JPH0478574U - - Google Patents
Info
- Publication number
- JPH0478574U JPH0478574U JP12110290U JP12110290U JPH0478574U JP H0478574 U JPH0478574 U JP H0478574U JP 12110290 U JP12110290 U JP 12110290U JP 12110290 U JP12110290 U JP 12110290U JP H0478574 U JPH0478574 U JP H0478574U
- Authority
- JP
- Japan
- Prior art keywords
- operation panel
- side connector
- measurement point
- engaging member
- exposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims 3
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
図面は、本考案の１実施例を示す構成説明図で
ある。図において、１は回路試験装置、１１はＸ
Ｙテーブル、１２はプローブ、１３は操作パネル
、１４は装置側側接続部である。
The drawings are configuration explanatory diagrams showing one embodiment of the present invention. In the figure, 1 is a circuit test device, 11 is an X
A Y table, 12 a probe, 13 an operation panel, and 14 a device side connection section.
Claims (1)
基板の所定の測定点に対して、装置の処理装置か
らの指令に応じてＸＹ方向に移動可能であるとと
もにＺ軸方向に上下動して上記所定の測定点に接
触して当該測定点における信号を取り出すプロー
ブを有し、このプローブにより取り出された信号
を上記処理装置に送出して上記処理装置内で所定
の処理を行い当該回路基板の良否を判定するよう
に構成された回路試験装置において、 この装置を動作させるための一部の命令につい
ては使用者が操作できるよう一部の命令を実行す
るためのスイツチが設けられるとともに装置と電
気機械的に結合するための操作パネル側コネクタ
と操作パネル側係合部材とが露出されて構成され
た操作パネルと、装置の２以上の領域に設けられ
上記操作パネル側の露出されたコネクタ及び係合
部材にそれぞれ係合可能な装置側コネクタと装置
側係合部材と、さらに、上記操作パネルを上記各
領域における装置側のコネクタ及び係合部材に結
合させた際において上記２以上の領域に設けられ
た装置側のコネクタ及び係合部材のいずれかがな
おむき出しになつている時にカバーとなるダミー
カバーとを有してなる回路試験装置の操作パネル
。[Claims for Utility Model Registration] A device that is movable in the XY direction and in the Z axis direction in response to commands from the processing device of the device, with respect to a predetermined measurement point of a circuit board to be inspected mounted on an XY table. It has a probe that moves up and down to touch the predetermined measurement point and extract the signal at the measurement point, and the signal extracted by the probe is sent to the processing device and subjected to predetermined processing in the processing device. In a circuit testing device configured to determine the acceptability of the circuit board, a switch is provided to execute some of the instructions for operating the device so that the user can operate them. an operation panel configured with an exposed operation panel side connector and an operation panel side engaging member for electromechanically coupling with the device; and an operation panel provided in two or more areas of the device and exposed on the operation panel side a device-side connector and a device-side engaging member that are respectively engageable with the device-side connector and the engaging member; An operation panel for a circuit testing device comprising: a device-side connector provided in the region; and a dummy cover that serves as a cover when any of the engaging members is still exposed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12110290U JPH0478574U (en) | 1990-11-19 | 1990-11-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12110290U JPH0478574U (en) | 1990-11-19 | 1990-11-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0478574U true JPH0478574U (en) | 1992-07-08 |
Family
ID=31868978
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12110290U Pending JPH0478574U (en) | 1990-11-19 | 1990-11-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0478574U (en) |
-
1990
- 1990-11-19 JP JP12110290U patent/JPH0478574U/ja active Pending
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