JPH0457663A - Positioning mechanism in prepositioning automatic surface grinder - Google Patents
Positioning mechanism in prepositioning automatic surface grinderInfo
- Publication number
- JPH0457663A JPH0457663A JP2162800A JP16280090A JPH0457663A JP H0457663 A JPH0457663 A JP H0457663A JP 2162800 A JP2162800 A JP 2162800A JP 16280090 A JP16280090 A JP 16280090A JP H0457663 A JPH0457663 A JP H0457663A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- edge
- semiconductor wafer
- water supply
- water
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 72
- 239000004065 semiconductor Substances 0.000 claims abstract description 50
- 239000007788 liquid Substances 0.000 claims abstract description 15
- 238000005553 drilling Methods 0.000 claims 1
- 230000000149 penetrating effect Effects 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 82
- 230000002093 peripheral effect Effects 0.000 description 8
- 238000000034 method Methods 0.000 description 6
- 239000000758 substrate Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000001179 sorption measurement Methods 0.000 description 4
- 241000257465 Echinoidea Species 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 210000000744 eyelid Anatomy 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
Landscapes
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
【発明の詳細な説明】
〔技術分野〕
本発明は平面自動研削盤等の半導体ウェハを研削加工す
るチャック機構の上面へ移送する前段階でのプリポジシ
ョンにおいて、半導体ウェハの下面を水流によって洗浄
すると同時にブリポジションの上で位置合わせをする機
構に関するものである。[Detailed Description of the Invention] [Technical Field] The present invention provides a method for cleaning the lower surface of a semiconductor wafer with a water stream in a preposition stage before transferring the semiconductor wafer to the upper surface of a chuck mechanism for grinding the semiconductor wafer, such as in a surface automatic grinding machine. It also relates to a mechanism for positioning on the preposition.
本発明に係るこの種の半導体ウェハは、コンピュタ−等
の電子関連機器、所謂OA機器等の集積回路に使用され
ており、その開発は日々進歩しており、機器そのものの
小型化に伴う、より極薄で超高精度の質性と、作業性の
向上から拡径化が要求されてきている。This type of semiconductor wafer according to the present invention is used for integrated circuits in electronic equipment such as computers, so-called office automation equipment, etc., and the development thereof is progressing day by day, and as the equipment itself becomes smaller, There is a growing demand for larger diameters due to ultra-thin, ultra-high precision quality and improved workability.
この種の平面自動研削盤は、半導体ウェハをバキューム
吸着する機能を有したチャック機構の平坦面へ吸着させ
、上方から先端にダイヤモンド砥石を備えたスピンドル
軸を降下させて研削加工を施し、研削加工後はエアーを
逆送してバキューム吸着を開放し、吸着バットを先端に
備えた移送アームで吸着させて搬送し洗浄、格納してい
るものであり、研削加工時の半導体ウェハの位置合わせ
は、チャック機構上でそのまま行うか、或いは、チャッ
ク機構へ移送する前段階でのプリポジションで行なって
いるものである。This type of surface automatic grinder sucks the semiconductor wafer onto the flat surface of a chuck mechanism with a vacuum suction function, and then lowers a spindle shaft with a diamond grinding wheel at the tip from above to perform the grinding process. After that, air is sent backwards to release the vacuum suction, and a transfer arm with a suction bat at the tip is used to suction the wafer, transport it, clean it, and store it.The semiconductor wafer is aligned during the grinding process. This is done either directly on the chuck mechanism, or prepositioned before being transferred to the chuck mechanism.
然し乍ら、平坦なチャック機構上で位置合わせを行う場
合には、チャック機構の上面の全面へ油水で適宜な水層
を形成し、該水層の表面張力によって中心位置へセンタ
リングをしていたが、適宜な水層を形成するために水量
を絶えず管理しなければならず、その上、水層を形成し
てセンタリングを行いバキューム吸着させるのに時間の
係る工程と成っていた。However, when positioning is performed on a flat chuck mechanism, a suitable water layer is formed on the entire top surface of the chuck mechanism with oil and water, and the surface tension of the water layer is used to center the chuck mechanism to the center position. In order to form an appropriate water layer, the amount of water must be constantly controlled, and in addition, forming the water layer, centering it, and vacuum adsorption are time-consuming processes.
又、プリポジションで位置合わせをする場合には1円盤
状の基体の外周縁へ縁部を有したもので、予め、周縁部
へ例えばテーパーを形成させる等の位置合わせガイドを
設けて、該ガイドに沿って位置合わせを行ない、移送ア
ームの先端に備えた吸着バットで吸着させると共に基体
の底面の下方から水を給水して、半導体ウェハの下面を
洗浄させ乍ら浮上させると共に移送アームを上昇させて
、半導体ウェハを基体の上面より上方へ剥がして、移送
アームの正確に設定された移送工程によって、半導体ウ
ェハを正確にチャック機構の上面の中心へ移送するもの
であったが、昨今要求されている極薄化、拡径化される
半導体ウェハでは基体に滞留させた液体特性による吸着
作用によって、半導体ウェハを損傷する事故が頻繁に発
生してしまう等の問題があった。In addition, when positioning is to be performed in pre-position, a disc-shaped base body having an edge on the outer periphery is provided, and a positioning guide is provided in advance such as forming a taper on the periphery. The semiconductor wafer is aligned along the wafer, and is adsorbed with a suction bat provided at the tip of the transfer arm, and water is supplied from below the bottom of the substrate to clean the bottom surface of the semiconductor wafer while floating it and raising the transfer arm. The semiconductor wafer is peeled upward from the top surface of the substrate, and the semiconductor wafer is accurately transferred to the center of the top surface of the chuck mechanism by a precisely set transfer process of the transfer arm. Semiconductor wafers, which are becoming extremely thin and enlarged in diameter, have had problems such as frequent accidents that damage the semiconductor wafers due to the adsorption effect due to the characteristics of the liquid retained in the substrate.
本発明は上記の事由に鑑みて鋭意研頌の結果、これらの
プリポジションにおいて、半導体ウェハを乗載させる基
体の外周縁をウェハ取出側縁部とウェハ位置合わせ縁部
と流出用縁部とを設けたで構成し、給水による水位の上
昇と共に水の流れを生じさせることで、半導体ウェハの
位置合わせと取り出しを円滑に行い、極薄化、拡径化す
る半導体ウェハでも液体の吸着作用の影響を受けて損傷
することなくチャック機構の正確な位置へ移送できるプ
リポジションの位置合わせ機構を提供する目的である。In view of the above-mentioned reasons, the present invention has been made as a result of extensive research, and in these prepositions, the outer peripheral edge of the base body on which the semiconductor wafer is mounted is divided into a wafer take-out side edge, a wafer positioning edge, and an outflow edge. By creating a flow of water as the water level rises due to water supply, semiconductor wafers can be smoothly aligned and removed, and even semiconductor wafers that are becoming thinner and larger in diameter can be prevented from being affected by the adsorption effect of liquid. It is an object of the present invention to provide a pre-position alignment mechanism that can be transferred to an accurate position on a chuck mechanism without being damaged by damage.
本発明の構成は、円盤状へは中心部材を突設させ、中心
部材と基体を貫通する給水孔を穿設し、給水孔の内周へ
環状ストッパーを植設し、給水孔へ支持管を環状ストッ
パーへ当接させて挿着し、環状ストッパーの上方へは胴
部と流量制御孔とを有した給水制御部材を間隔部を有し
て嵌入させ、間隔部へは複数の通水小孔を穿設し、頂部
へは円板状のウェハ乗載台を設けると共に、基体の外周
へは環状部材を嵌着し、環状部材の外周縁の半周以上へ
はウェハ取出側縁部を形成し、他方側の外周縁へは複数
のウェハ位置合わせ縁部を立設し、夫々のウェハ位置合
わせ縁部の間隔へは流出用縁部を形成した構成である。The structure of the present invention is to provide a central member protruding from the disc-shaped body, drill a water supply hole that penetrates the central member and the base, install an annular stopper on the inner periphery of the water supply hole, and connect a support pipe to the water supply hole. A water supply control member having a body portion and a flow rate control hole is inserted into the annular stopper in contact with the annular stopper, and a water supply control member having a body portion and a flow rate control hole is inserted into the annular stopper with a gap portion, and a plurality of small water flow holes are inserted into the gap portion. A disk-shaped wafer mounting table is provided at the top, an annular member is fitted to the outer periphery of the base, and a wafer take-out side edge is formed at more than half the outer periphery of the annular member. , a plurality of wafer positioning edges are erected on the outer peripheral edge of the other side, and an outflow edge is formed between the respective wafer positioning edges.
斯る目的を達成した本発明の平面自動研削盤のプリポジ
ション等における位置合わせ機構の実施例を以下図面を
用いて説明する
第1図は本発明の実施例による平面自動研削盤の位置合
わせ機構におけるブリポジシ目ンの説明の為の概要平面
図であって、第2図は中心線で断面とした概要断面図で
ある。An embodiment of the positioning mechanism for pre-positioning, etc. of the automatic surface grinding machine of the present invention that achieves the above object will be explained below with reference to the drawings. Fig. 1 shows the positioning mechanism of the automatic surface grinding machine according to the embodiment of the present invention. FIG. 2 is a schematic plan view for explaining the eyelids, and FIG. 2 is a schematic cross-sectional view taken along the center line.
本発明は、平面自動研削盤等の半導体ウェハAを研削加
工するチャック機構の上面へ移送する前段階でのプリポ
ジションにおいて、半導体ウェハAの下面を水流によっ
て洗浄すると同時にプリポジションの上で位置合わせを
する機構に関するものであり、前記平面自動研削盤のプ
リポジションにおいて、円盤状の基体1の中心辺の下面
へは円柱状の中心部材2を突設させ、該中心部材2と基
体1の中心部を貫通する給水孔3を穿設し、該給水孔3
の内周へ下端より若干高さを有して縦断面り字状の環状
ストッパー4を植設し、前記給水孔3へ下方から給水用
の支持管5を前記環状ストッパー4八当接させて挿着し
、前記環状ストッパー4の上方へは短筒状の胴部6aと
内部に流量制御孔6bとを有した給水制御部材6を前記
基体1の底面より若干高さの間隔部を有して嵌入させ、
該間隔部へは前記流量制御孔6bと連通させた複数の通
水小孔6cを穿設し、前記胴部6aの頂部へは円板状の
ウェハ乗載台7を該胴部6aの外周より膨出させて設け
ると共に、前記基体1の外周へは環状縁部材8を嵌着さ
せ、該環状縁部材8の外周縁の少なくとも半周以上へは
ウェハ乗載台7の上方へ一定水位が保持できる高さのウ
ェハ取出側縁部8aを形成し、他方側の外周縁へは該ウ
ェハ取出側縁部8aの上端より高い上端と夫々の間へ間
隔とを有した複数のウェハ位置合わせ縁部8bを外周縁
に沿って立設し、該夫々のウェハ位置合わせ縁部8bの
間隔へは流出用縁部8cの上端を前記ウェハ乗載台7の
上面とウェハ取出側縁部8aの上端との間の位置に形成
したことによって、前記ウェハ乗載台7の上に乗載させ
た半導体ウェハAを給水による液体で浮上させると共に
、流出用縁部8cより液体を流出させて半導体ウェハA
を複数のウェハ位置合わせ縁部8bへ寄せて位置合わせ
するものである。The present invention cleans the bottom surface of the semiconductor wafer A with a water stream and aligns it on the preposition at the same time as cleaning the bottom surface of the semiconductor wafer A with a water stream in a preposition stage before transferring the semiconductor wafer A to the top surface of a chuck mechanism that grinds the semiconductor wafer A in an automatic surface grinder. In the preposition of the surface automatic grinding machine, a cylindrical center member 2 is provided protruding from the lower surface of the center side of the disk-shaped base 1, and the center of the center member 2 and the base 1 is A water supply hole 3 is drilled through the part, and the water supply hole 3 is
An annular stopper 4 having a vertical cross-section is planted at a height slightly higher than the lower end on the inner periphery of the water supply hole 3, and a support pipe 5 for water supply is brought into contact with the annular stopper 48 from below into the water supply hole 3. A water supply control member 6 having a short cylindrical body 6a and a flow rate control hole 6b inside is inserted above the annular stopper 4 and has a gap slightly higher than the bottom surface of the base 1. and insert it into the
A plurality of small water passage holes 6c communicating with the flow rate control holes 6b are bored in the spaced portion, and a disk-shaped wafer mounting table 7 is installed at the top of the body 6a around the outer periphery of the body 6a. At the same time, an annular edge member 8 is fitted onto the outer periphery of the base 1, and a constant water level is maintained above the wafer mounting table 7 over at least half of the outer periphery of the annular edge member 8. A wafer take-out side edge 8a is formed as high as possible, and a plurality of wafer alignment edges having an upper end higher than the upper end of the wafer take-out side edge 8a and a space between them are formed on the other side outer peripheral edge. 8b is erected along the outer peripheral edge, and the upper end of the outflow edge 8c is connected to the upper surface of the wafer mounting table 7 and the upper end of the wafer take-out side edge 8a between the respective wafer positioning edges 8b. By forming the semiconductor wafer A at a position between the two, the semiconductor wafer A mounted on the wafer mounting table 7 is floated by the liquid supplied with water, and the liquid flows out from the outflow edge 8c, so that the semiconductor wafer A is
The wafers are aligned by bringing them closer to the plurality of wafer alignment edges 8b.
即ち、本発明を実施する平面自動研削盤は、半導体ウェ
ハAに研削加工を施す為のチャック機構と、該チャック
機構へプリポジションから正確な位置に載置させる為に
、予め、機械的に設定させた正確な軌道上で移動する昇
降自在で且つ進退自在な移送アームと、該移送アームの
先端部に備えられた半導体ウェハAの上面を吸着、離脱
自在な吸着バット(図示せず)を配設したものであり、
本発明の位置合わせ機構は、半導体ウェハAを前記移送
アームで移送させる前段階で円盤状の基体1のプリポジ
ションで位置合わせさせるものであり、該円盤状の基体
1の中心へは円柱状の中心部材2を下方に突出させて形
成すると共に該中心部材2と基体1との中心部を貫通さ
せて給水孔3を穿設したものであり、該給水孔3は後記
する環状ストッパー4と給水制御部材6とを内装し、下
端辺は支持管5との接続部と成るものである。That is, the automatic surface grinding machine embodying the present invention includes a chuck mechanism for grinding the semiconductor wafer A, and a mechanical setting mechanism for placing the semiconductor wafer A at an accurate position from a pre-position on the chuck mechanism. A transfer arm that can be raised and lowered and moved back and forth on a precise trajectory, and a suction bat (not shown) that can adsorb and detach the upper surface of the semiconductor wafer A provided at the tip of the transfer arm. It has been established,
The positioning mechanism of the present invention is for positioning the semiconductor wafer A at a pre-position of the disc-shaped base 1 before the semiconductor wafer A is transferred by the transfer arm. A center member 2 is formed to protrude downward, and a water supply hole 3 is bored through the center of the center member 2 and the base 1, and the water supply hole 3 is connected to an annular stopper 4 to be described later. A control member 6 is housed inside, and the lower end side serves as a connection part with the support tube 5.
そして、環状ストッパー4は、若干高さを有した環状部
と、該環状部の下端へフランジ状に膨出した水平部を有
する縦断面り字状であり、第2図に図示の如く、前記給
水孔3の内面へ周方向へ水平な溝を形成し、該溝へ前記
水平部を植設させ環状部は給水孔3の内周と若干間隔を
有しているものである。The annular stopper 4 has an annular portion having a slight height and a horizontal portion that bulges out like a flange toward the lower end of the annular portion. A horizontal groove is formed in the circumferential direction on the inner surface of the water supply hole 3, and the horizontal portion is planted in the groove, and the annular portion is slightly spaced from the inner circumference of the water supply hole 3.
前記給水孔3へは下方からは送水ポンプと接続されてい
る給水用と共に当該ブリポジションを支持する支持管5
の上端をストッパー4の下端と当接させて嵌着させて、
給水孔3の上方からは下方を開口した短円筒状の胴部6
aを有した給水制御部材6の胴部6aの下端をストッパ
ー4の水平部の上端へ当接させ、胴部6aの上方辺を前
記若干間隔へ挿通させて嵌入したものである。From below, the water supply hole 3 is connected to a water supply pump and a support pipe 5 that supports the bridge position.
The upper end is brought into contact with the lower end of the stopper 4 and fitted,
From above the water supply hole 3, there is a short cylindrical body 6 that opens downward.
The lower end of the body portion 6a of the water supply control member 6 having the shape A is brought into contact with the upper end of the horizontal portion of the stopper 4, and the upper side of the body portion 6a is inserted into the above-mentioned slight interval.
前記給水制御部材6は前記基体1の底面より胴部6aの
上方辺の若干高さを突出させ、前記胴部6aの上端へは
半導体ウェハAを載置させるに十分な大きさを有した円
板状のウェハ乗載台7を該胴部6aの外周より膨出させ
て形成し、該胴部6aの内部へは水流を制御するために
隔壁を形成し、該隔壁へは流水制御孔6bを穿設したも
のであり、該ウェハ乗載台7の直下の前記胴部6aの上
方辺へは前記流水制御孔6bに連通した複数の通水/J
)孔6cを放射状に配設するものである。The water supply control member 6 has the upper side of the body 6a protruding from the bottom surface of the base 1 by a slight height, and has a circle having a size sufficient to place the semiconductor wafer A on the upper end of the body 6a. A plate-shaped wafer mounting table 7 is formed by protruding from the outer periphery of the body 6a, a partition is formed inside the body 6a to control water flow, and a water flow control hole 6b is formed in the partition. The upper side of the body 6a directly below the wafer mounting table 7 has a plurality of water passages /J connected to the water flow control hole 6b.
) The holes 6c are arranged radially.
前記基体1の外周縁へは縁部と成る環状部材8を嵌着す
るものであるが、環状部材8の少なくとも半周以上へは
ウェハ乗載台7の上方で一定の水位が保持できる高さの
ウェハ取出側縁部8aを形成し、他方側の外周縁へはウ
ェハ取出側縁部8aの上端より高い上端と夫々の間に間
隔とを有した複数のウェハ位置合わせ縁部8bを外周縁
に沿って立設し、該夫々のウェハ位置合わせ縁部8bの
間隔へは流出用縁部8cの上端を前記ウェハ乗載台7の
上面とウェハ取出側縁部8aの上端に位置させて形成し
たものである。An annular member 8 serving as an edge is fitted onto the outer periphery of the base 1, and at least half the circumference of the annular member 8 has a height that allows a constant water level to be maintained above the wafer mounting table 7. A wafer take-out side edge 8a is formed, and a plurality of wafer alignment edges 8b each having an upper end higher than the upper end of the wafer take-out side edge 8a and a space between them are formed on the other side outer peripheral edge. The upper end of the outflow edge 8c is positioned at the upper surface of the wafer mounting table 7 and the upper end of the wafer take-out side edge 8a, and is formed in the interval between the respective wafer positioning edges 8b. It is something.
前述の構成によって、前記ウェハ乗載台7の上に乗載さ
せた半導体ウェハAを給水による液体で浮上させると共
に、流出用縁部8cより液体を流出させて半導体ウェハ
Aを複数のウェハ位置合わせ縁部8bへ寄せて位置合わ
せするものである。With the above-described configuration, the semiconductor wafer A mounted on the wafer mounting table 7 is floated by the liquid supplied with water, and the liquid is caused to flow out from the outflow edge 8c, thereby aligning the semiconductor wafer A with a plurality of wafers. The positioning is performed by bringing it closer to the edge 8b.
本発明は、バキュームチャック機構へ吸着載置させて研
削加工を施すための極薄化、拡径化された半導体ウェハ
Aを、先ず、搬送装置(図示せず)によって前記基体1
のウェハ乗載台7へ載置させるものであるが、予め、給
水ポンプを作動させて前記支持管5内より供給された水
は、給水孔3を通って給水制御部材6の流量制御孔6b
を通り、放射状に配設した複数の通水小孔6cより水量
を′一定量に制御されて基体1の上面と外周縁部材8で
囲われた空間内へ滞留しているものであり、半導体ウェ
ハAをウェハ乗載台7の上面へ若干の勢いを有して載置
すると、滞留している液体は夫々の流出用縁部8cから
溢れて流出し同時に半導体ウェハAの下面に付着した微
細な塵等は洗浄されるものである。In the present invention, first, an extremely thin and enlarged semiconductor wafer A to be suctioned and placed on a vacuum chuck mechanism and subjected to a grinding process is transferred to the substrate 1 by a transfer device (not shown).
The wafer is placed on the wafer mounting table 7, and the water supplied from the inside of the support tube 5 by operating the water supply pump in advance passes through the water supply hole 3 and flows through the flow rate control hole 6b of the water supply control member 6.
The amount of water is controlled to a constant amount through a plurality of radially arranged small water passage holes 6c and remains in the space surrounded by the upper surface of the substrate 1 and the outer peripheral member 8, and the semiconductor When the wafer A is placed on the top surface of the wafer mounting table 7 with some force, the remaining liquid overflows from each outflow edge 8c and flows out, and at the same time, the fine particles attached to the bottom surface of the semiconductor wafer A are removed. Any dust etc. will be washed away.
更に、給水を続けると半導体ウェハAは均一に浮上しは
じめ、水位が流出用縁部8Cより上方となると、該流出
用縁部8cより液体がオーバーフローして流出し、ウェ
ハ位置合わせ縁部8bへ向けて水の流れが生じるもので
あり、それに伴い半導体ウェハAはウェハ位置合わせ縁
部8bの方向へ水平に移動し、該ウェハ位置合わせ縁部
8bへ半導体ウェハAの周縁部が当接して水平状態で停
止し、図示の実線の位置で位置合わせが完了するもので
、この状態で移送アームに備えた吸着バットで半導体ウ
ェハAの上面を吸着させるものである。Furthermore, as the water supply continues, the semiconductor wafer A begins to float uniformly, and when the water level rises above the outflow edge 8C, the liquid overflows from the outflow edge 8c and flows out to the wafer alignment edge 8b. Accordingly, the semiconductor wafer A moves horizontally in the direction of the wafer alignment edge 8b, and the peripheral edge of the semiconductor wafer A comes into contact with the wafer alignment edge 8b, causing the semiconductor wafer A to move horizontally toward the wafer alignment edge 8b. The transfer arm stops in this state, and the alignment is completed at the position shown by the solid line in the figure. In this state, the top surface of the semiconductor wafer A is suctioned by a suction bat provided on the transfer arm.
更に、給水を続けると、水位は給水によって前記ウェハ
取出側縁部8aの上端へ達するものであり、前記移送ア
ームの進退機構によって半導体ウェハをウェハ位置合わ
せ縁部8b方向からウェハ取出側縁部8aの方向へ向け
て水平方向に移動して、液体の表面張力を破壊して取外
すもので、液体の吸着作用の影響を全く受けずにウニ/
)取出側縁部8aの方向から取外すことができるもので
あり、前記移送アームはその正確な軌道状を移動してチ
ャック機構の上面の正確な位置へ移送されるものである
。Further, when the water supply is continued, the water level reaches the upper end of the wafer take-out side edge 8a due to water supply, and the forward and backward movement mechanism of the transfer arm moves the semiconductor wafer from the wafer alignment edge 8b direction to the wafer take-out side edge 8a. The device removes sea urchins/sea urchins by moving horizontally in the direction of
) The transfer arm can be removed from the direction of the take-out edge 8a, and the transfer arm moves along a precise trajectory to be transferred to a precise position on the upper surface of the chuck mechanism.
以上の如く、本発明は極薄化、拡径化する半導体ウェハ
であっても何等水の吸着作用の影響を受けることなく取
外しができるだけでなく、位置合わせが適確に行われる
ものであり、水量を増加させることによって迅速に位置
合わせすることができ、その貢献性計り知れないものが
有り、極めて有意義な効果を有した発明である。As described above, the present invention not only allows semiconductor wafers to be removed even if they are becoming extremely thin and enlarged in diameter without being affected by the adsorption effect of water, but also enables accurate positioning. By increasing the amount of water, positioning can be done quickly, and its contribution is immeasurable, making it an extremely significant invention.
第1図は本発明の実施例による平面自動研削盤の位置合
わせ機構におけるプリポジションの説明の為の概要平面
図である。第2図は中心線で断面とした概要断面図であ
る。
A−半導体ウェハ。
1−基台、2−中心部材、3−給水孔、4−ストッパー
5−支持管、6−給水制御部材、6a−胴部、6b−
流水制御孔、6c−通水小孔、7−ウェハ乗載台、8−
外周縁部材、8a−ウェハ取出側縁部、8b−ウェハ位
置合わせ縁部、8C−流出用縁部。FIG. 1 is a schematic plan view for explaining preposition in a positioning mechanism of an automatic surface grinding machine according to an embodiment of the present invention. FIG. 2 is a schematic sectional view taken along the center line. A-Semiconductor wafer. 1-base, 2-center member, 3-water supply hole, 4-stopper 5-support pipe, 6-water supply control member, 6a-body, 6b-
Flowing water control hole, 6c- water passage small hole, 7- wafer mounting platform, 8-
Outer peripheral edge member, 8a-wafer removal side edge, 8b-wafer positioning edge, 8C-outflow edge.
Claims (1)
基体の中心辺の下面へは円柱状の中心部材を突設させ、
該中心部材と基体の中心部を貫通する給水孔を穿設し、
該給水孔の内周へ下端より若干高さを有して縦断面L字
状の環状ストッパーを植設し、前記給水孔へ下方から給
水用の支持管を前記環状ストッパーへ当接させて挿着し
、前記環状ストッパーの上方へは短筒状の胴部と内部に
流量制御孔とを有した給水制御部材を前記基体の底面よ
り若干高さの間隔部を有して嵌入させ、該間隔部へは前
記流量制御孔と連通させた複数の通水小孔を穿設し、前
記胴部の頂部へは円板状のウエハ乗載台を該胴部の外周
より膨出させて設けると共に、前記基体の外周へは環状
縁部材を嵌着させ、該環状縁部材の外周縁の少なくとも
半周以上へはウエハ乗載台の上方へ一定水位が保持でき
る高さのウエハ取出側縁部を形成し、他方側の外周縁へ
は該ウエハ取出側縁部の上端より高い上端と夫々の間へ
間隔とを有した複数のウエハ位置合わせ縁部を外周縁に
沿って立設し、該夫々のウエハ位置合わせ縁部の間隔へ
は流出用縁部の上端を前記ウエハ乗載台の上面とウエハ
取出側縁部の上端との間に位置させて形成したことによ
って、前記ウエハ乗載台の上に乗載させた半導体ウエハ
を給水による液体で浮上させると共に、流出用縁部より
液体を流出させて半導体ウエハをウエハ位置合わせ縁部
へ寄せて位置合わせすることを特徴とする平面自動研削
盤のプリポジシヨンにおける位置合わせ機構。In the preposition of a surface automatic grinding machine, a cylindrical center member is protruded from the lower surface of the center side of the disk-shaped base.
Drilling a water supply hole penetrating the center member and the center of the base,
An annular stopper having an L-shaped longitudinal section is planted on the inner periphery of the water supply hole at a height slightly higher than the lower end, and a support pipe for water supply is inserted into the water supply hole from below by contacting the annular stopper. A water supply control member having a short cylindrical body and a flow rate control hole therein is fitted above the annular stopper with a gap slightly higher than the bottom surface of the base, and A plurality of small water holes communicating with the flow rate control holes are bored in the body, and a disk-shaped wafer mounting table is provided at the top of the body so as to bulge out from the outer periphery of the body. , an annular edge member is fitted onto the outer periphery of the base body, and a wafer take-out side edge is formed at least half the circumference of the outer periphery of the annular edge member at a height that can maintain a constant water level above the wafer mounting table. A plurality of wafer positioning edges are provided along the outer periphery of the other side, each having an upper end higher than the upper end of the wafer removal side edge and a gap between each wafer alignment edge. The gap between the wafer alignment edges is formed by locating the upper end of the outflow edge between the upper surface of the wafer mounting table and the upper end of the wafer take-out side edge. An automatic surface grinding machine characterized in that a semiconductor wafer placed on a surface is floated by liquid supplied with water, and the liquid is flowed out from an outflow edge to bring the semiconductor wafer to a wafer alignment edge for alignment. Alignment mechanism in pre-position.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2162800A JPH0722880B2 (en) | 1990-06-22 | 1990-06-22 | Positioning mechanism in pre-position of automatic surface grinder |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2162800A JPH0722880B2 (en) | 1990-06-22 | 1990-06-22 | Positioning mechanism in pre-position of automatic surface grinder |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0457663A true JPH0457663A (en) | 1992-02-25 |
| JPH0722880B2 JPH0722880B2 (en) | 1995-03-15 |
Family
ID=15761457
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2162800A Expired - Lifetime JPH0722880B2 (en) | 1990-06-22 | 1990-06-22 | Positioning mechanism in pre-position of automatic surface grinder |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0722880B2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5534655A (en) * | 1994-02-03 | 1996-07-09 | Mitsui Toatsu Chemicals, Inc. | Process for preparing acrylamide |
| US6296555B1 (en) | 1998-10-19 | 2001-10-02 | Tokyo Seimitsu Co., Ltd. | Wafer machining apparatus |
| JP2003062750A (en) * | 2001-08-21 | 2003-03-05 | Okamoto Machine Tool Works Ltd | Temporary placing base for substrate and substrate transferring method |
| JP2007313627A (en) * | 2006-05-29 | 2007-12-06 | Fujikoshi Mach Corp | Work centering apparatus and work centering method |
-
1990
- 1990-06-22 JP JP2162800A patent/JPH0722880B2/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5534655A (en) * | 1994-02-03 | 1996-07-09 | Mitsui Toatsu Chemicals, Inc. | Process for preparing acrylamide |
| US6296555B1 (en) | 1998-10-19 | 2001-10-02 | Tokyo Seimitsu Co., Ltd. | Wafer machining apparatus |
| JP2003062750A (en) * | 2001-08-21 | 2003-03-05 | Okamoto Machine Tool Works Ltd | Temporary placing base for substrate and substrate transferring method |
| JP2007313627A (en) * | 2006-05-29 | 2007-12-06 | Fujikoshi Mach Corp | Work centering apparatus and work centering method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0722880B2 (en) | 1995-03-15 |
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