JPH0480941A - Positioning of substrate - Google Patents
Positioning of substrateInfo
- Publication number
- JPH0480941A JPH0480941A JP2195235A JP19523590A JPH0480941A JP H0480941 A JPH0480941 A JP H0480941A JP 2195235 A JP2195235 A JP 2195235A JP 19523590 A JP19523590 A JP 19523590A JP H0480941 A JPH0480941 A JP H0480941A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- piezoelectric element
- elements
- displace
- piezoelectric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
【発明の詳細な説明】
〈産業上の利用分野〉
本発明はフォトダイオードアレイ(以下、PDAと略す
)等の素子が形成された基板を位置決めする方法に関す
るものである。DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a method for positioning a substrate on which elements such as a photodiode array (hereinafter abbreviated as PDA) are formed.
〈従来の技術〉
光学式エンコーダでは、PDAが形成された基板の取付
は位置精度が検出信号のリップルに大きく影響する。<Prior Art> In an optical encoder, the positional accuracy of mounting a substrate on which a PDA is formed greatly affects the ripple of the detection signal.
従来は、PDAが形成された基板の位置決めはXYステ
ージ等のメカ的な装置を用いて行っていた。Conventionally, a mechanical device such as an XY stage has been used to position a substrate on which a PDA is formed.
〈発明が解決しようとする課題〉
しかし、XYステージでは、数μm程度の微調整は難し
いという問題点があった。また、ステージが大きいもの
であるため、扱いにくいという問照点もあった。<Problems to be Solved by the Invention> However, the XY stage has a problem in that fine adjustment of several μm is difficult. Also, since the stage was large, it was difficult to handle.
本発明はこのような問題点を解決するためになされたも
のであり、コンパクトな装置で基板を高精度で位置決め
できる方法を実現することを目的とする。The present invention was made to solve these problems, and an object of the present invention is to realize a method that can position a substrate with high precision using a compact device.
く課題を解決するための手段〉
本発明は、
長方形の基板を目標位置に位置決めする基板の位置決め
方法において、
印加電圧に比例して変位する圧電素子を長方形の基板の
各辺に当接させ、この圧電素子は、長方形の互いに向か
い合う一対の辺のうち、一方の辺には第1の圧電素子を
他方の辺には第2及び第3の圧電素子を配置し、互いに
向かい合う他の一対の辺のうち、一方の辺には第4の圧
電素子を、他方の辺には第5の圧電素子を配置し、次の
工程で基板を位置決めする基板の位置決め方法である。Means for Solving the Problems> The present invention provides a substrate positioning method for positioning a rectangular substrate at a target position, comprising: bringing a piezoelectric element that is displaced in proportion to an applied voltage into contact with each side of the rectangular substrate; This piezoelectric element has a first piezoelectric element on one side, second and third piezoelectric elements on the other side, and a pair of opposite sides of a rectangle. In this substrate positioning method, a fourth piezoelectric element is arranged on one side and a fifth piezoelectric element is arranged on the other side, and the substrate is positioned in the next step.
■前記第1の圧電素子を変位させず、前記第2の圧電素
子と第3の圧電素子を互いに逆方向に変位させて基板の
傾斜を調整する工程。(2) Adjusting the inclination of the substrate by displacing the second piezoelectric element and the third piezoelectric element in opposite directions without displacing the first piezoelectric element.
■前記第2の圧電素子と第3の圧電素子を同方向に同量
変位させ、前記第1の圧電素子を第2の圧電素子及び第
3の圧電素子に対して逆方向に同量変位させて基板のY
軸方向の位置を調整する工程。■Displace the second piezoelectric element and the third piezoelectric element by the same amount in the same direction, and displace the first piezoelectric element by the same amount in the opposite direction with respect to the second piezoelectric element and the third piezoelectric element. Y of the board
The process of adjusting the axial position.
■前記第4の圧電素子と第5の圧電素子を互いに逆方向
に同量だけ変位させて基板のX軸方向の位置を調整する
工程。(2) A step of adjusting the position of the substrate in the X-axis direction by displacing the fourth piezoelectric element and the fifth piezoelectric element by the same amount in opposite directions.
く作用〉
このような本発明では、長方形の基板の3辺には圧電素
子を1個ずつ当接させ、残りの1辺には2個の圧電素子
を当接させ、1辺に2個当接させた圧電素子を互いに逆
方向に変位させて基板の姿勢を調整する。また、互いに
向かい合う辺に配置された圧電素子どうしは逆方向に変
位させて、基板のX軸方向とY軸方向の位置を調整する
。これによって基板を位置決めする。In the present invention, one piezoelectric element is brought into contact with each of the three sides of the rectangular substrate, two piezoelectric elements are brought into contact with the remaining one side, and two piezoelectric elements are brought into contact with each side. The attitude of the substrate is adjusted by displacing the piezoelectric elements that are in contact with each other in opposite directions. Furthermore, the piezoelectric elements arranged on opposite sides are displaced in opposite directions to adjust the positions of the substrate in the X-axis direction and the Y-axis direction. This positions the substrate.
〈実施例〉 以下、図面を用いて本発明を説明する。<Example> Hereinafter, the present invention will be explained using the drawings.
第1図は本発明にかかる方法を実線するための装置の構
成例を示した図である。第1図で、<a)は装置の平面
図、(b)は(a)図のA−A部分の断面図である。FIG. 1 is a diagram showing an example of the configuration of an apparatus for carrying out the method according to the present invention. In FIG. 1, <a) is a plan view of the device, and FIG. 1(b) is a sectional view taken along the line AA in FIG. 1(a).
これらの図において、1は位置決め対象となる基板であ
り、ここでは長方形のものである。2は基板1上に形成
されたPDA、である。PDA2の各辺には基板を位置
決めする際の目印となるマク21〜24が付いている0
位置決めするときにはこれらのマークを顕微鏡でモニタ
し、顕微鏡のモニタ画面につけられた士印のカーソルと
マークが重なるように基板を位置合わせする。In these figures, 1 is a substrate to be positioned, and here it is a rectangular substrate. 2 is a PDA formed on the substrate 1. There are markings 21 to 24 on each side of the PDA 2 that serve as marks when positioning the board.
When positioning, these marks are monitored with a microscope, and the board is aligned so that the mark overlaps the cursor marked on the microscope's monitor screen.
3は基板1が位置決めして固定される固定部材である。3 is a fixing member to which the substrate 1 is positioned and fixed.
4は長方形の枠の形になった固定具であり、図示しない
別の固定手段によって位!が固定されている。4 is a fixing device in the form of a rectangular frame, and is fixed by another fixing means (not shown). is fixed.
51〜55は固定具4の内側に取付けられていて、先端
が枠の内側を向いている圧電素子である。51 to 55 are piezoelectric elements that are attached to the inside of the fixture 4 and have their tips facing inside the frame.
粋の内側の4辺のうち、3辺には圧電素子が1個ずつ取
付けられ、1辺には2個の圧電素子が取付けられている
。これらの圧電素子は、印加電圧に比例して変位するも
のであり、印加電圧を調整することにより任意に変位を
変えることができる。One piezoelectric element is attached to each of the four sides on the inside of the body, and one piezoelectric element is attached to each side, and two piezoelectric elements are attached to each side. These piezoelectric elements are displaced in proportion to the applied voltage, and the displacement can be arbitrarily changed by adjusting the applied voltage.
このような装置を用いて次の手順で基板を位置決めする
。Using such a device, the substrate is positioned according to the following procedure.
第2図は動作説明図である。第2図で第1図と同一のも
のは同一符号を付ける。FIG. 2 is an explanatory diagram of the operation. Components in FIG. 2 that are the same as those in FIG. 1 are given the same reference numerals.
まず、圧電素子51に電圧を印加し、基板1を圧電素子
52と53に当たるまで動かす、当たつことは、圧電素
子の電圧は変位に比例しているため、圧電素子52と5
3の電圧をモニタしておけば、電圧が変化したところで
当たったことを検知できる。First, a voltage is applied to the piezoelectric element 51 and the substrate 1 is moved until it hits the piezoelectric elements 52 and 53. This is because the voltage of the piezoelectric element is proportional to the displacement.
If you monitor the voltage in step 3, you can detect a hit when the voltage changes.
ここで、圧電素子52と53を互いに逆方向に変位させ
、基板1の傾斜すなわち角度θを調整する。Here, the piezoelectric elements 52 and 53 are displaced in opposite directions to adjust the inclination of the substrate 1, that is, the angle θ.
次に、圧電素子52と53を同方向に同量だけ変位させ
るとともに、圧電素子51を圧電素子52及び53とは
逆方向に同量だけ変位させて基板のY軸方向の位置を調
整する。Next, the piezoelectric elements 52 and 53 are displaced by the same amount in the same direction, and the piezoelectric element 51 is displaced by the same amount in the opposite direction to the piezoelectric elements 52 and 53 to adjust the position of the substrate in the Y-axis direction.
さらに、圧電素子54と55を変位させて基板1に当て
、当たったところで、圧電素子54と55を互いに逆方
向に同量だけ変化させて基板のX方向の位置を調整する
。Further, the piezoelectric elements 54 and 55 are displaced and brought into contact with the substrate 1, and when they hit, the piezoelectric elements 54 and 55 are moved by the same amount in opposite directions to adjust the position of the substrate in the X direction.
このような調整を行っている間は顕微鏡でマク21〜2
4の位置をモニタし、マークと顕微鏡のカーソルが重な
ったところで調整を終了する。While making these adjustments, Mac 21-2 is
Monitor the position 4, and finish the adjustment when the mark and the microscope cursor overlap.
く効果〉
本発明によれば、微少変位が可能な圧電素子を用いて基
板を位置決めしているため、高精度な位置決めが可能に
なる。また、位置決めは、基板のX軸方向の位置、Y軸
方向の位置及び傾斜について行なわれるため、決め細か
な位置決めが可能になる。さらに、圧電素子自体は小さ
いものであるため、装置がコンパクトになる。Effect> According to the present invention, since the substrate is positioned using a piezoelectric element capable of minute displacement, highly accurate positioning is possible. Moreover, since positioning is performed for the position of the substrate in the X-axis direction, the position in the Y-axis direction, and the inclination, precise positioning is possible. Furthermore, since the piezoelectric element itself is small, the device becomes compact.
光学式エンコーダでは符号板に形成されたスリットの寸
法は小さく、PDAの基板は高精度で位置決めされるこ
とが要求されているため、本発明にかかる方法はこのよ
うな用途に対して特に有効である。In an optical encoder, the size of the slit formed in the code plate is small, and the PDA board is required to be positioned with high precision, so the method according to the present invention is particularly effective for such applications. be.
第1図は本発明を実施するための装置の構成例を示した
図、第2図は第1図の装置の動作説明図である。
1・・・基板、2・・・PDA、3・・・固定部材、4
・・・固定具、51〜55・・・圧電素子。
\ミー/
×FIG. 1 is a diagram showing an example of the configuration of an apparatus for implementing the present invention, and FIG. 2 is an explanatory diagram of the operation of the apparatus shown in FIG. 1... Board, 2... PDA, 3... Fixing member, 4
...Fixing tool, 51-55...Piezoelectric element. \Me/ ×
Claims (1)
め方法において、 印加電圧に比例して変位する圧電素子を長方形の基板の
各辺に当接させ、この圧電素子は、長方形の互いに向か
い合う一対の辺のうち、一方の辺には第1の圧電素子を
他方の辺には第2及び第3の圧電素子を配置し、互いに
向かい合う他の一対の辺のうち、一方の辺には第4の圧
電素子を、他方の辺には第5の圧電素子を配置し、次の
工程で基板を位置決めする基板の位置決め方法。 (1)前記第1の圧電素子を変位させず、前記第2の圧
電素子と第3の圧電素子を互いに逆方向に変位させて基
板の傾斜を調整する工程。 (2)前記第2の圧電素子と第3の圧電素子を同方向に
同量変位させ、前記第1の圧電素子を第2の圧電素子及
び第3の圧電素子に対して逆方向に同量変位させて基板
のY軸方向の位置を調整する工程。 (3)前記第4の圧電素子と第5の圧電素子を互いに逆
方向に同量だけ変位させて基板のX軸方向の位置を調整
する工程。[Claims] In a substrate positioning method for positioning a rectangular substrate at a target position, a piezoelectric element that is displaced in proportion to an applied voltage is brought into contact with each side of the rectangular substrate; A first piezoelectric element is arranged on one side of a pair of sides facing each other, and second and third piezoelectric elements are arranged on the other side; A substrate positioning method in which a fourth piezoelectric element is placed on the other side, a fifth piezoelectric element is placed on the other side, and the substrate is positioned in the next step. (1) A step of adjusting the inclination of the substrate by displacing the second piezoelectric element and the third piezoelectric element in opposite directions without displacing the first piezoelectric element. (2) Displace the second piezoelectric element and the third piezoelectric element by the same amount in the same direction, and displace the first piezoelectric element by the same amount in the opposite direction with respect to the second piezoelectric element and the third piezoelectric element. A process of adjusting the position of the substrate in the Y-axis direction by displacing it. (3) A step of adjusting the position of the substrate in the X-axis direction by displacing the fourth piezoelectric element and the fifth piezoelectric element by the same amount in opposite directions.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2195235A JPH0480941A (en) | 1990-07-24 | 1990-07-24 | Positioning of substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2195235A JPH0480941A (en) | 1990-07-24 | 1990-07-24 | Positioning of substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0480941A true JPH0480941A (en) | 1992-03-13 |
Family
ID=16337736
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2195235A Pending JPH0480941A (en) | 1990-07-24 | 1990-07-24 | Positioning of substrate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0480941A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07248355A (en) * | 1994-03-10 | 1995-09-26 | Tokyo Inst Of Technol | Lead positioning method and apparatus used in TAB method automatic lead inspection apparatus |
-
1990
- 1990-07-24 JP JP2195235A patent/JPH0480941A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07248355A (en) * | 1994-03-10 | 1995-09-26 | Tokyo Inst Of Technol | Lead positioning method and apparatus used in TAB method automatic lead inspection apparatus |
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