JPH0464892A - Exhaust device - Google Patents
Exhaust deviceInfo
- Publication number
- JPH0464892A JPH0464892A JP2177184A JP17718490A JPH0464892A JP H0464892 A JPH0464892 A JP H0464892A JP 2177184 A JP2177184 A JP 2177184A JP 17718490 A JP17718490 A JP 17718490A JP H0464892 A JPH0464892 A JP H0464892A
- Authority
- JP
- Japan
- Prior art keywords
- pressure
- exhaust
- pipe
- branch pipe
- exhaust pipe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Chemical Vapour Deposition (AREA)
- Furnace Details (AREA)
Abstract
Description
【発明の詳細な説明】 [産業上の利用分野コ 本発明は排気装置に関する。[Detailed description of the invention] [Industrial application fields] The present invention relates to an exhaust system.
[従来の技術]
従来から、半導体製造工程における気体を伴う一定圧力
下で行われる成膜反応の反応装置では、排気管に設けら
れた流量調節弁を調節して装置内を一定圧力に保持する
ようにしたものとして、特開昭62−63421号、特
開昭63−238281号、特開昭63−304620
号公報等がある。[Prior Art] Conventionally, in a reaction device for a film formation reaction performed under a constant pressure with gas in a semiconductor manufacturing process, the inside of the device is maintained at a constant pressure by adjusting a flow control valve provided in an exhaust pipe. Japanese Patent Application Laid-Open No. 62-63421, JP-A No. 63-238281, and JP-A No. 63-304620
There are publications etc.
しかし、半導体製造装置の熱処理装置等の成膜装置では
、装置内で行われる反応が一定条件下で行われなければ
形成される膜厚が不均一になってしまい、半導体素子の
歩留りが低下してしまう。However, in film-forming equipment such as heat treatment equipment for semiconductor manufacturing equipment, if the reactions that take place within the equipment are not carried out under certain conditions, the thickness of the formed film will become uneven, reducing the yield of semiconductor devices. It ends up.
そのため、熱処理装置に接続された排気装置でも排気管
内の圧力を微妙にコントロールして熱処理装置内を一定
圧に保持しなければならなかった。Therefore, even in the exhaust device connected to the heat treatment apparatus, the pressure inside the exhaust pipe had to be delicately controlled to maintain a constant pressure inside the heat treatment apparatus.
ところで熱処理装置は、通常複数台設置され、その排気
装置は工場全体の排気系に接続され、強力なファンで排
気されるようになっている。従って、熱処理装置の一部
しか駆動されない場合は排気系が強すぎて排気管の負圧
が大きくなってしまい熱処理装置内の圧力に大きく影響
してしまった。By the way, a plurality of heat treatment devices are usually installed, and their exhaust devices are connected to the exhaust system of the entire factory, and the exhaust is exhausted using powerful fans. Therefore, when only a portion of the heat treatment apparatus is driven, the exhaust system is too strong and the negative pressure in the exhaust pipe becomes large, which greatly affects the pressure inside the heat treatment apparatus.
そのため、排気装置の排気管に支流管を設け、支流管に
重力の方向に対して垂直に配置した弁を設け、この弁を
大気圧と排気管内の圧力差が所定値以上に達すると(排
気管内の圧力が低過ぎる場合)大気圧により弁が押し上
げられ、大気が排気管内に入り、排気管の圧力が上昇す
るような重量に予め作成して自動的に開閉できるような
排気圧調整装置が開発された。Therefore, a tributary pipe is provided in the exhaust pipe of the exhaust system, and a valve is installed in the tributary pipe perpendicular to the direction of gravity, and this valve is activated when the pressure difference between atmospheric pressure and the exhaust pipe reaches a predetermined value (exhaust (If the pressure inside the pipe is too low) Atmospheric pressure pushes up the valve, allowing the atmosphere to enter the exhaust pipe, increasing the pressure in the exhaust pipe. It has been developed.
[発明が解決すべき課題]
しかし、このような排気装置であっても、弁の重さを排
気管内圧と大気圧の圧力差に鋭敏に応答して開閉するよ
うに例えば−1mmH2Oで作動するように作成するの
は難しく、また工場排気系が大幅に負圧になった場合に
は弁が完全に開放状態となり排気管内を所望の一定圧に
保持することができなくなり、熱処理装置内の圧力が変
動し、膜厚も不均一に形成されてしまうという欠点があ
った。[Problem to be solved by the invention] However, even in such an exhaust system, the weight of the valve is operated at -1 mmH2O, for example, so as to open and close in response to the pressure difference between the exhaust pipe internal pressure and atmospheric pressure. It is difficult to create such a system, and if the factory exhaust system becomes significantly negative pressure, the valve will be completely open and the exhaust pipe will not be able to maintain the desired constant pressure, causing the pressure inside the heat treatment equipment to drop. This has the disadvantage that the film thickness varies and the film thickness is non-uniform.
本発明は」1記の欠点を解消するためになされたもので
あって、排気装置の排管内圧を一定に保持し、工場排気
系等の排気系に接続されていても過度に減圧になったり
することもなく、工場排気系の変動に対して排気管内の
圧力を一定に保持できる。そのため反応装置内の圧力も
一定に保持され、従って一定条件下で反応が行われるた
め、製品の品質を向」ニさせることができる排気装置を
提供することを目的とする。The present invention has been made in order to eliminate the drawback described in item 1.The present invention maintains the internal pressure of the exhaust pipe of the exhaust system at a constant level, so that even if it is connected to an exhaust system such as a factory exhaust system, the pressure will not be excessively reduced. The pressure inside the exhaust pipe can be maintained constant despite fluctuations in the factory exhaust system. Therefore, it is an object of the present invention to provide an exhaust device that can improve the quality of products because the pressure inside the reactor is also kept constant and the reaction is carried out under constant conditions.
[課題を解決するための手段]
」1記の目的を達成するため、本発明の排気装置は、反
応装置の排気管に設けられ外気圧及び前記排気管内の圧
力差が所定量−1−になると外気により開成される弁を
備えた支流管と、前記支流管の」1流及び下流にそれぞ
れ設けられた圧ノj調整弁とを備えたものである。[Means for Solving the Problems] In order to achieve the object described in item 1, the exhaust system of the present invention is provided in the exhaust pipe of a reaction device, and the exhaust system is provided in an exhaust pipe of a reaction device so that the pressure difference between the outside air pressure and the pressure inside the exhaust pipe becomes a predetermined amount -1-. This system is equipped with a branch pipe equipped with a valve that is opened by outside air, and pressure adjustment valves provided on the first and downstream sides of the branch pipe, respectively.
[作用]
排気管内の圧力と外気圧の差が所定の位置」二になった
時(排気管内が過度に減圧されてしまった場合)、その
自重に対抗した外気圧に押され開口して外気を流入させ
排気管内圧を所定の値に」1昇させることができる自動
開閉の弁を設けた支流管を排気装置の排気管に設ける。[Function] When the difference between the pressure inside the exhaust pipe and the outside pressure reaches a predetermined level (if the inside of the exhaust pipe is excessively depressurized), it is pushed open by the outside pressure opposing its own weight, and outside air is released. The exhaust pipe of the exhaust system is provided with a tributary pipe equipped with an automatically opening/closing valve that allows the flow of water to raise the internal pressure of the exhaust pipe to a predetermined value.
その支流管の上流と下流に圧力調整弁を設け、排気管内
・ρガス流量を調整することにより、支流管に設けられ
た弁を最良の条件で動作させることができ、反応管と外
気圧の差を所望の一定圧にすることができる。By installing pressure regulating valves upstream and downstream of the tributary pipe and adjusting the flow rate of ρ gas in the exhaust pipe, the valve installed in the tributary pipe can be operated under the best conditions, and the pressure between the reaction pipe and the outside pressure can be adjusted. The difference can be made to a desired constant pressure.
[実施例]
以下、本発明の抽気装置を半導体製造工程の熱処理装置
に適用した一実施例を図面を参照して説明する。[Example] Hereinafter, an example in which the air extraction apparatus of the present invention is applied to a heat treatment apparatus for a semiconductor manufacturing process will be described with reference to the drawings.
第1図に示す反応装置である熱処理装置1は、円筒状の
プロセスチューブ5を備え、プロセスチューブ5の内部
には処理される半導体ウエノ\2を支持する石英ボート
3などを載置する載置台4が備えられる。プロセスチュ
ーブ5はその周囲を例えば円筒状の抵抗加熱コイルヒー
タ6で囲繞され、開口部か蓋体7で閉じられ、上記プロ
セスチューブ5の内部が500〜1200℃に適宜設定
加熱できるようになっている。プロセスチューブ5の上
部には流量計8を介して反応ガス供給系9に接続される
反応ガス(Jj給口10がプロセスチューブ5の下部に
は排気装置11に接続される反応ガス排気口12が備え
られ、半導体ウェハ2に成膜等の処理をした余剰の反応
ガスや反応生成ガスの混合ガスGが排気口12から排気
装置11に流入されるようになっている。排気装置11
には熱処理装置1の排気口12に接続される排気管13
と、排気管工3に設けられる支流管14と、支流管14
の」1流及び下流に設けられる圧力調整弁151及び1
5−2等が備えられる。そして、この圧力調整弁15−
1及び15−2のそれぞれにマノメータ等の差圧計16
−1及び16−2が設けられる。支流管14は第2図に
示すように一端は排気管13に接続され、他端は軸が鉛
直になるよう屈曲させて成る。そして鉛直部17に大径
部18を設け、大径部18に弾性部材から成る0リング
19を取着させ、0リング19」二に可動弁20が配置
される。可動弁20は例えば外気圧と排気管13内の差
圧が一10mmH2Oを所望とすれば、1気圧= 10
000mmH2O= I K g 7cm2の関係から
Ig/cm2の重さにすればよい。可動弁20の重さの
調整は材質や厚さにより行う。A heat treatment apparatus 1, which is a reaction apparatus shown in FIG. 1, is equipped with a cylindrical process tube 5, and inside the process tube 5 is a mounting table on which a quartz boat 3 and the like for supporting a semiconductor wafer 2 to be processed is placed. 4 are provided. The process tube 5 is surrounded by, for example, a cylindrical resistance heating coil heater 6, and is closed with an opening or a lid 7, so that the inside of the process tube 5 can be heated at an appropriately set temperature of 500 to 1200°C. There is. The upper part of the process tube 5 has a reactive gas supply port 10 connected to a reactive gas supply system 9 via a flow meter 8, and the lower part of the process tube 5 has a reactive gas exhaust port 12 connected to an exhaust device 11. A mixed gas G of surplus reaction gas and reaction product gas after processing such as film formation on the semiconductor wafer 2 flows into the exhaust device 11 from the exhaust port 12.Exhaust device 11
is an exhaust pipe 13 connected to the exhaust port 12 of the heat treatment apparatus 1.
, a tributary pipe 14 provided in the exhaust pipe work 3, and a tributary pipe 14
Pressure regulating valves 151 and 1 provided in the 1st stream and downstream of
5-2 etc. will be provided. And this pressure regulating valve 15-
Differential pressure gauge 16 such as a manometer for each of 1 and 15-2
-1 and 16-2 are provided. As shown in FIG. 2, the branch pipe 14 has one end connected to the exhaust pipe 13, and the other end bent so that its axis is vertical. A large-diameter portion 18 is provided in the vertical portion 17, an O-ring 19 made of an elastic member is attached to the large-diameter portion 18, and a movable valve 20 is disposed on the O-ring 19'. For example, if the desired differential pressure between the outside pressure and the exhaust pipe 13 is 110 mm H2O, the movable valve 20 has a pressure of 1 atm = 10
From the relationship: 000mmH2O=I K g 7cm2, the weight should be Ig/cm2. The weight of the movable valve 20 is adjusted depending on the material and thickness.
このような排気装置11を備えた熱処理装置1は通常工
場内に多数設置され、これらの排気装置11の排気管1
3はそれぞれ例えば工場排気系等の排気能力の大きな排
気系ファン21に共通排気管22を介して接続される。A large number of heat treatment apparatuses 1 equipped with such exhaust devices 11 are usually installed in a factory, and the exhaust pipes 1 of these exhaust devices 11
3 are each connected via a common exhaust pipe 22 to an exhaust system fan 21 having a large exhaust capacity, such as a factory exhaust system.
このような構成の熱処理装置の排気装置の動作を説明す
る。The operation of the exhaust device of the heat treatment apparatus having such a configuration will be explained.
複数の熱処理装置1のうち、1台のみが稼動し、他は停
止されている場合を述べる。流量計8により反応ガス供
給系9から供給される反応ガスの所定量を測定し、所定
量の反応ガスをプロセスチューブ5の反応ガス供給口1
0から供給する。コイルヒータ6により例えば1000
°Cに加熱されたプロセスチューブ5内で半導体ウェハ
2が処理される。処理後、余剰の反応ガス及び生成ガス
の混合ガスGは排気口12から排気管13に流入される
。この時、他の熱処理装置1は稼動されず、従って他の
排気装置には混合ガスGが流れないため排気ファン21
の排気能ノjに対して混合ガスGの流量の割合が少なく
なる。支流管14の可動弁20のみの働きであると、排
気管内圧の所望の差圧が例えば−1〜OmmH,O以下
であっても、排気管13の負圧が非常に大きくなるまで
可動しない。A case will be described in which only one of the plurality of heat treatment apparatuses 1 is in operation and the others are stopped. The flow meter 8 measures a predetermined amount of the reaction gas supplied from the reaction gas supply system 9, and the predetermined amount of the reaction gas is supplied to the reaction gas supply port 1 of the process tube 5.
Supply from 0. For example, 1000 by the coil heater 6.
A semiconductor wafer 2 is processed in a process tube 5 heated to .degree. After the treatment, the excess reaction gas and generated gas mixture G flows into the exhaust pipe 13 from the exhaust port 12 . At this time, the other heat treatment apparatuses 1 are not operated, and therefore the mixed gas G does not flow to the other exhaust apparatuses, so the exhaust fan 21
The ratio of the flow rate of the mixed gas G to the exhaust capacity No.j becomes smaller. If only the movable valve 20 of the tributary pipe 14 functions, it will not move until the negative pressure of the exhaust pipe 13 becomes extremely large, even if the desired differential pressure in the exhaust pipe internal pressure is, for example, -1 to OmmH,O or less. .
例えば−10mmH2O以下になると支流管14に設け
られた可動弁20が外気圧に押されてOリング19から
浮上する。そして外気が排気管13内に流入され、排気
管13は過剰な負圧状態でなく一10mmH2Oに保た
れる。この時、排気管13の支流管14の上流に設けら
れた圧力調整弁151を調整し、混合ガスGの流量を調
整し差圧計16−1の検出値が所望の−1−QmmH2
0になるようにする。また、支流管14の下流の圧力調
整弁15−2は、支流管14の開口部を塞いだ状態で排
気管13内が所望の差圧例えば−15〜2(111mH
20を示すように、差圧計16−2の検出値を検出しな
がら調整する。以上ように圧力調整弁15−1.15−
2を調整することにより支流管14で行なう圧力調整を
最適な圧力条件で行なうことができる。For example, when the temperature becomes -10 mm H2O or lower, the movable valve 20 provided in the branch pipe 14 is pushed by the external pressure and floats up from the O-ring 19. Then, outside air flows into the exhaust pipe 13, and the exhaust pipe 13 is kept at -10 mmH2O without being in an excessively negative pressure state. At this time, the pressure regulating valve 151 provided upstream of the tributary pipe 14 of the exhaust pipe 13 is adjusted to adjust the flow rate of the mixed gas G so that the detected value of the differential pressure gauge 16-1 is -1-QmmH2.
Make it 0. Further, the pressure regulating valve 15-2 downstream of the tributary pipe 14 is configured to maintain a desired differential pressure in the exhaust pipe 13, for example, -15 to 2 (111 mH) with the opening of the tributary pipe 14 closed.
20, the adjustment is made while detecting the detected value of the differential pressure gauge 16-2. As above, the pressure regulating valve 15-1.15-
By adjusting 2, the pressure adjustment in the tributary pipe 14 can be performed under optimal pressure conditions.
そのため、支流管14の可動弁20は常に最適な圧力条
件である−10 mm1−I 20前後で動作し、圧力
調整弁15−1を調整することで圧力調整弁15−1の
上流部を所望の圧ノコに保持することができる。工場排
気系と稼働される装置との関係で圧力調整弁15−2を
適宜調整しておくことにより、工場排気系のによる吸引
力の変動により生じる圧力変動に拘らず熱処理も一定条
件下で行うことができる。Therefore, the movable valve 20 of the tributary pipe 14 always operates at the optimum pressure condition of around -10 mm1-I20, and by adjusting the pressure regulating valve 15-1, the upstream part of the pressure regulating valve 15-1 can be adjusted to the desired value. Can be held in pressure saw. By appropriately adjusting the pressure regulating valve 15-2 in relation to the factory exhaust system and the equipment being operated, heat treatment can be performed under constant conditions regardless of pressure fluctuations caused by fluctuations in the suction force of the factory exhaust system. be able to.
また他の実施例として、第1図に示すように差圧計16
0−1及び160−2の出力により圧力調整弁150−
1及び150−2を自動的に駆動しフィードバック制御
を行うようにしてもよい。Further, as another embodiment, as shown in FIG. 1, a differential pressure gauge 16
The pressure regulating valve 150- is activated by the output of 0-1 and 160-2.
1 and 150-2 may be automatically driven to perform feedback control.
本発明は」1記の実施例に限定されるものでなく、工場
排気系に接続されず、単一の装置にも適用できる。また
、熱処理装置にも限定されず、CVD装置や処理液例え
ばレジストを塗布するスピンコータ装置等反応圧を一定
に保って処理を行う装置に好適に用いることができる。The present invention is not limited to the first embodiment, but can also be applied to a single device that is not connected to a factory exhaust system. Further, the present invention is not limited to heat treatment equipment, and can be suitably used in equipment that performs processing while keeping the reaction pressure constant, such as a CVD equipment or a spin coater equipment that applies a processing liquid such as a resist.
[発明の効果]
以」二の説明からも明らかなように、本発明の排気装置
は、外気圧と排気管内の差圧が大きくなった時に作動す
る可動弁を備えた支流管の上流と下流のそれぞれに圧力
調整弁を設けたため、支流管で行う圧力調整を最適な圧
力条件で行うことができ、高精度に均一なり1−気管内
圧を保持でき、従って反応装置内の圧力も所望の一定圧
に維持できる。[Effects of the Invention] As is clear from the following explanation, the exhaust system of the present invention has a movable valve that operates when the pressure difference between the outside pressure and the exhaust pipe increases. Since a pressure regulating valve is installed in each of the tributary tubes, the pressure in the tributary tube can be adjusted under optimal pressure conditions, ensuring uniformity with high precision and maintaining the intratracheal pressure. Can maintain pressure.
そのため、半導体ウェハの均一処理ができ、高品位な製
品の製造を行うことができる。Therefore, semiconductor wafers can be processed uniformly, and high-quality products can be manufactured.
第1図は本発明の一実施例を示す構成図、第2図は第1
図に示す一実施例の要部を示す図である。
・・・・・・熱処理装置(反応装置)
1・・・・・・排気装置
3・・・・・・排気管
4・・・・・・支流管
5−1.15−2.150−1.1.50−2・・・・
・・圧力調整弁FIG. 1 is a configuration diagram showing one embodiment of the present invention, and FIG.
FIG. 3 is a diagram illustrating a main part of the embodiment shown in the figure. ... Heat treatment device (reaction device) 1 ... Exhaust device 3 ... Exhaust pipe 4 ... Branch pipe 5-1.15-2.150-1 .1.50-2...
・・Pressure regulating valve
Claims (1)
の圧力差が所定以上になると外気により開成される弁を
備えた支流管と、前記支流管の上流及び下流にそれぞれ
設けられた圧力調整弁とを備えたことを特徴とする排気
装置。A branch pipe provided in the exhaust pipe of the reactor and equipped with a valve that is opened by the outside air when the pressure difference between the outside pressure and the pressure in the exhaust pipe exceeds a predetermined value, and pressure regulating valves provided upstream and downstream of the branch pipe, respectively. An exhaust system characterized by comprising:
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17718490A JP2868853B2 (en) | 1990-07-04 | 1990-07-04 | Heat treatment equipment |
| US07/644,565 US5088922A (en) | 1990-01-23 | 1991-01-23 | Heat-treatment apparatus having exhaust system |
| KR1019910001136A KR0147044B1 (en) | 1990-01-23 | 1991-01-23 | Heat treatment apparatus having exhaust system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17718490A JP2868853B2 (en) | 1990-07-04 | 1990-07-04 | Heat treatment equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0464892A true JPH0464892A (en) | 1992-02-28 |
| JP2868853B2 JP2868853B2 (en) | 1999-03-10 |
Family
ID=16026650
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17718490A Expired - Lifetime JP2868853B2 (en) | 1990-01-23 | 1990-07-04 | Heat treatment equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2868853B2 (en) |
-
1990
- 1990-07-04 JP JP17718490A patent/JP2868853B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2868853B2 (en) | 1999-03-10 |
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