JPH0512776Y2 - - Google Patents

Info

Publication number
JPH0512776Y2
JPH0512776Y2 JP1988020657U JP2065788U JPH0512776Y2 JP H0512776 Y2 JPH0512776 Y2 JP H0512776Y2 JP 1988020657 U JP1988020657 U JP 1988020657U JP 2065788 U JP2065788 U JP 2065788U JP H0512776 Y2 JPH0512776 Y2 JP H0512776Y2
Authority
JP
Japan
Prior art keywords
probe
plate
circuit board
probe plate
lifting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988020657U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01129672U (fr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988020657U priority Critical patent/JPH0512776Y2/ja
Publication of JPH01129672U publication Critical patent/JPH01129672U/ja
Application granted granted Critical
Publication of JPH0512776Y2 publication Critical patent/JPH0512776Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1988020657U 1988-02-19 1988-02-19 Expired - Lifetime JPH0512776Y2 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988020657U JPH0512776Y2 (fr) 1988-02-19 1988-02-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988020657U JPH0512776Y2 (fr) 1988-02-19 1988-02-19

Publications (2)

Publication Number Publication Date
JPH01129672U JPH01129672U (fr) 1989-09-04
JPH0512776Y2 true JPH0512776Y2 (fr) 1993-04-02

Family

ID=31237211

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988020657U Expired - Lifetime JPH0512776Y2 (fr) 1988-02-19 1988-02-19

Country Status (1)

Country Link
JP (1) JPH0512776Y2 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4583890B2 (ja) * 2004-11-17 2010-11-17 日本電子株式会社 プローブ装置及びそれを備えた試料検査装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57205073U (fr) * 1981-06-25 1982-12-27
JPS6053067U (ja) * 1983-09-20 1985-04-13 株式会社富士通ゼネラル 回路基板の検査装置

Also Published As

Publication number Publication date
JPH01129672U (fr) 1989-09-04

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