JPH0459464U - - Google Patents

Info

Publication number
JPH0459464U
JPH0459464U JP10175090U JP10175090U JPH0459464U JP H0459464 U JPH0459464 U JP H0459464U JP 10175090 U JP10175090 U JP 10175090U JP 10175090 U JP10175090 U JP 10175090U JP H0459464 U JPH0459464 U JP H0459464U
Authority
JP
Japan
Prior art keywords
support
holes
equal intervals
ferromagnetic material
contact needles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10175090U
Other languages
Japanese (ja)
Other versions
JPH0749417Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10175090U priority Critical patent/JPH0749417Y2/en
Publication of JPH0459464U publication Critical patent/JPH0459464U/ja
Application granted granted Critical
Publication of JPH0749417Y2 publication Critical patent/JPH0749417Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案電気抵抗探傷用探触子の一実施
例を示す部分截断の斜視図、第２図は同上の作動
要領の説明図である。第３図は従来探触子の部分
截断の斜視図、第４図は亀裂深さ測定要領の説明
図である。 １……支持体、２……貫通孔、３……接触針、
３ａ……先端部、４……支持杆、５……ストツパ
ー、６……リード線、７……保持体、８……貫通
孔、９……ねじ、１０……金属部材、１１……亀
裂。 FIG. 1 is a partially cutaway perspective view showing an embodiment of the electrical resistance flaw detection probe of the present invention, and FIG. 2 is an explanatory view of the operation procedure of the same. FIG. 3 is a partially cutaway perspective view of a conventional probe, and FIG. 4 is an explanatory diagram of a crack depth measurement procedure. 1...Support, 2...Through hole, 3...Contact needle,
3a...Tip, 4...Support rod, 5...Stopper, 6...Lead wire, 7...Holder, 8...Through hole, 9...Screw, 10...Metal member, 11...Crack .

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 等間隔に複数の貫通孔を設けた強磁性材の支持
体と、基部に上記貫通孔を前方への抜落ち抑止的
に通る非磁性材支持杆を設け先端部を円錐状に形
成した複数の強磁性材の接触針と、上記支持体の
前方に取付けられ上記接触針を等間隔にかつ軸方
向摺動自在に保持する複数の貫通孔を設けた箱状
の保持体とを具え、上記支持体と接触針とを逆向
き極性に磁化したことを特徴とする電気抵抗探傷
用探触子。 A support made of a ferromagnetic material with a plurality of through holes provided at equal intervals, a support rod made of a non-magnetic material that passes through the through holes at the base to prevent it from falling forward, and a plurality of support rods each having a conical tip. The support includes contact needles made of ferromagnetic material, and a box-shaped holder provided with a plurality of through holes that are attached to the front of the support and hold the contact needles at equal intervals and slidable in the axial direction. An electrical resistance flaw detection probe characterized by having a body and a contact needle magnetized with opposite polarities.
JP10175090U 1990-09-28 1990-09-28 Electric resistance flaw detection probe Expired - Lifetime JPH0749417Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10175090U JPH0749417Y2 (en) 1990-09-28 1990-09-28 Electric resistance flaw detection probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10175090U JPH0749417Y2 (en) 1990-09-28 1990-09-28 Electric resistance flaw detection probe

Publications (2)

Publication Number Publication Date
JPH0459464U true JPH0459464U (en) 1992-05-21
JPH0749417Y2 JPH0749417Y2 (en) 1995-11-13

Family

ID=31845459

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10175090U Expired - Lifetime JPH0749417Y2 (en) 1990-09-28 1990-09-28 Electric resistance flaw detection probe

Country Status (1)

Country Link
JP (1) JPH0749417Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013051675A1 (en) * 2011-10-07 2013-04-11 日本発條株式会社 Probe unit

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7154230B2 (en) 2017-05-15 2022-10-17 アウスター インコーポレイテッド Optical Imaging Transmitter with Enhanced Brightness
US11340336B2 (en) 2017-12-07 2022-05-24 Ouster, Inc. Rotating light ranging system with optical communication uplink and downlink channels
US10739189B2 (en) 2018-08-09 2020-08-11 Ouster, Inc. Multispectral ranging/imaging sensor arrays and systems
US11473970B2 (en) 2018-08-09 2022-10-18 Ouster, Inc. Subpixel apertures for channels in a scanning sensor array

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013051675A1 (en) * 2011-10-07 2013-04-11 日本発條株式会社 Probe unit
JPWO2013051675A1 (en) * 2011-10-07 2015-03-30 日本発條株式会社 Probe unit
US9291645B2 (en) 2011-10-07 2016-03-22 Nhk Spring Co., Ltd. Probe unit

Also Published As

Publication number Publication date
JPH0749417Y2 (en) 1995-11-13

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