JPH0466588U - - Google Patents

Info

Publication number
JPH0466588U
JPH0466588U JP10943090U JP10943090U JPH0466588U JP H0466588 U JPH0466588 U JP H0466588U JP 10943090 U JP10943090 U JP 10943090U JP 10943090 U JP10943090 U JP 10943090U JP H0466588 U JPH0466588 U JP H0466588U
Authority
JP
Japan
Prior art keywords
thermostatic chamber
test
outrail
heat insulating
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10943090U
Other languages
English (en)
Other versions
JP2540703Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10943090U priority Critical patent/JP2540703Y2/ja
Publication of JPH0466588U publication Critical patent/JPH0466588U/ja
Application granted granted Critical
Publication of JP2540703Y2 publication Critical patent/JP2540703Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】
第１図はこの考案の一実施例を示す断面図、第
２図はこの考案の変形実施例を示す断面図、第３
図はＩＣ試験装置のＩＣ搬送通路の形態を説明す
るための側面図、第４図は従来の技術を説明する
ための断面図、第５図は恒温槽の出口に設けられ
るシヤツタの構造を説明するための平面図、第６
図乃至第９図はＩＣの種類を説明するための正面
図である。 ２Ａ……被試験ＩＣ、２Ｂ……試験済ＩＣ、６
……シヤツタ、８……アウトレール、１４……ア
ウトレール収納孔、１４Ａ……空隙部分、１５Ａ
，１５Ｂ……断熱性気密材。

Claims (1)

  1. 【実用新案登録請求の範囲】 Ａ 恒温槽内において被試験ＩＣを試験し、試験
    されたＩＣをアウトレールと恒温槽の出口に設け
    たシヤツタを通じて恒温槽から排出するように構
    成したＩＣ試験装置において、 Ｂ 上記アウトレールと恒温槽を構成する断熱壁
    との間に形成される間隙を封止する断熱性気密材
    を設けて成るＩＣ試験装置。
JP10943090U 1990-10-19 1990-10-19 Ｉｃ試験装置 Expired - Lifetime JP2540703Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10943090U JP2540703Y2 (ja) 1990-10-19 1990-10-19 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10943090U JP2540703Y2 (ja) 1990-10-19 1990-10-19 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0466588U true JPH0466588U (ja) 1992-06-11
JP2540703Y2 JP2540703Y2 (ja) 1997-07-09

Family

ID=31856632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10943090U Expired - Lifetime JP2540703Y2 (ja) 1990-10-19 1990-10-19 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2540703Y2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999045403A1 (en) * 1998-03-02 1999-09-10 Advantest Corporation Ic test apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999045403A1 (en) * 1998-03-02 1999-09-10 Advantest Corporation Ic test apparatus

Also Published As

Publication number Publication date
JP2540703Y2 (ja) 1997-07-09

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