JPH0465329B2 - - Google Patents

Info

Publication number
JPH0465329B2
JPH0465329B2 JP58184915A JP18491583A JPH0465329B2 JP H0465329 B2 JPH0465329 B2 JP H0465329B2 JP 58184915 A JP58184915 A JP 58184915A JP 18491583 A JP18491583 A JP 18491583A JP H0465329 B2 JPH0465329 B2 JP H0465329B2
Authority
JP
Japan
Prior art keywords
temperature
mirror
transparent body
semitransparent
reflectance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58184915A
Other languages
Japanese (ja)
Other versions
JPS6076630A (en
Inventor
Isao Hishikari
Tetsuo Kobari
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Corp filed Critical Chino Corp
Priority to JP58184915A priority Critical patent/JPS6076630A/en
Publication of JPS6076630A publication Critical patent/JPS6076630A/en
Publication of JPH0465329B2 publication Critical patent/JPH0465329B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0808Convex mirrors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0813Planar mirrors; Parallel phase plates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/80Calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/06Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J2005/066Differential arrangement, i.e. sensitive/not sensitive

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Description

【発明の詳細な説明】 (1) 発明の分野 この発明は、ガラス、高分子フイルム等の半透
明体の温度を測定する装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (1) Field of the Invention The present invention relates to a device for measuring the temperature of a translucent body such as glass or polymer film.

(2) 従来技術 半透明体の温度を測定するには、その物質の吸
収帯に測定波長を限定した放射温度計を用いて行
う方法がある。
(2) Prior Art There is a method of measuring the temperature of a semitransparent material using a radiation thermometer whose measurement wavelength is limited to the absorption band of the material.

しかしながら、この方法では、波長を限定して
いるため、感度が悪く、測定下限温度を低くとれ
ない問題点がある。また、顕著な吸収帯がない場
合は、特に測定が困難となる。
However, in this method, since the wavelength is limited, the sensitivity is poor and the lower limit temperature for measurement cannot be kept low. Furthermore, measurement is particularly difficult when there is no significant absorption band.

(3) 発明の目的 この発明の目的は、以上の点に鑑み、鏡を利用
して半透明体の温度を高精度に測定することがで
きる温度測定装置を提供することである。
(3) Purpose of the Invention In view of the above points, the purpose of the present invention is to provide a temperature measuring device that can measure the temperature of a semi-transparent body with high precision using a mirror.

(4) 発明の実施例 第1図は、この発明の一実施例を示す構成説明
図である。
(4) Embodiment of the Invention FIG. 1 is a configuration explanatory diagram showing an embodiment of the invention.

図において、1は被測定対象であるガラス、高
分子フイルム等の半透明体2をおおう壁、3は半
透明体2の背面に設けられた鏡(ミラー)、4は
壁1の壁面1aの温度を測定する抵抗体、熱電対
その他の温度測定手段、5は半透明体2からの放
射エネルギーを受光する放射温度計、6は放射温
度計5の出力、温度測定手段4の出力等から半透
明体2の真温度を演算する演算手段である。
In the figure, 1 is a wall covering a semi-transparent body 2 such as glass or polymer film to be measured, 3 is a mirror provided on the back of the semi-transparent body 2, and 4 is a wall surface 1a of the wall 1. 5 is a radiation thermometer that receives the radiant energy from the translucent body 2; 6 is the output of the radiation thermometer 5, the output of the temperature measurement means 4, etc.; This is a calculation means for calculating the true temperature of the transparent body 2.

ここで測定原理は次のようである。 The measurement principle here is as follows.

半透明体2の温度をT、表面の反射率をρ1、裏
面の反射率をρ2、透過率をτとし、鏡3の温度を
To、反射率をρ0、壁面1aの温度をTw、放射率
をεwとし、半透明体2、鏡3、壁面1aからの放
射エネルギーをE(T)、E(To)、E(Tw)、放射
温度計5の受光する放射エネルギーをE(S)とすれ
ば、半透明体2と鏡3との間の多重反射を考慮し
て次式が成り立つ。
The temperature of the semitransparent body 2 is T, the reflectance of the front surface is ρ 1 , the reflectance of the back surface is ρ 2 , the transmittance is τ, and the temperature of the mirror 3 is
To, the reflectance is ρ 0 , the temperature of the wall 1a is Tw, the emissivity is ε w , and the radiant energy from the semitransparent body 2, mirror 3, and wall 1a is E(T), E(To), E(Tw ), and if the radiant energy received by the radiation thermometer 5 is E(S), then the following equation holds in consideration of multiple reflections between the semitransparent body 2 and the mirror 3.

E(S)={(1−ρ1−τ)+(1−ρ2−τ)ρ0τ/1
−ρ0ρ2}E(T) +1−ρ0/1−ρ0ρ2τE(To) +εw(ρ1+τ2ρ/1−ρ0ρ2)E(Tw) =(1−α−β)E(T)+εwαE(Tw)+βE(To)
……(1) ここで、 α=ρ1+ρ0/1−ρ0ρ2τ2、β=1−ρ0/1−ρ0
ρ2τ……(2) である。
E(S)={(1−ρ 1 −τ)+(1−ρ 2 −τ)ρ 0 τ/1
−ρ 0 ρ 2 }E(T) +1−ρ 0 /1−ρ 0 ρ 2 τE(To) +ε w12 ρ/1−ρ 0 ρ 2 )E(Tw) = (1−α −β)E(T)+ε w αE(Tw)+βE(To)
...(1) Here, α=ρ 10 /1−ρ 0 ρ 2 τ 2 , β=1−ρ 0 /1−ρ 0
ρ 2 τ……(2).

つまり、(1)式において、右辺第1項、第2項、
第3項は、それぞれ、熱放射の半透明体2から、
壁面1aから、背面の鏡3からの寄与分で、その
係数1−α−β、α、βは寄与率を示す。
In other words, in equation (1), the first term, the second term on the right side,
The third term is, respectively, from the semitransparent body 2 of thermal radiation,
This is the contribution from the wall surface 1a and the mirror 3 on the back side, and the coefficients 1-α-β, α, and β indicate the contribution rate.

(1)式よりE(T)を求めれば次式となる。 Calculating E(T) from equation (1) yields the following equation.

E(T)=E(S)−εwαE(Tw)−βE(To)/1−α−β
……(3) また、ρ1=ρ2=0.2、τ=0.4とし、1−α−β、
α、βのρ0に対する寄与率は第2図のようにな
る。つまり、鏡3の反射率ρ0が十分大きく、その
温度Toが半透明体2の温度Tよりも十分小さけ
れば(ρ0≧0.9、To<T)、第3式右辺第3項は
無視でき、次式となる。
E(T)=E(S)−ε w αE(Tw)−βE(To)/1−α−β
...(3) Also, ρ 1 = ρ 2 = 0.2, τ = 0.4, 1−α−β,
The contribution rates of α and β to ρ 0 are shown in Figure 2. In other words, if the reflectance ρ 0 of the mirror 3 is sufficiently large and its temperature To is sufficiently smaller than the temperature T of the semitransparent body 2 (ρ 0 ≧0.9, To < T), the third term on the right side of the third equation can be ignored. , is the following equation.

E(T)=E(S)−εwαE(Tw)/1−α−β ……(4) なお、壁面1aが等温・一様であれば、(1)、
(3)、(4)式においてεw≒1とおいてよい。
E(T)=E(S)−ε w αE(Tw)/1−α−β ……(4) If the wall surface 1a is isothermal and uniform, (1),
In equations (3) and (4), it may be assumed that ε w ≒1.

このように、放射温度計5の出力E(S)を、(3)、
(4)式に従つて補正を行えば透明体2の真温度Tが
求まる。
In this way, the output E(S) of the radiation thermometer 5 is expressed as (3),
By performing correction according to equation (4), the true temperature T of the transparent body 2 can be determined.

第1図の装置の動作は次の通りである。 The operation of the apparatus of FIG. 1 is as follows.

あらかじめ、透明体2の反射率ρ1、ρ2、透過率
τ、鏡3の反射率ρ0に基く定数α、β、壁面1a
の放射率εw等を演算手段6に設定値として入力す
る。次に、温度測定手段4の出力Twを演算手段
6に入力してE(Tw)に換算するとともに、演
算手段6は、放射温度計5の透明体3からの放射
エネルギーE(S)に相当する出力に、E(Tw)、
α、β等の定数に基いて(4)式のような補正演算を
行つてE(T)を求め、これより透明体2の真温度T
を演算して求めることができる。
In advance, the reflectances ρ 1 and ρ 2 of the transparent body 2, the transmittance τ, the constants α and β based on the reflectance ρ 0 of the mirror 3, and the wall surface 1a.
The emissivity ε w and the like are input to the calculation means 6 as set values. Next, the output Tw of the temperature measuring means 4 is input to the calculating means 6 and converted into E(Tw), and the calculating means 6 converts the output Tw from the transparent body 3 of the radiation thermometer 5 into E(S). For the output, E(Tw),
Based on the constants α, β, etc., perform a correction calculation as shown in equation (4) to obtain E(T), and from this, the true temperature T of the transparent body 2
It can be found by calculating.

なお、鏡3の温度Toが無視できない場合は、
その温度Toを他の温度測定手段で測定して演算
手段6によりE(To)に換算し、(3)式のような演
算を行えばよい。また、εw≒1とおければ、(3)、
(4)式は、簡略化できる。また、演算手段6等は、
マイクロコンピユータ等で構成してもよい。
In addition, if the temperature To of mirror 3 cannot be ignored,
The temperature To may be measured by another temperature measuring means, converted to E(To) by the calculation means 6, and calculations as shown in equation (3) may be performed. Also, if we set ε w ≒ 1, then (3),
Equation (4) can be simplified. In addition, the calculation means 6 etc.
It may also be configured with a microcomputer or the like.

(5) 発明の要約 以上述べたように、この発明は、半透明体の背
面に鏡を設け、放射温度計の半透明体からの放射
エネルギー出力を、壁面温度測定手段の出力、半
透明体の反射率、透過率、鏡の反射率等で演算手
段により補正し、透明体の真温度を測定するよう
にした温度測定装置である。
(5) Summary of the Invention As described above, the present invention provides a mirror on the back side of the semitransparent body, and the radiant energy output from the semitransparent body of the radiation thermometer is measured by the output of the wall temperature measuring means and the semitransparent body. This is a temperature measurement device that measures the true temperature of a transparent body by correcting it using calculation means using reflectance, transmittance, reflectance of a mirror, etc.

(6) 発明の効果 半透明体の背面に鏡を設けることにより、半透
明体のみかけの放射率を高め、背面からの熱放射
の影響を除去し、また、壁面からの熱放射の影響
も補正して除去するようにしているので、簡単な
構成で半透明体の真温度を高精度に測定すること
ができる。特に、特定の吸収帯がなく、低温測定
の場合に有効で、半透明体全般の温度測定に好適
で、実用的効果が大きい。
(6) Effects of the invention By providing a mirror on the back surface of the semi-transparent body, the apparent emissivity of the semi-transparent body is increased, the influence of heat radiation from the back surface is eliminated, and the influence of heat radiation from the wall surface is also reduced. Since it is corrected and removed, the true temperature of the semi-transparent body can be measured with high accuracy with a simple configuration. In particular, it has no specific absorption band, is effective for low temperature measurements, is suitable for measuring the temperature of semitransparent objects in general, and has great practical effects.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、この発明の一実施例を示す構成説明
図、第2図は特性説明図である。 1……壁、2……半透明体、3……鏡、4……
温度測定手段、5……放射温度計、6……演算手
段。
FIG. 1 is a configuration explanatory diagram showing an embodiment of the present invention, and FIG. 2 is a characteristic diagram. 1...Wall, 2...Semi-transparent object, 3...Mirror, 4...
Temperature measuring means, 5... Radiation thermometer, 6... Calculating means.

Claims (1)

【特許請求の範囲】 1 半透明体の背面に設けられた鏡と、壁面温度
Twを測定する温度測定手段と、前記半透明体お
よび壁面からの放射エネルギーE(T)、E(Tw)
などを受光する放射温度計と、この放射温度計の
出力E(S)を、前記温度測定手段の出力Twを壁面
からの放射エネルギーに換算したE(Tw)およ
び前記半透明体の表面および裏面の反射率ρ1、
ρ2、透過率τ、前記鏡の反射率ρ0および前記壁面
の放射率εwに基いて E(T)=[E(S)−εwαE(Tw)] /(1−α−β) なる補正演算を行い、前記半透明体の温度Tを演
算する演算手段とを備えた温度測定装置[ここ
で、 α=ρ1+ρ0τ2/(1−ρ0ρ2)、 β=(1−ρ0)τ/(1−ρ0ρ2)]。
[Claims] 1. A mirror provided on the back of the semi-transparent body and a wall temperature
temperature measuring means for measuring Tw, and radiant energy E(T), E(Tw) from the semitransparent body and wall surface;
A radiation thermometer that receives light such as the output E(S) of the radiation thermometer, E(Tw) obtained by converting the output Tw of the temperature measuring means into radiant energy from the wall surface, and the front and back surfaces of the semitransparent body. The reflectance of ρ1,
Based on ρ2, transmittance τ, reflectance ρ0 of the mirror, and emissivity εw of the wall surface, perform the correction calculation E(T)=[E(S)−εwαE(Tw)]/(1−α−β). and a calculation means for calculating the temperature T of the semi-transparent body [here, α=ρ1+ρ0τ 2 /(1−ρ0ρ2), β=(1−ρ0)τ/(1−ρ0ρ2) ].
JP58184915A 1983-10-03 1983-10-03 Temperature measuring device Granted JPS6076630A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58184915A JPS6076630A (en) 1983-10-03 1983-10-03 Temperature measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58184915A JPS6076630A (en) 1983-10-03 1983-10-03 Temperature measuring device

Publications (2)

Publication Number Publication Date
JPS6076630A JPS6076630A (en) 1985-05-01
JPH0465329B2 true JPH0465329B2 (en) 1992-10-19

Family

ID=16161554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58184915A Granted JPS6076630A (en) 1983-10-03 1983-10-03 Temperature measuring device

Country Status (1)

Country Link
JP (1) JPS6076630A (en)

Also Published As

Publication number Publication date
JPS6076630A (en) 1985-05-01

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