JPH0465109A - Apparatus for attaching tape to wafer - Google Patents

Apparatus for attaching tape to wafer

Info

Publication number
JPH0465109A
JPH0465109A JP17778590A JP17778590A JPH0465109A JP H0465109 A JPH0465109 A JP H0465109A JP 17778590 A JP17778590 A JP 17778590A JP 17778590 A JP17778590 A JP 17778590A JP H0465109 A JPH0465109 A JP H0465109A
Authority
JP
Japan
Prior art keywords
film
semiconductor wafer
wafer
pressing
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17778590A
Other languages
Japanese (ja)
Other versions
JP2945089B2 (en
Inventor
Takaharu Saeki
敬治 佐伯
Tsuneaki Komazawa
駒沢 恒明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP17778590A priority Critical patent/JP2945089B2/en
Publication of JPH0465109A publication Critical patent/JPH0465109A/en
Application granted granted Critical
Publication of JP2945089B2 publication Critical patent/JP2945089B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To obtain a low cost and simplified apparatus for attaching a tape to a wafer by forming a pressing part of press with a soft property material having recovery function and allowing the pressing surface to gradually curved and is protruded toward a film from the external side to the center. CONSTITUTION:A pressing part 2 is formed with a soft property material and is protruded by gradually curving toward the center from the external circumference. When a vacuum chamber B is evacuated to predetermined degree of vacuum to allow the pressing part 2 to move downward, a film C attached to a supporting frame E is pushed by a pushing surface 3, protruding the center thereof. When it is further moved downward, the pressing part 2 of the soft property material is pressed by a semiconductor wafer A through the film C and is deformed conforming to the shape. Thereby, bubbles between the film C and semiconductor wafer A are pushed out to the external side from the center. Moreover, when a press 1 is further operated for pressing, bubbles between the film C and semiconductor wafer A are further pushed out to the outside, causing these materials to be in close contact.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明のウェハへのテープ貼付装置は、半導体ウェハの
一面にテープを貼付けるのに使用されるものである。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Field of Application) The apparatus for applying tape to a wafer of the present invention is used to apply a tape to one surface of a semiconductor wafer.

(従来の技術) 半導体ウェハは製造の後工程において、その表面に保護
テープが、裏面にあるフレームに張り付けられているテ
ープが貼付けられて、切削加工時等の損傷から保護して
いる。
(Prior Art) In the post-manufacturing process, semiconductor wafers are protected from damage during cutting by applying a protective tape to the front surface and a tape attached to a frame on the back surface of the semiconductor wafer.

この場合、フィルムと半導体ウェハとの間に気泡が入ら
ないように、テープ貼付装置の真空チャンバ内で貼付け
られている。従来のテープ貼付装置としは第8図に示す
ようなものがあった。これは真空チャンバB内を真空排
気装置により所定の真空度に排気した後、同チャンバB
内に設けられたローラDにより、支持フレームEに貼付
けられているフィルムCを半導体ウェハAの上に矢印Z
方向から押付け、同ローラDを同図の矢印X方向に回転
させなから矢印y方向に移動させてフィルムCを半導体
ウェハAに押し付けると共に、半導体ウェハAとフィル
ムCとの間の気泡を押出していた。
In this case, the film and the semiconductor wafer are pasted in a vacuum chamber of a tape pasting device to prevent air bubbles from entering between the film and the semiconductor wafer. A conventional tape applicator is shown in FIG. This is done after evacuating the inside of vacuum chamber B to a predetermined degree of vacuum using a vacuum evacuation device.
A roller D provided inside moves the film C attached to the support frame E onto the semiconductor wafer A in the direction of arrow Z.
The film C is pressed against the semiconductor wafer A by pressing the film C against the semiconductor wafer A by pressing the film C against the semiconductor wafer A by pressing the film C against the semiconductor wafer A by rotating the same roller D in the direction of the arrow X in the same figure and then moving it in the direction of the arrow y. Ta.

ちなみに前記フィルムCの裏面には予め接着剤が塗布さ
れており、同フィルムCを半導体ウエハAに押付けるだ
けで両者が接着されるようにしである。
Incidentally, an adhesive is applied to the back surface of the film C in advance, so that simply by pressing the film C onto the semiconductor wafer A, the two can be bonded together.

(発明が解決しようとする課題) しかしなから従来の真空貼付装置では、前記ローラDを
回転させたり、移動させたりするローラ駆動装置Fを、
真空チャンバB内に設けなければならないので、同チャ
ンバB内の容量が大きくなる。このように容量が大きく
なると真空チャンバBの排気量が多くなるため、同チャ
ンバB内を高い真空度にするには大容量の排気装置が必
要となり、真空装置が大型で、しかもコスト高になる。
(Problem to be Solved by the Invention) However, in the conventional vacuum pasting device, the roller drive device F that rotates or moves the roller D is
Since it must be provided within vacuum chamber B, the capacity within chamber B becomes large. As the capacity increases, the amount of exhaust from vacuum chamber B increases, so a large-capacity exhaust device is required to create a high degree of vacuum in chamber B, making the vacuum device large and expensive. .

また、ローラDを真空中で動作させるためには、ローラ
駆動装置Fをはじめとする様々な箇所を気密にする必要
があるので、構造が複雑になり、装置がより一層高価に
なってしまう。
Furthermore, in order to operate the roller D in a vacuum, various parts including the roller drive device F need to be made airtight, which makes the structure complicated and the device even more expensive.

(発明の目的) 本発明の目的は、従来のようなローラを使用せず、真空
排気装置も小型で、構造が簡潔で、安価なウェハへのテ
ープ貼付装置を提供することにある。
(Objective of the Invention) An object of the present invention is to provide an apparatus for applying tape to a wafer that does not use conventional rollers, has a small vacuum evacuation device, has a simple structure, and is inexpensive.

(課題を解決するための手段) 本発明のウェハへのテープ貼付装置は第1図〜第6図の
ように、真空チャンバB内において、同チャンバB内の
ウェハ支持台5にセットされた半導体ウェハAの一面に
フィルムCを貼付ける半導体ウェハへのテープ貼付装置
において、前記真空チャンバB内のウェハ支持台5の上
方にフィルムCを半導体ウェハAに押し付けるプレス装
置1が設けられ、同プレス装置1の押圧部2が復元性を
有する軟質材料で形成され、同押圧部2の押圧面3が外
側から中央部に向けて次第にフィルムC側に湾曲して突
出するように形成されてなることを特徴とするものであ
る。
(Means for Solving the Problems) As shown in FIGS. 1 to 6, the device for applying tape to a wafer according to the present invention is configured to apply tape to a semiconductor set on a wafer support stand 5 in a vacuum chamber B, as shown in FIGS. In an apparatus for applying tape to a semiconductor wafer that applies a film C to one surface of a wafer A, a press apparatus 1 for pressing a film C onto the semiconductor wafer A is provided above the wafer support stand 5 in the vacuum chamber B, and the press apparatus The pressing part 2 of 1 is formed of a soft material having resilience, and the pressing surface 3 of the pressing part 2 is formed so as to gradually curve and protrude toward the film C from the outside toward the center. This is a characteristic feature.

(作用) 本発明のウェハへのテープ貼付装置では抑圧部2が軟質
材料で形成され、しかも外周から中央部に向けて次第に
湾曲して突出しているので、図示されていない真空排気
装置により第2図の真空チャンバB内を所定の真空度に
なるまで排気してから、第3図のようにプレス装置1の
押圧部2を同図の矢印を方向に降下させると、支持フレ
ームEに貼付けられているフィルムCが、同押圧部2の
押圧面3により押されて中央部が突出する。
(Function) In the apparatus for applying tape to a wafer according to the present invention, the suppressing part 2 is formed of a soft material and protrudes gradually from the outer periphery toward the center. After evacuating the vacuum chamber B shown in the figure to a predetermined degree of vacuum, when the pressing part 2 of the press device 1 is lowered in the direction of the arrow in the figure as shown in FIG. The film C is pressed by the pressing surface 3 of the pressing section 2, and its central portion protrudes.

この状態から更にプレス装置lにより押圧部2を降下さ
せると、第4図のように軟質材料からなる抑圧部2が、
フィルムCを介して半導体ウェハAに押付けられて同半
導体ウェハAの形状に倣って変形し、それと共にフィル
ムCがその中心部から外側に向けて徐々に半導体ウェハ
Aに押付けられ、フィルムCと半導体ウェハAとの間の
気泡が中心部から外側に押出される。更に、プレス装置
1を押出すか、第5図のように半導体ウェハAが載せら
れているウェハ受台5を同図の矢印W方向に押出すかす
れば、前記フィルムCが半導体ウェハAの全面に押付け
られて、同フィルムCと半導体ウェハA間の気泡が外に
押出されると共に両者が密着する。
When the pressing part 2 is further lowered from this state by the press device l, the suppressing part 2 made of a soft material as shown in FIG.
The film C is pressed against the semiconductor wafer A through the film C and deformed to follow the shape of the semiconductor wafer A. At the same time, the film C is gradually pressed against the semiconductor wafer A from the center outward, and the film C and the semiconductor are Air bubbles between the wafer A and the wafer A are pushed out from the center. Furthermore, by pushing out the press device 1 or pushing out the wafer pedestal 5 on which the semiconductor wafer A is placed as shown in FIG. When pressed, the air bubbles between the film C and the semiconductor wafer A are pushed out and the two are brought into close contact with each other.

(実施例) 本発明のウェハへのテープ貼付装置の一実施例である第
1図に示すAは半導体ウェハである。
(Example) A shown in FIG. 1, which is an example of the apparatus for applying tape to a wafer of the present invention, is a semiconductor wafer.

同図のBは真空チャンバであり、これは上体10と下体
11とが上下に二分されている。そして上体10に設け
られた排気口12には図示されでいない真空排気装置が
接続されている。また上体10と下体11との接合面に
はOリング13が取付けられて、両者が接合されたとき
に真空チャンバB内の気密性が保持されるようにしであ
る。
B in the figure is a vacuum chamber, which is divided into upper and lower halves into an upper body 10 and a lower body 11. A vacuum exhaust device (not shown) is connected to an exhaust port 12 provided in the upper body 10. Further, an O-ring 13 is attached to the joint surface between the upper body 10 and the lower body 11, so that the airtightness within the vacuum chamber B is maintained when the two are joined.

第1図の1はプレス装置であり、これは真空チャンバB
の上体lOに取付けられている。このプレス装置1はフ
ィルムCを半導体ウェハAに押付けるためのものであり
、上体10の外側に取付けられたシリンダ15と、同上
体10の内側に設けられた抑圧部2とから構成され、同
押圧部2はシJンダ15のロッド15aに取付けられて
、同ロッド15aの伸縮により同図の上下方向(矢印a
−b方向)に昇降するようにしである。勿論、前記ロッ
ド15aと上体10との間にはOリング16が介在され
て、真空チャンバB内の気密性が保持されるようにしで
ある。
1 in Fig. 1 is a press device, which is a vacuum chamber B.
It is attached to the upper body lO. This press device 1 is for pressing a film C onto a semiconductor wafer A, and is composed of a cylinder 15 attached to the outside of the upper body 10 and a suppressing part 2 provided inside the upper body 10. The pressing part 2 is attached to a rod 15a of the cylinder 15, and the rod 15a expands and contracts in the vertical direction (arrow a) in the figure.
-b direction). Of course, an O-ring 16 is interposed between the rod 15a and the upper body 10 to maintain airtightness within the vacuum chamber B.

そして前記抑圧部2は復元性を有する軟質材料で形成さ
れており、それがアルミニウム等の金属製取付板17の
下面に取付けられている。この軟質材料としては、例え
ばJISAに規定されるゴム硬度で20度程度の硬さの
ゴム状のものが使用でき、その程度の硬さであればフィ
ルムC及び半導体ウェハAに傷が付かない。それ以上に
硬いものではフィルムCを介して半導体ウェハAを押圧
した際に、同ウェハAが損傷する虞れがあるので好まし
くない。
The suppressing portion 2 is made of a resilient soft material, and is attached to the lower surface of a metal mounting plate 17 made of aluminum or the like. As this soft material, for example, a rubber-like material having a hardness of about 20 degrees as defined by JISA can be used, and as long as the hardness is at that level, the film C and the semiconductor wafer A will not be damaged. If it is harder than this, when the semiconductor wafer A is pressed through the film C, there is a risk that the wafer A will be damaged, so it is not preferable.

しかも前記押圧部2はその押圧面3が、外周から中央部
に向けて次第に湾曲して突出するように形成されている
。この実施例では押圧部2全体の高さ4〜6mmに対し
て押圧面3の突出量を約0.5〜1.0mm程度としで
ある。
Moreover, the pressing portion 2 is formed so that its pressing surface 3 gradually curves and protrudes from the outer periphery toward the center. In this embodiment, the amount of protrusion of the pressing surface 3 is approximately 0.5 to 1.0 mm relative to the overall height of the pressing portion 2 of 4 to 6 mm.

第1図のEは支持フレームであり、前記真空チャンバB
の下体11の下方に設けられている。この支持フレーム
EにはフィルムCの下面が貼付けられている。ちなみに
このフィルムCの裏面には従来と同様に予め接着剤が塗
布されている。
E in FIG. 1 is a support frame, and the vacuum chamber B
It is provided below the lower body 11. The lower surface of the film C is attached to this support frame E. Incidentally, the back side of this film C is coated with an adhesive in advance as in the conventional case.

第1図に示す5は真空チャンバBの下体11内に設けら
れたウェハ受台であり、これは同下体11の外側に取付
けられたシリンダ20のロッド20aにより第1図の矢
印c−d方向に昇降されるようにしである。このロッド
20aと下体11との間にはOリング22が、そのガイ
ド21と下体11との間には0リング24が取付けられ
ている。
Reference numeral 5 shown in FIG. 1 is a wafer holder provided in the lower body 11 of the vacuum chamber B, which is supported in the direction of arrow c-d in FIG. It is designed to be raised and lowered. An O-ring 22 is installed between the rod 20a and the lower body 11, and an O-ring 24 is installed between the guide 21 and the lower body 11.

第1図の25は前記上体10を同図の矢印ef力方向昇
降させる上体昇降装置、26は前記下体11を同図の矢
印g−h方向に昇降させる下体昇降装置であり、これら
の装置により上体10と下体11とが突き合されたり引
き離されたりするようにしである。これらの昇降装置2
5.26は同し構造のものであり、いずれも上体10又
は下体11を上下方向に移動させる昇降用シリンダ27
と、上体lO又は下体11の移動をガイドするアーム2
8.29とが備えられている。
Reference numeral 25 in FIG. 1 is an upper body elevating device for elevating the upper body 10 in the direction of the arrow ef force in the figure, and 26 is a lower body elevating device for elevating the lower body 11 in the direction of the arrow gh in the figure. The upper body 10 and the lower body 11 are brought into contact with each other and separated by the device. These lifting devices 2
Reference numerals 5 and 26 have the same structure, and both include a lifting cylinder 27 that moves the upper body 10 or the lower body 11 in the vertical direction.
and an arm 2 that guides the movement of the upper body lO or the lower body 11.
8.29 is provided.

なお、この実施例では前記支持フレームEに貼付けられ
たフィルムCを真空チャンバB内にセットするものにつ
いて詳述したが1本発明のウェハへのテープ貼付装置で
は例えば第7図のように、二分割された真空チャンバB
の上体IOと下体11との間に連続的にフィルムCが送
り込まれ、同フィルムCが上体10と下体llとの間に
挟み付けられるようにしてもよい。
In this embodiment, the film C affixed to the support frame E is set in the vacuum chamber B in detail. Divided vacuum chamber B
The film C may be continuously fed between the upper body IO and the lower body 11, and the film C may be sandwiched between the upper body 10 and the lower body 11.

(発明の効果) 本発明のウェハへのテープ貼付装置は以下のような効果
がある。
(Effects of the Invention) The apparatus for applying tape to a wafer of the present invention has the following effects.

■、フィルムCと半導体ウェハAとの間の気泡が外部に
押出されて両者が密着するので、フィルムCと半導体ウ
ェハAとの接着に従来のようなローラDを使用する必要
がない。ひいては同ローラDを回転させたり移動させた
りするための駆動装置Fも不要となるため、真空チャン
バBの容量を小さくすることができ、小型で安価なウェ
ハへのテープ貼付装置となる。
(2) Since the air bubbles between the film C and the semiconductor wafer A are pushed out and the two are brought into close contact with each other, there is no need to use the conventional roller D to bond the film C and the semiconductor wafer A. Furthermore, since the drive device F for rotating and moving the roller D is also unnecessary, the capacity of the vacuum chamber B can be reduced, resulting in a small and inexpensive wafer tape application device.

■ 真空チャンバB内を排気する真空排気装置も小型で
安価なものが使用できるので、装置全体がコンパクトな
ものとなる。また、プレス装置1を動かす機構が簡潔に
なるので、真空チャンバB内を気密化し易く、より一層
安価なものとなる。
(2) A small and inexpensive vacuum evacuation device for evacuating the inside of the vacuum chamber B can be used, so the entire device becomes compact. Furthermore, since the mechanism for moving the press device 1 is simplified, the inside of the vacuum chamber B can be easily made airtight, and the cost can be further reduced.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明のウェハへのテープ貼付装置の一実施例
を示す一部断面正面図、第2図〜第6図は同装置の使用
説明図、第7図は本発明のウェハへのテープ貼付装置の
他の実施例を示す一部断面正面図、第8図は従来のテー
プ貼付装置を示す一部断面正面図である。 lはプレス装置 2は押圧部 3は押圧面 5はウェハ支持台 Aは半導体ウェハ Bは真空チャンバ Cはフィルム
FIG. 1 is a partially sectional front view showing an embodiment of the device for applying tape to a wafer of the present invention, FIGS. 2 to 6 are illustrations for explaining the use of the device, and FIG. FIG. 8 is a partially sectional front view showing another embodiment of the tape applicator, and FIG. 8 is a partially sectional front view showing a conventional tape applicator. l is the press device 2 is the press unit 3 is the press surface 5 is the wafer support stand A is the semiconductor wafer B is the vacuum chamber C is the film

Claims (1)

【特許請求の範囲】[Claims] 真空チャンバB内において、同チャンバB内のウェハ支
持台5にセットされた半導体ウェハAの一面にフィルム
Cを貼付ける半導体ウエハへのテープ貼付装置において
、前記真空チャンバB内のウェハ支持台5の上方にフィ
ルムCを半導体ウェハAに押し付けるプレス装置1が設
けられ、同プレス装置1の押圧部2が復元性を有する軟
質材料で形成され、同押圧部2の押圧面3が外側から中
央部に向けて次第にフィルムC側に湾曲して突出するよ
うに形成されてなることを特徴とするウエハへのテープ
貼付装置。
In a semiconductor wafer tape application device that applies a film C to one surface of a semiconductor wafer A set on a wafer support 5 in the vacuum chamber B, the wafer support 5 in the vacuum chamber B is A press device 1 for pressing the film C onto the semiconductor wafer A is provided above, and the pressing section 2 of the press device 1 is made of a resilient soft material, and the pressing surface 3 of the pressing section 2 is pressed from the outside to the center. A device for applying tape to a wafer, characterized in that the device is formed so as to gradually curve and protrude toward the film C side.
JP17778590A 1990-07-05 1990-07-05 Tape sticking device for wafer Expired - Fee Related JP2945089B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17778590A JP2945089B2 (en) 1990-07-05 1990-07-05 Tape sticking device for wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17778590A JP2945089B2 (en) 1990-07-05 1990-07-05 Tape sticking device for wafer

Publications (2)

Publication Number Publication Date
JPH0465109A true JPH0465109A (en) 1992-03-02
JP2945089B2 JP2945089B2 (en) 1999-09-06

Family

ID=16037064

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17778590A Expired - Fee Related JP2945089B2 (en) 1990-07-05 1990-07-05 Tape sticking device for wafer

Country Status (1)

Country Link
JP (1) JP2945089B2 (en)

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JP2007158122A (en) * 2005-12-06 2007-06-21 Tokyo Ohka Kogyo Co Ltd Support plate laminating means and laminating apparatus, and support plate laminating method
US8931535B2 (en) 2005-12-06 2015-01-13 Tokyo Ohka Kogyo Co., Ltd. Attaching device and attaching apparatus for supporting plate, and attaching method for supporting plate
US20150279715A1 (en) * 2012-11-21 2015-10-01 Ev Group E. Thallner Gmbh Device and method for bonding
US10943810B2 (en) * 2012-11-21 2021-03-09 Ev Group E. Thallner Gmbh Device and method for bonding
KR101647387B1 (en) * 2015-03-09 2016-08-11 주식회사 도우인시스 Functional Film Sticking Apparatus and Sticking Method Thereof
CN119008459A (en) * 2024-08-09 2024-11-22 江苏爱矽半导体科技有限公司 Wafer film sticking machine for semiconductor device

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