JPH0453952A - Reticle washing device - Google Patents
Reticle washing deviceInfo
- Publication number
- JPH0453952A JPH0453952A JP2163828A JP16382890A JPH0453952A JP H0453952 A JPH0453952 A JP H0453952A JP 2163828 A JP2163828 A JP 2163828A JP 16382890 A JP16382890 A JP 16382890A JP H0453952 A JPH0453952 A JP H0453952A
- Authority
- JP
- Japan
- Prior art keywords
- reticle
- distilled water
- chamber
- drying
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005406 washing Methods 0.000 title abstract 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 27
- 239000012153 distilled water Substances 0.000 claims abstract description 23
- 238000004140 cleaning Methods 0.000 claims abstract description 19
- 238000001035 drying Methods 0.000 claims abstract description 16
- 238000004519 manufacturing process Methods 0.000 claims abstract description 8
- 239000011261 inert gas Substances 0.000 claims description 6
- 239000000428 dust Substances 0.000 abstract description 7
- 239000012535 impurity Substances 0.000 abstract description 3
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 9
- 238000010586 diagram Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半導体装置製造工程中のフォトリソグラフィ工
程で使用されるレチクルの洗浄装置に関し、特に洗浄後
にレチクルを乾燥させる乾燥部の構成に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a reticle cleaning apparatus used in a photolithography process in a semiconductor device manufacturing process, and more particularly to the configuration of a drying section for drying a reticle after cleaning.
従来、この種のレチクル洗浄装置は、第2図〜第4図の
ブロック図に示すようにブラシ、ジェット、超音波等に
よる純水洗浄を行なったあとのレチクル表面の乾燥方式
として、スピンドライヤーによる遠心乾燥方式(第2図
)、IPA(イソプロピルアルコール)で置換した後の
フロン蒸気によるフロン蒸気乾燥方式(第3図)、IP
A蒸気によるIPA蒸気乾燥方式(第4図)等が行なわ
れていた。Conventionally, this type of reticle cleaning device uses a spin dryer to dry the reticle surface after cleaning with pure water using brushes, jets, ultrasonic waves, etc., as shown in the block diagrams of Figures 2 to 4. Centrifugal drying method (Figure 2), Freon vapor drying method using Freon vapor after replacing with IPA (isopropyl alcohol) (Figure 3), IP
The IPA steam drying method (Figure 4) using A steam was used.
上述した従来の方式では、レチクル周辺の雰囲気に含ま
れる微小ごみ及び洗浄液中に含まれる微小ごみで、特に
有機系のごみがレチクルの乾燥時(レチクル表面の水分
の蒸発時)に凝縮され、しみ状となってレチクル面に残
ってしまうという欠点がある。In the conventional method described above, fine dust contained in the atmosphere around the reticle and fine dust contained in the cleaning solution, especially organic dust, condenses when the reticle dries (when water on the reticle surface evaporates), causing stains. The disadvantage is that it remains on the reticle surface.
上述した従来方式によるレチクル洗浄装置に対し、本発
明は蒸溜水製造システムによって作り出された蒸溜水を
、不活性ガス雰囲気中に設置された蒸溜水シャワー槽内
でレチクル上に流し、レチクル表面を微小ごみが全くな
い蒸溜水で置換したあと自然乾燥させる乾燥部を設けた
という相違点を有する。In contrast to the conventional reticle cleaning apparatus described above, the present invention allows distilled water produced by a distilled water production system to flow over the reticle in a distilled water shower tank installed in an inert gas atmosphere, thereby cleaning the reticle surface with minute particles. The difference is that a drying section is provided in which the water is replaced with distilled water, which is completely free of dirt, and then air-dried.
本発明のレチクル洗浄装置は、乾燥部に不活性ガス雰囲
気に満たされたチャンバーと、該チャンバー内に設置さ
れた蒸溜水シャワー槽と、該チャンバー外に設けられた
蒸溜水製造システムを有している。The reticle cleaning device of the present invention includes a chamber filled with an inert gas atmosphere in a drying section, a distilled water shower tank installed in the chamber, and a distilled water production system installed outside the chamber. There is.
次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の一実施例を示すブロック、図である。FIG. 1 is a block diagram showing one embodiment of the present invention.
レチクル収納部より取り出されたレチクルは洗浄部へ送
られ、洗浄液によりブラシ、ジェット、超音波等の手段
により洗浄され、レチクル上の有機及び無機系のごみが
物理的にレチクル上から剥離され洗浄液中へ浮遊する。The reticle taken out from the reticle storage section is sent to the cleaning section, where it is cleaned with a cleaning solution using means such as brushes, jets, and ultrasonic waves. Organic and inorganic dust on the reticle is physically peeled off from the reticle and placed in the cleaning solution. Float to.
洗浄部より引き上げられたレチクルは未乾燥である為、
レチクル上に残る洗浄液中には前記ごみが浮遊している
。Since the reticle pulled up from the cleaning section is not dried,
The dust is suspended in the cleaning liquid remaining on the reticle.
次にレチクルは乾燥部へ運ばれ、ごみを全く含まない不
活性ガス3で満たされたチャンバー1内の蒸溜水シャワ
ー檜2で、蒸溜水製造システム5によって作りだされた
不純物を全く含まない蒸溜水をノズル4よりレチクル上
ヘシャワーする。レチクル表面の洗浄液を蒸溜水によっ
て置換した後にチャンバー1内で自然乾燥させ、その後
レチクル収納部へレチクルを送る。The reticle is then conveyed to the drying section, where it is exposed to a distilled water shower cylinder 2 in a chamber 1 filled with an inert gas 3 containing no dirt and distilled water produced by a distilled water production system 5 containing no impurities. Water is showered from nozzle 4 onto the reticle. After replacing the cleaning liquid on the reticle surface with distilled water, the reticle is naturally dried in the chamber 1, and then sent to the reticle storage section.
以上説明した様に本発明は、ごみを全く含まない不活性
ガス雰囲気中で、不純物を全く含まない蒸溜水によって
レチクル表面を置換したあと自然乾燥させることにより
、レチクルの乾燥時にしみ等を発生させない効果がある
。As explained above, the present invention eliminates stains and the like when drying the reticle by replacing the reticle surface with distilled water that does not contain any impurities in an inert gas atmosphere that does not contain any dust, and then allowing it to air dry. effective.
第1図は本発明の一実施例を示すブロック図、第2図〜
第4図は従来のレチクル洗浄装置を示すブロック図であ
る。
1・・・チャンバー、2・・・蒸溜水シャワー槽、3・
・・不活性ガス、4・・・蒸溜水シャワーノズル、5・
・・蒸溜水製造システム。FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG.
FIG. 4 is a block diagram showing a conventional reticle cleaning device. 1...Chamber, 2...Distilled water shower tank, 3.
...Inert gas, 4...Distilled water shower nozzle, 5.
... Distilled water production system.
Claims (1)
ル洗浄装置において、乾燥部が不活性ガス雰囲気に満た
されたチャンバーと、該チャンバー内に設けられた蒸溜
水シャワー槽と、該チャンバー外に設けられた蒸溜水製
造システムにより構成されることを特徴とするレチクル
洗浄装置。In a reticle cleaning device having a drying section for drying a reticle after cleaning, the drying section includes a chamber filled with an inert gas atmosphere, a distilled water shower tank provided inside the chamber, and a distilled water shower tank provided outside the chamber. A reticle cleaning device comprising a distilled water production system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2163828A JPH0453952A (en) | 1990-06-21 | 1990-06-21 | Reticle washing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2163828A JPH0453952A (en) | 1990-06-21 | 1990-06-21 | Reticle washing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0453952A true JPH0453952A (en) | 1992-02-21 |
Family
ID=15781518
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2163828A Pending JPH0453952A (en) | 1990-06-21 | 1990-06-21 | Reticle washing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0453952A (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6255940A (en) * | 1985-09-05 | 1987-03-11 | Toshiba Corp | Drying apparatus |
-
1990
- 1990-06-21 JP JP2163828A patent/JPH0453952A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6255940A (en) * | 1985-09-05 | 1987-03-11 | Toshiba Corp | Drying apparatus |
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