JPH0499006A - Magnetostriction film for magnetostriction - Google Patents

Magnetostriction film for magnetostriction

Info

Publication number
JPH0499006A
JPH0499006A JP2169629A JP16962990A JPH0499006A JP H0499006 A JPH0499006 A JP H0499006A JP 2169629 A JP2169629 A JP 2169629A JP 16962990 A JP16962990 A JP 16962990A JP H0499006 A JPH0499006 A JP H0499006A
Authority
JP
Japan
Prior art keywords
film
magnetostrictive
less
magnetostriction
magnetic field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2169629A
Other languages
Japanese (ja)
Inventor
Mitsuaki Ikeda
満昭 池田
Shigehiro Ogata
緒方 茂宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yaskawa Electric Corp
Original Assignee
Yaskawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yaskawa Electric Corp filed Critical Yaskawa Electric Corp
Priority to JP2169629A priority Critical patent/JPH0499006A/en
Publication of JPH0499006A publication Critical patent/JPH0499006A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Thin Magnetic Films (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は磁歪効果を利用した磁歪式アクチュエータに用
いられる磁歪薄膜に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a magnetostrictive thin film used in a magnetostrictive actuator that utilizes the magnetostrictive effect.

[従来の技術] 今日のマイクロエレクトロニクスの発展jこよる電気素
子の小形化・マイクロ化は、単にコンパクトな機械の実
現という外観的な問題だけでなく、従来到底不可能であ
った機能的、質的な進歩をもたらしており、このような
メカニズムのマイクロ化に対する重要な課題として小形
で高出力の磁歪式アクチュエータの開発が要求されてい
る。
[Prior art] Today's development of microelectronics has led to the miniaturization and miniaturization of electrical elements, which is not only an issue of appearance such as realizing compact machines, but also improvements in functionality and quality that were previously impossible. The development of compact, high-output magnetostrictive actuators is required as an important issue in the miniaturization of such mechanisms.

磁歪式アクチュエータは、磁性材料に磁界を印加すると
材料の寸法が変化するジュール効果を利用したものであ
り、従来、その磁性薄膜としては、希土類とFeとの合
金を中心にして研究が行われており、たとえばSmFa
h TbFe*などがその例である。
Magnetostrictive actuators utilize the Joule effect, which causes the dimensions of a magnetic material to change when a magnetic field is applied to it, and conventional research has focused on alloys of rare earths and Fe as magnetic thin films. For example, SmFa
An example is hTbFe*.

[発明が解決しようとする課題〕 磁歪式アクチエエータの磁歪膜に要求される特性として
は、 ■磁気変化に対する変位量を大きくし、特性を向上させ
るために飽和磁歪定数(λS)が大きい。
[Problems to be Solved by the Invention] Characteristics required of the magnetostrictive film of the magnetostrictive actuator include: (1) A large saturation magnetostriction constant (λS) in order to increase the amount of displacement in response to magnetic changes and improve the characteristics.

■小形化のために動作磁界が小さい。■The operating magnetic field is small due to the miniaturization.

■温度変化に対する影響を小さくするため、熱膨張係数
(α)が小さい。
■The coefficient of thermal expansion (α) is small to reduce the influence of temperature changes.

ことが必要である。It is necessary.

ところで、現状の磁歪材料合金として知られているrt
pes(Rは希土類元素)の磁界に対する磁歪定数は、
第3図の磁界−磁歪定数特性曲線に示すように大きな値
を得ることができるが、磁界の強さとして数10にθ、
を要し、低磁界で動作するDyFe5でも、230XI
O−”の飽和磁歪定数を得るにはIKθ、の磁界を必要
とし、これでは機器の小形化が望めない。マイクロ領域
で使うためには少なくとも十数θ、で200X10−’
以上の磁歪定数を必要とする。さらに、希土類元素を含
む材料の熱膨張係数は10〜20×10−@/℃と大き
く、前述の要求を満たすことができなかった。
By the way, rt, which is known as the current magnetostrictive material alloy,
The magnetostriction constant of pes (R is a rare earth element) with respect to the magnetic field is
As shown in the magnetic field-magnetostriction constant characteristic curve in Figure 3, large values can be obtained;
230XI even with DyFe5, which requires
In order to obtain a saturation magnetostriction constant of O-'', a magnetic field of IKθ is required, and with this, it is not possible to downsize the device.For use in the micro area, at least a dozen θ is required, which is 200X10-'.
or higher magnetostriction constant is required. Furthermore, the thermal expansion coefficient of materials containing rare earth elements is as large as 10 to 20×10 −@/° C., and the above-mentioned requirements could not be met.

このため、前述の要件を満たし、製造が容易な磁歪材料
が望まれている。
Therefore, a magnetostrictive material that satisfies the above-mentioned requirements and is easy to manufacture is desired.

[課題を解決するための手段] 本発明者は、上記の課題に対して研究を重ね、アクチュ
エータ材料に真空技術を用いて低熱膨張係数を有するイ
ンバー形合金を350℃以上で厚さ2μm以下に薄膜形
成し、または、350℃未満で厚さ2μm以下に薄膜形
成し、これを350℃以上でアニールすることにより、
10 θ、で飽和磁歪定数の絶対値が200XI01を
超える磁歪膜を形成させた。
[Means for Solving the Problems] The present inventor has conducted repeated research to solve the above problems, and has developed an invar type alloy having a low coefficient of thermal expansion using vacuum technology for the actuator material to a thickness of 2 μm or less at temperatures of 350°C or higher. By forming a thin film, or by forming a thin film with a thickness of 2 μm or less at less than 350°C and annealing it at 350°C or more,
A magnetostrictive film having an absolute value of the saturation magnetostriction constant exceeding 200×I01 was formed at 10 θ.

[作用コ 磁歪材料を薄膜化することにより、飽和磁歪定数の絶対
値をバルク材の場合に比して著しく増大させることがで
きる理由は明らかでないが、磁歪は磁性材料に磁界を加
えると材料の寸法が変化する現象であり、磁化をになっ
ているFe、C。
[The reason why the absolute value of the saturation magnetostriction constant can be significantly increased by making the magnetostrictive material thinner than in the case of bulk material is not clear, but magnetostriction changes when a magnetic field is applied to a magnetic material. This is a phenomenon in which the dimensions change, and the magnetization of Fe and C.

Niなどの原子の配置いわゆる結晶構造が関係している
が、バルク材と薄膜では結晶構造が同してあっても、薄
膜になると圧倒的に欠陥の量が多くなり、その結果、平
均的原子間隔が異なり、このようなミクロ的な構造の相
違により磁歪の増大を生じるものではないかと考えられ
る。
This is related to the arrangement of atoms such as Ni, so-called crystal structure, but even if the bulk material and thin film have the same crystal structure, the thin film has an overwhelmingly large amount of defects, and as a result, the average atomic The spacing is different, and it is thought that this difference in microstructure causes an increase in magnetostriction.

なお、膜作製時の温度が350℃未満であると膜の結晶
化が不十分で保磁力が大きくなり、動作磁界を大きくす
る必要がある。
Note that if the temperature at the time of film formation is less than 350° C., the film will not be sufficiently crystallized and the coercive force will increase, making it necessary to increase the operating magnetic field.

また、真空技術による薄膜の形成で膜の保磁力を小さく
することができ、低磁界で磁歪定数を大きくするととも
に、薄膜材料として熱膨張係数の小さい合金を用いるの
で、磁歪の温度変化が小さく検出精度が向上する。
In addition, by forming the thin film using vacuum technology, the coercive force of the film can be reduced, increasing the magnetostriction constant in a low magnetic field, and using an alloy with a small coefficient of thermal expansion as the thin film material, so small temperature changes in magnetostriction can be detected. Improves accuracy.

[実施例コ 以下、本発明を実施例について詳述する。[Example code] Hereinafter, the present invention will be described in detail with reference to Examples.

熱膨張係数が5xtO−@/”C以下の特性をもつイン
バー形合金、たとえば32Ni−Fe、34Ni−Fe
、39Ni−Fe、63Fe−32Ni−5Co合金を
用い、真空蒸着法、スパッタ法、イオンプレーティング
法により磁歪薄膜を作製し、飽和磁歪定数を測定した。
Invar type alloys with a thermal expansion coefficient of 5xtO-@/”C or less, such as 32Ni-Fe, 34Ni-Fe
, 39Ni-Fe, and 63Fe-32Ni-5Co alloys, magnetostrictive thin films were prepared by vacuum evaporation, sputtering, and ion plating, and the saturation magnetostriction constants were measured.

たとえば、39Ni−Feをスパッタ法によって薄膜化
した例を示すと、石英基板をトリクレンおよび純水で洗
浄して二極式スパッタ装置内にセットし、真空槽内を3
XIO−@Torr以下に排気したあと、石英基板を1
50〜600℃の範囲でそれぞれ異なる温度に加熱した
状態に保持し、sx 1 (I’To r rのアルゴ
ンガスを導入して、ターゲット電圧−400V、電流0
.9Aでスパッタリングを行い、スパッタ時間を制御し
て種々の厚さの試料を作製した。
For example, to show an example in which 39Ni-Fe is made into a thin film by sputtering, a quartz substrate is cleaned with Triclean and pure water, set in a two-electrode sputtering device, and the inside of a vacuum chamber is
After evacuation to below XIO-@Torr, the quartz substrate is
They were heated to different temperatures in the range of 50 to 600°C, and sx 1 (I'Torr) argon gas was introduced, and the target voltage was -400 V and the current was 0.
.. Sputtering was performed at 9A, and samples with various thicknesses were prepared by controlling the sputtering time.

このようにして得られた磁性膜の飽和磁歪定数を測定し
た結果、基板温度350℃以上で作製した膜については
、第1図の曲線aに示すように膜厚が4μmまでは15
×lO−@であり、バルク材での飽和磁歪定数と殆ど変
わらなかったが、膜厚が3μm以下になると飽和磁歪定
数が急激に大きくなり、2μm以下では200×10−
’以上の値が得られた。
As a result of measuring the saturation magnetostriction constant of the magnetic film obtained in this way, it was found that for the film produced at a substrate temperature of 350°C or higher, as shown by curve a in Figure 1, the film thickness was 15 μm up to 4 μm.
×lO−@, which was almost the same as the saturation magnetostriction constant of the bulk material, but when the film thickness became 3 μm or less, the saturation magnetostriction constant suddenly increased, and at 2 μm or less, the saturation magnetostriction constant was 200 × 10−
' or more values were obtained.

この膜厚1.8μmの磁歪膜を選んで磁界を加え、磁歪
定数と磁界との関係を調へた結果は、第2図に示すよう
に100.で飽和している。
A magnetic field was applied to this magnetostrictive film with a thickness of 1.8 μm, and the relationship between the magnetostriction constant and the magnetic field was investigated. The results were as shown in Figure 2. It is saturated with

また、300℃以下で作製した膜については、保磁力が
大きいため、再び真空中400℃で30分アニールした
結果、同様の特性を得ることができた。
Furthermore, since the film produced at 300° C. or lower had a large coercive force, similar characteristics could be obtained by annealing it again in vacuum at 400° C. for 30 minutes.

他の材料についても実験した結果同様の傾向が得られ、
付表に膜厚を異にした各材料のlOθ。
As a result of experiments with other materials, similar trends were obtained.
The lOθ of each material with different film thickness is shown in the attached table.

における磁歪定数を測定した結果を示しており、膜厚が
薄い程大きい値が得られた。
The figure shows the results of measuring the magnetostriction constant of the film, and the thinner the film, the larger the value obtained.

付表 [発明の効果] 本発明は上述のように、磁歪アクチュエータ用磁歪膜を
、熱膨張係数の絶対値が5 x I O−”/℃以下の
インバー合金を350℃以上で厚さ2μm以下に真空薄
膜形成し、あるいは350℃未満で厚さ2μm以下に真
空薄膜形成して350℃以上でアニールするようにしで
あるから、低磁界で大きな飽和磁歪定数の絶対値が得ら
れ、変位を大きくとることができ、希土類元素を含まな
いので安価である。また小さな磁界で飽和するので、こ
の磁歪膜を利用するアクチュエータを小形化することが
でき、熱膨張係数が小さく、磁歪膜の温度補償を必要と
しないで検出精度の高い磁歪式アクチュエータを得られ
る効果がある。
Attached Table [Effects of the Invention] As described above, the present invention produces a magnetostrictive film for a magnetostrictive actuator by forming an invar alloy with an absolute value of thermal expansion coefficient of 5 x IO-"/°C or less at a temperature of 350°C or higher to a thickness of 2 μm or less. Since a vacuum thin film is formed, or a vacuum thin film is formed at a temperature below 350°C to a thickness of 2 μm or less and annealed at a temperature above 350°C, a large absolute value of the saturation magnetostriction constant can be obtained in a low magnetic field, and a large displacement can be obtained. It is inexpensive because it does not contain rare earth elements.Also, since it saturates with a small magnetic field, actuators using this magnetostrictive film can be made smaller.The coefficient of thermal expansion is small, and temperature compensation of the magnetostrictive film is required. This has the effect that a magnetostrictive actuator with high detection accuracy can be obtained without having to do so.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明による実施例磁歪膜の膜厚と飽和磁歪定
数との関係を示す特性曲線図、第2図は磁界に対する磁
歪定数の関係を示す特性曲線図、第3図は従来の磁歪材
料の磁界に対する磁歪定数の関係を示す特性曲線図であ
る。 第3図 膜厚(μm) 磁 界H(KOe) 磁界COe)
FIG. 1 is a characteristic curve diagram showing the relationship between the film thickness and saturation magnetostriction constant of a magnetostrictive film according to an embodiment of the present invention, FIG. 2 is a characteristic curve diagram showing the relationship between the magnetostriction constant and the magnetic field, and FIG. FIG. 3 is a characteristic curve diagram showing the relationship between the magnetostriction constant and the magnetic field of the material. Figure 3 Film thickness (μm) Magnetic field H (KOe) Magnetic field COe)

Claims (1)

【特許請求の範囲】 1 熱膨張係数の絶対値が5×10^−^6/℃以下の
インバー合金を350℃以上で厚さ2μm以下に真空薄
膜形成したことを特徴とする磁歪式アクチュエータ用磁
歪膜。 2 熱膨張係数の絶対値が5×10^−^6/℃以下の
インバー合金を350℃未満で厚さ2μm以下に真空薄
膜形成し、350℃以上でアニールしたことを特徴とす
る磁歪式アクチュエータ用磁歪膜。 3 前記合金が、Niを32〜39wt%含むNi−F
e系合金である請求項1または2記載の磁歪式アクチュ
エータ用磁歪膜。 4 前記真空薄膜が、スパッタ法、真空蒸着法、イオン
プレーティング法のいずれかで形成される請求項1また
は2記載の磁歪式アクチュエータ用磁歪膜。
[Scope of Claims] 1. For use in a magnetostrictive actuator, characterized in that an invar alloy having an absolute value of thermal expansion coefficient of 5×10^-^6/°C or less is formed into a vacuum thin film of 2 μm or less at a temperature of 350°C or higher. Magnetostrictive film. 2. A magnetostrictive actuator characterized in that an invar alloy having an absolute value of thermal expansion coefficient of 5×10^-^6/°C or less is formed into a vacuum thin film of 2 μm or less in thickness at less than 350°C, and annealed at 350°C or more. magnetostrictive film. 3 The alloy is Ni-F containing 32 to 39 wt% Ni.
The magnetostrictive film for a magnetostrictive actuator according to claim 1 or 2, which is an e-based alloy. 4. The magnetostrictive film for a magnetostrictive actuator according to claim 1 or 2, wherein the vacuum thin film is formed by any one of a sputtering method, a vacuum evaporation method, and an ion plating method.
JP2169629A 1990-06-26 1990-06-26 Magnetostriction film for magnetostriction Pending JPH0499006A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2169629A JPH0499006A (en) 1990-06-26 1990-06-26 Magnetostriction film for magnetostriction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2169629A JPH0499006A (en) 1990-06-26 1990-06-26 Magnetostriction film for magnetostriction

Publications (1)

Publication Number Publication Date
JPH0499006A true JPH0499006A (en) 1992-03-31

Family

ID=15890045

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2169629A Pending JPH0499006A (en) 1990-06-26 1990-06-26 Magnetostriction film for magnetostriction

Country Status (1)

Country Link
JP (1) JPH0499006A (en)

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