JPH0480644A - Measurement of contamination of insulator - Google Patents
Measurement of contamination of insulatorInfo
- Publication number
- JPH0480644A JPH0480644A JP2195152A JP19515290A JPH0480644A JP H0480644 A JPH0480644 A JP H0480644A JP 2195152 A JP2195152 A JP 2195152A JP 19515290 A JP19515290 A JP 19515290A JP H0480644 A JPH0480644 A JP H0480644A
- Authority
- JP
- Japan
- Prior art keywords
- insulator
- cleaning
- tank
- water
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1245—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of line insulators or spacers, e.g. ceramic overhead line cap insulators; of insulators in HV bushings
Landscapes
- Insulators (AREA)
- Electric Cable Installation (AREA)
- Testing Relating To Insulation (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は懸垂碍子や長幹碍子などに付着した塩分、硫
化物、硫酸塩、石膏、あるいはセメントなどを含んだ汚
損物の量を測定することができる碍子汚損量測定方法に
関するものである。[Detailed Description of the Invention] [Field of Industrial Application] This invention measures the amount of contaminants containing salt, sulfide, sulfate, gypsum, cement, etc. attached to suspended insulators, long-stem insulators, etc. The present invention relates to a method for measuring the amount of contamination of an insulator.
一般に、送電線の支持碍子の塩害などによる絶縁低下に
起因する地絡事故を未然に防止するため、碍子に付着し
た汚損物を等価塩分付着密度として正確に把握すること
か重要である。このような汚損量測定方法として、水を
貯留した洗浄槽内で被測定碍子を超音波振動作用を利用
して洗浄し、洗浄後の汚損水の電導度を測定して、この
電導度から汚損量を演算する測定方法や、前もって複数
の電極が焼き付けである被測定碍子を使用して、表面を
均等に湿潤させた状態で電極間の抵抗を測定して汚損量
を求める測定方法があった。In general, in order to prevent ground faults caused by deterioration of insulation due to salt damage to the support insulators of power transmission lines, it is important to accurately understand the contaminants attached to the insulators as the equivalent salt adhesion density. As a method for measuring the amount of contamination, the insulator to be measured is cleaned using ultrasonic vibration in a cleaning tank filled with water, the conductivity of the contaminated water after cleaning is measured, and the contamination is determined from this conductivity. There was a measurement method that calculated the amount, and a measurement method that used an insulator to be measured with multiple electrodes baked in advance and measured the resistance between the electrodes with the surface evenly moistened to determine the amount of contamination. .
ところが、前者の超音波洗浄方法は、碍子の被洗浄表面
が必ず洗浄水に浸されていなければならないので、長幹
碍子のように形状が複雑でない碍子の汚損量測定には適
用できるが、懸垂碍子のように複雑な表面形状の碍子の
汚損量測定には適用できないという問題があった。However, the former ultrasonic cleaning method requires that the surface of the insulator to be cleaned must be immersed in cleaning water, so it can be applied to measuring the amount of contamination on insulators that are not complex in shape, such as long-stem insulators; There is a problem in that it cannot be applied to measuring the amount of contamination on insulators with complex surface shapes such as insulators.
一方、後者の測定方法は碍子表面を均等に湿潤させるの
に時間かかかり、又、表面抵抗から汚損量に換算するた
め測定精度が低くなるという問題かあった。On the other hand, the latter measurement method takes time to evenly wet the insulator surface, and also has the problem of low measurement accuracy because it converts the surface resistance into the amount of contamination.
なお、懸垂碍子の汚損量を測定する従来の方法として、
碍子表面に付着したl汚損物を水分を含浸した綿等によ
り拭き取り、汚損物を所定量の水に溶解させた後、その
汚損水の電導度を測定して汚損量を演算する方法もあっ
たか、これは汚損量測定作業か面倒で長時間を要し、台
風等による急速汚損時での測定作業が危険であるという
問題があった。The conventional method for measuring the amount of contamination of suspended insulators is as follows:
There was also a method of wiping off the contaminants adhering to the insulator surface with water-impregnated cotton, etc., dissolving the contaminants in a predetermined amount of water, and then measuring the conductivity of the contaminated water to calculate the amount of contamination. This method is troublesome and takes a long time to measure the amount of contamination, and there are problems in that it is dangerous to perform measurement work when rapid contamination occurs due to a typhoon or the like.
この発明の目的は上記従来の問題点を解消して、汚損量
の測定作業能率を向上することかできるとともに、測定
精度を向上し、懸垂碍子のような複雑な形状の碍子の汚
損量測定にも適用できる碍子汚損量測定方法を提供する
ことにある。The purpose of the present invention is to solve the above-mentioned conventional problems and improve the work efficiency of measuring the amount of contamination. It is an object of the present invention to provide a method for measuring the amount of insulator contamination that can also be applied.
請求項1記載の発明は、上記目的を達成するため、洗浄
水供給源から碍子洗浄槽内へ洗浄水を供給して洗浄槽内
を清掃した後、被測定碍子を暴露位置から洗浄槽内に移
動し、清掃後の洗浄水を洗浄槽から排出し、前記洗浄水
供給源から洗浄水を洗浄槽内の被測定碍子に噴射して碍
子表面を洗浄し、さらに、電導度肝により洗浄後の汚損
水の電導度を測定し、演算制御装置により前記電導度か
ら予め測定又は設定しておいた洗浄水用タンクの洗浄水
の固有電導度を減算し、被測定碍子の塩分付着密度を演
算するという方法をとっている。In order to achieve the above object, the invention as claimed in claim 1, after cleaning the inside of the insulator washing tank by supplying washing water from the washing water supply source into the insulator washing tank, removes the insulator to be measured from the exposed position into the washing tank. The cleaning water is discharged from the cleaning tank, and the cleaning water is sprayed from the cleaning water supply source onto the insulator to be measured in the cleaning tank to clean the insulator surface. The electrical conductivity of the water is measured, and the specific electrical conductivity of the washing water in the washing water tank, which has been measured or set in advance, is subtracted from the electrical conductivity by the arithmetic and control device, and the salt adhesion density of the insulator to be measured is calculated. method.
又、請求項2記載の発明は洗浄水供給源から碍子洗浄槽
内へ洗浄水を供給して洗浄槽内を清掃するとともに、清
掃後の洗浄水を洗浄槽から排出し、次に、所定量の洗浄
水を洗浄槽内に供給して電導度肝により洗浄水固有の電
導度を測定し、その後、被測定碍子を暴露位置から洗浄
槽内に移動し、測定後の洗浄水を洗浄槽から排出し、次
に前記洗浄水供給源から所定量の洗浄水を洗浄槽内の被
測定碍子に噴射して碍子表面を洗浄し、さらに、電導度
肝により洗浄後の汚損水の電導度を測定し、この被測定
碍子の洗浄後に得られた電導度から前記洗浄水固有の電
導度を演算制御装置により減算し、この減算された電導
度から被測定碍子の塩分付着密度を演算するという方法
をとっている。Further, the invention according to claim 2 cleans the inside of the washing tank by supplying washing water from the washing water supply source to the inside of the insulator washing tank, and discharges the washing water after cleaning from the washing tank. of cleaning water is supplied into the cleaning tank and the specific conductivity of the cleaning water is measured using the conductivity scale.Then, the insulator to be measured is moved from the exposed position into the cleaning tank, and the cleaning water after measurement is discharged from the cleaning tank. Then, a predetermined amount of cleaning water is sprayed from the cleaning water supply source onto the insulator to be measured in the cleaning tank to clean the insulator surface, and further, the conductivity of the contaminated water after cleaning is measured by the conductivity scale, A calculation and control device subtracts the electrical conductivity specific to the cleaning water from the electrical conductivity obtained after washing the insulator to be measured, and the salt adhesion density of the insulator to be measured is calculated from this subtracted electrical conductivity. There is.
さらに、請求項3記載の発明は、請求項1又は2記載の
碍子汚損量測定方法において、被測定碍子の洗浄後の汚
損水の電導度を測定した後、碍子洗浄槽から汚損水を排
出し、洗浄水供給源から碍子洗浄槽内へ洗浄水を供給し
て洗浄槽内を清掃するという方法をとっている。Furthermore, the invention according to claim 3 provides the method for measuring the amount of soiling of an insulator according to claim 1 or 2, in which the conductivity of the contaminated water after washing the insulator to be measured is measured, and then the contaminated water is discharged from the insulator cleaning tank. , a method is used in which cleaning water is supplied from a cleaning water supply source into the insulator cleaning tank to clean the inside of the cleaning tank.
請求項1記載の発明は、洗浄水供給源から碍子洗浄槽内
へ洗浄水を供給して洗浄槽内の清掃を行なうので、洗浄
槽内に付着している残留汚損物が除去されるため、被測
定碍子の汚損量の測定精度が向上する。又、被測定碍子
の碍子表面を洗浄した汚損水の電導度から予め測定又は
設定しておいた洗浄水固有の電導度を減算し、この減算
結果に基づいて汚損量を演算するので、被測定碍子の汚
損量の測定精度が向上する。The invention according to claim 1 supplies cleaning water from the cleaning water supply source to the insulator cleaning tank to clean the inside of the cleaning tank, so that residual contaminants adhering to the inside of the cleaning tank are removed. The accuracy of measuring the amount of contamination on the insulator to be measured is improved. In addition, the electrical conductivity specific to the cleaning water measured or set in advance is subtracted from the electrical conductivity of the contaminated water used to clean the insulator surface of the insulator to be measured, and the amount of contamination is calculated based on this subtraction result. The accuracy of measuring the amount of contamination on the insulator is improved.
又、請求項2記載の発明は、所定量の洗浄水を洗浄槽内
に供給して電導度肝により洗浄水固有の電導度を測定す
るので、請求項1記載の発明よりも測定精度か向上する
。Furthermore, the invention according to claim 2 supplies a predetermined amount of cleaning water into the cleaning tank and measures the specific conductivity of the cleaning water based on the conductivity, so that the measurement accuracy is improved compared to the invention according to claim 1. .
さらに、請求項3記載の発明は、被測定碍子の洗浄後の
汚損水の電導度の測定後、碍子洗浄槽から汚損水を排出
し、洗浄水供給源から碍子洗浄槽内へ洗浄水を供給して
洗浄槽内を洗浄清掃するので、洗浄槽内に付着して残留
する汚損物の量を減少して、次回の汚損量の測定精度を
向上することができる。Furthermore, the invention according to claim 3 provides that after measuring the conductivity of contaminated water after cleaning the insulator to be measured, the contaminated water is discharged from the insulator cleaning tank, and cleaning water is supplied from the cleaning water supply source into the insulator cleaning tank. Since the inside of the cleaning tank is washed and cleaned, the amount of contaminants adhering to and remaining in the cleaning tank can be reduced, and the accuracy of measuring the amount of contamination next time can be improved.
以下、請求項1記載の発明の碍子汚損量測定方法に使用
される汚損量測定装置を第2図に基づいて説明する。Hereinafter, a contamination amount measuring device used in the insulator contamination amount measuring method according to the first aspect of the invention will be explained based on FIG.
第2図に示すように、洗浄水用タンク1には給水管路2
を介して碍子洗浄槽3か接続され、前記給水管路2の途
中には給水用ポンプ4と常閉型の電磁弁SVIか接続さ
れている。又、前記ポンプ4には第1及び第2のバイパ
ス管路5,6が接続され、第1バイパス管路5には手動
弁Vが接続され、第2バイパス管路6には常開型の電磁
弁SV2か接続されている。そして、電磁弁S V ]
を閉鎖した状態でポンプ4を起動すると、洗浄水用タン
ク1内の洗浄水がポンプ4により給水管路2から第2バ
イパス管路6及び電磁弁S V 2を通り前記タンク1
へ還元される。このとき手動弁Vの開口量を調節するこ
とによりポンプ4か定速回転している状態で、洗浄水の
水圧が調整され、電磁弁SVIを開放した状態でポンプ
4を所定時間(所定回転数)回転した時の洗浄水の供給
量が調節される。As shown in FIG. 2, the cleaning water tank 1 has a water supply pipe 2.
An insulator cleaning tank 3 is connected thereto, and a water supply pump 4 and a normally closed solenoid valve SVI are connected in the middle of the water supply pipe 2. Further, first and second bypass pipes 5 and 6 are connected to the pump 4, a manual valve V is connected to the first bypass pipe 5, and a normally open type valve V is connected to the second bypass pipe 6. Solenoid valve SV2 is connected. And solenoid valve SV]
When the pump 4 is started with the tank 1 closed, the cleaning water in the cleaning water tank 1 passes from the water supply pipe 2 through the second bypass pipe 6 and the solenoid valve S V 2 to the tank 1.
will be returned to. At this time, by adjusting the opening amount of the manual valve V, the water pressure of the cleaning water is adjusted while the pump 4 is rotating at a constant speed, and the pump 4 is operated for a predetermined time (at a predetermined rotation speed) with the solenoid valve SVI open. ) The amount of cleaning water supplied when rotating is adjusted.
前記洗浄槽3には所定圧力の洗浄水をダミー碍子28や
被測定碍子27の表面に噴射して碍子表面の汚損物を洗
浄するための噴射ノズル7が適数箇所に配置されている
。In the cleaning tank 3, spray nozzles 7 are arranged at appropriate locations for spraying cleaning water at a predetermined pressure onto the surfaces of the dummy insulators 28 and the insulators to be measured 27 to clean dirt on the surfaces of the insulators.
前記洗浄槽3内には電導度計10が設けられ、該洗浄槽
3内に貯留した洗浄水の電導度を測定できるようになっ
ている。又、前記洗浄槽3の下面には排水管路14が接
続され、該管路14の途中に排水用電磁弁SV3が接続
されている。A conductivity meter 10 is provided in the cleaning tank 3 to measure the conductivity of the cleaning water stored in the cleaning tank 3. Further, a drainage pipe line 14 is connected to the lower surface of the cleaning tank 3, and a drainage solenoid valve SV3 is connected in the middle of the pipe line 14.
前記電導度計10はり一ト線15により演算制御装置1
6に接続されている。この演算制御装置16は制御部1
7と演算部18とにより構成され、前記制御部17は、
ポンプ4、電磁弁SVI〜SV3、及び次に述べる被測
定碍子26.27の昇降機構24などに動作信号を出力
するようになっている。又、演算部18は電導度計10
から出力された電導度に基づいて碍子の塩分付着密度な
どを演算することが可能である。The arithmetic and control unit 1 is connected to the conductivity meter 10 by the tong line 15.
6. This arithmetic and control device 16 is a control section 1
7 and an arithmetic unit 18, the control unit 17 includes:
An operation signal is output to the pump 4, the electromagnetic valves SVI to SV3, and the elevating mechanism 24 for the insulators to be measured 26 and 27, which will be described next. In addition, the calculation unit 18 includes a conductivity meter 10.
It is possible to calculate the salt adhesion density of the insulator based on the electrical conductivity output from the insulator.
碍子昇降機構24の支持棒25の下端部には二連の被測
定碍子26.27及び−個のダミー碍子28が昇降動作
可能に支持されている。そして、常時はダミー碍子28
の外周が洗浄槽3の上部内周面に接触した状態で装設さ
れている。又、被測定碍子26.27のうち例えば被測
定碍子27の汚損量を測定する際には、洗浄槽3か二つ
に分割された状態で支持棒25が下降して被測定碍子2
7が洗浄槽3の所定位置に降下された後、再び洗浄槽3
を合体させて被測定碍子27の外周縁を密閉した状態で
、噴射ノズル7から所定量の洗浄水を被測定碍子27の
裏面に吹き付けて汚損物の洗浄を行なう。At the lower end of the support rod 25 of the insulator lifting mechanism 24, two sets of insulators to be measured 26, 27 and - dummy insulators 28 are supported so as to be movable up and down. And always dummy insulator 28
The outer periphery of the cleaning tank 3 is installed in such a manner that it is in contact with the upper inner peripheral surface of the cleaning tank 3. In addition, when measuring the amount of contamination of the insulator to be measured 27, for example, among the insulators to be measured 26 and 27, the support rod 25 is lowered to remove the insulator to be measured 2 while the cleaning tank 3 is divided into two parts.
7 is lowered to a predetermined position in the cleaning tank 3, the cleaning tank 3 is moved again.
With the outer periphery of the insulator 27 to be measured sealed, a predetermined amount of cleaning water is sprayed from the spray nozzle 7 onto the back surface of the insulator 27 to be measured to clean the dirt.
又、洗浄槽3内の清掃を行なう場合には、ダミー碍子2
8の外周縁を洗浄槽3の内周縁に接触した状態で噴射ノ
ズル7から洗浄水を噴射させてダミー碍子28の裏面及
び洗浄槽3の内周面などを洗浄水により洗浄する。Also, when cleaning the inside of the cleaning tank 3, use the dummy insulator 2.
Cleaning water is jetted from the injection nozzle 7 while the outer peripheral edge of the dummy insulator 8 is in contact with the inner peripheral edge of the cleaning tank 3, and the back surface of the dummy insulator 28, the inner peripheral surface of the cleaning tank 3, etc. are cleaned with the cleaning water.
次に、前述した碍子汚損量測定装置により、請求項1記
載の発明を具体化した第1実施例の測定方法を説明する
。Next, a measuring method according to a first embodiment of the invention according to claim 1 will be explained using the above-mentioned insulator stain amount measuring device.
この第1実施例の測定方法では前記制御装置16に予め
洗浄水の固有の電導度R1が記憶されているものとする
。In the measurement method of this first embodiment, it is assumed that the control device 16 stores in advance the specific conductivity R1 of the cleaning water.
第2図に示すように、ダミー碍子28か洗浄槽3を閉鎖
した状態で、制御部17に図示しないスイッチから測定
開始信号か入力されると、第1図のステップS1におい
て、洗浄水用タンク1がら碍子洗浄槽3内へ洗浄水が供
給され洗浄槽3内が清掃される。次に、ステップS2に
おいて、被測定碍子27が暴露位置から洗浄槽3内に移
動された状態で、ステップS3において、清掃後の洗浄
水か洗浄槽3から排出され、次に、ステップS4におい
て、前記洗浄水用タンク1から洗浄水が洗浄槽3内の被
測定碍子27に噴射されて碍子27裏面が洗浄され、さ
らに、ステップS5において、電導度肝lOにより洗浄
後の汚損水の電導度R2が測定され、ステップS6にお
いて、演算制御装置16により前記電導度R2から予め
測定又は設定しておいた洗浄水用タンク1の洗浄水の固
有電導度R1が減算され、ステップS7において、前記
減算型導度に基づいて被測定碍子27の塩分付着密度が
演算される。As shown in FIG. 2, when a measurement start signal is input from a switch (not shown) to the control unit 17 with the dummy insulator 28 or the cleaning tank 3 closed, the cleaning water tank Cleaning water is supplied into the insulator cleaning tank 3 from scratch to clean the inside of the cleaning tank 3. Next, in step S2, with the insulator to be measured 27 moved from the exposed position into the cleaning tank 3, in step S3, the cleaning water after cleaning is discharged from the cleaning tank 3, and then, in step S4, Cleaning water is injected from the cleaning water tank 1 onto the insulator 27 to be measured in the cleaning tank 3 to clean the back surface of the insulator 27. Furthermore, in step S5, the conductivity R2 of the contaminated water after cleaning is determined by the conductivity value lO. In step S6, the specific conductivity R1 of the wash water in the wash water tank 1, which has been measured or set in advance, is subtracted from the conductivity R2 by the arithmetic and control unit 16, and in step S7, the subtractive conductivity R1 is subtracted from the conductivity R2. The salt adhesion density of the insulator 27 to be measured is calculated based on the degree.
又、前記ステップS5の終了後、ステップS8において
被測定碍子27が測定位置から暴露位置へ移動され、ダ
ミー碍子28が第2図に示すように洗浄槽3と対応し、
初期状態に復帰する。Further, after the step S5 is completed, the insulator to be measured 27 is moved from the measurement position to the exposure position in step S8, and the dummy insulator 28 corresponds to the cleaning tank 3 as shown in FIG.
Return to initial state.
このように前記実施例では、洗浄水用タンク1から碍子
洗浄槽3内へ洗浄水を供給して洗浄槽3内を清掃するよ
うにしたので、前回の測定時に碍子洗浄槽3内に付着し
ていた汚損物を除去して、測定精度を向上することがで
きる。In this embodiment, since the cleaning water is supplied from the cleaning water tank 1 to the insulator cleaning tank 3 to clean the inside of the cleaning tank 3, the inside of the insulator cleaning tank 3 is cleaned during the previous measurement. The measurement accuracy can be improved by removing contaminants.
又、前記実施例では、汚損水の電導度R2から予め測定
又は設定しておいた洗浄水の固有電導度R1を減算し、
この減算型導度に基ついて被測定碍子27の塩分付着密
度を演算するので、汚損量の測定精度を向上することか
できる。Further, in the above embodiment, the specific conductivity R1 of the cleaning water measured or set in advance is subtracted from the conductivity R2 of the contaminated water,
Since the salt adhesion density of the insulator 27 to be measured is calculated based on this subtraction type conductivity, it is possible to improve the measurement accuracy of the amount of contamination.
さらに、碍子裏面を洗浄水により洗浄して汚損物を除去
するようにしたので、測定作業を迅速に行うことができ
るとともに、懸垂碍子等の複雑な形状の碍子の汚損量の
測定作業に適用することもできる。Furthermore, since the back side of the insulator is cleaned with washing water to remove contaminants, measurement work can be carried out quickly, and it can also be applied to measuring the amount of contamination on insulators with complex shapes such as suspended insulators. You can also do that.
次に、第2図とほぼ同様の測定装置を使用して請求項2
記載の発明を具体化した第2実施例の碍子の汚損量測定
方法を第3図により説明する。Next, claim 2 is obtained using a measuring device substantially similar to that shown in FIG.
A method for measuring the amount of contamination of an insulator according to a second embodiment of the invention will be explained with reference to FIG.
この第2実施例の測定方法は前記第1実施例の測定方法
と比較して、第3図のステップSl。The measuring method of this second embodiment is compared with the measuring method of the first embodiment described above in step Sl in FIG.
82、S3.S4.S5.S7.S8は第1図と同様で
あり、次の点が異なる。すなわち、第3図のステップ8
2a、S2bに示すように、洗浄水の固有電導度R1a
を、所定量の洗浄水を碍子洗浄槽3内に供給して電導度
肝lOにより実測し、ステップS2bにおいて、その洗
浄水を洗浄槽3から排出してステップS4に移行すると
ともに、ステップS6において、汚損水の測定型導度R
2から洗浄水の実測固有電導度R1aを減算し、この減
算型導度に基づいて、碍子の汚損量を演算するようにし
ている。従って、第2実施例の測定方法は、第1実施例
の測定方法と比較して、測定精度をさらに向上すること
ができる。82, S3. S4. S5. S7. S8 is the same as in FIG. 1, except for the following points. That is, step 8 in FIG.
As shown in 2a and S2b, the specific conductivity R1a of the cleaning water
is actually measured by supplying a predetermined amount of cleaning water into the insulator cleaning tank 3 and measuring the electrical conductivity, and in step S2b, the cleaning water is discharged from the cleaning tank 3 and the process moves to step S4, and in step S6, Measurement type conductivity R of contaminated water
The actually measured specific conductivity R1a of the cleaning water is subtracted from 2, and the amount of contamination of the insulator is calculated based on this subtracted conductivity. Therefore, the measuring method of the second embodiment can further improve measurement accuracy compared to the measuring method of the first embodiment.
次に、請求項2記載の発明を具体化した第3実施例の測
定方法を実施する測定装置を第4図及び第5図により説
明する。Next, a measuring device for carrying out the measuring method of the third embodiment embodying the invention as claimed in claim 2 will be explained with reference to FIGS. 4 and 5.
前記洗浄槽3には管路8を介して測定用タンク9が接続
されている。この測定用タンク9には電導度肝lOが設
けられ、該タンク9内に貯留した洗浄水の電導度を測定
できるようになっている。A measurement tank 9 is connected to the cleaning tank 3 via a pipe line 8. This measuring tank 9 is provided with an electrical conductivity indicator 10, so that the electrical conductivity of the wash water stored in the tank 9 can be measured.
又、前記測定用タンク9の内部には洗浄水を攪拌するた
めの攪拌羽根11が収容され、該羽根11はモータ12
の回転軸13に取付られている。さらに、測定用タンク
9の下面には排水管路14が接続され該管路14の途中
に排水用電磁弁SV3が接続されている。Further, a stirring blade 11 for stirring the cleaning water is housed inside the measurement tank 9, and the blade 11 is connected to a motor 12.
It is attached to the rotating shaft 13 of. Furthermore, a drainage pipe line 14 is connected to the lower surface of the measurement tank 9, and a drainage solenoid valve SV3 is connected in the middle of the pipe line 14.
前記電導度肝10はリード線15より演算制御装置16
に接続されている。この演算制御装置16の制御部17
は、ポンプ4、電磁弁SVI〜SV3、攪拌羽根11の
モータ12、被測定碍子26゜27の昇降機構24等に
動作信号を出力するようになっている。The conductivity gauge 10 is connected to an arithmetic and control unit 16 via a lead wire 15.
It is connected to the. Control unit 17 of this arithmetic and control device 16
outputs operating signals to the pump 4, the electromagnetic valves SVI to SV3, the motor 12 of the stirring blade 11, the lifting mechanism 24 of the insulators 26 and 27 to be measured, and the like.
又、この実施例では例えば洗浄槽3を単独で鉄塔上へ装
着するため長尺の管路2,8を使用している。Further, in this embodiment, the long pipes 2 and 8 are used to mount the cleaning tank 3 alone on the steel tower, for example.
そこで、次に第3実施例の測定方法を第6図を中心に詳
細に説明する。Next, the measuring method of the third embodiment will be explained in detail with reference to FIG. 6.
第4図に示すようにダミー碍子28が洗浄槽3を閉鎖し
た状態で、第5図において制御部17に図示しないスイ
ッチから測定開始信号が入力されると、第6図のステッ
プS1において給水用ポンプ4が起動され、ステップS
2において電磁弁SV3が開放され、次に、ステップS
3において測定用タンク9内の残水が排出され、ステッ
プ4で電磁弁SV3が閉じられる。When the dummy insulator 28 closes the cleaning tank 3 as shown in FIG. 4, when a measurement start signal is input from the switch (not shown) to the control unit 17 in FIG. Pump 4 is started and step S
2, the solenoid valve SV3 is opened, and then in step S
In step 3, the remaining water in the measuring tank 9 is discharged, and in step 4, the solenoid valve SV3 is closed.
次に、ステップS5において電磁弁SVIか開放される
とともに電磁弁SV2が閉じられ、洗浄水用タンク1内
の洗浄水かポンプ4により給水管路2を通って洗浄槽3
内に供給され、ダミー碍子28の裏面及び洗浄槽3の内
周面が洗浄されるとともに管路8を通って洗浄水が測定
用タンク9内に供給され、洗浄槽3、管路8及び測定用
タンク9の内部が清掃される。(ステップS6)そして
、ステップS7で電磁弁SVIが閉じられるとともに電
磁弁SV2が開放され、ステップS8でモータ12に通
電され攪拌羽根11が回転される。これにより測定用タ
ンク9内の洗浄水は該タンク内で攪拌されるため、タン
ク9内が効率良く清掃される。Next, in step S5, the solenoid valve SVI is opened and the solenoid valve SV2 is closed, and the cleaning water in the cleaning water tank 1 is passed through the water supply pipe 2 by the pump 4 to the cleaning tank 3.
The back surface of the dummy insulator 28 and the inner circumferential surface of the cleaning tank 3 are cleaned, and the cleaning water is also supplied into the measurement tank 9 through the pipe line 8, and the cleaning water is supplied to the measurement tank 9 through the pipe line 8. The inside of the storage tank 9 is cleaned. (Step S6) Then, in step S7, the solenoid valve SVI is closed and the solenoid valve SV2 is opened, and in step S8, the motor 12 is energized and the stirring blade 11 is rotated. As a result, the cleaning water in the measurement tank 9 is stirred within the tank, so that the inside of the tank 9 is efficiently cleaned.
次に、ステップS9で電磁弁SV3が開放されて、ステ
ップS10において測定用タンク9内の洗浄水が排出さ
れる。ステップS11において電磁弁SV2、SV3が
閉じられるとともに電磁弁SVIが開放されてポンプ4
により洗浄水が所定量洗浄槽3内に供給される。この洗
浄水は洗浄槽3から管路8を通って測定用タンク9内に
貯留される。(ステップ512)
次に、ステップS13において電磁弁Svlか閉じられ
るとともにS V 2が開放され、その後ステップS1
4で攪拌羽根11が回転され、貯留された洗浄水が測定
用タンク内で攪拌される。そして、ステップS15で電
導度計10により洗浄水の固有電導度R1aが測定され
る。Next, the solenoid valve SV3 is opened in step S9, and the cleaning water in the measurement tank 9 is discharged in step S10. In step S11, the solenoid valves SV2 and SV3 are closed, and the solenoid valve SVI is opened, so that the pump 4
A predetermined amount of cleaning water is supplied into the cleaning tank 3. This cleaning water passes from the cleaning tank 3 through a pipe line 8 and is stored in a measurement tank 9. (Step 512) Next, in step S13, the solenoid valve Svl is closed and S V 2 is opened, and then in step S1
At step 4, the stirring blade 11 is rotated, and the stored cleaning water is stirred in the measurement tank. Then, in step S15, the specific conductivity R1a of the cleaning water is measured by the conductivity meter 10.
次に、ステップS16において洗浄槽3か二つに分離さ
れるとともに、碍子昇降機構24が動作されて被測定碍
子27が洗浄槽3内に移動された後、洗浄槽3を合体さ
せ、洗浄槽3を被測定碍子27の外周縁に密着させる。Next, in step S16, the cleaning tank 3 is separated into two, and the insulator lifting mechanism 24 is operated to move the insulator 27 to be measured into the cleaning tank 3, and then the cleaning tank 3 is combined. 3 is brought into close contact with the outer peripheral edge of the insulator 27 to be measured.
ステップS17で電磁弁SV3が開放され、ステップS
18で測定用タンク9内の洗浄水が排出される。そして
、ステップS19で電磁弁SV2、SV3が閉じられる
とともに電磁弁SV1が開放され、ステップS20にお
いて所定量の洗浄水で被測定碍子27の裏面が洗浄され
る。その後ステップS21において電磁弁SVIが閉じ
られるとともにSV2か開放され、ステップS22で攪
拌羽根11が回転され、測定用タンク9内の洗浄水が攪
拌される。その後ステップS23において電導度計10
により汚損洗浄水の電導度R2が測定される。In step S17, the solenoid valve SV3 is opened, and in step S
At step 18, the cleaning water in the measuring tank 9 is discharged. Then, in step S19, the solenoid valves SV2 and SV3 are closed, and the solenoid valve SV1 is opened, and in step S20, the back surface of the insulator to be measured 27 is cleaned with a predetermined amount of cleaning water. Thereafter, in step S21, solenoid valve SVI is closed and SV2 is opened, and in step S22, stirring blade 11 is rotated to stir the cleaning water in measurement tank 9. After that, in step S23, the conductivity meter 10
The conductivity R2 of the soiled cleaning water is measured.
次に、ステップS24において演算部18により前記電
導度R2から洗浄水の固有電導度R1aを減算した後、
ステップS25において前記減算結果に基づいて演算部
18により汚損量の演算が行われ、さらにステップ82
6においてポンプ4が停止されてステップS27で被測
定碍子27が暴露位置に移動され、ダミー碍子28が洗
浄槽3の開口部を閉鎖する。Next, in step S24, after subtracting the specific conductivity R1a of the cleaning water from the conductivity R2 by the calculation unit 18,
In step S25, the calculation unit 18 calculates the amount of contamination based on the subtraction result, and further in step S82
6, the pump 4 is stopped, and the insulator 27 to be measured is moved to the exposed position in step S27, and the dummy insulator 28 closes the opening of the cleaning tank 3.
さて、この第3実施例の測定方法においては、被測定碍
子27の汚損量の測定に先立って洗浄槽3、長尺の管路
2,8及び測定用タンク9等の清掃作業を洗浄水により
行なうので、汚損量の測定精度を向上することができる
。Now, in the measurement method of this third embodiment, prior to measuring the amount of contamination on the insulator 27 to be measured, cleaning work of the cleaning tank 3, long pipes 2, 8, measurement tank 9, etc. is performed using cleaning water. Therefore, the accuracy of measuring the amount of contamination can be improved.
又、この第3実施例においては、洗浄水固有の電導度R
1aを測定しておき、被測定碍子27の洗浄後の汚損洗
浄水の電導度R2から前記電導度R1aを減算した後、
この減算結果から被測定碍子27の汚損量を演算するよ
うにしたので、汚損量の測定精度を向上することができ
る。In addition, in this third embodiment, the specific conductivity R of the cleaning water is
1a, and after subtracting the electrical conductivity R1a from the electrical conductivity R2 of the soiled washing water after washing the insulator 27 to be measured,
Since the amount of contamination of the insulator 27 to be measured is calculated from the result of this subtraction, the measurement accuracy of the amount of contamination can be improved.
次に、第7図により請求項3記載の発明を具体化した第
4実施例を説明する。Next, a fourth embodiment that embodies the invention set forth in claim 3 will be described with reference to FIG.
この第4実施例の測定方法は、第6図のステップ25の
後に、第7図に示すように、ステップS2から88まで
の前洗浄清掃工程Aと同様の工程、すなわちS2aから
88aを後洗浄清掃工程Bとして行っている。In the measuring method of this fourth embodiment, after step 25 in FIG. 6, as shown in FIG. This is done as cleaning process B.
この第4実施例の場合には被測定碍子27の洗浄で生じ
た汚損物が洗浄槽3、管路2,8及び測定用タンク9に
乾燥して付着する以前に清掃して測定用タンク9内に回
収することかでき、このため、次回の汚損量の測定作業
時に管路2,8、洗浄槽3及び測定用タンク9内に付着
して残留しようとする汚損物の量を一層少なくして、測
定精度をさらに向上することができる。In the case of this fourth embodiment, before the contaminants generated by cleaning the insulator 27 to be measured dry and adhere to the cleaning tank 3, the pipes 2 and 8, and the measurement tank 9, the measurement tank 9 is cleaned. Therefore, the amount of contaminants that adhere to and remain in the pipes 2, 8, cleaning tank 3, and measurement tank 9 during the next measurement of the amount of contamination can be further reduced. Therefore, measurement accuracy can be further improved.
なお、前記第1〜第3の実施例においては、被測定碍子
27を暴露位置から洗浄槽3内に移動後、清掃後の洗浄
水を排出しているので、両行程を逆にした場合に比べ、
被測定碍子27の移動中に洗浄槽3内に雨水等が入って
も、測定行程前に排出てき、より好ましい。In the first to third embodiments, the cleaning water after cleaning is discharged after the insulator 27 to be measured is moved from the exposed position into the cleaning tank 3, so if both steps are reversed, compared,
Even if rainwater or the like enters the cleaning tank 3 during movement of the insulator 27 to be measured, it is preferably discharged before the measurement process.
又、前記第1〜第4の実施例において、測定終了時点で
測定した洗浄水を貯留しておけば、電導度計10が乾燥
して性能劣化をきたすこと、あるいは汚損水か乾燥して
汚損物か固着すること等を防止でき、より好ましい。In addition, in the first to fourth embodiments, if the cleaning water measured at the end of the measurement is stored, the conductivity meter 10 will dry and deteriorate its performance, or the contaminated water will dry and become contaminated. This is more preferable since it can prevent objects from sticking together.
ところで、第8図は放水量と測定汚損量変化率との関係
を示すグラフである。このグラフから明らかなように、
洗浄水の放水量を400cC以上にすれば、汚損量の変
化率が10%以下に収まり、ステップS1から88まで
の前洗浄清掃工程Aを行った場合と、前洗浄清掃工程A
及び後洗浄清掃工程Bを行った場合とを示す。このグラ
フのように両清掃工程A、Bを行った場合には、汚損量
変化率が400ccの放水量の場合96%と非常に高く
検出精度を向上することかできる。By the way, FIG. 8 is a graph showing the relationship between the amount of water discharged and the rate of change in the amount of measured contamination. As is clear from this graph,
If the amount of washing water is set to 400 cC or more, the rate of change in the amount of contamination will be within 10%, and the difference between the case where the pre-cleaning and cleaning process A from steps S1 to 88 is performed and the case where the pre-cleaning and cleaning process A is performed
and a case where post-cleaning and cleaning step B is performed. When both cleaning steps A and B are performed as shown in this graph, the detection accuracy can be improved to a very high rate of change in the amount of contamination of 96% when the amount of water is 400 cc.
又、第9図は塩と、トノコを含有した400cCの洗浄
水(汚損量0. 0965+ng/cイ)を使用した場
合において、前記管路8の長さと、回収水量との関係を
示すグラフである。このグラフから明らかなように管路
2,8の長さが長くなる程、回収水量が減少し、例えば
○印は180秒後の回収水量を示し、・印は60秒後の
回収水量を示すものである。従って、管路8か例えは2
0mのように長くなった場合においても時間の長い18
0秒後であればほぼ全部が回収されることになる。Furthermore, FIG. 9 is a graph showing the relationship between the length of the pipe 8 and the amount of recovered water when using 400 cC cleaning water containing salt and tonoko (contamination amount 0.0965+ng/c). be. As is clear from this graph, the longer the length of the pipes 2 and 8, the lower the amount of water recovered. For example, the circle mark indicates the amount of water recovered after 180 seconds, and the mark . indicates the amount of water recovered after 60 seconds. It is something. Therefore, conduit 8 or, for example, 2
Even when it is long like 0m, the time is long 18
If it is after 0 seconds, almost all of it will be recovered.
なお、この発明は前記実施例に限定されるものではなく
、例えば、洗浄槽3の上部開口を開閉する蓋を装着する
ことにより、洗浄清掃工程中は前記蓋を閉鎖して行い、
被測定碍子の汚損量を測定する場合には前記蓋を開放し
て被測定碍子を洗浄槽3に収容した状態にすることもで
きる。Note that the present invention is not limited to the above-mentioned embodiments; for example, by installing a lid that opens and closes the upper opening of the cleaning tank 3, the lid is closed during the cleaning and cleaning process;
When measuring the amount of contamination on the insulator to be measured, the lid may be opened and the insulator to be measured may be housed in the cleaning tank 3.
又、第2,4図におてい、被測定碍子26.27は2個
としているが、1個又は3個以上であってもよい。Further, in FIGS. 2 and 4, the number of insulators to be measured 26 and 27 is two, but it may be one or three or more.
以上詳述したように、請求項1記載の発明は、洗浄内に
付着する汚損物を予め洗浄水により清掃して排出するこ
とにより、被測定碍子の汚損量の測定精度を向上するこ
とができるとともに、測定作業の能率を向上し、さらに
前もって測定しておいた洗浄水固有の電導度を被測定碍
子の洗浄後の汚損水の電導度から減算して汚損量を演算
するようにしたので、汚損量の測定精度を向上すること
ができる効果がある。As described in detail above, the invention according to claim 1 can improve the accuracy of measuring the amount of contamination of the insulator to be measured by cleaning and discharging the contaminants adhering to the inside of the insulator with cleaning water in advance. At the same time, the efficiency of the measurement work has been improved, and the amount of contamination is calculated by subtracting the specific conductivity of the cleaning water, which has been measured in advance, from the conductivity of the contaminated water after cleaning the insulator to be measured. This has the effect of improving the measurement accuracy of the amount of contamination.
又、請求項2記載の発明は、洗浄水固有の電導度を実測
するので、請求項1記載の発明よりも汚損量の測定精度
を向上することができる効果かある。Further, since the invention according to claim 2 actually measures the electrical conductivity specific to the cleaning water, it is possible to improve the measurement accuracy of the amount of contamination more than the invention according to claim 1.
さらに、請求項3記載の発明は、後洗浄清掃を行なうの
で、請求項1又は2記載の発明よりも汚損量の測定精度
をさらに向上することができる効果がある。Furthermore, since the invention according to claim 3 performs post-cleaning, there is an effect that the measurement accuracy of the amount of contamination can be further improved compared to the invention according to claim 1 or 2.
第1図はこの発明の碍子汚損量測定方法の第1実施例を
説明するためのフローチャート、第2図は碍子汚損量測
定装置を示す正面図、第3図は測定方法の第2実施例を
説明するためのフローチャート、第4図は碍子汚損量測
定装置の別個を示す路体正面図、第5図はその測定装置
のブロック回路図、第6図は碍子汚損量測定方法の第3
実施例を説明するためのフローチャート、第7図は碍子
汚損量測定方法の第4実施例を説明するためのフローチ
ャート、第8図は洗浄水の放水量と汚損量変化率との関
係を示すグラフ、第9図は管路の長さと回収水量との関
係を示すグラフである。
1・・・洗浄水用タンク、2・・・給水管路、3・・・
洗浄槽、4・・・給水ポンプ、7・・・噴射ノズル、8
・・・管路、9・・・測定用タンク、10・・・電導度
計、16・・・制御装置、17・・・制御部、18・・
・演算部、24・・・碍子昇降機構、26.27・・・
被測定碍子、SV1〜SV3・・・電磁弁。
特許出願人 東京電力 株式会社日本碍子 株
式会社
代理人 弁理士 恩1)博宣(ほか1名)
第2図FIG. 1 is a flowchart for explaining the first embodiment of the method for measuring the amount of insulator contamination according to the present invention, FIG. 2 is a front view showing an apparatus for measuring the amount of insulator contamination, and FIG. Flowchart for explanation; FIG. 4 is a front view of the road body showing a separate device for measuring the amount of insulator fouling; FIG. 5 is a block circuit diagram of the measuring device; FIG. 6 is a third diagram of the method for measuring the amount of insulator fouling
Flowchart for explaining the embodiment, FIG. 7 is a flowchart for explaining the fourth embodiment of the method for measuring the amount of contamination on an insulator, and FIG. 8 is a graph showing the relationship between the amount of washing water discharged and the rate of change in the amount of contamination. , FIG. 9 is a graph showing the relationship between the length of the pipeline and the amount of recovered water. 1...Washing water tank, 2...Water supply pipe, 3...
Cleaning tank, 4... Water supply pump, 7... Injection nozzle, 8
...Pipe line, 9...Measuring tank, 10...Conductivity meter, 16...Control device, 17...Control unit, 18...
- Arithmetic unit, 24... Insulator lifting mechanism, 26.27...
Insulators to be measured, SV1 to SV3...Solenoid valves. Patent applicant Tokyo Electric Power Company Nippon Insulator Co., Ltd. Agent Patent attorney On 1) Hironobu (and 1 other person) Figure 2
Claims (1)
洗浄槽内を清掃した後、被測定碍子を暴露位置から洗浄
槽内に移動し、清掃後の洗浄水を洗浄槽から排出し、次
に前記洗浄水供給源から洗浄水を洗浄槽内の被測定碍子
に噴射して碍子表面を洗浄し、さらに、電導度計により
洗浄後の汚損水の電導度を測定し、演算制御装置により
前記電導度から予め測定又は設定しておいた洗浄水用タ
ンクの洗浄水の固有電導度を減算し、被測定碍子の塩分
付着密度を演算することを特徴とする碍子汚損量測定方
法。 2、洗浄水供給源から碍子洗浄槽内へ洗浄水を供給して
洗浄槽内を清掃するとともに、清掃後の洗浄水を洗浄槽
から排出し、次に、所定量の洗浄水を洗浄槽内に供給し
て電導度計により洗浄水固有の電導度を測定し、その後
、被測定碍子を暴露位置から洗浄槽内に移動し、前記洗
浄水を排出し、次に、前記洗浄水供給源から所定量の洗
浄水を洗浄槽内の被測定碍子に噴射して碍子表面を洗浄
し、さらに、電導度計により洗浄後の汚損水の電導度を
測定し、この被測定碍子の洗浄後に得られた電導度から
前記洗浄水固有の電導度を演算制御装置により減算し、
この減算された電導度から被測定碍子の塩分付着密度を
演算することを特徴とする碍子汚損量測定方法。 3、被測定碍子の洗浄後の汚損水の電導度を測定した後
、碍子洗浄槽から汚損水を排出し、洗浄水供給源から碍
子洗浄槽内へ洗浄水を供給して洗浄槽内を清掃すること
を特徴とする請求項1又は2記載の碍子汚損量測定方法
。[Claims] 1. After cleaning the inside of the cleaning tank by supplying cleaning water from the cleaning water supply source into the insulator cleaning tank, move the insulator to be measured from the exposed position into the cleaning tank, and perform the cleaning after cleaning. The water is discharged from the cleaning tank, and then cleaning water is sprayed from the cleaning water supply source onto the insulator to be measured in the cleaning tank to clean the insulator surface, and the conductivity of the contaminated water after cleaning is measured using a conductivity meter. is measured, and the specific conductivity of the wash water in the wash water tank, which has been measured or set in advance, is subtracted from the conductivity by the arithmetic and control device to calculate the salt adhesion density of the insulator to be measured. Method for measuring the amount of insulator contamination. 2. Supply cleaning water from the cleaning water supply source into the insulator cleaning tank to clean the inside of the cleaning tank, drain the cleaning water from the cleaning tank, and then pour a predetermined amount of cleaning water into the cleaning tank. The specific conductivity of the cleaning water is measured using a conductivity meter, and then the insulator to be measured is moved from the exposure position into the cleaning tank, the cleaning water is discharged, and then the cleaning water is removed from the cleaning water supply source. A predetermined amount of cleaning water is sprayed onto the insulator to be measured in the cleaning tank to clean the insulator surface, and the conductivity of the contaminated water after cleaning is measured using a conductivity meter. subtracting the electrical conductivity specific to the washing water from the electrical conductivity obtained by using an arithmetic control device;
A method for measuring the amount of contamination of an insulator, characterized in that the salt adhesion density of the insulator to be measured is calculated from the subtracted electrical conductivity. 3. After measuring the conductivity of contaminated water after cleaning the insulator to be measured, drain the contaminated water from the insulator cleaning tank and supply cleaning water from the cleaning water supply source to the insulator cleaning tank to clean the inside of the cleaning tank. The method for measuring the amount of insulator staining according to claim 1 or 2, characterized in that:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19515290A JP2515422B2 (en) | 1990-07-24 | 1990-07-24 | Insulator pollution amount measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19515290A JP2515422B2 (en) | 1990-07-24 | 1990-07-24 | Insulator pollution amount measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0480644A true JPH0480644A (en) | 1992-03-13 |
| JP2515422B2 JP2515422B2 (en) | 1996-07-10 |
Family
ID=16336298
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19515290A Expired - Fee Related JP2515422B2 (en) | 1990-07-24 | 1990-07-24 | Insulator pollution amount measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2515422B2 (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007319923A (en) * | 2006-06-05 | 2007-12-13 | Nippon Steel Corp | Continuous casting method for molten steel |
| CN101393152B (en) | 2008-10-24 | 2011-12-28 | 重庆电力科学试验研究院 | Insulator dirty degree sampling and measurement method and special funnel device |
| CN102508036A (en) * | 2011-11-02 | 2012-06-20 | 浙江大学城市学院 | On-line remote monitoring method and device for pollution state of disk insulator |
| CN103323497A (en) * | 2013-06-03 | 2013-09-25 | 武汉工程大学 | Electrical power insulator surface salt deposit density detector |
| CN103752548A (en) * | 2014-01-24 | 2014-04-30 | 国家电网公司 | Automatic insulator salt density online detection device |
| CN105092469A (en) * | 2015-07-21 | 2015-11-25 | 海南电力技术研究院 | Method and system for obtaining insulator salt density saturation coefficient based on on-line monitoring technology |
-
1990
- 1990-07-24 JP JP19515290A patent/JP2515422B2/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007319923A (en) * | 2006-06-05 | 2007-12-13 | Nippon Steel Corp | Continuous casting method for molten steel |
| CN101393152B (en) | 2008-10-24 | 2011-12-28 | 重庆电力科学试验研究院 | Insulator dirty degree sampling and measurement method and special funnel device |
| CN102508036A (en) * | 2011-11-02 | 2012-06-20 | 浙江大学城市学院 | On-line remote monitoring method and device for pollution state of disk insulator |
| CN103323497A (en) * | 2013-06-03 | 2013-09-25 | 武汉工程大学 | Electrical power insulator surface salt deposit density detector |
| CN103752548A (en) * | 2014-01-24 | 2014-04-30 | 国家电网公司 | Automatic insulator salt density online detection device |
| CN105092469A (en) * | 2015-07-21 | 2015-11-25 | 海南电力技术研究院 | Method and system for obtaining insulator salt density saturation coefficient based on on-line monitoring technology |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2515422B2 (en) | 1996-07-10 |
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