JPH0478543U - - Google Patents

Info

Publication number
JPH0478543U
JPH0478543U JP1990120547U JP12054790U JPH0478543U JP H0478543 U JPH0478543 U JP H0478543U JP 1990120547 U JP1990120547 U JP 1990120547U JP 12054790 U JP12054790 U JP 12054790U JP H0478543 U JPH0478543 U JP H0478543U
Authority
JP
Japan
Prior art keywords
light
laser beam
particle size
scattered
size distribution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1990120547U
Other languages
English (en)
Other versions
JPH081482Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990120547U priority Critical patent/JPH081482Y2/ja
Priority to EP91118667A priority patent/EP0486859A1/en
Priority to US07/786,525 priority patent/US5164787A/en
Publication of JPH0478543U publication Critical patent/JPH0478543U/ja
Application granted granted Critical
Publication of JPH081482Y2 publication Critical patent/JPH081482Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【図面の簡単な説明】
第１図ないし第４図は本考案の一実施例を示し
、第１図は本考案の粒度分布測定装置の測定光学
系を示す図、第２図は前記粒度分布測定装置にお
けるリング状デイテクタを示す斜視図、第３図は
前記粒度分布測定装置におけるバンドパスフイル
タを示す平面図、第４図は前記粒度分布測定装置
による粒度分布の測定範囲を示す図である。第５
図および第４図は従来例を示し、第５図は従来の
粒度分布測定装置の測定光学系を示す図、第６図
はその粒度分布測定装置による粒度分布の測定範
囲を示す図である。 １９……大径粒子検出用光学系、２０……小径
粒子検出用光学系、２１……試料容器、２２……
レーザ光照射手段、２３……単一波長照射手段、
２５……リング状デイテクタ、２６……フオトセ
ンサ群、３３……バンドパスフイルタ群、３５…
…フイルタ移動手段、３７……データ入力手段、
Ｌ……レーザ光、Ｍ……単一波長光、Ｍｏ……ラ
ンプ光。

Claims (1)

    【実用新案登録請求の範囲】
  1. 試料粒子が分散する媒体を収容した試料容器に
    対してレーザ光を照射するレーザ光照射手段およ
    び前記試料粒子によつて回折もしくは散乱する各
    散乱角ごとのレーザ光の光強度をそれぞれ測定す
    るリング状デイテクタを含む大径粒子検出用光学
    系と、前記試料容器に対してランプ光から得た単
    一波長光を照射する単一波長光照射手段および前
    記試料粒子によつて回折もしくは散乱する各散乱
    角ごとの単一波長光の光強度をそれぞれ測定する
    フオトセンサ群を含む小径粒子検出用光学系とに
    よつて得られる回折光もしくは散乱光の強度分布
    から、フラウンホーフア回折もしくはミー散乱理
    論に基づいて試料粒子の粒度分布を求める粒度分
    布測定装置において、前記単一波長光照射手段に
    は、ランプ光からそれぞれ異なる波長の単一波長
    光を得る複数のバンドパスフイルタを配列したバ
    ンドパスフイルタ群と、このバンドパスフイルタ
    群をその各バンドパスフイルタが前記ランプ光の
    光路に切り換え配置されるように移動させるフイ
    ルタ移動手段を設け、前記フオトセンサ群は、前
    記試料容器の後方から前方にわたる回折光もしく
    は散乱光を受光できるように配置すると共に、前
    記リング状デイテクタの測定データと前記フオト
    センサ群の測定データを共通のデータ入力手段で
    取り込むようにしたことを特徴とする粒度分布測
    定装置。
JP1990120547U 1990-11-17 1990-11-17 粒度分布測定装置 Expired - Lifetime JPH081482Y2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP1990120547U JPH081482Y2 (ja) 1990-11-17 1990-11-17 粒度分布測定装置
EP91118667A EP0486859A1 (en) 1990-11-17 1991-10-31 Apparatus for measuring a particle size distribution
US07/786,525 US5164787A (en) 1990-11-17 1991-11-01 Apparatus for measuring particle size distribution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990120547U JPH081482Y2 (ja) 1990-11-17 1990-11-17 粒度分布測定装置

Publications (2)

Publication Number Publication Date
JPH0478543U true JPH0478543U (ja) 1992-07-08
JPH081482Y2 JPH081482Y2 (ja) 1996-01-17

Family

ID=14789007

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990120547U Expired - Lifetime JPH081482Y2 (ja) 1990-11-17 1990-11-17 粒度分布測定装置

Country Status (3)

Country Link
US (1) US5164787A (ja)
EP (1) EP0486859A1 (ja)
JP (1) JPH081482Y2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010537165A (ja) * 2007-08-15 2010-12-02 マルベルン インスツルメンツ リミテッド 広幅分光計

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2863874B2 (ja) * 1990-12-30 1999-03-03 株式会社堀場製作所 粒度分布測定装置
DE4228388B4 (de) * 1992-08-26 2005-03-03 Sympatec Gmbh System-Partikel-Technik Vorrichtung zur Bestimmung von Partikelgrößen und/oder Partikelgrößenverteilungen
JPH0816646B2 (ja) * 1992-09-28 1996-02-21 株式会社島津製作所 粒度分布測定装置
NL9301446A (nl) * 1993-08-20 1995-03-16 Univ Delft Tech Werkwijze en inrichting voor het meten van vormeigenschappen van deeltjes.
DE4414166C1 (de) * 1994-04-22 1995-12-07 Lorenz Mesgeraetebau Verfahren und Vorrichtung zur Messung der Lichtstreuung an Partikeln
AU6385496A (en) * 1995-06-13 1997-01-09 University Of South Florida Multi-angle, multiwavelength particle characterization syste m and method
US5818583A (en) * 1996-11-08 1998-10-06 Purdue Research Foundation Particle analysis system and method
US7187441B1 (en) 1996-11-08 2007-03-06 The Texas A&M University System Particle analysis system and method
US6246474B1 (en) 1998-04-29 2001-06-12 Particle Measuring Systems, Inc. Method and apparatus for measurement of particle size distribution in substantially opaque slurries
US6417920B1 (en) * 1999-05-11 2002-07-09 Shimadzu Corporation Particle size analyzer based on laser diffraction method
US6480276B1 (en) 1999-07-13 2002-11-12 Clemson University Enhanced photon-migration methods for particle sizing in concentrated suspensions
US7054002B1 (en) 1999-10-08 2006-05-30 The Texas A&M University System Characterization of luminescence in a scattering medium
US6219138B1 (en) 2000-01-10 2001-04-17 The United States Of America As Represented By The Secretary Of The Navy Particle sizing technique
US6639674B2 (en) * 2000-03-28 2003-10-28 Board Of Regents, The University Of Texas System Methods and apparatus for polarized reflectance spectroscopy
JP4266075B2 (ja) * 2001-02-19 2009-05-20 株式会社堀場製作所 粒径分布測定装置
JP4535697B2 (ja) * 2003-07-23 2010-09-01 オリンパス株式会社 生体組織の光散乱観測内視鏡装置
US7651559B2 (en) 2005-11-04 2010-01-26 Franklin Industrial Minerals Mineral composition
US7833339B2 (en) 2006-04-18 2010-11-16 Franklin Industrial Minerals Mineral filler composition
US7847936B2 (en) * 2007-05-15 2010-12-07 Waters Technologies Corporation Evaporative light scattering device and methods of use thereof
US20130115720A1 (en) * 2011-11-07 2013-05-09 Arnold Allenic Surface measurement
US10365197B2 (en) * 2015-06-12 2019-07-30 Koninklijke Philips N.V. Optical particle sensor and sensing method
CN116067847B (zh) * 2023-02-14 2025-12-12 丹东百特仪器有限公司 一种基于动态和静态光散射技术的流动模式纳米粒度仪及其检测方法
CN117782912A (zh) * 2023-10-31 2024-03-29 丹东百特仪器有限公司 一种检测纳米级颗粒物浓度的光学装置及其检测方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5970944A (ja) * 1982-10-15 1984-04-21 Toshiba Corp 粒径測定装置
JPH0266425A (ja) * 1988-08-31 1990-03-06 Shimadzu Corp 粒度分布測定装置
JPH02226046A (ja) * 1989-02-27 1990-09-07 Shimadzu Corp 粒度分布測定装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361403A (en) * 1978-06-26 1982-11-30 Loos Hendricus G Multiple wavelength instrument for measurement of particle size distributions
US4679939A (en) * 1985-12-23 1987-07-14 The United States Of America As Represented By The Secretary Of The Air Firce In situ small particle diagnostics
US4781460A (en) * 1986-01-08 1988-11-01 Coulter Electronics Of New England, Inc. System for measuring the size distribution of particles dispersed in a fluid
JPS6415950A (en) * 1987-07-10 1989-01-19 Hitachi Ltd Method for forming multilayered interconnection and semiconductor device using same
FR2617971B1 (fr) * 1987-07-10 1989-11-10 Onera (Off Nat Aerospatiale) Procede et dispositifs de granulometrie optique pour de larges gammes de mesure
US5056918A (en) * 1989-03-03 1991-10-15 Coulter Electronics Of New England, Inc. Method and apparatus for particle size analysis
JP2715604B2 (ja) * 1989-12-18 1998-02-18 株式会社島津製作所 レーザ回折・散乱式粒度分布測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5970944A (ja) * 1982-10-15 1984-04-21 Toshiba Corp 粒径測定装置
JPH0266425A (ja) * 1988-08-31 1990-03-06 Shimadzu Corp 粒度分布測定装置
JPH02226046A (ja) * 1989-02-27 1990-09-07 Shimadzu Corp 粒度分布測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010537165A (ja) * 2007-08-15 2010-12-02 マルベルン インスツルメンツ リミテッド 広幅分光計

Also Published As

Publication number Publication date
US5164787A (en) 1992-11-17
JPH081482Y2 (ja) 1996-01-17
EP0486859A1 (en) 1992-05-27

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