように
多量のスズ量が集中する部分においては導電性か低く、
この結果として電荷が蓄積し易(なり、異常放電を発生
し易くなるのである。本発明においては、スズが焼結体
全体にわたって均一に分散しており、スズが局所的に集
中する部分がないために、局所的な電荷の蓄積が有効に
回避され、異常放電を有効に抑制することが可能となる
。In addition, in the present invention, the range of variation in tin composition in line analysis with an electron beam microanalyzer is 0.
.. It is also important that it be within the range of 8 to 1.2 times. For example, if the variation in the tin composition in the above-mentioned line analysis falls outside the above-mentioned range, it means that there is a portion where the amount of tin is concentrated and considerably large. In areas where a large amount of tin is concentrated, the conductivity is low,
As a result, electric charges tend to accumulate (and abnormal discharges tend to occur).In the present invention, tin is uniformly dispersed throughout the sintered body, and there are no areas where tin is locally concentrated. Therefore, local charge accumulation can be effectively avoided, and abnormal discharge can be effectively suppressed.
さらに本発明によれば、焼結体の表面抵抗値は、1mΩ
/ cnr以下とされる。この表面抵抗値が1mΩ/
crdよりも大きければ、その焼結体自体が電荷の蓄積
を生じ易いものであるため、異常放電を有効に抑制する
ことが困難となる。Furthermore, according to the present invention, the surface resistance value of the sintered body is 1 mΩ.
/ cnr or less. This surface resistance value is 1mΩ/
If it is larger than crd, the sintered body itself tends to accumulate charge, making it difficult to effectively suppress abnormal discharge.
TTO焼結体の製造
上述した組成及び物性を有するTTO焼結体は、−殻内
に言って、次の2つの方法によって製造することかでき
る。Manufacture of TTO sintered body A TTO sintered body having the above-mentioned composition and physical properties can be manufactured by the following two methods.
第1の方法は、平均粒径か0.1μm以下のIn2(L
+粉末と平均粒径か1μm以下の5n02粉末とを、充
分に混合した後に、1350°C以上、好ましくは14
00〜1500°Cの温度て均質化処理を行い、該処理
が行われた粉末を用いて、500〜1000℃の温度で
加圧下の焼結(ホットプレスまたは熱間静水圧プレス)
を行う方法である。この第1の方法における特に重要な
工程は均質化処理工程てあり、上記温度範囲において均
質化処理を行うことによって5n02の凝集が生じるの
が有効に防止され、前述した線分析におけるスズ組成の
バラツキを一定の範囲に調整することが可能となるので
ある。The first method is In2(L) with an average particle size of 0.1 μm or less.
After thoroughly mixing the + powder and 5n02 powder with an average particle size of 1 μm or less, heat the mixture at 1350°C or higher, preferably at 14°C.
Homogenization treatment is carried out at a temperature of 00 to 1500°C, and the treated powder is sintered under pressure at a temperature of 500 to 1000°C (hot press or hot isostatic pressing).
This is the way to do it. A particularly important step in this first method is the homogenization treatment step, and by performing the homogenization treatment in the above temperature range, agglomeration of 5n02 is effectively prevented, and the variation in tin composition in the line analysis mentioned above is prevented. can be adjusted within a certain range.
第2の方法は、上記と同様のIn2O3粉末と5n02
粉末を充分に混合・粉砕して、平均粒径か0.07μm
以下となるように微粒子化を行なって焼結性を高めた後
に、好ましくは1000〜1200°Cの温度で固溶化
処理を行い、その粉末を用いてプレス成形を行い、次い
で1350°C以上、好ましくは1400〜1550°
Cの温度で焼結を行い、その後、無酸素雰囲気中(例え
ば、アルゴン、窒素等の不活性ガス中あるいは真空中)
において、1000〜l300°Cの温度て熱処理を行
う方法である。この第2の方法における重要な工程は微
粒子化工程であり、このような微粒子化処理を行うこと
によって、5n02の凝集が生じるのが有効に防止され
、前述した線分析におけるスズ組成のバラツキを一定の
範囲に調整することが可能となる。また上記の熱処理工
程は、表面抵抗値の低下のために行う処理である。The second method uses the same In2O3 powder as above and 5n02
Thoroughly mix and crush the powder to obtain an average particle size of 0.07 μm.
After improving the sinterability by micronizing the particles as shown below, solution treatment is preferably performed at a temperature of 1000 to 1200°C, press molding is performed using the powder, and then 1350°C or higher, Preferably 1400-1550°
Sintering is performed at a temperature of
In this method, heat treatment is performed at a temperature of 1000 to 1300°C. An important step in this second method is the atomization step, and by performing such a micronization treatment, agglomeration of 5n02 is effectively prevented, and the variation in tin composition in the line analysis mentioned above is kept constant. It is possible to adjust within the range of . Further, the above-mentioned heat treatment step is a treatment performed to reduce the surface resistance value.
以上の方法によって製造される焼結体は、相対密度、電
子線マイクロアナライザーの線分析におけるスズ組成の
バラツキ範囲、及び表面抵抗値が、前述した範囲内にあ
り、これにより異常放電を有効に抑制することが可能と
なる。The sintered body manufactured by the above method has a relative density, a variation range of tin composition in line analysis using an electron beam microanalyzer, and a surface resistance value within the above-mentioned ranges, which effectively suppresses abnormal discharge. It becomes possible to do so.
本発明の優れた効果を次の例で説明する。The excellent effects of the present invention will be explained with the following example.
(実施例)
実施例1
平均粒径0.07μmの酸化インジウム(In203)
粉末と、平均粒径0.5μmの酸化スズ(SnO□)粉
末とを使用し、その組成比か(In203)9o(Sn
O□)+o となるように両者を配合した。(Example) Example 1 Indium oxide (In203) with an average particle size of 0.07 μm
powder and tin oxide (SnO□) powder with an average particle size of 0.5 μm, and the composition ratio was
Both were blended so that O□)+o.
次いて、これに1重量%のパラフィンワックスバインダ
ー及び純水を加えた後、10mm径のジルコニアボール
を用いて24時間ボールミル混合を行った。Next, 1% by weight of paraffin wax binder and pure water were added thereto, and then ball mill mixing was performed for 24 hours using 10 mm diameter zirconia balls.
この混合粉末を乾燥した後、大気中にて1400°Cて
5時間保持し、均質化を行った。次いて室温に冷却後、
クラファイト型に充填し、真空中で800°Cにて0.
2 ton/ciの圧力てホットプレスを行い、75m
m径X5mm厚の円板状の焼結体(ターゲラI−)を得
た。After drying this mixed powder, it was held at 1400°C in the air for 5 hours to homogenize it. Then, after cooling to room temperature,
Filled into a graphite mold and heated at 800°C in vacuum to 0.
Hot press at 2 ton/ci pressure, 75 m
A disc-shaped sintered body (Tagela I-) with a diameter of m and a thickness of 5 mm was obtained.
得られた焼結体の密度及び四探針法により測定した表面
抵抗値を第1表に示す。Table 1 shows the density of the obtained sintered body and the surface resistance value measured by the four-probe method.
また」1記焼結体の断面を研磨した後、ビーム径1μm
のEPMA線分析て50μmの長さにわたってスズのバ
ラツキを調べた結果、スズ組成は、7.1重量%から8
.5重量%の間でばらついた。尚、化学分析による平均
スズ組成は7.9重量%であった。In addition, after polishing the cross section of the sintered body described in 1., the beam diameter was 1 μm.
As a result of examining the variation in tin over a length of 50 μm using EPMA line analysis of
.. It varied between 5% by weight. The average tin composition determined by chemical analysis was 7.9% by weight.
また上記焼結体をスパッタリング用ターゲット利として
使用し、DCマグネトロンスパッタ法により16時間の
連続スパッタを行い、1分間当たりに発生した異常放電
の回数を第1表に示した。また16時間経過後の表面状
態の観察結果、並びに16時間スパッタ後の成膜速度の
、1時間スパッタ後の成膜速度に対する変化の割合を、
併せて第1表に示した。Further, using the above sintered body as a sputtering target, continuous sputtering was performed for 16 hours by DC magnetron sputtering, and Table 1 shows the number of abnormal discharges that occurred per minute. In addition, the observation results of the surface state after 16 hours and the rate of change in the film formation rate after 16 hours of sputtering with respect to the film formation rate after 1 hour of sputtering were determined.
They are also shown in Table 1.
実施例2
インジウム及びスズの合金より製造したスズ固溶インジ
ウム酸化物粉末に、バインダー及び純水を加えた後、1
0mm径のジルコニアボールを用いて24時間ボールミ
ル混合を行った。得られた粉末の粒径をベット法により
測定した結果、0.05μmであった。Example 2 After adding a binder and pure water to tin solid solution indium oxide powder manufactured from an alloy of indium and tin, 1
Ball mill mixing was performed for 24 hours using zirconia balls with a diameter of 0 mm. The particle size of the obtained powder was measured by the BET method and was found to be 0.05 μm.
この粉末を乾燥した後に造粒を行い、3 ton/cn
rの圧力て75ffII[l径X5mm厚の円板状にプ
レス成形し、次いて酸素雰囲気中で1550°Cにて5
時間保持し焼結させた。その後、アルゴン中、1250
°Cにて3時間熱処理を行い、表面抵抗値の低下処理を
行った。After drying this powder, it is granulated to produce 3 ton/cn.
It was press-formed into a disk shape with a diameter of 75 mm and a thickness of 5 mm at a pressure of r, and then heated at 1550 °C in an oxygen atmosphere for 5
It was held for a time and sintered. Then in argon, 1250
A heat treatment was performed at °C for 3 hours to reduce the surface resistance value.
この焼結体について、実施例1と同様の方法でスズ組成
のバラツキを調べたところ、スズ組成は7.0重量%か
ら8.9重量%の間でばらついた。尚、化学分析による
平均スズ組成は、7.9重量%てあった。When this sintered body was examined for variations in tin composition in the same manner as in Example 1, the tin composition varied between 7.0% by weight and 8.9% by weight. The average tin composition determined by chemical analysis was 7.9% by weight.
また上記焼結体の密度、表面抵抗値、及び実施例1と同
様の方法で行ったスパッタリング試験の結果を第1表に
示す。Table 1 also shows the density and surface resistance of the sintered body, and the results of a sputtering test conducted in the same manner as in Example 1.
比較例1
均質化処理を行わない以外は実施例■と同様の方法で配
合及び混合を行って得られた粉末を、乾燥し、2ton
/cnfの圧力でプレス成形し、次いて酸素雰囲気中で
1550 ’Cにて5時間保持し、75+n+n径×5
mm厚の円板状焼結体を得た。Comparative Example 1 Powder obtained by blending and mixing in the same manner as in Example ① except that homogenization treatment was not performed was dried and 2 tons
/cnf pressure, then held at 1550'C in an oxygen atmosphere for 5 hours to form a 75+n+n diameter x 5
A disk-shaped sintered body with a thickness of mm was obtained.
この焼結体の各種性状の測定及びスパッタリング試験を
実施例1と同様に行い、その結果を第1表に示した。Various properties of this sintered body were measured and sputtering tests were conducted in the same manner as in Example 1, and the results are shown in Table 1.
比較例2
実施例1で用いたのと同様の各粉末を、実施例1と同じ
組成に配合し、■−ブレンダーを用いて60分間混合し
た後、これをグラファイト型に充填し、真空中で800
℃にて0.2 ton/c&の圧力でホットプレスを行
い、75mm径X5mm厚の円板状の焼結体(ターゲッ
ト)を得た。Comparative Example 2 Each powder similar to that used in Example 1 was blended with the same composition as in Example 1, mixed for 60 minutes using a ■-blender, and then filled into a graphite mold and heated in a vacuum. 800
Hot pressing was performed at a temperature of 0.2 ton/c&, to obtain a disk-shaped sintered body (target) with a diameter of 75 mm and a thickness of 5 mm.
この焼結体の各種性状の測定及びスパッタリング試験を
実施例1と同様に行い、その結果を第1表に示した。Various properties of this sintered body were measured and sputtering tests were conducted in the same manner as in Example 1, and the results are shown in Table 1.
(発明の効果)
本発明によれば、スパッタリング中の異常放電回数が極
めて少なく、また長時間使用後においても、表面黒化の
生じないITOターゲットを提供することができる。(Effects of the Invention) According to the present invention, it is possible to provide an ITO target that has an extremely small number of abnormal discharges during sputtering and does not cause surface blackening even after long-term use.
Claims (1)
対密度が80%以上であるITO焼結体において、電子
線マイクロアナライザーの線分析におけるスズ組成が、
平均組成の0.8〜1.2倍の範囲内にあり、且つ、表
面抵抗値が1mΩ/cm^2以下であるITO焼結体。(1) In an ITO sintered body that consists essentially of indium, tin, and oxygen and has a relative density of 80% or more, the tin composition in line analysis with an electron beam microanalyzer is
An ITO sintered body having a surface resistance value within a range of 0.8 to 1.2 times the average composition and a surface resistance value of 1 mΩ/cm^2 or less.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2160099A JPH0779005B2 (en) | 1990-06-19 | 1990-06-19 | ITO sintered body and manufacturing method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2160099A JPH0779005B2 (en) | 1990-06-19 | 1990-06-19 | ITO sintered body and manufacturing method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0451409A true JPH0451409A (en) | 1992-02-19 |
| JPH0779005B2 JPH0779005B2 (en) | 1995-08-23 |
Family
ID=15707831
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2160099A Expired - Lifetime JPH0779005B2 (en) | 1990-06-19 | 1990-06-19 | ITO sintered body and manufacturing method thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0779005B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002038261A (en) * | 2000-07-26 | 2002-02-06 | Toshiba Corp | Sputtering target and method for manufacturing the same |
| JP2007103712A (en) * | 2005-10-05 | 2007-04-19 | Arima Optoelectronics Corp | High-brightness GaN-based light-emitting diode |
| CN114853467A (en) * | 2022-05-24 | 2022-08-05 | 先导薄膜材料(广东)有限公司 | ITO (indium tin oxide) planar target material and preparation method thereof |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6212009A (en) * | 1985-07-09 | 1987-01-21 | 昭和電工株式会社 | Formation of indium oxide based low resistance transparent thin film |
| JPS6221751A (en) * | 1985-07-22 | 1987-01-30 | 昭和電工株式会社 | In2o3-sno2 sintered body and manufacture |
| JPS63161161A (en) * | 1986-12-23 | 1988-07-04 | Nippon Mining Co Ltd | Target made al-si alloy and its production |
| JPH01290551A (en) * | 1988-05-16 | 1989-11-22 | Tosoh Corp | Production of target for sputtering to be used for production of transparent electroconductive film |
| JPH02115326A (en) * | 1988-10-21 | 1990-04-27 | Mitsubishi Metal Corp | Manufacture of sintered compact of indium-tin oxide having superior electric conductivity |
| JPH03207858A (en) * | 1990-01-08 | 1991-09-11 | Nippon Mining Co Ltd | Production of ito sputtering target |
-
1990
- 1990-06-19 JP JP2160099A patent/JPH0779005B2/en not_active Expired - Lifetime
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6212009A (en) * | 1985-07-09 | 1987-01-21 | 昭和電工株式会社 | Formation of indium oxide based low resistance transparent thin film |
| JPS6221751A (en) * | 1985-07-22 | 1987-01-30 | 昭和電工株式会社 | In2o3-sno2 sintered body and manufacture |
| JPS63161161A (en) * | 1986-12-23 | 1988-07-04 | Nippon Mining Co Ltd | Target made al-si alloy and its production |
| JPH01290551A (en) * | 1988-05-16 | 1989-11-22 | Tosoh Corp | Production of target for sputtering to be used for production of transparent electroconductive film |
| JPH02115326A (en) * | 1988-10-21 | 1990-04-27 | Mitsubishi Metal Corp | Manufacture of sintered compact of indium-tin oxide having superior electric conductivity |
| JPH03207858A (en) * | 1990-01-08 | 1991-09-11 | Nippon Mining Co Ltd | Production of ito sputtering target |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002038261A (en) * | 2000-07-26 | 2002-02-06 | Toshiba Corp | Sputtering target and method for manufacturing the same |
| JP2007103712A (en) * | 2005-10-05 | 2007-04-19 | Arima Optoelectronics Corp | High-brightness GaN-based light-emitting diode |
| CN114853467A (en) * | 2022-05-24 | 2022-08-05 | 先导薄膜材料(广东)有限公司 | ITO (indium tin oxide) planar target material and preparation method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0779005B2 (en) | 1995-08-23 |
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