JPH0463138U - - Google Patents
Info
- Publication number
- JPH0463138U JPH0463138U JP10371590U JP10371590U JPH0463138U JP H0463138 U JPH0463138 U JP H0463138U JP 10371590 U JP10371590 U JP 10371590U JP 10371590 U JP10371590 U JP 10371590U JP H0463138 U JPH0463138 U JP H0463138U
- Authority
- JP
- Japan
- Prior art keywords
- comparator
- handler
- ics
- control circuit
- compares
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10371590U JPH0463138U (2) | 1990-10-02 | 1990-10-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10371590U JPH0463138U (2) | 1990-10-02 | 1990-10-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0463138U true JPH0463138U (2) | 1992-05-29 |
Family
ID=31848694
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10371590U Pending JPH0463138U (2) | 1990-10-02 | 1990-10-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0463138U (2) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63253276A (ja) * | 1987-04-10 | 1988-10-20 | Nec Corp | Ｉｃ試験システム |
| JPH0224577A (ja) * | 1988-07-13 | 1990-01-26 | Mitsubishi Electric Corp | 半導体装置の検査用搬送装置 |
-
1990
- 1990-10-02 JP JP10371590U patent/JPH0463138U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63253276A (ja) * | 1987-04-10 | 1988-10-20 | Nec Corp | Ｉｃ試験システム |
| JPH0224577A (ja) * | 1988-07-13 | 1990-01-26 | Mitsubishi Electric Corp | 半導体装置の検査用搬送装置 |
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