JPH0477683A - Semiconductor circuit simulation device - Google Patents

Abstract

PURPOSE:To simply and exactly understand circuits judging the suitability of the combination of the first and second circuits on the basis of each connec tion relation information previously set. CONSTITUTION:Since an A-D converter 24 compares voltage vA1 with threshold value VOA and the relation which is VA1<VOA+alpha rather than vA1=vOA holds, the digital signal of an 'L' level is output. An NOR circuit 26B requests a negative OR condition in regard to the digital signal 'L' from an A-D converter 24 and the digital signal 'L' from another NOT circuit 26A to output to a switch 28. And according to the normal output information of an operation amplifier A20 the combination of a bias circuit A10 and an operation amplifier A20 can judge normal suitability on simulation.

Description

[Detailed Description of the Invention] [Table of Contents] Overview Industrial Field of Application Conventional Technology Problems to be Solved by the Invention Means for Solving the Problems (Fig. 1) Working Example (a) An Embodiment of the Present Invention (Figures 2 to 7) 1) Other embodiments of the present invention (Figures 8 to 10) (c) Other embodiments of the present invention Effects of the invention [Summary] Predetermined specific relationships Regarding a semiconductor circuit simulation device that inspects the suitability of a circuit combination for a semiconductor circuit formed by connecting two circuits of For the purpose of providing a device, a first circuit that outputs a control signal and a second circuit that operates based on the control signal are connected! 2. In a semiconductor circuit simulation apparatus for inspecting the suitability of the connection relationship between the first and second circuits in one of the semiconductor circuits formed in step 2, the connections between the first and second circuits are determined and set. a storage means for storing each connection relationship information; and when connecting arbitrary first and second circuits based on the connection relationship information, determining suitability of a combination of the first and second circuits; and connection determining means.

[Industrial Application Field] The present invention relates to a semiconductor circuit simulation device for inspecting the suitability of a circuit combination of a semiconductor circuit formed by connecting two circuits having a predetermined specific relationship.

In recent years, there have been semiconductor circuits formed by combining various circuit elements, and it is necessary to determine whether or not the combination of circuit elements is appropriate for this semiconductor circuit.

In particular, as semiconductor circuits become more highly integrated and highly functional,
Accordingly, the relationship between the combinations of circuit elements becomes complicated, making it difficult to judge whether or not the combination of circuit elements is appropriate. There is a need for a semiconductor circuit simulation apparatus that can reliably detect the suitability of a combination of circuit elements in such a semiconductor circuit through simulation.

When simulating semiconductor circuits that combine circuits, these semiconductor circuits are actually operated, and based on the operation results, a skilled and experienced person determines the suitability of the above-mentioned combination of circuits.

In the semiconductor circuit shown in FIG. 4, the control signal bias voltage 1 is input from the bias circuit 10, which is the first circuit, to the operational amplifier 20, which is the second circuit. Output information I)3
is output. By analyzing this output information D3, it is determined whether the combination of the transistor circuit 10 and the operational amplifier 20 is appropriate.

In addition, in the semiconductor circuit shown in FIG. judge the suitability of the

[Conventional technology]

[Problem to be Solved by the Invention] Conventionally, simulations for the conventional semiconductor circuit have been carried out in the above manner, as shown in FIGS. 4 and 5. Otherwise, it would be impossible to judge whether or not the combination of two circuits is appropriate, and furthermore, this judgment could only be made with the extremely high level of knowledge and experience of a skilled and experienced person. That is, the control signal (bias voltage v
The second circuit may operate even if 1) has a slightly different value, and it is difficult to determine whether the operation of the second circuit is a normal and proper operation.

Furthermore, since the judgment of semiconductor circuits based on actual operation must be made by a skilled and experienced person, it is not possible to judge the suitability of a combination of two circuits by visually checking the circuit diagram without actually operating the semiconductor circuits. However, the simulation time would be enormous and the number of errors in judgment would increase.

The present invention has been made to solve the above problems, and an object of the present invention is to provide a semiconductor circuit simulation device that can easily and accurately judge the suitability of a combination of two circuits through simulation.

(Means for solving problems) FIG. 1 shows a diagram explaining the principle of the present invention.

In the same figure, the semiconductor circuit simulation device according to the present invention is configured to perform a semiconductor circuit formed by connecting a first circuit that outputs a control signal and a second circuit that operates based on the control signal. and a second semiconductor circuit simulation device for inspecting the suitability of connection relationships between each of the circuits, comprising a storage means for storing connection relationship information set in advance regarding connections between the first and second circuits, and the connection relationship information. When connecting arbitrary first and second circuits based on the above, the apparatus further includes a connection determination means for determining suitability of a combination of the first and second circuits.

[Effect]

In the present invention, the suitability of the combination of the two circuits is determined by determining the suitability of the combination of the first and second circuits based on each connection relationship information set in advance for the first and second circuits to be combined. can be easily and accurately determined through simulation. Furthermore, the time required to determine the suitability of circuit combinations can be shortened.

〔Example〕

(a) One Embodiment of the Present Invention The present embodiment will be described below with reference to FIGS. 2 to 5. FIG. 2 is a configuration diagram of this embodiment, FIG. 3 is an explanatory diagram of information storage in the memory in this embodiment, and FIG.
The figure shows each circuit configuration diagram of the circuit to be tested.

In each of the figures, the semiconductor circuit simulation device according to the present embodiment has two first and second circuits 10 to be combined.
．． a memory 1 that stores connection relationship information D 1 , D 2 associated in advance with respect to 20 connections and output information D3 of the second circuit 20; and the first and second circuits 10.2.
o is connected, the first and second circuits 10.2
The suitability of the combination o is determined based on the connection relationship information D, and when the combination is appropriate, the second
connection determination unit 2 that outputs output information D3 from the circuit 20 of
The configuration includes the following.

The connection determining unit 2 includes a voltage dividing circuit 21 that generates a divided voltage V+ corresponding to the connection relationship information Dl of the first circuit, and a second
A register 22 that holds the voltage V2 of the connection relationship information D2 of the circuit, and an error tolerance setting value σ is added to and subtracted from the voltage v2 of the connection relationship information D held in the register 22 to obtain the threshold values −V2+σ, v2−σ. a threshold generation unit 23 that outputs
The voltage v1 of the voltage dividing circuit 21 is set to a threshold value V2+σ, V2−σ
The A-D converter 24.25 converts into a digital signal based on
a logic circuit 26 that detects whether or not it is included in 2+σ to v2-σ and outputs a detection signal; an output information register 27 that holds output information D3 of the second circuit; and a detection signal of the logic circuit 26. This configuration includes a switch 28 that controls the output of the output information D3 based on.

Next, the operation of the apparatus of this embodiment based on the above configuration will be explained. First, a simulation for determining the appropriateness of the combination when the bias circuit 10 and the operational amplifier 20 are connected together as shown in FIG. 4 will be described. Note that the bias circuit AIO and the operational amplifier A20 have a normally compatible combination relationship, and the connection relationship information D11D2 indicates the voltage V l=V 2 (V Al=
VGA) relationship is set in advance.

Furthermore, the bias circuit AIO, operational amplifier B20, operational amplifier C20, etc. are incompatible combinations, and the connection relationship information D 1D indicates the voltage V ≠ V (V Al ≠
The relationship is set in advance such that vOB'vAl≠voc...).

In the following, cases in which the combination of the bias circuit and the operational amplifier is appropriate and cases in which the combination is inappropriate will be explained separately.

0 combination is appropriate, the connection determining section 2 selects the bias circuit AIO and the operational amplifier A.
20, each connection relationship information D, D and output information D
3 from memory 1. The resistance values R and R of this read connection relationship information D are the dividing voltage l AI A
2 settings are input to the resistors RXR of the circuit 21, and VOA of the connection relation information D2 is stored in the register 22. Further, the DoA of the read output information D3 is stored in the output information register 27.

In this state, the voltage dividing circuit 21 divides the power supply voltage V by the resistance value RR and outputs the voltage A1/A2 voltage vA1 to the AD converter 24.25.

The connection relation information v (=D2) of the operational amplifier A20 is inputted from the register 22 to each operational amplifier 23A, 23B of the threshold generation unit 23, and the operational amplifier 23A generates the threshold value voA+σ, and the operational amplifier 23B generates the threshold value. vDA-σ is generated.

The A-D converter 24 sets the voltage vA1 to a threshold value V +σ
Compared with vAt” vOA, V Al < VO
Since the relationship is A0Aσ, a digital signal of “L” level is output. Further, the A-D converter 25 has a voltage V
is the threshold value V. In comparison with A-σ, the intermediary outputs an "H" level digital signal.

Digital signal “H” from the A-D converter 25
is NO as a “L” level signal in the NOT circuit 26A.
It is output to the R circuit 26B. This NOR circuit 26B is
- Digital signals “L” and N from the D converter 24
A NOR condition is determined for the digital signal "L" from the OT circuit 26A, and a 'H' level digital signal is output to the switch 28 as a control signal.

This "H" level control signal turns on the switch 28 (ON state), and outputs the output information D-vOA of the operational amplifier A20 stored in the output information register 27. Based on voA, which is the normal output information D3 of the operational amplifier A20, it can be determined through simulation that the bias circuit AIO and the operational amplifier A20 are a normally compatible combination.

■If the combination is inappropriate, the connection judgment section 2 will connect the bias circuit AIO and the operational amplifier B.
20, each connection relationship information D, D and output information D
Read 4 from memory. The resistance value RR of the read connection relation information D is set and inputted to the resistors R and R of the voltage dividing circuit 21, respectively, and the voltage vA1 is outputted from the voltage dividing circuit 21.

Further, the voltage voB of the connection relationship information D 2 is stored in the register 22, and the DoB of the output information D 2 is stored in the output information register 27. The voltage voB is determined by the threshold generation unit 23
is input to each of the operational amplifiers 23A and 23B, and the operational amplifier 23A generates a threshold value voE+σ,
A threshold value vOB-σ is generated by the operational amplifier 23B.

The A-D converter 24 sets the voltage VAI to a threshold value VOB.
Compare with +σ. This voltage is V^1≠■OB, and if the magnitude relationship of each voltage is VAl>vOB, then vA
Since the relationship is 1>voB+σ, an "H" level digital signal is output. In addition, in the case of VAl<V OB, there is a relationship of vAl<V1)B+σ, so “
Outputs an L'' level digital signal.

From the above relationship, the A-D converter 25 has vAl>vl
In the case of 1B, an H” level digital signal is output,
When vAI<vOB, an L'' level digital signal is output.

The logic circuit 26 to which each digital signal "H""H"L"L" is inputted from the A-D converter 25.
In either case, a control signal which is an L'' level digital signal is output to the switch 28, and this switch 28
is in an open state (OFF state) and the output information register 2 is set in an open state (OFF state).
The output of DoB, which is the output information D from 7, is blocked.

Therefore, since the connection determination unit 2 does not output the output information DoA of the operational amplifier B20 to be connected, it can be determined through simulation that the bias circuit AIO and the operational amplifier A20 are an inappropriate combination.

Next, when the bias circuit 10 and the A-D converter 20 are connected in combination as shown in FIG. 5, the bias circuits A, B, . . . and the A-D converters A, B, . By setting specific connection relationship information D SD for a predetermined regular combination of circuits, it is possible to determine suitability or non-suitability of a combination of circuits through simulation in the same manner as described above.

Further, as shown in FIG. 6, the case where MO8FETQ and Q2 constituting a current mirror circuit are connected in combination can also be determined by simulation in the same manner as described above. Note that the current mirror circuit is compatible with MO8FE.
A current I S I2 corresponding to the ratio of the channel widths W1 and W 2 of the MOSFET is determined by the gate voltage vl from TQ.

Furthermore, as shown in FIG.
L (Emitle+Couplcd Logic
) When connecting circuits 20 to 20 in combination, it is possible to judge whether the combination of circuits is compatible or unsuitable through simulation in the same manner as described above.

(b) Another embodiment of the invention FIG. 8 shows another embodiment of the invention. Here, the non-earth circuit A generates voltage v2 by resistor voltage division, and the operational amplifier circuit B has a built-in 1-bit A, two DC (comparators), an inverter, NoRl, and one switch, and is an input type. The switch is configured to be in the ON state only when the pressure is V2. Therefore, operational amplifier A outputs normally only when the input voltage is V (when bias circuit A is used as a bias circuit).

On the other hand, when bias circuit A is connected to operational amplifier circuit B as shown in FIG.
Since it is set to operate normally only when , the voltage generated by bias circuit A is ■ (≠v b ), so the switch is turned off and the output of operational amplifier B is not output. As a result, it will operate normally only when the operational amplifier circuit and bias circuit match. In this way, since there is a voltage (V, ) generated in the bias circuit and a voltage (V2) at which the operational amplifier circuit operates, the operational amplifier operates when the voltage v = v2, and V! When ≠v2, the operational amplifier does not operate.

In the above embodiment, the second circuit is an operational amplifier circuit, but it may be used as a circuit other than an operational amplifier. It can be used for devices with specific bias circuits such as AD converters and DA converters. The bias voltage generated at this time may be outside the power supply voltage range during operation of the bias circuit and the like.

An example in the case of an A-D converter is shown in FIG. In this case as well, like the operational amplifier circuit, the bias circuit C is a circuit that generates a voltage V, and the A-D converter circuit C is a circuit that operates only when the input voltage is V, so that they operate normally.

(c) Other embodiments of the present invention In the embodiments described above, the output information D3 of the second circuit 20 is stored in the memory, and when the connection determination section 2 determines that the combination of circuits is compatible, the output information D3 is stored in the memory. Although the configuration is configured to output D3 to determine whether or not it is compatible, if the combination of circuits is compatible or non-compatible in the connection determining unit 2, the corresponding digital signals "H" and "L" are sent from the logic circuit 26. It is also possible to have a configuration in which the suitability of the combination is judged by outputting the data.In this case, the output information D3 of the second circuit is stored in the memory.
There is no need to store it.

In each of the embodiments described above, the logic circuit 26 is replaced by a NOT circuit 26.
A and a NOR circuit 26B, but EX-
A logic circuit is configured with an OR circuit, and an A-D converter 24.
It is also possible to adopt a configuration in which the suitability of a circuit combination is determined by determining an exclusive OR condition for each of the 25 outputs.

Further, the logic circuit 26 is connected to a NOT circuit 26A and a NOR circuit.
It was configured with circuit 26B, but instead of NOR circuit 26B, A
It can be configured as an ND circuit, consisting of this AND circuit and the N07 circuit.

Furthermore, in the embodiment, the first circuit 1 is provided in the memory.
The resistance RAl・R, R−R, which is the connection relation information D of 0
... is stored, and this connection relationship information 81 A2
B2 Connect information R-R, R-R... to Ai B of connection judgment unit 2
Although the configuration is such that a predetermined voltage v1 is inputted to the I A2 B2 voltage dividing circuit 21 and outputted, a configuration may also be adopted in which the value of v1 depending on the type of the first circuit 10 is stored in the memory. In this case, it is not necessary to provide the voltage dividing circuit 21 in the connection determining section 1.

Furthermore, in each of the embodiments described above, the error tolerance setting value σ in the threshold generation unit 23 is set in advance as a fixed value, but the error tolerance setting value σ can be changed according to the characteristics of the circuits to be combined. It can also be configured. That is, by increasing (reducing) the error tolerance setting value σ, it is possible to widen ((reduce) the error tolerance range 2σ.

Furthermore, it is also possible to determine the suitability of a circuit combination with the bias circuit regarding a constant voltage circuit that generates a constant voltage based on a predetermined bias voltage from the bias circuit.

[Effects of the Invention] As explained above, in the present invention, the suitability of the combination of the first and second circuits is determined based on each connection relationship information set in advance for the first and second circuits to be combined. This has the effect that the suitability of a combination of two circuits can be easily and accurately determined through simulation. Further, it has the effect of shortening the time required to determine the suitability of circuit combinations.

[Brief explanation of drawings]

FIG. 1 is an explanatory diagram of the principle of the present invention, FIG. 2 is a configuration diagram of an embodiment of the present invention, FIG. 3 is an explanatory diagram of information storage in the memory in the embodiment described in FIG. 2, and FIGS. 4 to 7 are Each of the circuit configuration diagrams of the circuit to be inspected and FIGS. 8 to 10 show illustrations of other embodiments of the present invention. DESCRIPTION OF SYMBOLS 1...Memory (storage means) 2...Connection judgment unit (connection judgment means) 10...First circuit 20...Second circuit 2]...Voltage dividing circuit 22...Register 23...Threshold value generation unit 24.25...A-D converter 26...Logic circuit 27...Output information register 28...Switch

Claims (1)

[Claims] 1. Regarding a semiconductor circuit formed by connecting a first circuit (10) that outputs a control signal and a second circuit (20) that operates based on the control signal, In a semiconductor circuit simulation device for inspecting the suitability of the connection relationship between the first and second circuits (10, 20), each connection relationship information set in advance regarding the connection of the first and second circuits (10, 20). (D_1, D_2), and when connecting arbitrary first and second circuits (10, 20) based on the connection relationship information (D_1, D_2), 1. A semiconductor circuit simulation device comprising: connection determining means (2) for determining suitability of a combination of first and second circuits (10, 20). 2. The semiconductor circuit simulation device according to claim 1, wherein the storage means (1) stores each of the first and second circuits (10, 2).
0) is properly connected to the second circuit (20).
stores the output information (D_2) outputted by the operation, and when the connection determining means (2) determines that the connection between the first and second circuits (10, 20) is appropriate,
A semiconductor circuit simulation device characterized in that output information (D_3) of the second circuit (20) is output. 3. In the semiconductor circuit simulation device according to claim 1, the connection determination means (2) receives connection relationship information (D_1) of the first circuit (10) as a first voltage value (V_1), and When the connection relationship information (D_2) of the second circuit (20) is input as the second voltage value (V_2), the information obtained by adding or subtracting a predetermined value (σ) to the second voltage value (V_2) is obtained. Each addition/subtraction threshold (V_2+σ, V_2-σ
) and the first voltage value (V_1) are compared (V_
1-V_2-σ, V_1-V_2+σ), and the logic of each of the comparison results (V_1-V_2-σ, V_1-V_2+σ) is determined to determine the suitability of connection between the first and second circuits. A semiconductor circuit simulation device.