JPH0478569U - - Google Patents

Info

Publication number
JPH0478569U
JPH0478569U JP12051390U JP12051390U JPH0478569U JP H0478569 U JPH0478569 U JP H0478569U JP 12051390 U JP12051390 U JP 12051390U JP 12051390 U JP12051390 U JP 12051390U JP H0478569 U JPH0478569 U JP H0478569U
Authority
JP
Japan
Prior art keywords
integrated circuit
semiconductor integrated
circuit device
socket
screening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12051390U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12051390U priority Critical patent/JPH0478569U/ja
Publication of JPH0478569U publication Critical patent/JPH0478569U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案の第1の実施例のフラツトパ
ツケージ用ICソケツトの一部の断面図、第2図
はICソケツトにICをコンタクトさせた状態を
示す断面図、第3図a,bは本考案の第2の実施
例の断面図と右側面図、第4図は従来のICソケ
ツトの断面図である。 1……IC、2……ICのリード、3,10,
11……コンタクトピン、4……ICソケツト、
5……コンタクトピンのリード押え部、6……コ
ンタクトピンの固定部、7……コンタクトピンの
上下部。
FIG. 1 is a sectional view of a part of an IC socket for a flat package according to the first embodiment of the present invention, FIG. 2 is a sectional view showing a state in which an IC is brought into contact with the IC socket, and FIGS. 4b is a sectional view and a right side view of the second embodiment of the present invention, and FIG. 4 is a sectional view of a conventional IC socket. 1...IC, 2...IC lead, 3,10,
11...Contact pin, 4...IC socket,
5... Lead holding part of the contact pin, 6... Fixing part of the contact pin, 7... Upper and lower parts of the contact pin.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体集積回路装置の選別測定に用いるソケツ
トにおいて、コンタクトピンが半導体集積回路装
置のリードを挟みこむ構造を有することを特徴と
する半導体集積回路装置用ソケツト。
1. A socket for a semiconductor integrated circuit device, which is used for screening and measuring semiconductor integrated circuit devices, and has a structure in which contact pins sandwich leads of the semiconductor integrated circuit device.
JP12051390U 1990-11-16 1990-11-16 Pending JPH0478569U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12051390U JPH0478569U (en) 1990-11-16 1990-11-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12051390U JPH0478569U (en) 1990-11-16 1990-11-16

Publications (1)

Publication Number Publication Date
JPH0478569U true JPH0478569U (en) 1992-07-08

Family

ID=31868415

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12051390U Pending JPH0478569U (en) 1990-11-16 1990-11-16

Country Status (1)

Country Link
JP (1) JPH0478569U (en)

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