JPH0455939A - Setting method for measuring pin number at production of check program of circuit substrate checking device - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a circuit board inspection apparatus, and more specifically, to a method for setting pin numbers of measurement pins when creating an inspection program.

[Conventional technology]

For example, when individually testing elements mounted on a circuit board, it is necessary to set pin numbers for measurement pins that contact both ends of the element. Figure 3 shows resistors R1 and R2
This is a simple circuit diagram in which R3 and R3 are connected in a delta connection. Taking this as an example, in the past, the conventional method was to refer to the circuit diagram, check the pin number on the corresponding jig (for example, a pin board), and then I am trying to enter a number.

That is, regarding the resistor R1, on the keyboard (not shown), set its l(igh pin (here, the bin connected to the measurement signal source side) to "1", and set the Loi+ pin (the bin connected to the signal measurement section side) to "1". is set to "2".

Similarly, for resistor R2, its High pin is “1”.
”, and the Low pin is set to “3”. Also, resistor R3
For example, the High bin is "3", the Low
The pin is set to "2". Note that for devices without polarity such as resistors, the High and Low pins have little meaning, but for polarized devices such as diodes and capacitors, the High and Low pins are set in consideration of their polarity.
LOII+ pin is set.

[Problem to be solved by the invention]

As described above, an inspection program for each element is created, but according to this program, unless the circuit diagram and other materials are complete, the pin number of the measurement pin cannot be input. In addition, since the method relies heavily on manual input work, there is a problem in that input errors are likely to occur.

[Means to solve the problem]

This invention was made to solve the above-mentioned conventional drawbacks, and its structural features include a plurality of measurement pins that contact the part to be measured of the circuit board to be tested, and a pin search probe that is at ground potential. , a measurement signal source and a signal measurement section;
A circuit board inspection device that has a display section such as a CRT, and each measurement pin is provided with a pair of switches, and the measurement pin can be connected to a measurement signal source and/or a signal measurement section via the switch. In this step, each of the measurement pins is brought into contact with each corresponding part to be measured on the circuit board to be inspected, and with the pin search probe in contact with any part to be measured, the above-mentioned pair of switches belonging to each measurement pin are connected. It turns on and off alternately, and searches for the measurement pin that electrically corresponds to the specified measurement area with the bin search probe based on the presence or absence of signal input to the signal measurement section at that time.
The pin number is displayed on the display section together with the name of the device to be tested.

[For production]

Under normal conditions, when a pair of switches are turned on at the same time, the measurement signal source and signal measurement section are directly connected, so the measurement signal from the measurement signal source is input to the signal measurement section. Become. On the other hand, since the part to be measured that is contacted by the bin search probe is at ground potential, the measurement signal from the measurement signal source is not input to the signal measurement section. The measurement pin that is in contact with the measurement site is searched, and its pin number is displayed on the display unit along with the name of the device to be tested.

〔Example〕

Hereinafter, embodiments of the present invention will be described in detail with reference to FIGS. 1 and 2.

Figure 1 shows a circuit diagram of the circuit board testing device. In this example, the circuit to be tested is a simple circuit similar to that shown in Figure 3 described above, so three measurement pins are used. explain.

Each connection point of Δ-connected resistors R1 to R3 (part to be measured)
Let x, y, and z be x, y, and z, and the corresponding measurement pins be A, B, and C, respectively. In this case, each measurement pin is assigned a pin number in advance, and in this embodiment, measurement pin A is rlolJ, B is r102J, and C is r103J.

Each of the measurement pins A-C has a pair of switches l.
la, fib; 12a, 12b; 13
a, 13b are connected. In this case, one of the switches 11a.

12a and 13a are connected to the measurement signal source 21 of the measurement section 20. On the other hand, each of the other switches 11
b, 12b and 13b are the signal measuring section 22 of the measuring section 20
It is connected to the. In this example, the signal measuring section 22
is the current measurement section. 23 is an operation unit including a keyboard;
Reference numeral 24 indicates a display unit, for example, a CRT; 25 indicates a CPU that controls the switching of each switch and controls the operation of the measurement unit 20 and the display unit 24; the CPU 25 includes a ROM 25 a in which system programs and the like are written; and an inspection program. A RAM 25b is attached for storing information such as information and pin numbers.

In addition to individually testing elements mounted on a circuit board, this circuit board testing device can determine the quality of the board by measuring the impedance of a portion to be measured. To explain the outline of the process, first, reference data, which serves as a judgment criterion, is obtained from a non-defective board. That is, when measuring the impedance of the part to be measured X, switch 1
1a.

12b, 13b off, switch llb, 12a
, turn on 13a. As a result, the measurement signal source 21
A measurement signal is supplied from the measurement pin B and C through the measurement pins B and C, and the current passing through the resistor R2゜R3 is transmitted from the measurement pin A to the signal measurement section 22.
is input. Similarly, reference data for the other parts Y and Z to be measured is obtained. During inspection, the impedance of each part of the product board to be measured is measured under the same conditions as above, and the values are compared with reference data to determine pass/fail. This testing method is, so to speak, a 1-pin vs. all remaining pin test, and in this specification, this testing method is called a macro test as opposed to an individual testing of elements (bin-to-bin testing).

Further, this circuit board inspection device has a pin search function and is equipped with a pin search probe P for that purpose. This probe P is connected to, for example, the chassis of the apparatus main body, and its potential is set to the ground potential.

Next, the case where pin numbers are set in the inspection program will be described with reference to the flowchart in FIG.

Note that each measurement pin A-C is brought into contact with each measurement target site X-2 in advance. To input the pin number of the measurement pin of resistor R1, first enter the element name on the keyboard of the operation section 23.

For example, input R1 (step PL). Then,
In step P2, "Macro test?" is displayed on the display section 24. When the macro test is selected, the inspection program itself is terminated. If no, proceed to step P3,
"Pin search (High pin) input?" is displayed.

In other words, a question is asked as to whether the settings are to be made by the operator or by the pin search function. Here, if the setting is made by the operator, the process moves to step P4, and the pin number 10 of measurement pin A, which is the High pin, is selected using the keyboard.
1 and the pin number 102 of measurement pin B, which is a Log pin, are input.

On the other hand, if a pin search input is to be made, step P5 is executed after the pin search probe P is brought into contact with the part to be measured X, which is one end of the resistor R1. That is, each pair of switches lla, llb; 12a,
12b H13a and 13b are turned on and off alternately. For example, first the switches Ila and llb are turned on at the same time, then turned off, and then the switch 12a is turned on instead.
, 12b are turned on at the same time and then turned off. In this case, the part to be measured X
Since the measurement pin A that is in contact with the When the switches 12a, 12b; 13a, 13b belonging to pins B and C are turned on, the measurement signal from the measurement signal source 21 is input to the signal measurement section 22. In this way, the measurement pin A that is in contact with one end of the resistor R1 is searched for depending on whether or not a signal is input to the signal measurement section 22, and its pin number 101 is set on the display section 24. Note 1: For example, if multiple measurement pins are set up in the same pattern, all of them will be searched, but in such a case,
In this embodiment, the measurement pin with the lowest number is selected.

When the High pin is set as described above, the process moves to step P6, and the display section 24 displays "Pin search (Low pin) input?". In the case of pin search, step P7 is executed. That is, with the pin search probe P in contact with the measurement site Y, which is the other end of the resistor R1, each pair of switches lla, llb;

12b; 13a and 13b are turned on alternately. In this case, since the measurement pin B is set to the ground potential, the measurement signal from the measurement signal source 21 is not input to the signal measurement section 22 even if the switches 13a and 13b belonging to the pin B are turned on. Switches lla, llb belonging to measurement pins A and B; 12a, 12
When b is turned on, the measurement signal from the measurement signal source 21 is input to the signal measurement section 22. In this way, the measurement pin B that is in contact with the other end of the resistor R1 is searched, and its pin number 102 is set on the display section 24. If multiple measurement pins are searched, the measurement pin with the lowest number is set as in step P5 above.6 Note that if No is selected in step P6, step P8 is performed without setting the Low bin. , and you will be asked if you want to finish.

In this way, an example of display on the display section 24 is shown in a primary table in which the pin numbers of the measurement pins used for the inter-bin test of each element and the pin numbers during the macro test are set. In addition,
Measurement step order No. 4 in the table is a display example when the macro step is selected for element R4 (not shown) in step P5, and in this case, the pin number is 104.

Further, this display content is written into the RAM 25b, etc., so that it can be read out sequentially.

(Table) As explained above, according to the present invention, by bringing the pin search probe P into contact, the measurement pin corresponding to the part to be measured is automatically searched, and the pin number is set. Therefore, the effort required to create an inspection program can be significantly reduced.

[Brief explanation of drawings]

Fig. 1 is a schematic circuit diagram showing an example of a circuit board inspection device for implementing the present invention, Fig. 2g is a flowchart relating to the pin number setting method of the invention, and Fig. 3 is used to explain a conventional example. This is a circuit diagram. In the figure, A, B, and C are measurement pins; 23 is an operation section, 24 is a display section, and 25 is a CPU. Patent Applicant Hioki Electric Co., Ltd. Agent Patent Attorney Takuya Ohara [Effects of the Invention]

Claims (1)

[Claims] (1) A plurality of measurement pins that contact the part to be measured of the circuit board to be inspected, a pin search probe set to ground potential,
It has a measurement signal source and a signal measurement section, and a display section made of a CRT or the like, and each of the measurement pins is provided with a pair of switches, and the measurement pins are connected to the measurement signal source and/or In a circuit board inspection device that can be connected to a signal measuring section, each of the measurement pins is brought into contact with a corresponding part to be measured of the circuit board to be tested, and the pin search probe is brought into contact with any part to be measured. In this state, the pair of switches belonging to each measurement pin are turned on and off alternately, and depending on the presence or absence of a signal input to the signal measurement section, electrical power is applied to the part to be measured specified by the pin search probe. A method for setting pin numbers of measurement pins when creating an inspection program, characterized in that a corresponding measurement pin is searched and the pin number is displayed on the display section together with the name of the device to be tested.