JPH0451544A - Wafer container - Google Patents
Wafer containerInfo
- Publication number
- JPH0451544A JPH0451544A JP2160412A JP16041290A JPH0451544A JP H0451544 A JPH0451544 A JP H0451544A JP 2160412 A JP2160412 A JP 2160412A JP 16041290 A JP16041290 A JP 16041290A JP H0451544 A JPH0451544 A JP H0451544A
- Authority
- JP
- Japan
- Prior art keywords
- region
- air
- wafer
- area
- air filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、半導体装置の製造工程におけるウエハを保管
、搬送する際に使用されるウェハ収納器に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a wafer storage device used for storing and transporting wafers in the manufacturing process of semiconductor devices.
近年、半導体装置の高集積化に伴い、製造工程中にウェ
ハに付着するパーティクルは歩留りを低下させる大きな
要因となっている。そのため、保管、搬送時においても
パーティクルの付着を防止する必要がある。In recent years, as semiconductor devices have become highly integrated, particles adhering to wafers during the manufacturing process have become a major factor in reducing yield. Therefore, it is necessary to prevent particles from adhering even during storage and transportation.
半導体装置の製造工程中において、ウェハは多数枚ずつ
キャリヤに保持されて搬送される。搬送は工程間搬送と
工程内搬送かあり、工程間搬送では、キャリヤは充分な
空気清浄度か確保された搬送用トンネル内を搬送される
が、工程内搬送ではそのキャリヤを作業者自身か各製造
装置に搬送している。この場合、ウェハは露出状態であ
り、工程内での搬送及び保管時にパーティクルか付着す
る。During the manufacturing process of semiconductor devices, a large number of wafers are held and transported by carriers. There are two types of transport: inter-process transport and intra-process transport. In inter-process transport, carriers are transported inside transport tunnels that have ensured sufficient air cleanliness, but in intra-process transport, the carriers are transported by workers themselves or by individual workers. Transported to manufacturing equipment. In this case, the wafer is exposed and particles may adhere to it during transportation and storage within the process.
そこで、ウェハを保持したキャリヤを清浄箱内に収納す
ることが知られている。第4図に、従来の清浄箱(ウェ
ハ収納器)の外観図を示す。第4図において、清浄箱5
0は、底面を開口した四角筒状に形成され、天井面にキ
ャリヤの取手を通すための孔51か形成される。背面に
はエアフィルタ52を介在させて連通ずるエア引込部5
3が設けられる。エア引込部53は、エアフィルタ室5
3a、バッテリ室53b及びエア引込み室53Cにより
構成され、エア引込み室53cはエアフィルタ室53a
とは通気孔53dにより連通される。また、エア引込み
室には天井面よりエアを引込むファン(送風機)54か
設けられ、バッテリ室53bに該ファン54を駆動する
バッテリ55か配置される。Therefore, it is known to house a carrier holding a wafer in a clean box. FIG. 4 shows an external view of a conventional clean box (wafer storage container). In Figure 4, the clean box 5
0 is formed in the shape of a rectangular cylinder with an open bottom, and a hole 51 for passing the handle of the carrier is formed in the ceiling. On the back side, there is an air intake part 5 that communicates with an air filter 52.
3 is provided. The air intake part 53 is connected to the air filter chamber 5
3a, a battery chamber 53b, and an air suction chamber 53C, and the air suction chamber 53c is an air filter chamber 53a.
is communicated with through a ventilation hole 53d. Further, a fan 54 for drawing air from the ceiling surface is provided in the air drawing room, and a battery 55 for driving the fan 54 is arranged in the battery room 53b.
そして、この清浄箱50内にウェハを保持したキャリヤ
を収納して密閉した状態で、ファン54を回転させて外
気を引込み、エアフィルタ52てろ過しながら、キャリ
ヤ内を循環させる。これにより、ウェハを清浄な雰囲気
中で保管してパーティクルの付着を防止している。Then, while the carrier holding the wafer is housed in the clean box 50 and sealed, the fan 54 is rotated to draw in outside air, and the air is circulated inside the carrier while being filtered by the air filter 52. This allows the wafer to be stored in a clean atmosphere and prevents particles from adhering to it.
ところで、ウェハにパーティクルが付着するのを防止す
るためには、キャリヤ内の全域に均一な0.3m/s以
上の風速で層流をウェハに当てる必要かある。By the way, in order to prevent particles from adhering to the wafer, it is necessary to apply a laminar flow to the wafer uniformly over the entire area inside the carrier at a wind speed of 0.3 m/s or more.
しかし、ウニハロ径か比較的小さい場合には送風面積も
小さく定格の風速が得られるが、ウェハの大口径化に伴
いキャリヤの拡大により送風面積か大きくなると定格の
風速が得られない。そのため、外気の引込み量を多くす
る方法として、ファンを複数個にすることが考えられる
が、風量を得ることかできてもエアフィルタ面の全域、
ひいてはキャリヤ内の全域に均一な風速を得ることが困
難であるという問題がある。However, when the diameter of the sea urchin harrow is relatively small, the blown area is also small and the rated wind speed can be obtained, but if the blown area increases due to the enlargement of the carrier as the diameter of the wafer increases, the rated wind speed cannot be obtained. Therefore, one way to increase the amount of outside air drawn in is to use multiple fans, but even if it is possible to obtain a large amount of air, the entire area of the air filter surface
Furthermore, there is a problem in that it is difficult to obtain a uniform wind speed over the entire area within the carrier.
そこで、本発明は上記課題に鑑みなされたもので、エア
フィルタ面の全域で均一な定格以上の風速が得られ、大
口径のウェハへのパーティクルの付着を防止するウェハ
収納器を提供することを目的とする。SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and an object thereof is to provide a wafer storage device that can obtain a uniform air velocity exceeding the rated value over the entire air filter surface and prevent particles from adhering to large-diameter wafers. purpose.
上記課題は、複数のウェハを並列に保持するキャリヤを
収納領域部に収納し、該収納領域部とエアフィルタを介
して連通される外気領域部に、複数の送風機で外気を引
込み、該収納領域部のウェハに該エアフィルタでろ過し
たエアを送風するウェハ収納器において、前記外気領域
部に、前記送風機で引込まれた外気を前記エアフィルタ
の全面で均一に所定風速で配分する所定数の拡散板を設
けることにより解決される。The above problem is solved by storing a carrier that holds a plurality of wafers in parallel in a storage area, drawing outside air using a plurality of blowers into an outside air area that communicates with the storage area through an air filter, and In the wafer storage device that blows air filtered by the air filter to the wafers in the air filter, a predetermined number of diffusers are provided to uniformly distribute the outside air drawn in by the blower to the outside air area at a predetermined wind speed over the entire surface of the air filter. This problem can be solved by providing a board.
上述のように、複数の送風機で引込まれた外気を、外気
領域部に設けられた所定数の拡散板により、エアフィル
タの全面で均一に所定風速で配分する。すなわち、エア
フィルタの全面において均一に所定風速で通過するろ過
されたエアが収納領域部内のウェハに送風される。As described above, the outside air drawn in by the plurality of blowers is distributed uniformly over the entire surface of the air filter at a predetermined wind speed by a predetermined number of diffusion plates provided in the outside air area. That is, filtered air that passes uniformly over the entire surface of the air filter at a predetermined speed is blown onto the wafers within the storage area.
これにより、ウェハか大口径化された結果として収納領
域部が拡大されても、常に定格以上の風速の層流を該収
納領域部の全域で均一に得られ、ウェハにパーティクル
の付着を防止することか可能となる。As a result, even if the storage area is expanded as a result of increasing the diameter of the wafer, a laminar flow with a wind speed higher than the rated value can be obtained uniformly throughout the storage area, thereby preventing particles from adhering to the wafer. It becomes possible.
第1図に本発明の一実施例の構成図を示す。第1図にお
いて、ウェハ収納器1は収納領域部1a。FIG. 1 shows a configuration diagram of an embodiment of the present invention. In FIG. 1, the wafer storage device 1 has a storage area portion 1a.
外気領域部1b及び引込み領域部1cより構成される。It is composed of an outside air area portion 1b and a drawing area portion 1c.
収納領域部1aは、底面が開口されている。The storage area portion 1a has an open bottom surface.
また、天井面には孔2a、2bか形成され、該孔2a、
2b間は図示しないが二重構造に形成される。この二重
構造の天井面の下板部分には後述するキャリヤ(第3図
参照)の取手を貫通する孔が形成されている。そして、
収納領域1aの側面には電圧の供給及び充電のための電
極3が設けられる。Further, holes 2a and 2b are formed in the ceiling surface, and the holes 2a,
Although not shown, the space between 2b is formed into a double structure. A hole is formed in the lower plate portion of the ceiling surface of this double structure to pass through a handle of a carrier (see FIG. 3), which will be described later. and,
Electrodes 3 for voltage supply and charging are provided on the side surface of the storage area 1a.
外気領域部1bは、収納領域部1aの前記対向面とエア
フィルタ4を介して連通される。ここで、エア7、(ル
タ4は、例えばHE P A (High Effci
ency Particu1ate Air−filt
er )フィルタやULPA (Ultra low
Pexetration Air−filter)フィ
ルタ等が使用される。また、外気領域部1b内の背面に
は2つの拡散板5a、5b(後述する)か設けられる。The outside air area 1b is communicated with the opposing surface of the storage area 1a via the air filter 4. Here, the air 7 and router 4 are, for example, HEPA (High Effci
ency Particulate Air-filt
er) filters and ULPA (Ultra low
Pexetration Air-filter) filter, etc. are used. Furthermore, two diffusion plates 5a and 5b (described later) are provided on the back surface in the outside air area 1b.
一方、引込み領域部1cは外気領域部1b上に設けられ
ており、対向する両側面にそれぞれ送風機(ファン)6
a、6bが設けられて外気を引込む。このファン6a、
6bは、収納領域部1aの上部に内設されたバッテリ7
a、7bにより駆動され、バッテリ7a、7bは電極3
に接続される。On the other hand, the drawing-in area 1c is provided on the outside air area 1b, and blowers (fans) 6 are provided on both opposing sides.
a and 6b are provided to draw outside air. This fan 6a,
6b is a battery 7 installed inside the upper part of the storage area 1a.
a, 7b, and the batteries 7a, 7b are connected to the electrodes 3
connected to.
ここで、第2図に上記拡散板5a、5bの構成図を示す
。第2図(A)(B)において、拡散板5a、5bは、
外気領域部1bの背面の上方より中央にかけて逆「ハ」
の字状に設けられる。また、その厚さは、外気領域部1
bのうち、エアフィルタ4の位置する残りの領域におけ
る奥行きの1/2〜1/3に設定される。Here, FIG. 2 shows a configuration diagram of the diffusion plates 5a and 5b. In FIGS. 2(A) and 2(B), the diffusion plates 5a and 5b are
From the upper part of the back of the outside air area 1b to the center, there is an inverted "ha" shape
It is set up in the shape of a square. In addition, the thickness of the outside air area 1
b is set to 1/2 to 1/3 of the depth of the remaining area where the air filter 4 is located.
ところで、ウェハの大型化(例えば8インチ、10イン
チ)によって収納領域部1aの容積が拡大し、2つの送
風機6a、6bにより側面から外気を引込むと、拡散板
5a、5bを設けない場合には、エアフィルタ4の面上
で中心部の風速が極端に低下する。そこで、上述のよう
に拡散板5a。By the way, when the volume of the storage area 1a increases as the size of the wafer increases (e.g. 8 inches, 10 inches), and the outside air is drawn in from the sides by the two blowers 6a and 6b, when the diffusion plates 5a and 5b are not provided, , the wind speed at the center of the surface of the air filter 4 is extremely reduced. Therefore, as described above, the diffusion plate 5a is used.
5bを逆「ハ」の字状に設けることにより、中心部の風
速の低下を防止し、エアフィルタ4の全面で風速か均一
化される。By providing 5b in an inverted "V" shape, the wind speed at the center is prevented from decreasing and the wind speed is made uniform over the entire surface of the air filter 4.
従って、例えばファン6a、6bの送入口を引込み領域
部1cの上面に設けた場合等のように、外気領域部1b
内の層流か変化する場合には、これに応じて拡散板5a
、5bの取付は角度や位置、個数、形状等を適宜設定す
れば足りる。Therefore, for example, when the inlets of the fans 6a and 6b are provided on the upper surface of the drawing area 1c, the outside air area 1b
When the laminar flow inside changes, the diffuser plate 5a changes accordingly.
, 5b can be installed by appropriately setting the angle, position, number, shape, etc.
このようなウェハ収納器1に収納されるキャリヤを第3
図に示す。第3図において、キャリヤ10は、対向する
二側面が開口された箱型のもので、ウェハを出入れする
開口部10aには係止部11a、l1bが形成され、対
向する開口部lObには延出部12a、12bが形成さ
れる。また、キャリヤIOの天井面には運搬のための取
手13が設けられている。一方、キャリヤ10の対向す
る内側面には支持溝14か多数形成され、該支持溝14
に多数枚のウェハ(例えば8インチ)か並列に支持され
る。なお、底部は下方へ開口される。The carriers stored in such a wafer storage container 1 are
As shown in the figure. In FIG. 3, the carrier 10 is box-shaped with openings on two opposing sides, and the opening 10a through which the wafer is taken in and out is formed with locking parts 11a and l1b, and the opposing opening lOb is formed with locking parts 11a and l1b. Extending portions 12a and 12b are formed. Furthermore, a handle 13 for transportation is provided on the ceiling surface of the carrier IO. On the other hand, a large number of support grooves 14 are formed on the opposing inner surfaces of the carrier 10.
A large number of wafers (for example, 8 inches) are supported in parallel. Note that the bottom portion is opened downward.
多数枚のウェハか保持されたキャリヤ10は、ウェハ収
納器1の底面から収納される。すなわち、キャリヤlO
の取手13は孔2a、2b間の前述のような二重構造の
天井面の下板部分に形成された孔を貫通し、この取手1
3の両方を持つことによりキャリヤ10及びウェハ収、
結語1の両方を運搬可能としている。また、キャリヤl
Oの開口部10aの係止部11bは収納時のストッパで
あり、開口部10bの延出部12a、12b間で前述の
エアフィルタ4を位置させるものである。A carrier 10 holding a large number of wafers is stored from the bottom of the wafer storage container 1. That is, the carrier lO
The handle 13 passes through a hole formed in the lower plate part of the ceiling surface of the double structure as described above between the holes 2a and 2b.
By having both the carrier 10 and wafer storage,
Both of Conclusion 1 are transportable. Also, the carrier
The locking portion 11b of the opening 10a of O is a stopper during storage, and is used to position the above-mentioned air filter 4 between the extending portions 12a and 12b of the opening 10b.
この場合、ファン6a、6bを駆動させ、エアフィルタ
4の全面で均一に所定風速で配分されることで、キャリ
ヤ10内のウェハにはエアフィルタ4でろ過したエアか
均一に定格以上で送風することができ、ウェハへのパー
ティクルの付着を防止することができる。従って、ウェ
ハ収納器lが大型化した場合に、均一な送風を得るため
に外気領域部1bの形状を大きく変化させる必要がなく
なる。In this case, by driving the fans 6a and 6b and uniformly distributing air at a predetermined speed over the entire surface of the air filter 4, the air filtered by the air filter 4 is evenly blown to the wafer in the carrier 10 at a rate higher than the rated value. This makes it possible to prevent particles from adhering to the wafer. Therefore, when the wafer storage container 1 increases in size, there is no need to greatly change the shape of the outside air region 1b in order to obtain uniform air blowing.
例えば、エアフィルタ4にULPAフィルタを使用した
場合に、0.1m四方でパーティクルか99、999%
カットすることかでき、ウェハ上で0.35m/sの定
格以上の風速が得られる。For example, if a ULPA filter is used as the air filter 4, particles will be 99,999% in a 0.1 m square area.
It is possible to cut the wafer, and a wind speed exceeding the rated value of 0.35 m/s can be obtained on the wafer.
以上のように本発明によれば、外気領域部に所定数の拡
散板を設けることにより、エアフィルタの全面で均一に
所定風速で配分し、キャリヤ内に均一な定格以上の風速
で層流を当てることでウェハへのパーティクルの付着を
防止することかでき、製品の歩留りを向上させることか
できる。As described above, according to the present invention, by providing a predetermined number of diffusion plates in the outside air area, the air is uniformly distributed over the entire surface of the air filter at a predetermined speed, and a laminar flow is created uniformly within the carrier at a wind speed higher than the rated value. This can prevent particles from adhering to the wafer and can improve product yield.
第1図は本発明の一実施例の構成図、
第2図は本発明の拡散板を示した構成図、第3図はウェ
ハ収納器に収納されるキャリヤの斜視図、
第4図は従来のウェハ収納器の外観図である。
図において、
lはウェハ収納器、
1aは収納領域部、
1bは外気領域部、
1cは引込み領域部、
2a、2bは孔、
3は電極、
4はエアフィルタ、
5a、5bは拡散板、
6a、6bは送風機(ファン)、
7a、7bはバッテリ
を示す。Fig. 1 is a block diagram of an embodiment of the present invention, Fig. 2 is a block diagram showing a diffusion plate of the present invention, Fig. 3 is a perspective view of a carrier stored in a wafer storage container, and Fig. 4 is a conventional FIG. 2 is an external view of a wafer storage device. In the figure, l is a wafer storage container, 1a is a storage area, 1b is an outside air area, 1c is a drawing area, 2a and 2b are holes, 3 is an electrode, 4 is an air filter, 5a and 5b are diffusion plates, and 6a , 6b is a blower (fan), and 7a and 7b are batteries.
Claims (1)
(1a)に収納し、該収納領域部(1a)とエアフィル
タ(4)を介して連通される外気領域部(1b)に、複
数の送風機(6a、6b)で外気を引込み、該収納領域
部のウェハに該エアフィルタ(4)でろ過したエアを送
風するウェハ収納器において、 前記外気領域部(1a)に、前記送風機(6a、6b)
で引込まれた外気を前記エアフィルタ(4)の全面で均
一に所定風速で配分する所定数の拡散板(5a、5b)
を設けることを特徴とするウェハ収納器。[Claims] A carrier holding a plurality of wafers in parallel is stored in a storage area (1a), and an outside air area (1b) is communicated with the storage area (1a) via an air filter (4). ), in a wafer storage device that draws outside air using a plurality of blowers (6a, 6b) and blows air filtered by the air filter (4) to the wafers in the storage area, the outside air area (1a) having: The blower (6a, 6b)
a predetermined number of diffusion plates (5a, 5b) that distribute the outside air drawn in uniformly over the entire surface of the air filter (4) at a predetermined wind speed;
A wafer storage device characterized by being provided with.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2160412A JPH0451544A (en) | 1990-06-19 | 1990-06-19 | Wafer container |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2160412A JPH0451544A (en) | 1990-06-19 | 1990-06-19 | Wafer container |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0451544A true JPH0451544A (en) | 1992-02-20 |
Family
ID=15714378
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2160412A Pending JPH0451544A (en) | 1990-06-19 | 1990-06-19 | Wafer container |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0451544A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6364922B1 (en) | 1999-07-06 | 2002-04-02 | Ebara Corporation | Substrate transport container |
| US6521007B1 (en) | 1997-12-03 | 2003-02-18 | Ebara Corporation | Clean box |
| JP2016225352A (en) * | 2015-05-27 | 2016-12-28 | 信越ポリマー株式会社 | Substrate storage container |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62269334A (en) * | 1986-05-19 | 1987-11-21 | Fujitsu Ltd | Wafer carrier |
-
1990
- 1990-06-19 JP JP2160412A patent/JPH0451544A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62269334A (en) * | 1986-05-19 | 1987-11-21 | Fujitsu Ltd | Wafer carrier |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6521007B1 (en) | 1997-12-03 | 2003-02-18 | Ebara Corporation | Clean box |
| US6364922B1 (en) | 1999-07-06 | 2002-04-02 | Ebara Corporation | Substrate transport container |
| JP2016225352A (en) * | 2015-05-27 | 2016-12-28 | 信越ポリマー株式会社 | Substrate storage container |
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