JPH0482892A - Production of highly pure alkoxysilane - Google Patents
Production of highly pure alkoxysilaneInfo
- Publication number
- JPH0482892A JPH0482892A JP19352490A JP19352490A JPH0482892A JP H0482892 A JPH0482892 A JP H0482892A JP 19352490 A JP19352490 A JP 19352490A JP 19352490 A JP19352490 A JP 19352490A JP H0482892 A JPH0482892 A JP H0482892A
- Authority
- JP
- Japan
- Prior art keywords
- alkoxysilane
- chitosan
- chelate resin
- distillate
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 16
- 239000013522 chelant Substances 0.000 claims abstract description 34
- 239000011347 resin Substances 0.000 claims abstract description 32
- 229920005989 resin Polymers 0.000 claims abstract description 32
- 229920001661 Chitosan Polymers 0.000 claims abstract description 27
- 239000011261 inert gas Substances 0.000 claims abstract description 8
- 238000005292 vacuum distillation Methods 0.000 claims abstract description 8
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910000077 silane Inorganic materials 0.000 claims abstract description 5
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical group CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 claims description 10
- 239000006227 byproduct Substances 0.000 claims description 6
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 claims description 4
- NBZBKCUXIYYUSX-UHFFFAOYSA-N iminodiacetic acid Chemical compound OC(=O)CNCC(O)=O NBZBKCUXIYYUSX-UHFFFAOYSA-N 0.000 claims description 4
- 229920000768 polyamine Polymers 0.000 claims description 4
- 125000003545 alkoxy group Chemical group 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 24
- 239000002994 raw material Substances 0.000 abstract description 9
- 239000004065 semiconductor Substances 0.000 abstract description 9
- 239000007788 liquid Substances 0.000 abstract description 6
- 150000002894 organic compounds Chemical class 0.000 abstract description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 19
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 14
- 150000001768 cations Chemical class 0.000 description 14
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 229910052755 nonmetal Inorganic materials 0.000 description 10
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 8
- 239000012535 impurity Substances 0.000 description 8
- 229910052757 nitrogen Inorganic materials 0.000 description 8
- 238000004821 distillation Methods 0.000 description 7
- 238000000746 purification Methods 0.000 description 7
- 238000010438 heat treatment Methods 0.000 description 6
- 239000007789 gas Substances 0.000 description 5
- 229910052786 argon Inorganic materials 0.000 description 4
- 238000007872 degassing Methods 0.000 description 4
- 229910001873 dinitrogen Inorganic materials 0.000 description 4
- 239000001307 helium Substances 0.000 description 4
- 229910052734 helium Inorganic materials 0.000 description 4
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 4
- -1 lithium aluminum hydride Chemical compound 0.000 description 4
- 239000007858 starting material Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 4
- 239000005046 Chlorosilane Substances 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 239000003054 catalyst Substances 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- KOPOQZFJUQMUML-UHFFFAOYSA-N chlorosilane Chemical class Cl[SiH3] KOPOQZFJUQMUML-UHFFFAOYSA-N 0.000 description 3
- 230000018044 dehydration Effects 0.000 description 3
- 238000006297 dehydration reaction Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000003472 neutralizing effect Effects 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- QQQSFSZALRVCSZ-UHFFFAOYSA-N triethoxysilane Chemical compound CCO[SiH](OCC)OCC QQQSFSZALRVCSZ-UHFFFAOYSA-N 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 238000006555 catalytic reaction Methods 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000000460 chlorine Substances 0.000 description 2
- 229910052801 chlorine Inorganic materials 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- DRUOQOFQRYFQGB-UHFFFAOYSA-N ethoxy(dimethyl)silicon Chemical compound CCO[Si](C)C DRUOQOFQRYFQGB-UHFFFAOYSA-N 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000003980 solgel method Methods 0.000 description 2
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- ZBSKZKPSSKTLNE-UHFFFAOYSA-N 4-methylpent-3-enoxysilane Chemical compound CC(=CCCO[SiH3])C ZBSKZKPSSKTLNE-UHFFFAOYSA-N 0.000 description 1
- 229910021591 Copper(I) chloride Inorganic materials 0.000 description 1
- HILUWRPVFKJTAD-ZGHMGGRHSA-N GA21 Chemical compound O=C(O)[C@H]1[C@@H]2[C@]3(C(=O)O)C(=O)O[C@@]2([C@H]2[C@]41CC(=C)[C@@](O)(C4)CC2)CCC3 HILUWRPVFKJTAD-ZGHMGGRHSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 1
- 101100353042 Mycobacterium bovis (strain BCG / Pasteur 1173P2) lnt gene Proteins 0.000 description 1
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
- KEAYESYHFKHZAL-UHFFFAOYSA-N Sodium Chemical compound [Na] KEAYESYHFKHZAL-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 229910001413 alkali metal ion Inorganic materials 0.000 description 1
- 229910001420 alkaline earth metal ion Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000009835 boiling Methods 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 150000001805 chlorine compounds Chemical class 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000004927 clay Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- OXBLHERUFWYNTN-UHFFFAOYSA-M copper(I) chloride Chemical compound [Cu]Cl OXBLHERUFWYNTN-UHFFFAOYSA-M 0.000 description 1
- 229940045803 cuprous chloride Drugs 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000003599 detergent Substances 0.000 description 1
- WCRDXYSYPCEIAK-UHFFFAOYSA-N dibutylstannane Chemical compound CCCC[SnH2]CCCC WCRDXYSYPCEIAK-UHFFFAOYSA-N 0.000 description 1
- AHUXYBVKTIBBJW-UHFFFAOYSA-N dimethoxy(diphenyl)silane Chemical compound C=1C=CC=CC=1[Si](OC)(OC)C1=CC=CC=C1 AHUXYBVKTIBBJW-UHFFFAOYSA-N 0.000 description 1
- PKTOVQRKCNPVKY-UHFFFAOYSA-N dimethoxy(methyl)silicon Chemical compound CO[Si](C)OC PKTOVQRKCNPVKY-UHFFFAOYSA-N 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000032050 esterification Effects 0.000 description 1
- 238000005886 esterification reaction Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- ZLNAFSPCNATQPQ-UHFFFAOYSA-N ethenyl-dimethoxy-methylsilane Chemical compound CO[Si](C)(OC)C=C ZLNAFSPCNATQPQ-UHFFFAOYSA-N 0.000 description 1
- NUFVQEIPPHHQCK-UHFFFAOYSA-N ethenyl-methoxy-dimethylsilane Chemical compound CO[Si](C)(C)C=C NUFVQEIPPHHQCK-UHFFFAOYSA-N 0.000 description 1
- RSIHJDGMBDPTIM-UHFFFAOYSA-N ethoxy(trimethyl)silane Chemical compound CCO[Si](C)(C)C RSIHJDGMBDPTIM-UHFFFAOYSA-N 0.000 description 1
- CWAFVXWRGIEBPL-UHFFFAOYSA-N ethoxysilane Chemical compound CCO[SiH3] CWAFVXWRGIEBPL-UHFFFAOYSA-N 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 229910000041 hydrogen chloride Inorganic materials 0.000 description 1
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 239000012280 lithium aluminium hydride Substances 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910001507 metal halide Inorganic materials 0.000 description 1
- 150000005309 metal halides Chemical class 0.000 description 1
- POPACFLNWGUDSR-UHFFFAOYSA-N methoxy(trimethyl)silane Chemical compound CO[Si](C)(C)C POPACFLNWGUDSR-UHFFFAOYSA-N 0.000 description 1
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 101150028022 ppm1 gene Proteins 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 230000035484 reaction time Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000021148 sequestering of metal ion Effects 0.000 description 1
- 238000007086 side reaction Methods 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000011863 silicon-based powder Substances 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 229910001415 sodium ion Inorganic materials 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000012756 surface treatment agent Substances 0.000 description 1
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- YUYCVXFAYWRXLS-UHFFFAOYSA-N trimethoxysilane Chemical compound CO[SiH](OC)OC YUYCVXFAYWRXLS-UHFFFAOYSA-N 0.000 description 1
- 238000004065 wastewater treatment Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、粗アルコキシシランを精製し、高純度のアル
コキシシランを得る方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for purifying crude alkoxysilane to obtain highly pure alkoxysilane.
従来の技術
〈アルコキシシラン〉
テトラエトキシシラン、トリエトキシメヂルシラン等の
アルコキシシランは、化学工業用原料としてよく知られ
ており、たとえばゾル−ゲル法によるガラスおよびセラ
ミックスの製造の出発物質、触媒製造時の出発物質など
として多用されている。Conventional technology <Alkoxysilane> Alkoxysilanes such as tetraethoxysilane and triethoxymedylsilane are well known as raw materials for the chemical industry, and are used, for example, as starting materials for the production of glass and ceramics by the sol-gel method, and for the production of catalysts. It is often used as a starting material.
〈アルコキシシランの製造方法〉
アルコキシシランの製造方法としては、特開昭50−7
1632号公報や特公昭60−35351号公報(特開
昭51−13725号公報)に開示の方法が知られてい
る。<Method for producing alkoxysilane> As a method for producing alkoxysilane, JP-A-50-7
Methods disclosed in Japanese Patent Publication No. 1632 and Japanese Patent Publication No. 60-35351 (Japanese Unexamined Patent Publication No. 51-13725) are known.
すなわち、前者においては、ケイ素、ケイ化鉄またはケ
イ索鎖を、■アルコール、■アルカリ金属アルコレート
および@オルトケイ酸エステルの存在下に125〜25
0℃で反応させることにより、オルトケイ酸テトラアル
コキシアルキルエステルを得ている。That is, in the former, silicon, iron silicide, or silica chain is reacted with 125 to 25
By reacting at 0°C, orthosilicate tetraalkoxyalkyl ester is obtained.
後者においては、クロルシランをアルコールで直接エス
テル化することによってアルコキシシランを連続的に製
造する場合に、反応成分を別々の導管を通して塔蒸留装
置の頂部に加え、塩化水素を留去し、生成物を溢流管か
ら連続的に流出する方法を採用している。In the latter, when alkoxysilanes are produced continuously by direct esterification of chlorosilanes with alcohols, the reactants are added through separate conduits to the top of a column distillation apparatus, the hydrogen chloride is distilled off, and the product is A method is adopted in which water flows out continuously from an overflow pipe.
〈アルコキシシランの精製方法〉
アルコキシシランの精製方法についても、いくつかの方
法が採用されている。<Method for Purifying Alkoxysilane> Several methods have been adopted for purifying alkoxysilane.
たとえば、特開昭50−47931号公報においては、
シリコン粉とエタノールを反応させて得られるトリエト
キシシランに、不活性ガスを接触させながら還流あるい
は蒸留を行い、不純物を除去している。For example, in Japanese Patent Application Laid-open No. 50-47931,
Triethoxysilane obtained by reacting silicon powder with ethanol is refluxed or distilled while being brought into contact with an inert gas to remove impurities.
この公報の従来技術の説明の個所には、トリエトキシシ
ラン中の主な不純物は、未反応のエタノール、触媒の塩
化第一銅に起因する各種塩素化合物、副反応生成物であ
る各種炭化水素、エチルジェトキシシラン、エチルエー
テル等であるとしてあり、従来はこれら不純物の沸点差
を利用して精留により分離していたことが述べられてい
る。The explanation of the prior art in this publication states that the main impurities in triethoxysilane are unreacted ethanol, various chlorine compounds resulting from the cuprous chloride catalyst, various hydrocarbons as side reaction products, It is said that these impurities are ethyljethoxysilane, ethyl ether, etc., and that conventionally these impurities have been separated by rectification using the difference in their boiling points.
特開昭62−114992号公報においては、塩素に起
因する不純物を含むアルコキシシランを精製するに際し
、全精製工程中に、(1)アルコキシシランを酸性白土
または金属ハロゲン化物の存在下に加熱する工程、(i
il中和剤で中和する工程、(iij)中和塩を除去す
る工程を順に実施する工程を含ませるようにしている。In JP-A-62-114992, when purifying alkoxysilane containing impurities caused by chlorine, (1) heating the alkoxysilane in the presence of acid clay or metal halide during the entire purification process. , (i
The process includes a step of neutralizing with an il neutralizing agent and (iii) a step of removing the neutralized salt in order.
この公報の従来技術の説明の個所には、アルコキシシラ
ン類はそれに相当するクロロシランとアルコールとを液
相または気相で接触反応させることにより得られること
、得られたアルコキシシランの精製は、従来、中和剤に
よる中和、ついでアルコキシシランの蒸留による中和塩
など不揮発成分からの分離により行われていたことこと
が述べられている。また、非加水分解性塩素を除去する
方法として、リチウムアルミニウムハイドライド、テト
ラメチルグリニシン、酸化マグニシウム、ジヒドリドジ
ブチルスズ、金属ナトリウムのいずれかの存在下に加熱
処理し、ついで蒸留する方法が従来法としであることも
述べられている。In the description of the prior art of this publication, it is stated that alkoxysilanes can be obtained by catalytically reacting the corresponding chlorosilane and alcohol in the liquid phase or gas phase, and that the purification of the obtained alkoxysilane has been conventionally carried out. It is stated that this was carried out by neutralization using a neutralizing agent, and then separation from non-volatile components such as neutralized salts by distillation of alkoxysilane. In addition, as a method for removing non-hydrolyzable chlorine, conventional methods include heat treatment in the presence of lithium aluminum hydride, tetramethylglinicine, magnesium oxide, dibutyltin dihydride, or sodium metal, followed by distillation. It is also stated that
発明が解決しようとする課題
上に述べたアルコキシシランの精製方法は、アルコキシ
シラン中に残存している揮発性または液体有機化合物を
除去対象物質としている。Problems to be Solved by the Invention In the method for purifying alkoxysilane described above, volatile or liquid organic compounds remaining in alkoxysilane are targeted for removal.
しかるに、近時、アルコキシシランを半導体素子のSi
n、絶縁膜形成用の原料化合物として使用するとシラン
ガス等よりも低い温度(たとえば650℃以下)で絶縁
膜形成が実現できることが確認され、それに伴ないアル
コキシシランの新規用途として半導体工業での使用が拡
大している。However, in recent years, alkoxysilanes have been used as Si in semiconductor devices.
It has been confirmed that when used as a raw material compound for forming insulating films, it is possible to form insulating films at lower temperatures (e.g., 650°C or lower) than silane gas, etc., and as a result, alkoxysilanes are being used in the semiconductor industry as a new application. It is expanding.
このような半導体素子の絶縁膜としては、形成した絶縁
膜中に、可動イオン濃度を増大させるNa、に、Ca等
のアルカリまたはアルカリ土金属イオン、あるいはAs
、P、B等のP−N接合を生ずる非金属陽イオン、さら
にはFe、Cr、Cu等の析出物・転移の発生原因とな
る重金属イオンなどの種々の金属・非金属陽イオンが残
存していないことが不可欠の条件となる。The insulating film of such a semiconductor element may contain Na, alkali or alkaline earth metal ions such as Ca, or As, which increase the concentration of mobile ions, in the insulating film formed.
Various metal and non-metal cations remain, such as non-metal cations such as , P, and B that cause P-N junctions, as well as heavy metal ions that cause precipitates and transitions such as Fe, Cr, and Cu. The essential condition is that the
しかしながら上に述べたような従来の精製方法は、これ
らの金属・非金属イオンの除去を主目的としていないた
め、上記の精製方法により精製されたアルコキシシラン
中においては、未だこれらの金属・非金属陽イオンが充
分に除去されず、たとえば総計で1〜5 w/w pp
m程度の陽イオンが残留しているのが現状である。However, the conventional purification methods described above do not have the main purpose of removing these metal/nonmetal ions, so these metal/nonmetal ions still remain in the alkoxysilane purified by the above purification method. Cations are not removed sufficiently, e.g. 1-5 w/w pp in total.
Currently, about 100,000 m of cations remain.
本発明は、このような状況に鑑み、半導体素子の絶縁膜
形成用としても使用可能な高純度のアルコキシシランを
製造する方法を提供すること、さらに詳しくは、アルコ
キシシラン中に残存している種々の金属・非金属陽イオ
ンを検出限度(2〜10 w/w ppbl付近あるい
はそれ以下にまで除去すると共に、副生ずるアルコール
も検出限度(2w/w ppm1付近あるいはそれ以下
にまで除去する工業的に有利な精製方法を提供すること
を目的とするものである。In view of this situation, the present invention provides a method for producing high-purity alkoxysilane that can also be used for forming an insulating film of semiconductor devices, and more specifically, it is an object of the present invention to provide a method for producing a high-purity alkoxysilane that can also be used for forming an insulating film of a semiconductor element. It is an industrial method that removes metal and non-metal cations to the detection limit (nearly 2 to 10 w/w ppbl or less), and also removes by-product alcohol to the detection limit (nearly 2w/w ppm1 or less). The aim is to provide an advantageous purification method.
課題を解決するための手段
本発明の高純度アルコキシシランの製造方法は、
粗アルコキシシランをキトサン系キレート樹脂と接触処
理する工程A、
前工程A終了後、減圧蒸留によりアルコキシシランを前
記キレート樹脂から留出液として分離する工程B、
前工程Bで得られた留出液に減圧下に不活性ガスを導入
し、系中にすでに含まれあるいは新たに副生ずる揮発性
成分を揮散除去する工程C1からなることを特徴とする
ものである。Means for Solving the Problems The method for producing high-purity alkoxysilane of the present invention includes a step A in which crude alkoxysilane is contacted with a chitosan-based chelate resin, and after the previous step A, alkoxysilane is extracted from the chelate resin by vacuum distillation. Step B of separating the distillate as a distillate; Step C1 of introducing an inert gas under reduced pressure into the distillate obtained in the previous step B to volatilize and remove volatile components already contained in the system or newly produced by-products; It is characterized by consisting of.
以下本発明の詳細な説明する。The present invention will be explained in detail below.
アルコキシシラン
アルコキシシランとしては、トリメトキシシラン、トリ
エトキシシラン、テトラメトキシシラン、テトラエトキ
シシラン、メチルトリメトキシシラン、メチルトリエト
キシシラン、ジメチルエトキシシラン、ジメチルジェト
キシシラン、トリメチルメトキシシラン、トリメチルエ
トキシシラン、メチルジメトキシシラン、メチルジェト
キシシラン、ジメチルエトキシシラン、ジメチルビニル
メトキシシラン、ジメチルビニルエトキシシラン、メチ
ルビニルジメトキシシラン、メチルビニルジェトキシシ
ラン、ジフェニルジメトキシシラン、フェニルトリメト
キシシラン、ジフェニルジェトキシシラン、フェニルト
リエトキシシランなどがあげられ、これらの中では特に
テトラエトキシシランが重要である。AlkoxysilaneAs the alkoxysilane, trimethoxysilane, triethoxysilane, tetramethoxysilane, tetraethoxysilane, methyltrimethoxysilane, methyltriethoxysilane, dimethylethoxysilane, dimethyljethoxysilane, trimethylmethoxysilane, trimethylethoxysilane, Methyldimethoxysilane, methyljethoxysilane, dimethylethoxysilane, dimethylvinylmethoxysilane, dimethylvinylethoxysilane, methylvinyldimethoxysilane, methylvinyljethoxysilane, diphenyldimethoxysilane, phenyltrimethoxysilane, diphenyljethoxysilane, phenyl trimethoxysilane Examples include ethoxysilane, and among these, tetraethoxysilane is particularly important.
粗アルコキシシランは、従来の精製方法により一応の精
製を行ったものであってもよ(、クロロシランのアルコ
キシ化工程で生成したものであってもよい。The crude alkoxysilane may be one that has been purified to some extent by a conventional purification method (or may be one that is produced in the alkoxylation step of chlorosilane).
工][Δ
工程Aは、粗アルコキシシランをキトサン系キレート樹
脂と接触処理する工程である。Process] [Δ Process A is a process in which crude alkoxysilane is brought into contact with a chitosan-based chelate resin.
キトサン系キレート樹脂としては、キトサンを主鎖とし
、かつポリアミン型、イミノジ酢酸型または芳香族カル
ボン酸型の配位基を有する樹脂が用いられる。除去対象
となる金属・非金属陽イオンの種類によっては個々の反
応特性に応じて異なる配位基を有するものを併用する方
がよい。このようなキトサン系キレート樹脂の市販品と
しては、富士紡績株式会社の「キレートキトバール」が
ある。(なお粒状多孔質キトサンの製造方法については
、富士紡績株式会社の出願にかかる特公平1−1642
0号公報に詳しい説明がある。)
粗アルコキシシランとキトサン系キレート樹脂との接触
処理に際しては、窒素、アルゴン、ヘリウムなどの不活
性ガス気流下に加熱を行って、脱水・脱ガス処理をして
おく。As the chitosan-based chelate resin, a resin having chitosan as a main chain and a polyamine type, iminodiacetic acid type, or aromatic carboxylic acid type coordination group is used. Depending on the type of metal/nonmetal cation to be removed, it is better to use cations having different coordination groups in accordance with the individual reaction characteristics. A commercially available product of such a chitosan-based chelate resin is "Chelate Chitobal" manufactured by Fujibo Co., Ltd. (For the production method of granular porous chitosan, please refer to Japanese Patent Publication No. 1-1642 filed by Fujibo Co., Ltd.
There is a detailed explanation in Publication No. 0. ) When contacting the crude alkoxysilane with the chitosan-based chelate resin, heat it under a stream of inert gas such as nitrogen, argon, helium, etc. to perform dehydration and degassing treatment.
接触反応により粗アルコキシシラン中の金属陽イオンを
痕跡量まで除去するときの反応時間は、数時間ないし1
00時間程度、たとえば3〜90時間程度とすることが
多い。The reaction time for removing trace amounts of metal cations from crude alkoxysilane by catalytic reaction is several hours to 1 hour.
It is often about 00 hours, for example about 3 to 90 hours.
この接触反応は、ロータリーエバポレータを用い、系を
窒素、アルゴン、ヘリウムなどの不活性ガス雰囲気下に
保った状態で、ロークリエバボレークーを回転させなが
ら行うことが好ましい。処理すべき粗アルコキシシラン
中にはアルコールが含まれていることがあり、また上記
のように脱水脱ガスの前処理を行っていても、キトサン
系キレート樹脂より遊離する微量の水分とアルコキシシ
ランとの加水分解反応によりアルコールが副生ずるので
、このようなアルコールの除去を連続的に同一装置にて
行うにはロータリーエバポレーターが好適であるからで
ある。This catalytic reaction is preferably carried out using a rotary evaporator while rotating the rotary evaporator while keeping the system under an inert gas atmosphere such as nitrogen, argon, or helium. The crude alkoxysilane to be treated may contain alcohol, and even if the pretreatment of dehydration and degassing is performed as described above, trace amounts of water liberated from the chitosan-based chelate resin and the alkoxysilane may be mixed together. Since alcohol is produced as a by-product through the hydrolysis reaction of , a rotary evaporator is suitable for continuously removing such alcohol in the same device.
1里上
工程Bは、前工程A終了後、減圧蒸留によりアルコキシ
シランを前記キレート樹脂から留出液として分離する工
程である。Step B, which is one mile higher, is a step in which, after the previous step A, the alkoxysilane is separated from the chelate resin as a distillate by vacuum distillation.
内温および減圧の程度は、アルコキシシランの種類に応
じ適宜に設定される。系の雰囲気は、窒素、アルゴン、
ヘリウムなどの不活性ガス雰囲気下に保つ。最終的な減
圧蒸留条件は原料のアルコキシシランに固有の物性であ
る蒸気圧曲線に応じて決定されるが、過度に高い温度は
キトサン系キレート樹脂の寿命の点で不利となるので、
通常は100 ’C以下に設定する。The internal temperature and the degree of pressure reduction are appropriately set depending on the type of alkoxysilane. The atmosphere of the system is nitrogen, argon,
Keep under an inert gas atmosphere such as helium. The final vacuum distillation conditions are determined according to the vapor pressure curve, which is a physical property specific to the raw material alkoxysilane, but excessively high temperatures are disadvantageous in terms of the lifespan of the chitosan-based chelate resin, so
Usually set to 100'C or less.
アルコキシシラン中の金属・非金属陽イオンはキトサン
系キレート樹脂に固定されているので、留出液にはもは
や非金属・金属陽イオンは痕跡量程度しか含まれていな
いことになる。Since the metal/nonmetal cations in the alkoxysilane are fixed to the chitosan-based chelate resin, the distillate no longer contains only trace amounts of nonmetal/metal cations.
工業的には、工程Aにおいてロータリーエバポレーター
を用い、工程A終了後そのエバボレークーを用いて引き
続き工程Bを実施することが有利である。Industrially, it is advantageous to use a rotary evaporator in step A, and to carry out step B subsequently using the evaporator after step A is completed.
二丘工
工程Cは、前工程Bで得られた留出液に減圧下に窒素、
アルゴン、ヘリウムなどの不活性ガスを導入し、系中に
すでに含まれあるいは新たに副生ずる揮発性成分を揮散
除去する工程である。In the Nikoka process C, nitrogen is added to the distillate obtained in the previous process B under reduced pressure.
This is a process in which an inert gas such as argon or helium is introduced to volatilize and remove volatile components that are already contained in the system or are newly produced as by-products.
この工程により、アルコール、水等の揮発成分は除去さ
れ、高純度の精製アルコキシシランが得られる。Through this step, volatile components such as alcohol and water are removed, and purified alkoxysilane with high purity is obtained.
■
本発明の方法により得られる高純度アルコキシシランは
、ゾル−ゲル法によるガラスおよびセラミックスの製造
の出発物質、触媒製造時の出発物質としてはもとより、
半導体の酸化ケイ素絶縁膜の原料や光フアイバー用の原
料など高度の純度を要求される用途にも好適に用いるこ
とができる。■ High purity alkoxysilane obtained by the method of the present invention can be used not only as a starting material for the production of glasses and ceramics by the sol-gel method, but also as a starting material for the production of catalysts.
It can also be suitably used in applications that require a high degree of purity, such as raw materials for silicon oxide insulating films for semiconductors and raw materials for optical fibers.
作 用
工程Aにおいては、粗アルコキシシラン中に残存してい
る種々の金属・非金属陽イオンがキトサン系キレート樹
脂に化学吸着される。In operation step A, various metal and nonmetal cations remaining in the crude alkoxysilane are chemically adsorbed onto the chitosan-based chelate resin.
キレート樹脂には種々のものがあるが、以下に述べるよ
うに、本発明の目的にはキトサン系キレート樹脂が最適
である。There are various types of chelate resins, but as described below, chitosan-based chelate resins are most suitable for the purpose of the present invention.
すなわち、本発明においては、キレート樹脂の従来の主
用途である金属表面処理剤、メツキ薬1 】
品、工業用洗剤等に使用する場合の金属イオン封鎖効果
、あるいは排水処理等に使用する場合のように10〜1
00 w/w ppmオーグーの高濃度金属陽イオンの
化学吸着を目的にはしておらず、各1w/w ppm以
下の含有量の種々の陽イオンを、誘導プラズマ発光法や
原子吸光法の検出限界以下または検出限界近くの痕跡量
まで除去することを目的としているので、キレート樹脂
としての化学吸着量よりも化学吸着時の下限値の低いも
のが好ましい。工程Aで用いるキトサン系キレート樹脂
は、このような要件を満足するものである。That is, in the present invention, the metal ion sequestration effect when used in metal surface treatment agents, plating agents, industrial detergents, etc., which are the conventional main uses of chelate resins, or when used in wastewater treatment, etc. Like 10-1
00 w/w ppm Augu is not intended for chemical adsorption of high concentration metal cations, but various cations with a content of 1 w/w ppm or less can be detected using stimulated plasma emission method or atomic absorption method. Since the purpose is to remove trace amounts below the limit or near the detection limit, it is preferable that the lower limit value of chemisorption is lower than the amount of chemisorption as a chelate resin. The chitosan-based chelate resin used in Step A satisfies these requirements.
また、常法でしばしば使用されているpHコントロール
用の薬品は、精製目的のアルコキシシランそのものの汚
染源となる。そこでキレート形成範囲が中性付近である
ものが有利であり、工程Aで用いるキトサン系キレート
樹脂は、このような要件をも満足している。In addition, pH control chemicals often used in conventional methods become a source of contamination of the alkoxysilane itself for purification purposes. Therefore, it is advantageous to have a chelate formation range near neutrality, and the chitosan-based chelate resin used in Step A also satisfies these requirements.
さらにキトサン系キレート樹脂は、他の通常の純合成キ
レート樹脂に共通する特有の臭気を持たないこと、工程
Aに供する前に行う脱水脱ガス処理が容易であることな
どの点でも本発明の目的に適している。Furthermore, the chitosan-based chelate resin does not have the characteristic odor that is common to other ordinary pure synthetic chelate resins, and the dehydration and degassing treatment that is performed before being subjected to step A is easy, which is another object of the present invention. suitable for
工程Bにおいては、減圧蒸留によりアルコキシシランが
キレート樹脂から分離され、留出液であるアルコキシシ
ランにはもはや金属・非金属陽イノ
オンは事実上台まれていない。In step B, the alkoxysilane is separated from the chelate resin by vacuum distillation, and the alkoxysilane distillate is no longer substantially free of metal and nonmetal cations.
そして工程Cにより、留出液中にすでに含まれあるいは
新たに副生ずる揮発性成分も揮散除去され、不純物を事
実上含有しない高純度のアルコキシシランが得られる。Then, in Step C, volatile components already contained in the distillate or newly produced by-products are removed by volatilization, and a highly pure alkoxysilane containing virtually no impurities is obtained.
実施例 次に実施例をあげて本発明をさらに説明する。Example Next, the present invention will be further explained with reference to Examples.
実施例1
キトサンを主鎖とし、かつキレート配位基がそれぞれポ
リアミン、芳香族カルボン酸、イミノジ酢酸である3種
のキトサン系キレート樹脂(富士紡績株式会社製のキレ
ートキトパール)を準備した。Example 1 Three types of chitosan-based chelate resins (Chelate Chitopearl manufactured by Fujibo Co., Ltd.) having chitosan as the main chain and having chelate coordination groups of polyamine, aromatic carboxylic acid, and iminodiacetic acid were prepared.
上記のうち、ポリアミンな配位基とするもの(CC−S
タイプ)の交換容量は1.56meq/ml、粒度分布
は0,20〜0.45mm、弾性率は5.OX 106
dyne/am2、芳香族カルボン酸を配位基とするも
の(CG−Tタイプ)の交換容量は1.20meq/m
l、粒度分布は0,20〜0.45mm、弾性率は11
.5X 106dyne/cm2、イミノジ酢酸な配位
基とするもの(CG−Iクイズ)の交換容量は0.83
meq/ml、粒度分布は0.20〜0.45mm、弾
性率は5.0X10’dyne/Cm2である。Among the above, those with polyamine coordination groups (CC-S
Type) exchange capacity is 1.56 meq/ml, particle size distribution is 0.20-0.45 mm, and elastic modulus is 5. OX106
dyne/am2, the exchange capacity of aromatic carboxylic acid as a coordination group (CG-T type) is 1.20 meq/m
l, particle size distribution is 0.20-0.45mm, elastic modulus is 11
.. 5X 106 dyne/cm2, the exchange capacity of iminodiacetic acid coordination group (CG-I quiz) is 0.83
meq/ml, particle size distribution is 0.20-0.45 mm, and elastic modulus is 5.0×10'dyne/Cm2.
上記3種のキトサン系キレート樹脂各2g、合計6gを
窒素気流下に120°Cで脱水、脱ガスした後、ロータ
リーエバポレーターの回転フラスコ中に投入し、ついで
、第1表のa)欄に示した量の不純物を含有する粗テト
ラエトキシシラン(化学品グレードのもの)500ml
を同じ回転フラスコ中に投入し、全系を窒素置換後、室
温下で24時間回転接触反応を行った。After dehydrating and degassing 2 g of each of the above three types of chitosan-based chelate resins (6 g in total) at 120°C under a nitrogen stream, they were put into a rotary flask of a rotary evaporator, and then the amounts shown in column a) of Table 1 were added. 500 ml of crude tetraethoxysilane (chemical grade) containing the same amount of impurities.
was placed in the same rotating flask, and after purging the entire system with nitrogen, a rotating contact reaction was carried out at room temperature for 24 hours.
次に、ロータリーエバポレーターの回転フラスコを加温
浴に入れ、液温を52〜55℃に保った状態で10To
rrまで減圧蒸留を行い、投入したキトサン系キレート
樹脂を缶残液と共に回転フラスコに残した。蒸留受器に
留出液が350m1留出した時点で系内圧を窒素ガスで
l OOTorrまで戻すと共に、加温を停止し、減圧
蒸留を終了した。Next, put the rotating flask of the rotary evaporator into a heating bath, and while keeping the liquid temperature at 52 to 55°C, 10To
Distillation was performed under reduced pressure to rr, and the chitosan-based chelate resin that had been charged was left in the rotary flask together with the remaining liquid from the can. When 350 ml of distillate had been distilled into the distillation receiver, the internal pressure of the system was returned to 1 OOTorr using nitrogen gas, heating was stopped, and vacuum distillation was completed.
最後に、受器に得られた留出物にガス吹き込み用多孔管
より窒素ガスを100 Torr下で60分間吹き込み
、系中に微量含有されているエタノールを系外に放散さ
せ、目的とする高純度の精製テトラエトキシシランを得
た。Finally, nitrogen gas is blown into the distillate obtained in the receiver for 60 minutes at 100 Torr through a gas blowing porous tube to diffuse the trace amount of ethanol contained in the system to the outside of the system and achieve the desired high temperature. Purified tetraethoxysilane with high purity was obtained.
得られた高純度テトラエトキシシランの分析結果を第1
表のb)欄に示す。The analysis results of the obtained high-purity tetraethoxysilane were
It is shown in column b) of the table.
なお分析は、誘導プラズマ発光分析計(株式会社島津製
作所製ICPV−100O3)、原子吸光分析計(株式
会社島津製作所製、AA−680G)および熱伝導度型
ガスクロマトグラフを用いて行った。The analysis was performed using an induced plasma emission spectrometer (ICPV-100O3, manufactured by Shimadzu Corporation), an atomic absorption spectrometer (AA-680G, manufactured by Shimadzu Corporation), and a thermal conductivity gas chromatograph.
第 1 表 #の単位はv/v ppm。Table 1 The unit of # is v/v ppm.
上記で得た高純度テトラエトキシシランを用いて下記の
条件で8102膜を形成し、その抵抗率を測定した。An 8102 film was formed using the high purity tetraethoxysilane obtained above under the following conditions, and its resistivity was measured.
蒸着方法 プラズマCVD
高周波出力 400W
テトラエトキシシラン流量
20 cc/mjn
O2流量 300 cc/min
蒸着基板 41nchシリコンウ工ハー炉内温度
320℃
蒸着速度 15 nm/min
蒸着膜厚 150nm
デジタルエレクトロメータ(アトパンテスト株式会社製
のTR−8411型)を用いての5iO−膜抵抗率の測
定結果は、6x10+aΩcmであり、半導体グレート
として充分に満足しつるものであった。Vapor deposition method Plasma CVD High frequency output 400W Tetraethoxysilane flow rate 20 cc/mjn O2 flow rate 300 cc/min Vapor deposition substrate 41nch silicon wafer furnace temperature
320°C Deposition rate: 15 nm/min Deposited film thickness: 150 nm The 5iO- film resistivity measured using a digital electrometer (model TR-8411 manufactured by Atopan Test Co., Ltd.) was 6 x 10 + aΩcm, which is sufficient as a semiconductor grade. I was satisfied with it.
なお、原料の粗テトラエトキシシランを用いてのSiO
□膜抵抗率は、9X10”である。In addition, SiO using crude tetraethoxysilane as a raw material
□Membrane resistivity is 9×10”.
実施例2
実施例1で用いたCC−5タイプおよびCC−rタイプ
の2種のキトサン系キレート樹脂各4g、合計8gを窒
素気流下に100’Cで脱水、脱ガスした後、ロータリ
ーエバポレーターの回転フラスコ中に投入し、ついで、
第2表のa)欄に示した量の不純物を含有する粗トリエ
トキシメチルシラン500m1を同じ回転フラスコ中に
投入し、全系を窒素置換後、室温下で32時間回転接触
反応を行った。Example 2 4 g each of the two chitosan-based chelate resins of the CC-5 type and CC-r type used in Example 1, a total of 8 g, were dehydrated and degassed at 100'C under a nitrogen stream, and then placed in a rotary evaporator. Pour into a rotating flask, then
500 ml of crude triethoxymethylsilane containing the amount of impurities shown in column a) of Table 2 was charged into the same rotating flask, and after purging the entire system with nitrogen, a rotating contact reaction was carried out at room temperature for 32 hours.
次に、ロータリーエバポレーターの回転フラスコを加温
浴に入れ、液温を61〜64°Cに保った状態で40
Torrまで減圧蒸留を行い、投入したキトサン系キレ
ート樹脂を缶残液と共に回転フラスコに残した。蒸留受
器に留出液が350m1留出した時点で系内圧を窒素ガ
スでl OOTorrまで戻すと共に、加温を停止し、
減圧蒸留を終了した。Next, place the rotating flask of the rotary evaporator in a heating bath, and keep the liquid temperature at 61-64°C for 40 minutes.
Distillation was performed under reduced pressure to Torr, and the chitosan-based chelate resin that had been introduced was left in the rotary flask together with the remaining liquid from the can. When 350 ml of distillate has been distilled into the distillation receiver, the internal pressure of the system is returned to 1 OOTorr with nitrogen gas, and heating is stopped.
Vacuum distillation was completed.
最後に、受器に得られた留出物にガス吹き込み用多孔管
より窒素ガスを100 Torr下で60分間吹き込み
、系中に微量含有されているエタノールを系外に放散さ
せ、目的とする高純度の精製トリエトキシメチルシラン
を得た。Finally, nitrogen gas is blown into the distillate obtained in the receiver for 60 minutes at 100 Torr through a gas blowing porous tube to diffuse the trace amount of ethanol contained in the system to the outside of the system and achieve the desired high temperature. Purified triethoxymethylsilane of high purity was obtained.
得られた高純度トリエトキシメチルシランの分析結果を
第2表のb)欄に示す。The analysis results of the obtained high purity triethoxymethylsilane are shown in column b) of Table 2.
#の単位はv/v ppm。The unit of # is v/v ppm.
発明の効果
以上のように本発明の方法によれば、半導体素子の絶縁
膜原料あるいは光ファイバーの原料の如き用途にも適合
する高純度のアルコキシシランを工業的に製造すること
ができる。Effects of the Invention As described above, according to the method of the present invention, it is possible to industrially produce a high-purity alkoxysilane suitable for uses such as a raw material for insulating films of semiconductor devices or a raw material for optical fibers.
Claims (1)
触処理する工程A、前工程A終了後、減圧蒸留によりア
ルコキシシランを前記キレート樹脂から留出液として分
離する工程B、前工程Bで得られた留出液に減圧下に不
活性ガスを導入し、系中にすでに含まれあるいは新たに
副生する揮発性成分を揮散除去する工程Cからなること
を特徴とする高純度アルコキシシランの製造方法。 2、工程Aをロータリーエバポレーターを用いて該エバ
ポレーターを回転させながら行い、工程A終了後そのエ
バポレーターを用いて引き続き工程Bを実施することを
特徴とする請求項1記載の製造方法。 3、工程Aで用いるキトサン系キレート樹脂が、キトサ
ンを主鎖とし、かつポリアミン型、イミノジ酢酸型およ
び芳香族カルボン酸型よりなる群から選ばれた少なくと
も1種の配位基を有する樹脂である請求項1記載の製造
方法。 4、アルコキシシランがテトラエトキシシランである請
求項1記載の製造方法。[Scope of Claims] 1. Step A in which crude alkoxysilane is contacted with a chitosan-based chelate resin, Step B in which after completion of the preceding step A, the alkoxysilane is separated from the chelate resin as a distillate by vacuum distillation, and the preceding step High-purity alkoxy characterized by comprising step C of introducing an inert gas under reduced pressure into the distillate obtained in step B to volatilize and remove volatile components already contained in the system or newly produced as by-products. Method of manufacturing silane. 2. The manufacturing method according to claim 1, wherein step A is carried out using a rotary evaporator while rotating the evaporator, and after step A is completed, step B is carried out subsequently using the evaporator. 3. The chitosan-based chelate resin used in step A is a resin that has chitosan as its main chain and at least one type of coordination group selected from the group consisting of polyamine type, iminodiacetic acid type, and aromatic carboxylic acid type. The manufacturing method according to claim 1. 4. The manufacturing method according to claim 1, wherein the alkoxysilane is tetraethoxysilane.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2193524A JPH0747594B2 (en) | 1990-07-20 | 1990-07-20 | Method for producing high-purity alkoxysilane |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2193524A JPH0747594B2 (en) | 1990-07-20 | 1990-07-20 | Method for producing high-purity alkoxysilane |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0482892A true JPH0482892A (en) | 1992-03-16 |
| JPH0747594B2 JPH0747594B2 (en) | 1995-05-24 |
Family
ID=16309508
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2193524A Expired - Fee Related JPH0747594B2 (en) | 1990-07-20 | 1990-07-20 | Method for producing high-purity alkoxysilane |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0747594B2 (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1996037434A1 (en) * | 1995-05-26 | 1996-11-28 | Mitsubishi Chemical Corporation | Synthetic quartz glass powder, quartz glass moldings, high purity tetraalkoxysilane, and production methods thereof |
| JP2004256479A (en) * | 2003-02-27 | 2004-09-16 | Tosoh Corp | Material for insulating film containing organic silane compound, method for producing the same and semiconductor device |
| JP2011500523A (en) * | 2007-10-12 | 2011-01-06 | エボニック デグサ ゲーエムベーハー | Removal of polar organic compounds and different metals from organosilanes |
| JP2012511529A (en) * | 2008-12-11 | 2012-05-24 | エボニック デグサ ゲーエムベーハー | Purification of silicon compounds |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59204133A (en) * | 1983-05-04 | 1984-11-19 | Kyowa Chem Ind Co Ltd | Removal of alkali metal in organic compound |
| JPS60215003A (en) * | 1984-04-10 | 1985-10-28 | Unitika Ltd | Chitosan molding and its production |
| JPS62266196A (en) * | 1986-05-12 | 1987-11-18 | Lion Corp | Water-soluble heavy metal ion scavenger |
-
1990
- 1990-07-20 JP JP2193524A patent/JPH0747594B2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59204133A (en) * | 1983-05-04 | 1984-11-19 | Kyowa Chem Ind Co Ltd | Removal of alkali metal in organic compound |
| JPS60215003A (en) * | 1984-04-10 | 1985-10-28 | Unitika Ltd | Chitosan molding and its production |
| JPS62266196A (en) * | 1986-05-12 | 1987-11-18 | Lion Corp | Water-soluble heavy metal ion scavenger |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1996037434A1 (en) * | 1995-05-26 | 1996-11-28 | Mitsubishi Chemical Corporation | Synthetic quartz glass powder, quartz glass moldings, high purity tetraalkoxysilane, and production methods thereof |
| JP2004256479A (en) * | 2003-02-27 | 2004-09-16 | Tosoh Corp | Material for insulating film containing organic silane compound, method for producing the same and semiconductor device |
| JP2011500523A (en) * | 2007-10-12 | 2011-01-06 | エボニック デグサ ゲーエムベーハー | Removal of polar organic compounds and different metals from organosilanes |
| JP2012511529A (en) * | 2008-12-11 | 2012-05-24 | エボニック デグサ ゲーエムベーハー | Purification of silicon compounds |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0747594B2 (en) | 1995-05-24 |
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| LAPS | Cancellation because of no payment of annual fees |