JPH0453401B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Application] The present invention relates to a thermal imaging device, and in particular to a thermal imaging device in which radiation from a scanning position sensor passes only through a beam path perpendicular to the normal to the scanning mirror in its rest position. In particular, but not limited to thermal imaging devices.

[Prior Art] This invention is disclosed in German Patent Application No. 3329590.5,
That is, it is an improvement on the thermal imaging device described in US Patent Application No. 641,525. In this conventional thermal imaging device, it is stated that the operating axis for the sensor in the scanning position must be aligned perpendicularly to the scanning mirror in the resting position of the thermal imaging device.

SUMMARY OF THE INVENTION For structural reasons, conventional vertical devices are not compatible with all thermal imaging devices. In order to solve this problem, according to the present invention, a scanning sensor is used which forms a beam path with a varying angle to the scanning position sensor placed at a position approximately 90° different from the conventional scanning sensor. This is important compared to other thermal imaging devices. In conventional thermal imaging devices, the angle between the scanning mirror and the sensor must be perpendicular or within an angle of 89-91 degrees. According to this invention, the angle formed by the beam path can be made substantially free.

[Example] Hereinafter, one implementation of the present invention will be described based on the drawings.

FIG. 1 shows a thermal imaging device employing the principle of thermal imaging in which radiation is incident on an infrared telescope 1 of the device. Radiation 13 not focused by infrared telescope 1
is transmitted by a scanning mirror 2, which in its rest position is arranged at a rest position of 45° to the incident beam of radiation 13 and to the infrared objective 3 orthogonal to this incident beam. The detector array 4 employs an electro-optical converter that simultaneously activates a light emitting diode array 6, which is arranged in accordance with the detector array 4. The visible optical collimator of the scanning mirror 2 A dichroic beam splitter 8 is arranged on the side.The light-emitting diode array 6 is scanned via the objective lens 5 on the visible optical collimator side of the scanning mirror 2.By means of an imaging optical system 9, the image is The beam is transmitted to an observer 11 via a dichroic beam splitter 8.A scanning position sensor 12 is disposed on the visible optical collimator side of the scanning mirror 2, and this scanning position sensor 12 includes a light source 12a and a detector 12.
b, and the light source 12a and detector 12b are arranged above the beam splitter 12d at the image plane of the collimator objective lens 12c. Using this scanning position sensor 12, a trigger signal is emitted when automatic collimation with the scanning mirror 2 is carried out.

In FIG. 2, the zero position of the scanning mirror 2 is shown enlarged by a solid line, and furthermore, the deflection in the position direction of the scanning mirror 2 and the deflection in the other direction are shown by broken lines. For example, to determine the zero position, an objective lens 5 placed between the scanning mirror 2 and the light emitting diode array 6 in FIG. and is transmitted to the observer 11 via a plane plate 7 which acts as a beam splitter. Approximately 560n due to this flat plate 7
m wavelength (green light) is reflected, and approximately 670 nm
wavelength (red light) is transmitted.

The light source 12a of the scanning position sensor 12 is a light emitting diode. Detector 12b is a phototransistor. A beam splitter 12d placed between the light source 12a and the detector 12b splits the energy in a 1:1 ratio. Light source 12a and beam splitter 12d operate in a wavelength range of 560 nm.
A dichroic beam splitter 8 arranged between the optical collimator side of the scanning mirror 2 and the imaging optical system 9 allows the light emitting diode array 6 to be
Radiation with a wavelength of 670 nm emitted from the
And by the dichroic beam splitter 8,
Wavelength 560n emitted from scanning position sensor 12
m radiation 15 is reflected. That is, radiation from the light emitting diode array 6 is transmitted to the observer 11. However, the radiation generated from the light source 12a is transmitted to the dichroic beam splitter 8, the beam splitter 12d and the collimator objective lens 12.
transmitted via c. The radiation is reflected by 90° by the dichroic beam splitter 8 and is transmitted to the plane plate 7 via the optical collimator side of the scanning mirror 2. Furthermore, the radiation is transmitted onto the detector 12b by a scanning mirror 2, a dichroic beam splitter 8, and a collimator objective lens 1.
2a and a beam splitter 12d. Furthermore, radiation of other wavelength ranges can be used within the scope of this invention. Such operating wavelengths are easily adjusted by varying the use of light source 12a, detector 12b, and beam splitter 12d.

When the scanning mirror 2 is in the zero position, the radiation 15 emitted by the light source 12a is automatically imaged onto the detector 12b in parallel rays.
The signal of this detector 12b indicates the state of a given scanning mirror 2 in position. If an aperture or slit diaphragm of a corresponding size is arranged in front of the detector 12b, the angle of the position of the scanning mirror 2 can be detected with an accuracy of seconds. The plane plate 7 is adjusted in the direction of travel of the beam of radiation and in a direction perpendicular to that direction, so that the position, position and other positions of the scanning mirror 2 are detected.

Note that this invention is not limited to the embodiments described above, and can be modified and implemented without departing from the gist of the invention.

[Brief explanation of drawings]

FIG. 1 is a schematic diagram of a thermal imaging device showing an embodiment of the present invention, and FIG. 2 is a schematic diagram of a scanning mirror shown in FIG. 1.
It is an enlarged view showing the position of the part. 1...Infrared telescope, 2...Scanning mirror, 3...
...Infrared objective lens, 4...Detector array, 6...
...Light emitting diode array, 7...Plane plate,
8...Dichroic beam splitter, 12...
...Scanning position sensor, 12a...Light source, 12b...
...Detector, 12d...Dichroic beam splitter.

Claims (1)

[Claims] 1. An infrared telescope that receives an incident beam of radiation;
a scanning mirror, an infrared objective lens, and a detector array for receiving radiation that is photoelectrically converted and displayed by a corresponding light emitting diode array, the light emitting diode array being coupled to the optical collimator side of the scanning mirror by the objective lens. a scanning position comprising a light source for emitting light that is focused and transmitted to the eyepiece via a dichroic beam splitter and further emitting light to the visible optical collimator side of the scanning mirror and a detector for detecting the radiation; In the thermal imaging device, the light-emitting diode array is provided with a sensor for scanning, and when radiation is detected by the detector, a trigger signal is generated by the sensor for scanning position. the scanning position sensor includes a light source that illuminates a flat plate through a dichroic beam splitter, and the flat plate emits radiation that is transmitted to the optical collimator side of the scanning position sensor. A thermal imaging device characterized in that the radiation is arranged to be reflected through a dichroic beam splitter that directs the radiation to the device. 2. The thermal imaging device according to claim 1, wherein the plane plate is adjustable in the direction of travel of the incident beam and in the direction perpendicular to the direction of travel of the incident beam. 3. The thermal imaging device according to claim 1, wherein the scanning position sensor has a light source and a detector arranged above the beam splitter in the image plane of the collimator objective lens. 4. The thermal imaging device according to claim 1, wherein the scanning position sensor operates in a range near visible light and infrared light. 5. The thermal imaging device according to claim 2, wherein the scanning position sensor operates in a range near visible light and infrared light. 6. The thermal imaging device according to claim 3, wherein the scanning position sensor operates in a range near visible light and infrared light. 7. The thermal imaging system of claim 1, wherein said planar plate and said dichroic beam splitter reflect relatively short wavelength radiation and transmit relatively long wavelength radiation. 8. The thermal imaging device of claim 2, wherein said planar plate and said dichroic beam splitter reflect relatively short wavelength radiation and transmit relatively long wavelength radiation. 9. The thermal imaging system of claim 3, wherein said planar plate and said dichroic beam splitter reflect relatively short wavelength radiation and transmit relatively long wavelength radiation. 10. The thermal imaging device of claim 1, wherein said planar plate and said dichroic beam splitter reflect radiation in the green range and transmit radiation in the red range. 11. The thermal imaging device of claim 2, wherein the planar plate and the dichroic beam splitter reflect radiation in the green range and transmit radiation in the red range. 12. The thermal imaging device of claim 3, wherein said planar plate and said dichroic beam splitter reflect radiation in the green range and transmit radiation in the red range. 13. The thermal imaging device according to claim 2, wherein the plane plate and the dichroic beam splitter reflect radiation with a wavelength of 560 nm and transmit radiation with a wavelength of 670 nm. 14. The thermal imaging device according to claim 3, wherein the plane plate and the dichroic beam splitter reflect radiation with a wavelength of 560 nm and transmit radiation with a wavelength of 670 nm. 15. The thermal imaging device of claim 1, wherein the scanning position sensor operates in a wavelength range of 850 to 950 nm. 16. The thermal imaging device of claim 2, wherein the scanning position sensor operates in a wavelength range of 850 to 950 nm. 17. The thermal imaging device according to claim 3, wherein the scanning position sensor operates in a wavelength range of 850 to 950 nm.