JPH046452A - Residual chlorine meter - Google Patents
Residual chlorine meterInfo
- Publication number
- JPH046452A JPH046452A JP2109002A JP10900290A JPH046452A JP H046452 A JPH046452 A JP H046452A JP 2109002 A JP2109002 A JP 2109002A JP 10900290 A JP10900290 A JP 10900290A JP H046452 A JPH046452 A JP H046452A
- Authority
- JP
- Japan
- Prior art keywords
- span
- time
- residual chlorine
- drift
- residual
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
【発明の詳細な説明】
〈産業上の利用分野〉
本発明は、例えば3か月程度の長期間ノーメンテナンス
が要求される配水モニターに使用される残留塩素計に係
るものであり、詳しくはスパンドリフトを時間的に補償
するような改善を図った残留塩素計に関するものである
。Detailed Description of the Invention <Industrial Application Field> The present invention relates to a residual chlorine meter used in a water distribution monitor that requires no maintenance for a long period of time, for example about 3 months. This relates to a residual chlorine meter that has been improved to compensate for drift over time.
〈従来の技術〉 第3図は残留塩素計の概要の説明に供する図である。<Conventional technology> FIG. 3 is a diagram for explaining the outline of the residual chlorine meter.
第3図において、残留塩素計は、試料水1か流入流出す
る容器2内に、銀電極3と回転電極4からなる残塩検出
センサー5が設けられ、この時に前記回転電極4にあっ
てはガラス、セラミックビズ等の研磨材6内に挿入され
、この探な状態で回転電極表面が研磨されながら、残塩
検出センサー5の測定値に基づいて演算回路7において
試料水2の残留塩素を演算・測定する構造となっている
。In FIG. 3, the residual chlorine meter is equipped with a residual salt detection sensor 5 consisting of a silver electrode 3 and a rotating electrode 4 in a container 2 through which sample water 1 flows in and out. It is inserted into an abrasive material 6 such as glass or ceramic beads, and while the surface of the rotating electrode is being polished in this state, the residual chlorine in the sample water 2 is calculated in the calculation circuit 7 based on the measured value of the residual salt detection sensor 5.・It has a structure to be measured.
〈発明が解決しようとする課題〉
このような技術にあって、以下のような問題点があった
。<Problems to be Solved by the Invention> This technology has the following problems.
スパン校正は、一般的にドリフトに応じて短い周期で行
なっており、又、回転電極は第3図に示すように研磨状
態で測定が行なわれているが例えば3か月程度の長期間
ノーメンテナンスという訳にはいかない6尚、自動的に
スパン調整をすることかできる構成は考えられるか、長
期間安定にスパン点を供給できるスパン液については現
在得られていない。Span calibration is generally performed at short intervals depending on drift, and measurements are performed with the rotating electrode in a polished state as shown in Figure 3. However, it is not possible to think of a configuration that can automatically adjust the span, and currently there is no span liquid that can stably supply the span point for a long period of time.
本発明は、従来の技術の有するこのような問題点に鑑み
てなされたものであり、その目的とするところは、予め
実験的に求められたスパンドリフトのデータに基づき、
CPUを用いてプログラムにより経過時間に対しドリフ
ト補償分を演算して、スパンドリフトを補償することに
より長期間安定で信頼性の高い残留塩素計を提供するも
のである。The present invention has been made in view of these problems of the conventional technology, and its purpose is to
A CPU is used to calculate a drift compensation amount for elapsed time by a program to compensate for span drift, thereby providing a residual chlorine meter that is stable and highly reliable for a long period of time.
く課題を解決するための手段〉
上記目的を達成するために、本発明は、試料水内に残塩
検出センサーが設けられ、該残塩検出センサーの測定値
に基づいて前記試料水の残留塩素を測定する残留塩素計
において、
予め実験的に求められたスパンドリフトのデータに基づ
いて演算で使用するスパン係数やパラメタを設定する条
件設定手段と、
該条件設定手段により設定される値を取入れ、前記残塩
検出センサーで検出される試料水に含まれる残留塩素に
係わる検出信号を取込んで、該検出信号について、前記
スパン係数やパラメータ及び予めプログラムされた演算
式を用いて、時間経過に対して自動的に刻々と変化させ
たりその変化割合を変えたりしてドリフト補償分を演算
し、スパンドリフトを補償する演算をし、その時の残留
塩素濃度を演算する残留塩素濃度演算手段と、を具備し
たことを特徴とするものである。Means for Solving the Problems> In order to achieve the above object, the present invention provides a residual salt detection sensor in the sample water, and detects residual chlorine in the sample water based on the measured value of the residual salt detection sensor. In the residual chlorine meter that measures The detection signal related to residual chlorine contained in the sample water detected by the residual salt detection sensor is taken in, and the detection signal is calculated over time using the span coefficient, parameters, and pre-programmed calculation formula. residual chlorine concentration calculation means for calculating the drift compensation amount by automatically changing the rate of change from time to time or changing the rate of change, performing calculations to compensate for span drift, and calculating the residual chlorine concentration at that time. It is characterized by the fact that
〈実施例〉 実施例について図面を参照して説明する。<Example> Examples will be described with reference to the drawings.
尚、以下の図面において、第3図と重複する部分は同一
番号を付してその説明は省略する。In the following drawings, parts that overlap with those in FIG. 3 are given the same numbers, and their explanations will be omitted.
第1図は本発明の残留塩素計の具体的実施例の説明に供
する図である。FIG. 1 is a diagram for explaining a specific embodiment of the residual chlorine meter of the present invention.
第2図は第1図の説明に供する図であり、横軸に経過時
間(1)を取り、縦軸に残塩濃度のスパン(F)をとっ
た時の残留塩素計のスパンドリフトの特性曲線を示す。Figure 2 is a diagram used to explain Figure 1, and shows the characteristics of the span drift of the residual chlorine meter when the horizontal axis represents the elapsed time (1) and the vertical axis represents the span (F) of the residual salt concentration. Show a curve.
第1図乃至第2図において、8は残塩検出センサー5で
検出される試料水2に含まれる残留塩素に係わる検出信
号が導かれるプリアンプである。In FIGS. 1 and 2, reference numeral 8 denotes a preamplifier to which a detection signal related to residual chlorine contained in the sample water 2 detected by the residual salt detection sensor 5 is guided.
9はプリアンプ8で増幅された残塩検出センサ5の検出
信号をA/D (アナログ/デジタル)変換するA/D
変換回路である。10はA/D変換回路8でデジタル変
換された信号を取込んで、予め決められた演算式、及び
操作キー等の条件設定手段(以下「操作キー」という)
11によって設定される演算で使用されるスパン係数や
パラメータ(補償係数)等によって、残留塩素濃度を演
算してその演算結果を表示部12で表示するために出力
したり、例えばアナログ計器等が設けられる場合におい
てはそこにアナログ出力を供給するためのD/A (デ
ジタル/′アナログ)変換回7113にこの演算結果を
出力したりする残留塩素濃度演算手段である。尚、D/
A変換回路13は必要に応じて設けられるものであり、
残留塩素濃度演算手段10内に設けられるようにしても
よい事はいうまでもない。9 is an A/D for A/D (analog/digital) conversion of the detection signal of the residual salt detection sensor 5 amplified by the preamplifier 8;
It is a conversion circuit. Reference numeral 10 refers to condition setting means such as a predetermined arithmetic expression and operation keys (hereinafter referred to as "operation keys"), which takes in the signal digitally converted by the A/D conversion circuit 8.
The residual chlorine concentration can be calculated based on the span coefficients and parameters (compensation coefficients) used in the calculations set by 11, and the calculation results can be output to be displayed on the display unit 12. If the D/A (digital/'analog) conversion circuit 7113 is used to supply an analog output therein, the residual chlorine concentration calculation means outputs the calculation result to a D/A (digital/'analog) conversion circuit 7113 for supplying an analog output thereto. In addition, D/
The A conversion circuit 13 is provided as necessary,
Needless to say, it may be provided within the residual chlorine concentration calculation means 10.
ところで、前記残留塩素濃度演算手段10を前記目的を
達成するための構成とするために、具体的には、例えば
、l10(入出力インターフェイス)10a ROM
(リードオンリメモリ)10b、RAM(ランタムアク
セスメモリ)10C及び演算結果を外部に出力したりす
る演算/指令等の制御機能を有する演算制御部(CPU
iOdを主構成要素とする。そして、ROM 10bに
予め決められた(プログラムされた)演算式等を格納す
る。又、RAM10cには、l1010aを介して入力
する、操作キー11の操作・設定により演算で使用され
る、予め実験的に求められたスパンドリフトのデータに
基づいてきめられたスパン係数やパラメータ(補償係数
)等を格納する。By the way, in order to configure the residual chlorine concentration calculating means 10 to achieve the above object, specifically, for example, l10 (input/output interface) 10a ROM
(read only memory) 10b, RAM (random access memory) 10c, and a calculation control unit (CPU) that has control functions such as calculation/commands that output calculation results to the outside
The main component is iOd. Then, predetermined (programmed) arithmetic expressions and the like are stored in the ROM 10b. In addition, the RAM 10c stores span coefficients and parameters (compensation parameters) determined based on span drift data determined experimentally in advance and used in calculations by operating and setting the operation keys 11, which are input via the l1010a. coefficient) etc.
従って、CPU10dにおいて、1.1010aからA
/D変換回路9の検出信号を入力すると、この検出信号
について、RA M 10cに格納される演算で使用さ
れるスパン係数やパラメータをROM 10bに格納さ
れているプログラムにより時間経過に対して自動的に刻
々と変化させたり、その変化割合を変えたりして、その
時の残留塩素濃度(残塩濃度)を演算する。Therefore, in the CPU 10d, from 1.1010a to A
When the detection signal of the /D conversion circuit 9 is input, the span coefficients and parameters used in the calculation stored in the RAM 10c are automatically changed over time by the program stored in the ROM 10b. The residual chlorine concentration (residual salt concentration) at that time is calculated by changing the rate of change from moment to moment.
ここで、前記残塩濃度のスパンFは、第2図のように、
時間経過tと共に時開の関数/(α、1>により減少し
ていく。即ち、式で表わすと、F=F、−/(α・t)
・・・(1)で表わすことができる[
但し、FOをスパンの初期値、αを関数を決定する定数
即ち関数を決定するパラメータ(補償係数)とする]。Here, the span F of the residual salt concentration is as shown in Figure 2.
As time t passes, it decreases according to the time opening function /(α, 1>. In other words, when expressed in the formula, F=F, −/(α・t)
...It can be expressed as (1) [
However, FO is the initial value of the span, and α is a constant that determines the function, that is, a parameter (compensation coefficient) that determines the function].
従って、関数/(α・t)の逆関数(1/f(α・1)
)を発生させて、これをスパンFに乗算すれば、スパン
変化は補償することができる。Therefore, the inverse function of the function/(α・t) (1/f(α・1)
) and multiplying it by the span F, the span change can be compensated for.
スパン変化の補償値をF−とすれば、これは、即ち、(
1)式から、
F−=F ・(1// (a・t) l =Fo ’
・’(2)として求めることかできる。つまり、スパン
係数。If the compensation value for span change is F-, then this is (
From formula 1), F-=F ・(1// (a・t) l = Fo'
・It can be obtained as '(2). That is, the span factor.
パラメータ及びプログラムにより、検出信号を時間経過
tに対して刻々と変化させたり変化割合を変えたりして
、経過時間tに対してドリフト補償分を演算し更にスパ
ンドリフトを補償する演算をすることができ、長期間安
定で信頼性の高いその時の残留塩素濃度(残塩濃度)を
演算する事ができる。Depending on the parameters and program, it is possible to calculate the drift compensation amount for the elapsed time t and further to compensate for the span drift by changing the detection signal moment by moment or changing the rate of change with respect to the elapsed time t. It is possible to calculate the current residual chlorine concentration (residual salt concentration), which is stable and reliable for a long period of time.
尚、パラメータ(補償係数)αは任意に操作キ10によ
り設定することができる。Note that the parameter (compensation coefficient) α can be arbitrarily set using the operation key 10.
〈発明の効果〉
本発明は、以上説明したように構成されているので、次
に記載するような効果を奏する。<Effects of the Invention> Since the present invention is configured as described above, it produces the following effects.
■ニスパンのドリフ1〜を自動的にプログラムによる演
算により補償するように構成できる。(2) It can be configured to automatically compensate for Nispan drift 1 through program calculation.
■:これにより、長期間に渡り安定した出力を得ること
ができる。■: This allows stable output to be obtained over a long period of time.
■:これにより、長期間ノーメンテナンスの製品か実現
できる。■: This makes it possible to create a product that requires no maintenance for a long period of time.
■:低コストでしかも簡単に実現できる。■: It can be realized easily and at low cost.
第1図は本発明の残留塩素計の具体的実施例の説明に供
する図、第2図は第1図の説明に供する図、第3図は残
留塩素計の概要の説明に供する図である。
2・・・試料水、5・・・残塩検出センサー、8・・・
プリアンプ、9・・・A/D変換回路、10・・・残留
演算濃度演算手段、11・・・条件設定手段(操作キー
)、12・・・表示部。FIG. 1 is a diagram for explaining a specific embodiment of the residual chlorine meter of the present invention, FIG. 2 is a diagram for explaining FIG. 1, and FIG. 3 is a diagram for explaining the outline of the residual chlorine meter. . 2... Sample water, 5... Residual salt detection sensor, 8...
Preamplifier, 9...A/D conversion circuit, 10...Residual calculation concentration calculation means, 11...Condition setting means (operation keys), 12...Display unit.
Claims (1)
ンサーの測定値に基づいて前記試料水の残留塩素を測定
する残留塩素計において、 予め実験的に求められたスパンドリフトのデータに基づ
いて演算で使用するスパン係数やパラメータを設定する
条件設定手段と、 該条件設定手段により設定される値を取入れ、前記残塩
検出センサーで検出される試料水に含まれる残留塩素に
係わる検出信号を取込んで、該検出信号について、前記
スパン係数やパラメータ及び予めプログラムされた演算
式を用いて、時間経過に対して自動的に刻々と変化させ
たりその変化割合を変えたりしてドリフト補償分を演算
し、スパンドリフトを補償する演算をし、その時の残留
塩素濃度を演算する残留塩素濃度演算手段と、を具備し
たことを特徴とする残留塩素計。[Scope of Claims] A residual chlorine meter is provided with a residual salt detection sensor in the sample water, and measures residual chlorine in the sample water based on the measured value of the residual salt detection sensor. a condition setting means for setting span coefficients and parameters to be used in calculations based on span drift data; and a condition setting means for setting span coefficients and parameters to be used in calculations based on span drift data; A detection signal related to chlorine is taken in, and the detection signal is automatically changed from moment to moment or the rate of change is changed over time using the span coefficients, parameters, and pre-programmed arithmetic expressions. A residual chlorine concentration calculation means for calculating a drift compensation amount, calculating a span drift compensation amount, and calculating a residual chlorine concentration at that time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2109002A JP2850481B2 (en) | 1990-04-25 | 1990-04-25 | Residual chlorine meter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2109002A JP2850481B2 (en) | 1990-04-25 | 1990-04-25 | Residual chlorine meter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH046452A true JPH046452A (en) | 1992-01-10 |
| JP2850481B2 JP2850481B2 (en) | 1999-01-27 |
Family
ID=14499080
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2109002A Expired - Fee Related JP2850481B2 (en) | 1990-04-25 | 1990-04-25 | Residual chlorine meter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2850481B2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5483750A (en) * | 1993-06-16 | 1996-01-16 | Kabushiki Kaisha Komatsu Seisakusho | Springback angle measuring instrument for V-bending |
| US5802788A (en) * | 1994-02-22 | 1998-09-08 | Kabushiki Kaisha Komatsu Seisakusho Komatsu Plastics Industry Co., Ltd. | Fixing device for tensioning member for prestressed concrete |
| JP2020148652A (en) * | 2019-03-14 | 2020-09-17 | 東亜ディーケーケー株式会社 | Cable with data processing function, measurement system, and control system |
| CN115266835A (en) * | 2022-07-05 | 2022-11-01 | 华电国际电力股份有限公司技术服务分公司 | A method for measuring the salt content of wastewater with multiple compensations based on conductivity measurement |
-
1990
- 1990-04-25 JP JP2109002A patent/JP2850481B2/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5483750A (en) * | 1993-06-16 | 1996-01-16 | Kabushiki Kaisha Komatsu Seisakusho | Springback angle measuring instrument for V-bending |
| US5802788A (en) * | 1994-02-22 | 1998-09-08 | Kabushiki Kaisha Komatsu Seisakusho Komatsu Plastics Industry Co., Ltd. | Fixing device for tensioning member for prestressed concrete |
| JP2020148652A (en) * | 2019-03-14 | 2020-09-17 | 東亜ディーケーケー株式会社 | Cable with data processing function, measurement system, and control system |
| CN115266835A (en) * | 2022-07-05 | 2022-11-01 | 华电国际电力股份有限公司技术服务分公司 | A method for measuring the salt content of wastewater with multiple compensations based on conductivity measurement |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2850481B2 (en) | 1999-01-27 |
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