JPH0479042B2 - - Google Patents
Info
- Publication number
- JPH0479042B2 JPH0479042B2 JP22036390A JP22036390A JPH0479042B2 JP H0479042 B2 JPH0479042 B2 JP H0479042B2 JP 22036390 A JP22036390 A JP 22036390A JP 22036390 A JP22036390 A JP 22036390A JP H0479042 B2 JPH0479042 B2 JP H0479042B2
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- magnetic head
- magnetic
- etching
- sendust
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000010409 thin film Substances 0.000 claims description 43
- 238000005530 etching Methods 0.000 claims description 22
- 238000000034 method Methods 0.000 claims description 18
- 239000002131 composite material Substances 0.000 claims description 17
- 238000004519 manufacturing process Methods 0.000 claims description 16
- 238000005260 corrosion Methods 0.000 claims description 13
- 230000007797 corrosion Effects 0.000 claims description 13
- 239000000696 magnetic material Substances 0.000 claims description 8
- 230000004907 flux Effects 0.000 claims description 6
- 238000010884 ion-beam technique Methods 0.000 claims description 2
- 229910000702 sendust Inorganic materials 0.000 description 28
- 239000010408 film Substances 0.000 description 12
- 230000001105 regulatory effect Effects 0.000 description 12
- 229910000859 α-Fe Inorganic materials 0.000 description 12
- 235000012431 wafers Nutrition 0.000 description 9
- 238000003754 machining Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 229910004298 SiO 2 Inorganic materials 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 229910000889 permalloy Inorganic materials 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 229910021364 Al-Si alloy Inorganic materials 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- SOCTUWSJJQCPFX-UHFFFAOYSA-N dichromate(2-) Chemical compound [O-][Cr](=O)(=O)O[Cr]([O-])(=O)=O SOCTUWSJJQCPFX-UHFFFAOYSA-N 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000006060 molten glass Substances 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Description
【発明の詳細な説明】
本発明は磁気記録再生装置に用いられる複合型
磁気ヘツドの製造方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing a composite magnetic head used in a magnetic recording/reproducing device.
VTR等の磁気記録再生装置に用いられる磁気
ヘツドとして第6図に示す複合型磁気ヘツドが提
案されている(実開昭56−174119号公報)。これ
はフエライト材等の高固有抵抗磁性材によつて形
成された一対の磁気ヘツド半体2,2の突き合わ
せ面に該磁性材よりも更に飽和磁束密度の高い磁
性体、例えばセンダスト、パーマロイ、アモルフ
アス磁性体等の薄膜3,3を形成して磁気空〓部
近傍に於ける飽和磁束密度を高めたものである。 A composite magnetic head shown in FIG. 6 has been proposed as a magnetic head for use in magnetic recording and reproducing devices such as VTRs (Japanese Utility Model Publication No. 174119/1983). This is because the abutting surfaces of the pair of magnetic head halves 2, 2 made of a high resistivity magnetic material such as ferrite are coated with a magnetic material having a higher saturation magnetic flux density than the magnetic material, such as sendust, permalloy, amorphous material, etc. Thin films 3, 3 made of magnetic material or the like are formed to increase the saturation magnetic flux density near the magnetic air space.
従来の複合型磁気ヘツドに於ては、センダスト
等の薄膜によつて飽和磁束密度を高めても、薄膜
3が磁気ヘツド半体の接合面に接合する幅Tは目
的とするトラツク幅と同一とし、且つ磁気ヘツド
半体はフエライト材によつて形成されているの
で、該接合面で磁気飽和が生ずる虞れがあつた。 In conventional composite magnetic heads, even if the saturation magnetic flux density is increased by using a thin film such as sendust, the width T where the thin film 3 joins the joint surface of the magnetic head halves is the same as the target track width. Moreover, since the magnetic head half is made of ferrite material, there is a risk that magnetic saturation will occur at the joint surface.
更に従来の複合型磁気ヘツドに於ては、製造方
法による理由から下記の如き構造上の問題があつ
た。即ち、複合型の磁気ヘツドを製造するには第
2図に示す如く、一対の磁気ヘツドブロツク半体
11,12の夫々にトラツク幅規制用溝21を開
設し、両ブロツク半体の突き合わせ部に例えばセ
ンダストの薄膜3を真空蒸着或はスパツタリング
等の公知の成膜技術によつて厚さ数μmに形成す
る。 Furthermore, conventional composite magnetic heads have had the following structural problems due to the manufacturing method. That is, in order to manufacture a composite type magnetic head, as shown in FIG. 2, a track width regulating groove 21 is formed in each of a pair of magnetic head block halves 11 and 12, and a groove 21 for regulating the track width is formed in the abutting portion of both block halves, for example. A thin film 3 of sendust is formed to a thickness of several micrometers by a known film forming technique such as vacuum evaporation or sputtering.
該薄膜3の上面には更にSiO2の非磁性体層4
を同様の成膜技術によつて厚さ約0.1μmに形成
し、その後両ブロツク半体を第3図に示す如く突
き合わせてトラツク幅規制用溝5に溶融ガラスを
充填し、両ブロツク半体を一体化する。そして、
これを第4図に示す如く適当な厚さにスライスす
れば、上記の非磁性体層4を磁気空〓部とする磁
気ヘツド1が得られる。 A non-magnetic layer 4 of SiO 2 is further formed on the upper surface of the thin film 3.
was formed to a thickness of approximately 0.1 μm using the same film forming technique, and then the two block halves were butted together as shown in Fig. 3, the track width regulating groove 5 was filled with molten glass, and both block halves were then Unify. and,
By slicing this to an appropriate thickness as shown in FIG. 4, a magnetic head 1 having the above-mentioned non-magnetic layer 4 as a magnetic air space can be obtained.
ところが上述の製造方法の成膜工程に於ては、
両ブロツク半体の突き合わせ部にスリツト状の開
口を有するマスクを介してセンダストの真空蒸着
或はスパツタリングを施すので、センダストの粒
子の付着状態がマスクの開口縁付近と開口中央部
とで異なつたり、或はセンダストの粒子がマスク
の裏側にも侵入して、均一な厚さの膜が形成され
ず、第6図に示す如く製品となつた複合型磁気ヘ
ツドのセンダストの薄膜3には両端になで肩部3
1,31が生じる。この様な磁気ヘツドに於ては
トラツク幅Wを正確に規定することが出来ないの
で、製品間に記録再生性能のバラツキを引き起こ
していた。 However, in the film formation process of the above manufacturing method,
Since sendust is vacuum-deposited or sputtered through a mask having a slit-shaped opening at the abutting portion of both block halves, the state of adhesion of sendust particles may differ between near the edge of the opening of the mask and at the center of the opening. Alternatively, the sendust particles may also enter the back side of the mask, preventing a film of uniform thickness from being formed, and as shown in Figure 6, the sendust thin film 3 of the manufactured composite magnetic head has a thin film on both ends. Stroke shoulder part 3
1,31 occurs. In such magnetic heads, the track width W cannot be accurately defined, resulting in variations in recording and reproducing performance among products.
又、上記の問題を解決する為に、両ブロツク半
体にトラツク幅規制用溝を開設する前に接合面全
面にセンダスト及びSiO2の膜を形成し、その後
これらの膜とフエライトウエハとに同時にダイヤ
モンドブレード或はCBNブレードによる機械加
工を施して、トラツク幅規制用溝5及び非磁性体
層4を形成する方法も採用出来るが、この方法に
よるとセンダストの薄膜が加工の際に剥離するこ
とがあつた。剥離部分が大きければ製品として使
用することが出来ないのは勿論であるが、剥離が
軽微であつても第6図に示す如く欠け部32が生
じていることがあり、前述したなで肩部31と同
様、磁気ヘツドの実質的なトラツク幅Wを不確定
なものとしていた。 In addition, in order to solve the above problem, before creating track width regulating grooves in both block halves, films of sendust and SiO 2 were formed on the entire bonding surface, and then these films and the ferrite wafer were simultaneously coated. It is also possible to adopt a method of forming the track width regulating groove 5 and the non-magnetic layer 4 by machining with a diamond blade or CBN blade, but with this method, the thin film of sendust may peel off during processing. It was hot. Of course, if the peeled part is large, it cannot be used as a product, but even if the peeling is slight, a chipped part 32 may occur as shown in FIG. Similarly, the actual track width W of the magnetic head is made uncertain.
本発明の目的は、磁気ヘツド半体となる部材に
トラツク幅規制用溝加工等の溝加工を行う際、薄
膜が剥離するのを防止した複合型磁気ヘツドの製
造方法を提供することである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a method for manufacturing a composite magnetic head in which peeling of a thin film is prevented when grooves, such as track width regulating grooves, are formed on a member forming a magnetic head half.
本発明の製造方法は、磁気ヘツド半体2となる
部材に達する溝5の形成を、薄膜3の上面に所定
の幅を有する帯状耐蝕層6を形成して該薄膜の耐
蝕層に覆われていない部分をエツチングにより除
去した後、該除去部に機械的溝加工を施すことに
より行うことを特徴とする。
In the manufacturing method of the present invention, the groove 5 reaching the member that becomes the magnetic head half 2 is formed by forming a band-shaped corrosion-resistant layer 6 having a predetermined width on the upper surface of the thin film 3 and covering the groove with the corrosion-resistant layer of the thin film. It is characterized in that the removed portion is removed by etching, and then the removed portion is mechanically grooved.
上記製造方法に依れば、機械的溝加工により除
去される薄膜3は無く、若しくは少なく、該薄膜
3の剥離は防止される。
According to the above manufacturing method, no or less thin film 3 is removed by mechanical grooving, and peeling of the thin film 3 is prevented.
本発明に係る複合型磁気ヘツドの製造方法に依
れば、薄膜の剥離は防止され、製造歩留りが向上
すると共にトラツク幅Wを正確に規定することが
出来る。
According to the method of manufacturing a composite magnetic head according to the present invention, peeling of the thin film is prevented, manufacturing yield is improved, and the track width W can be accurately defined.
以下図示する実施例に基づき本発明を詳述す
る。 The present invention will be described in detail below based on the illustrated embodiments.
第1図は本発明に係る複合型磁気ヘツドの磁気
空〓部付近の拡大平面図であつて、トラツク幅規
制用溝5が開設されたフエライト材よりなる1対
の磁気ヘツド半体2,2の突き合わせ部に高飽和
磁気密度材となるセンダスト(Fe−Al−Si系合
金)の薄膜3,3を設け、更に両薄膜間には
SiO2の非磁性体層4を設けて前記突き合わせ部
に平行である磁気空〓部を形成している。又、ト
ラツク幅規制用溝5にはガラスが充填されてい
る。上記のセンダストの薄膜3及び非磁性体層4
は後記の如くエツチングにより成形される。 FIG. 1 is an enlarged plan view of the vicinity of the magnetic air space of a composite magnetic head according to the present invention, showing a pair of magnetic head halves 2, 2 made of ferrite material with track width regulating grooves 5 formed therein. Thin films 3 and 3 of Sendust (Fe-Al-Si alloy), which is a high saturation magnetic density material, are provided at the butt part of the
A non-magnetic layer 4 of SiO 2 is provided to form a magnetic air space parallel to the abutting portion. Further, the track width regulating groove 5 is filled with glass. The above Sendust thin film 3 and non-magnetic layer 4
is formed by etching as described later.
第2図乃至第5図は本発明に係る複合型磁気ヘ
ツドを製造する工程を示している。 FIGS. 2 to 5 show steps for manufacturing a composite magnetic head according to the present invention.
第2図はトラツク幅規制用溝となるU字状溝2
1が開設された1対のフエライトウエハ20,2
0の突き合わせ部にセンダストの薄膜3,3を設
けてブロツク半体11,12が形成されている状
況を示している。尚、一方のフエライトウエハ2
0には後にコイル巻装孔8となるコイル溝13が
開設されている。 Figure 2 shows the U-shaped groove 2 that serves as the track width regulating groove.
A pair of ferrite wafers 20, 2 with 1 opened
This figure shows a situation in which block halves 11 and 12 are formed by providing sendust thin films 3 and 3 at the abutting portions of the blocks. In addition, one ferrite wafer 2
0 is provided with a coil groove 13 that will later become a coil winding hole 8.
第5図はフエライトウエハ20にセンダストの
薄膜3を公知技術であるエツチングによつて形成
する手順を示し、先ず第5図aに示す如くフエラ
イトウエハ20の表面全面にセンダストの薄膜3
をスパツタリング等の成膜方法によつて厚さ約1
乃至10μmに形成し、その上面にトラツク幅Wに
よつて規定される幅W0の帯状耐蝕層6を一定の
ピツチで繰り返し形成する。帯状耐蝕層6は例え
ば重クロム酸塩系の感光液をセンダストの薄膜表
面に厚さ約1μmにコーテイングして乾燥の後、幅
W0のスリツト状開口を有するフオトマスクをそ
の上にのせ、紫外線を照射する露光工程と、現像
液によつて前記原版に覆われない部分を除去する
現像工程を経て形成される。 FIG. 5 shows a procedure for forming a thin film 3 of sendust on a ferrite wafer 20 by etching, which is a known technique. First, as shown in FIG.
The thickness is approximately 1 mm depending on a film forming method such as sputtering.
A band-shaped corrosion-resistant layer 6 having a width W 0 defined by the track width W is repeatedly formed on the upper surface at a constant pitch. The strip-shaped corrosion-resistant layer 6 is formed by coating the surface of a thin Sendust film with a dichromate-based photosensitive liquid to a thickness of about 1 μm, and then drying it.
A photomask having a W 0 slit-shaped opening is placed thereon, and an exposure process of irradiating ultraviolet rays is performed, followed by a development process of removing the portion not covered by the original plate using a developer.
次に第5図bに示す如く、センダストの薄膜3
の耐蝕層6に覆われない部分をエツチング液で溶
解させる。本実施例ではエツチング液として30%
の硝酸液を25℃で使用した。この際、腐蝕は深さ
方向のみならず、横方向即ち耐蝕層6の下方にも
進行し、所謂サイドエツチが生じるが、サイドエ
ツチ量Rはセンダストの薄膜3が10μm以下の厚
さであれば再現性が良いことが確かめられてい
る。従つて予めサイドエツチ量を予測して、目的
のトラツク幅Wが得られる耐蝕層6の幅W0を決
めることが可能である。例えばセンダストの薄膜
3の厚さが10μmであつて、上記のエツチング液
を使用して6分30秒のエツチングを行うと、サイ
ドエツチ量は約8μmとなる。本実施例の場合、ト
ラツク幅Wを24±2μmとする必要があり、この為
には耐蝕層6の幅W0を40μmとすれば良い。 Next, as shown in FIG. 5b, the sendust thin film 3
The portions not covered by the corrosion-resistant layer 6 are dissolved with an etching solution. In this example, 30% was used as the etching solution.
of nitric acid solution was used at 25°C. At this time, corrosion progresses not only in the depth direction but also in the lateral direction, that is, below the corrosion-resistant layer 6, resulting in so-called side etching, but the side etching amount R is reproducible if the sendust thin film 3 has a thickness of 10 μm or less. It has been confirmed that it is good. Therefore, it is possible to predict the amount of side etching in advance and determine the width W0 of the corrosion-resistant layer 6 that will provide the desired track width W. For example, if the thickness of the sendust thin film 3 is 10 .mu.m and etching is performed for 6 minutes and 30 seconds using the above etching solution, the side etching amount will be about 8 .mu.m. In the case of this embodiment, the track width W needs to be 24±2 μm, and for this purpose, the width W 0 of the corrosion-resistant layer 6 may be set to 40 μm.
本実施例ではこのサイドエツチを利用してセン
ダストの薄膜3を目的の断面形状としている。即
ち、サイドエツチはセンダスト膜の耐蝕層6に近
い部分がより速く進行し、この結果図示の如く成
形後の薄膜3のフエライトウエハ20との接合面
の幅Tは上面の幅Wよりも大きくなる。又、該薄
膜3の側面30は上面に対して略90度をなす。 In this embodiment, this side etching is utilized to give the sendust thin film 3 a desired cross-sectional shape. That is, the side etching progresses faster in the portion of the sendust film near the corrosion-resistant layer 6, and as a result, as shown in the figure, the width T of the bonding surface of the formed thin film 3 with the ferrite wafer 20 becomes larger than the width W of the upper surface. Further, the side surface 30 of the thin film 3 forms approximately 90 degrees with respect to the top surface.
エツチングが終了した後、第5図cに示す如く
フエライトウエハ20にトラツク幅規制用溝とな
るU字状溝21をダイヤモンドブレードを用いて
開設する。この場合、ブレードをセンダストの薄
膜3に接触しない範囲で可及的に接近させる必要
があるが、機械加工のみでセンダストの薄膜やフ
エライトウエハを成形する場合に比べて、粗い加
工で可い。センダストの薄膜3の上面には更に前
記同様の成膜技術によつてSiO2の薄い膜を形成
し、ギヤツプを規定する為の非磁性体層4とす
る。尚、非磁性体層4を第5図aに示す段階でセ
ンダストの薄膜3の上面に全面に形成し、第5図
bに示す段階で先ずこの非磁性体層にふつ酸等に
よるウエツトエツチング或はドライエツチングを
施すことにより、非磁性体層の所定の形状に成形
しても可い。 After the etching is completed, as shown in FIG. 5c, a U-shaped groove 21 is formed in the ferrite wafer 20 to serve as a track width regulating groove using a diamond blade. In this case, it is necessary to bring the blade as close as possible to the sendust thin film 3 without contacting it, but compared to the case where the sendust thin film or ferrite wafer is formed only by machining, rough machining is possible. A thin SiO 2 film is further formed on the upper surface of the sendust thin film 3 by the same film forming technique as described above to form a nonmagnetic layer 4 for defining the gap. The non-magnetic layer 4 is formed on the entire surface of the sendust thin film 3 in the step shown in FIG. Alternatively, the nonmagnetic layer may be formed into a predetermined shape by dry etching.
上記の如く形成された2つのブロツク半体1
1,12を第3図に示す如く非磁性体層4にて当
接せしめ、トラツク幅規制用溝5には溶融ガラス
を充填し、両ブロツク半体を接着一体化すると、
非磁性体層4からなる磁気空〓部、トラツク幅規
制用溝5及びコイル巻装孔8を有する磁気ヘツド
ブロツク10が出来上がる。これを適当な厚さに
スライスすれば、第4図に示す複合型磁気ヘツド
1が複数個得られる。 Two block halves 1 formed as above
1 and 12 are brought into contact with each other with a non-magnetic layer 4 as shown in FIG.
A magnetic headblock 10 having a magnetic air space made of a non-magnetic layer 4, a track width regulating groove 5 and a coil winding hole 8 is completed. By slicing this to an appropriate thickness, a plurality of composite magnetic heads 1 shown in FIG. 4 can be obtained.
この様にして製作された磁気ヘツド1のセンダ
ストの薄膜3は第1図に示す如く、幅がトラツク
幅Wと厳密に一致する高い平面度を有する上面
と、該上面から略垂直方向に伸びた側面30と、
前記上面より大なる幅を有する磁気ヘツド半体と
の接合面を具備し、不均一な成膜に基づくなで肩
部や機械加工に基づく欠け部は無い。 As shown in FIG. 1, the sendust thin film 3 of the magnetic head 1 manufactured in this manner has a highly flat upper surface whose width closely matches the track width W, and an upper surface extending approximately perpendicularly from the upper surface. side surface 30;
It has a joint surface with the magnetic head half having a width larger than the upper surface, and there are no rounded shoulders due to non-uniform film formation or chips due to machining.
尚、上述の実施例ではセンダストの薄膜を全て
エツチングによつて成形しているが、該薄膜の上
肩部のみをエツチングによつて成形し、残りの下
層部をU字状溝と共に機械加工で同時に成形して
も良く、下層部の厚さが1μm程度であれば、機械
加工による剥離は殆んど生じないことが実験的に
確かめられている。 In the above-mentioned embodiment, all of the sendust thin film is formed by etching, but only the upper shoulder part of the thin film is formed by etching, and the remaining lower layer is machined together with the U-shaped groove. They may be molded at the same time, and it has been experimentally confirmed that if the thickness of the lower layer is approximately 1 μm, peeling due to machining will hardly occur.
又、本実施例ではケミカルエツチングによつて
センダストの薄膜を成形しているが、他の周知の
エツチング方法を用いて可いのは勿論であつて、
例えばイオンビームエツチングによつても可い。 Furthermore, although the sendust thin film is formed by chemical etching in this example, it is of course possible to use other well-known etching methods.
For example, ion beam etching may be used.
更に、高飽和磁束密度の薄膜の材質としてセン
ダスト以外にパーマロイやアモルフアス磁性体を
用いても本実施例と同様の効果が得られる。 Furthermore, the same effects as in this embodiment can be obtained by using permalloy or amorphous magnetic material other than sendust as the material of the thin film with high saturation magnetic flux density.
本発明に係る磁気ヘツドの製造に於ては、高飽
和磁束密度の薄膜をフエライトウエハの突き合わ
せ部全面について同時に成形することが出来、然
もU字状溝は比較的粗い精度で加工出来るので、
従来の製造方法に比べて高い生産性が得られる。 In manufacturing the magnetic head according to the present invention, a thin film with a high saturation magnetic flux density can be simultaneously formed on the entire surface of the abutting portion of the ferrite wafer, and the U-shaped groove can be processed with relatively rough precision.
Higher productivity can be obtained compared to conventional manufacturing methods.
第1図は本発明に係る複合型磁気ヘツドの拡大
部分平面図、第2図は1対のブロツク半体の斜視
図、第3図は磁気ヘツドブロツクの斜視図、第4
図は完成した磁気ヘツドの斜視図、第5図a,
b,cはエツチングによる薄膜の成形方法を示す
説明図、第6図は従来の複合型磁気ヘツドの拡大
部分平面図を示す。
2…磁気ヘツド半体、3…センダストの薄膜、
4…非磁性体層、5…トラツク幅規制用溝、20
…フエライトウエハ(磁気ヘツド半体となる部
材)、21…U字状溝、W…トラツク幅。
FIG. 1 is an enlarged partial plan view of a composite magnetic head according to the present invention, FIG. 2 is a perspective view of a pair of block halves, FIG. 3 is a perspective view of a magnetic head block, and FIG. 4 is a perspective view of a pair of block halves.
The figure is a perspective view of the completed magnetic head, Figure 5a,
b and c are explanatory diagrams showing a method of forming a thin film by etching, and FIG. 6 is an enlarged partial plan view of a conventional composite magnetic head. 2...Magnetic head half, 3...Sendust thin film,
4...Nonmagnetic layer, 5...Track width regulating groove, 20
...Ferrite wafer (member that becomes half of the magnetic head), 21...U-shaped groove, W...track width.
Claims (1)
半体のうち少なくとも一方の磁気ヘツド半体とな
る部材に前記磁性材よりも高い飽和磁束密度を有
する磁性材の薄膜を形成した後、該薄膜に前記部
材に達する所定幅の溝を形成し、次いで前記一方
の磁気ヘツド半体となる部材に残存している前記
薄膜と他方の磁気ヘツド半体となる部材とを磁気
空〓部を介して接合する複合型磁気ヘツドの製造
方法において、 前記溝の形成を、薄膜の上面に所定の幅を有す
る帯状耐蝕層を形成して該薄膜の耐蝕層に覆われ
ていない部分をエツチングにより除去した後、該
除去部に機械的溝加工を施すことにより行うこと
を特徴とする複合型磁気ヘツドの製造方法。 2 前記エツチングを、イオンビームエツチング
により行うことを特徴とする特許請求の範囲第1
項記載の複合型磁気ヘツドの製造方法。[Scope of Claims] 1. A thin film of a magnetic material having a saturation magnetic flux density higher than that of the magnetic material is provided on at least one of a pair of magnetic head halves made of a high resistivity magnetic material. After forming the thin film, a groove of a predetermined width reaching the member is formed in the thin film, and then the thin film remaining on the member that will become the one half of the magnetic head and the member that will become the other half of the magnetic head are magnetically bonded. In a method for manufacturing a composite magnetic head in which the heads are bonded through a cavity, the grooves are formed by forming a band-shaped corrosion-resistant layer having a predetermined width on the upper surface of the thin film, and then forming a band-shaped corrosion-resistant layer on the top surface of the thin film in a portion of the thin film that is not covered with the corrosion-resistant layer. 1. A method for manufacturing a composite magnetic head, characterized in that the step of manufacturing a composite magnetic head is carried out by removing the removed portion by etching and then mechanically forming a groove in the removed portion. 2. Claim 1, wherein the etching is performed by ion beam etching.
A method for manufacturing a composite magnetic head as described in .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22036390A JPH03237605A (en) | 1990-08-21 | 1990-08-21 | Production of composite type magnetic head |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22036390A JPH03237605A (en) | 1990-08-21 | 1990-08-21 | Production of composite type magnetic head |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22036290A Division JPH03141006A (en) | 1990-08-21 | 1990-08-21 | Composite type magnetic head |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03237605A JPH03237605A (en) | 1991-10-23 |
| JPH0479042B2 true JPH0479042B2 (en) | 1992-12-14 |
Family
ID=16749965
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22036390A Granted JPH03237605A (en) | 1990-08-21 | 1990-08-21 | Production of composite type magnetic head |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03237605A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5413672A (en) * | 1992-07-22 | 1995-05-09 | Ngk Insulators, Ltd. | Method of etching sendust and method of pattern-etching sendust and chromium films |
-
1990
- 1990-08-21 JP JP22036390A patent/JPH03237605A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03237605A (en) | 1991-10-23 |
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