JPH0453952A - Reticle washing device - Google Patents

Reticle washing device

Info

Publication number
JPH0453952A
JPH0453952A JP2163828A JP16382890A JPH0453952A JP H0453952 A JPH0453952 A JP H0453952A JP 2163828 A JP2163828 A JP 2163828A JP 16382890 A JP16382890 A JP 16382890A JP H0453952 A JPH0453952 A JP H0453952A
Authority
JP
Japan
Prior art keywords
reticle
distilled water
chamber
drying
cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2163828A
Other languages
Japanese (ja)
Inventor
Shinsui Saruwatari
新水 猿渡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP2163828A priority Critical patent/JPH0453952A/en
Publication of JPH0453952A publication Critical patent/JPH0453952A/en
Pending legal-status Critical Current

Links

Landscapes

  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To prevent the occurrence of a stain, etc., at the time of drying of a reticle by providing a chamber filled with a gaseous inactive atmosphere, a distilled water bath disposed in the chamber and a distilled water manufacturing system disposed outside the chamber in a drying section. CONSTITUTION:After washing, the reticle is conveyed to the drying section, where at the distilled water shower bath 2 in the chamber 1 filled with the inactive gas 3 without incorporating at all dust, the distilled water without incorporating any impurity, produced with a distilled water manufacturing system 5, is showered on the reticle through a nozzle 4. After a cleaning solution on the reticle surface is displaced with the distilled water, the reticle is dried naturally inside the chamber 1, then it is conveyed to a reticle storing place. Thus the occurrence of stain, etc., at the drying time of the reticle is prevented.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置製造工程中のフォトリソグラフィ工
程で使用されるレチクルの洗浄装置に関し、特に洗浄後
にレチクルを乾燥させる乾燥部の構成に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a reticle cleaning apparatus used in a photolithography process in a semiconductor device manufacturing process, and more particularly to the configuration of a drying section for drying a reticle after cleaning.

〔従来の技術〕[Conventional technology]

従来、この種のレチクル洗浄装置は、第2図〜第4図の
ブロック図に示すようにブラシ、ジェット、超音波等に
よる純水洗浄を行なったあとのレチクル表面の乾燥方式
として、スピンドライヤーによる遠心乾燥方式(第2図
)、IPA(イソプロピルアルコール)で置換した後の
フロン蒸気によるフロン蒸気乾燥方式(第3図)、IP
A蒸気によるIPA蒸気乾燥方式(第4図)等が行なわ
れていた。
Conventionally, this type of reticle cleaning device uses a spin dryer to dry the reticle surface after cleaning with pure water using brushes, jets, ultrasonic waves, etc., as shown in the block diagrams of Figures 2 to 4. Centrifugal drying method (Figure 2), Freon vapor drying method using Freon vapor after replacing with IPA (isopropyl alcohol) (Figure 3), IP
The IPA steam drying method (Figure 4) using A steam was used.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の方式では、レチクル周辺の雰囲気に含ま
れる微小ごみ及び洗浄液中に含まれる微小ごみで、特に
有機系のごみがレチクルの乾燥時(レチクル表面の水分
の蒸発時)に凝縮され、しみ状となってレチクル面に残
ってしまうという欠点がある。
In the conventional method described above, fine dust contained in the atmosphere around the reticle and fine dust contained in the cleaning solution, especially organic dust, condenses when the reticle dries (when water on the reticle surface evaporates), causing stains. The disadvantage is that it remains on the reticle surface.

上述した従来方式によるレチクル洗浄装置に対し、本発
明は蒸溜水製造システムによって作り出された蒸溜水を
、不活性ガス雰囲気中に設置された蒸溜水シャワー槽内
でレチクル上に流し、レチクル表面を微小ごみが全くな
い蒸溜水で置換したあと自然乾燥させる乾燥部を設けた
という相違点を有する。
In contrast to the conventional reticle cleaning apparatus described above, the present invention allows distilled water produced by a distilled water production system to flow over the reticle in a distilled water shower tank installed in an inert gas atmosphere, thereby cleaning the reticle surface with minute particles. The difference is that a drying section is provided in which the water is replaced with distilled water, which is completely free of dirt, and then air-dried.

〔課題を解決するための手段〕[Means to solve the problem]

本発明のレチクル洗浄装置は、乾燥部に不活性ガス雰囲
気に満たされたチャンバーと、該チャンバー内に設置さ
れた蒸溜水シャワー槽と、該チャンバー外に設けられた
蒸溜水製造システムを有している。
The reticle cleaning device of the present invention includes a chamber filled with an inert gas atmosphere in a drying section, a distilled water shower tank installed in the chamber, and a distilled water production system installed outside the chamber. There is.

〔実施例〕〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例を示すブロック、図である。FIG. 1 is a block diagram showing one embodiment of the present invention.

レチクル収納部より取り出されたレチクルは洗浄部へ送
られ、洗浄液によりブラシ、ジェット、超音波等の手段
により洗浄され、レチクル上の有機及び無機系のごみが
物理的にレチクル上から剥離され洗浄液中へ浮遊する。
The reticle taken out from the reticle storage section is sent to the cleaning section, where it is cleaned with a cleaning solution using means such as brushes, jets, and ultrasonic waves. Organic and inorganic dust on the reticle is physically peeled off from the reticle and placed in the cleaning solution. Float to.

洗浄部より引き上げられたレチクルは未乾燥である為、
レチクル上に残る洗浄液中には前記ごみが浮遊している
Since the reticle pulled up from the cleaning section is not dried,
The dust is suspended in the cleaning liquid remaining on the reticle.

次にレチクルは乾燥部へ運ばれ、ごみを全く含まない不
活性ガス3で満たされたチャンバー1内の蒸溜水シャワ
ー檜2で、蒸溜水製造システム5によって作りだされた
不純物を全く含まない蒸溜水をノズル4よりレチクル上
ヘシャワーする。レチクル表面の洗浄液を蒸溜水によっ
て置換した後にチャンバー1内で自然乾燥させ、その後
レチクル収納部へレチクルを送る。
The reticle is then conveyed to the drying section, where it is exposed to a distilled water shower cylinder 2 in a chamber 1 filled with an inert gas 3 containing no dirt and distilled water produced by a distilled water production system 5 containing no impurities. Water is showered from nozzle 4 onto the reticle. After replacing the cleaning liquid on the reticle surface with distilled water, the reticle is naturally dried in the chamber 1, and then sent to the reticle storage section.

〔発明の効果〕〔Effect of the invention〕

以上説明した様に本発明は、ごみを全く含まない不活性
ガス雰囲気中で、不純物を全く含まない蒸溜水によって
レチクル表面を置換したあと自然乾燥させることにより
、レチクルの乾燥時にしみ等を発生させない効果がある
As explained above, the present invention eliminates stains and the like when drying the reticle by replacing the reticle surface with distilled water that does not contain any impurities in an inert gas atmosphere that does not contain any dust, and then allowing it to air dry. effective.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示すブロック図、第2図〜
第4図は従来のレチクル洗浄装置を示すブロック図であ
る。 1・・・チャンバー、2・・・蒸溜水シャワー槽、3・
・・不活性ガス、4・・・蒸溜水シャワーノズル、5・
・・蒸溜水製造システム。
FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG.
FIG. 4 is a block diagram showing a conventional reticle cleaning device. 1...Chamber, 2...Distilled water shower tank, 3.
...Inert gas, 4...Distilled water shower nozzle, 5.
... Distilled water production system.

Claims (1)

【特許請求の範囲】[Claims]  洗浄後のレチクルを乾燥させる乾燥部を有するレチク
ル洗浄装置において、乾燥部が不活性ガス雰囲気に満た
されたチャンバーと、該チャンバー内に設けられた蒸溜
水シャワー槽と、該チャンバー外に設けられた蒸溜水製
造システムにより構成されることを特徴とするレチクル
洗浄装置。
In a reticle cleaning device having a drying section for drying a reticle after cleaning, the drying section includes a chamber filled with an inert gas atmosphere, a distilled water shower tank provided inside the chamber, and a distilled water shower tank provided outside the chamber. A reticle cleaning device comprising a distilled water production system.
JP2163828A 1990-06-21 1990-06-21 Reticle washing device Pending JPH0453952A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2163828A JPH0453952A (en) 1990-06-21 1990-06-21 Reticle washing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2163828A JPH0453952A (en) 1990-06-21 1990-06-21 Reticle washing device

Publications (1)

Publication Number Publication Date
JPH0453952A true JPH0453952A (en) 1992-02-21

Family

ID=15781518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2163828A Pending JPH0453952A (en) 1990-06-21 1990-06-21 Reticle washing device

Country Status (1)

Country Link
JP (1) JPH0453952A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6255940A (en) * 1985-09-05 1987-03-11 Toshiba Corp Drying apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6255940A (en) * 1985-09-05 1987-03-11 Toshiba Corp Drying apparatus

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