JPH0481080U - - Google Patents
Info
- Publication number
- JPH0481080U JPH0481080U JP12563690U JP12563690U JPH0481080U JP H0481080 U JPH0481080 U JP H0481080U JP 12563690 U JP12563690 U JP 12563690U JP 12563690 U JP12563690 U JP 12563690U JP H0481080 U JPH0481080 U JP H0481080U
- Authority
- JP
- Japan
- Prior art keywords
- printed circuit
- circuit board
- signal terminal
- testing
- testing device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第１図はこの考案の一実施例によるプリント回
路基板テスト装置を示す図、第２図はこの考案の
他の実施例によるプリント回路基板テスト装置を
示す図、第３図は従来のプリント基板テスト装置
を示す図である。
図において、１はＩＣ、２は通常動作回路、３
は入力バツフア、４は出力バツフア、５はプリン
ト回路、６は外部端子、８はインサーキツトテス
タ、９は選択信号発生回路、１０はセレクタを示
す。なお、図中、同一符号は同一、または相当部
分を示す。
FIG. 1 is a diagram showing a printed circuit board testing device according to one embodiment of the present invention, FIG. 2 is a diagram showing a printed circuit board testing device according to another embodiment of this invention, and FIG. 3 is a diagram showing a conventional printed circuit board test device. It is a figure showing an apparatus. In the figure, 1 is an IC, 2 is a normal operation circuit, and 3
4 is an input buffer, 4 is an output buffer, 5 is a printed circuit, 6 is an external terminal, 8 is an in-circuit tester, 9 is a selection signal generating circuit, and 10 is a selector. In addition, in the figures, the same reference numerals indicate the same or corresponding parts.
Claims (1)
載部品の接続テストにおいて、基板に搭載するＩ
Ｃの内部にセレクトを用いて入力信号端子と出力
信号端子の間にある内部回路をバイパスすること
を特徴とするプリント回路基板テスト装置。 When testing the connection between the printed circuit and mounted components of a printed circuit board unit,
A printed circuit board testing device characterized in that an internal circuit between an input signal terminal and an output signal terminal is bypassed by using a select inside the circuit board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12563690U JPH0481080U (en) | 1990-11-27 | 1990-11-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12563690U JPH0481080U (en) | 1990-11-27 | 1990-11-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0481080U true JPH0481080U (en) | 1992-07-15 |
Family
ID=31873227
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12563690U Pending JPH0481080U (en) | 1990-11-27 | 1990-11-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0481080U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007024884A (en) * | 2005-07-11 | 2007-02-01 | Samsung Electronics Co Ltd | Semiconductor device, test substrate, semiconductor device test system, and semiconductor device test method |
-
1990
- 1990-11-27 JP JP12563690U patent/JPH0481080U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007024884A (en) * | 2005-07-11 | 2007-02-01 | Samsung Electronics Co Ltd | Semiconductor device, test substrate, semiconductor device test system, and semiconductor device test method |
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