JPH0514852B2 - - Google Patents
Info
- Publication number
- JPH0514852B2 JPH0514852B2 JP59202818A JP20281884A JPH0514852B2 JP H0514852 B2 JPH0514852 B2 JP H0514852B2 JP 59202818 A JP59202818 A JP 59202818A JP 20281884 A JP20281884 A JP 20281884A JP H0514852 B2 JPH0514852 B2 JP H0514852B2
- Authority
- JP
- Japan
- Prior art keywords
- emissivity
- temperature
- measurement object
- radiation
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0022—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation of moving bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/064—Ambient temperature sensor; Housing temperature sensor; Constructional details thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0831—Masks; Aperture plates; Spatial light modulators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/70—Passive compensation of pyrometer measurements, e.g. using ambient temperature sensing or sensing of temperature within housing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
- G01J5/802—Calibration by correcting for emissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0074—Radiation pyrometry, e.g. infrared or optical thermometry having separate detection of emissivity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Description
【発明の詳細な説明】
(1) 発明の分野
この発明は、走査形放射温度計を用いた鋼板等
の放射率および温度の測定装置に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION (1) Field of the Invention The present invention relates to an apparatus for measuring the emissivity and temperature of steel plates and the like using a scanning radiation thermometer.
(2) 従来技術
出願人は、たとえば特開昭57−161521号公報に
あるように、比較熱板と測定物体との距離を変化
させたときの放射検出器の出力変化から測定物体
の放射率を求める方法を提案している。(2) Prior art As disclosed in Japanese Patent Application Laid-open No. 57-161521, for example, the applicant has determined the emissivity of a measuring object from the change in the output of a radiation detector when the distance between the comparison hot plate and the measuring object is changed. We are proposing a method to find the .
しかしながら、この方法では、比較熱板を駆動
する装置が大型なものとなり、また、一点測定の
ため測定物体の広い範囲での放射率、温度パター
ンの測定が困難である等の問題点が生じている。 However, this method requires a large device to drive the comparative heating plate, and also has problems such as the difficulty of measuring the emissivity and temperature pattern over a wide range of the measurement object because of the single-point measurement. There is.
(3) 発明の目的
この発明の目的は、以上の点に鑑み、より簡便
に、測定物体の広い範囲での放射率、温度の測定
を可能とした物体の放射率および温度の測定装置
を提供することである。(3) Purpose of the Invention In view of the above points, the purpose of the present invention is to provide a device for measuring the emissivity and temperature of an object, which makes it possible to more easily measure the emissivity and temperature of the object over a wide range. It is to be.
(4) 発明の概要
この発明は、走査形放射温度計に測定物体を反
射した放射源からの放射エネルギーが入射したと
きと入射しないときの検出値の差と放射源温度に
関連する値との比である補正係数が測定物体の放
射率と所定の関係にあることに基いて放射率を求
め、この放射率から温度を求めるようにした物体
の放射率および温度の測定装置である。(4) Summary of the Invention This invention detects the difference in detected values between when radiant energy from a radiation source reflected from a measurement object is incident on a scanning radiation thermometer and when it is not, and the value related to the radiation source temperature. This is an apparatus for measuring the emissivity and temperature of an object, which calculates the emissivity based on the fact that a correction coefficient, which is a ratio, has a predetermined relationship with the emissivity of the object to be measured, and calculates the temperature from this emissivity.
(5) 発明の実施例
第1図は、この発明の一実施例を示す構成説明
図である。(5) Embodiment of the Invention FIG. 1 is a configuration explanatory diagram showing an embodiment of the invention.
図において、1は、紙面に対して垂直に走行す
る鋼板のような測定物体、2は、測定物体1の幅
方向を垂直に走査して測定物体1からの放射エネ
ルギーを検出するCCDまたは走査鏡等を用いた
走査形放射温度計、31,32は、走査形放射温
度計2の走査線上の両側に位置し走査形放射温度
計2の走査領域の測定物体1に放射エネルギーを
放射し測定物体1を反射した放射エネルギーが走
査形放射温度計2に入射するよう設けられた放射
源、4は、走査形放射温度計2、放射源31,3
2を支持し、放射源31,32の放射エネルギー
を放射する開口、走査形放射温度計2の放射エネ
ルギーを受光する開口を有する背景放射板(壁)、
5は、背景放射板4の温度を検出する熱電対、測
温抵抗体のような温度検出器、6は、走査形放射
温度計2、放射源31,32、温度検出器5の出
力信号が供給され、所定の演算処理を行い温度信
号を得るマイクロコンピユータ、パーソナルコン
ピユータ、あるいはアナログ回路を利用した演算
手段である。 In the figure, 1 is a measurement object such as a steel plate that runs perpendicular to the paper surface, and 2 is a CCD or scanning mirror that scans the width direction of the measurement object 1 perpendicularly to detect the radiant energy from the measurement object 1. The scanning radiation thermometers 31 and 32 are located on both sides of the scanning line of the scanning radiation thermometer 2, and emit radiant energy to the measurement object 1 in the scanning area of the scanning radiation thermometer 2. A radiation source 4 is provided so that the radiant energy reflected from 1 is incident on the scanning radiation thermometer 2; 4 is the scanning radiation thermometer 2;
2, a background radiation plate (wall) having an opening that emits the radiant energy of the radiation sources 31 and 32, and an opening that receives the radiant energy of the scanning radiation thermometer 2;
5 is a temperature detector such as a thermocouple or a resistance temperature detector for detecting the temperature of the background radiation plate 4; 6 is a scanning radiation thermometer 2, radiation sources 31 and 32, and an output signal of the temperature detector 5; This is a calculation means using a microcomputer, a personal computer, or an analog circuit.
なお、走査形放射温度計2は、以下、1軸(−
次元)走査形のものについて説明するが、面走査
形についてでも同様で、放射源31,32は、1
個でもよく、また背景放射板4は、通常の壁面で
もよい。 In addition, the scanning radiation thermometer 2 will be described below with one axis (-
The explanation will be given for the scanning type (dimensional) scanning type, but the same applies to the surface scanning type, and the radiation sources 31 and 32 are 1
Alternatively, the background radiation plate 4 may be a normal wall surface.
測定物体1の温度をT、放射率をε、反射率を
ρ、放射源31,32の温度をTr、放射率をεr、
背景放射板4の温度をTw、走査形放射温度計2
の出力信号をE(S)、温度Tの黒体の放射エネルギ
ーをE(T)とする。 The temperature of the measurement object 1 is T, the emissivity is ε, the reflectance is ρ, the temperature of the radiation sources 31 and 32 is Tr, the emissivity is εr,
Tw the temperature of the background radiation plate 4, scanning radiation thermometer 2
The output signal of is E(S), and the radiant energy of a black body at temperature T is E(T).
走査形放射温度計2が、測定物体1を走査する
と第2図のように、放射源31,32からの放射
エネルギーが入射したときに、高い出力信号が得
られる。 When the scanning radiation thermometer 2 scans the measurement object 1, a high output signal is obtained when radiant energy from the radiation sources 31 and 32 is incident, as shown in FIG.
放射源31,32からの放射エネルギーが走査
形放射温度計2に入射したときの出力信号をE
(S1)、入射しないときの出力信号をE(S2)とす
ると次式が成り立つ。 The output signal when the radiation energy from the radiation sources 31 and 32 enters the scanning radiation thermometer 2 is expressed as E.
(S 1 ), and the output signal when it is not incident is E(S 2 ), the following equation holds true.
E(S1)=εE(T)+αρεrE(Tr)
+βρE(Tw) ……(1)
E(S2)=εE(T)+ρE(Tw)
=εE(T)+αρE(Tw)
+βρE(Tw) ……(2)
ここで、αは放射源31,32からの放射エネ
ルギーが測定物体1で反射され走査形放射温度計
2に入射する割合、βは背景放射板4からの放射
エネルギーが測定物体1で反射され走査形放射温
度計2に入射する割合でα+β=1である。 E(S 1 )=εE(T)+αρεrE(Tr) +βρE(Tw) ...(1) E(S 2 )=εE(T)+ρE(Tw) =εE(T)+αρE(Tw) +βρE(Tw) ...(2) Here, α is the ratio of the radiation energy from the radiation sources 31 and 32 reflected by the measurement object 1 and incident on the scanning radiation thermometer 2, and β is the ratio of the radiation energy from the background radiation plate 4 to the measurement object 1 and enters the scanning radiation thermometer 2, α+β=1.
つまり、走査形放射温度計2が放射源31,3
2を見たときの(1)式の右辺第1項は測定物体1自
体からの放射エネルギー、第2項は放射源31,
32からの放射エネルギー、第3項は背景放射板
4からの放射エネルギーの寄与分で、走査形放射
温度計2が放射源31,32を見ないときの(2)式
の右辺では放射源31,32の影響はなく、背景
放射板4からの寄与分のみとなつている。 In other words, the scanning radiation thermometer 2
2, the first term on the right side of equation (1) is the radiation energy from the measurement object 1 itself, and the second term is the radiation source 31,
32, the third term is the contribution of the radiant energy from the background radiation plate 4, and on the right side of equation (2) when the scanning radiation thermometer 2 does not see the radiation sources 31 and 32, the radiation source 31 , 32, and only the contribution from the background radiation plate 4.
(1)、(2)式は辺々差し引くと次式となる。 When formulas (1) and (2) are subtracted, the following formula is obtained.
E(S1)−E(S2)
=αρ{εrE(Tr)−E(Tw)}
αρ=[E(S1)−E(S2)]
/[εrE(Tr)−E(Tw)] ……(3)
ここで左辺をkとおき、この左辺kの値はその
右辺から測定で求めることができるものである。 E(S 1 ) − E(S 2 ) = αρ {εrE(Tr) − E(Tw)} αρ = [E(S 1 ) − E(S 2 )] / [εrE(Tr) − E(Tw) ] ...(3) Here, let the left side be k, and the value of this left side k can be obtained by measurement from the right side.
一方、k=αρと放射率εとの関係は、次式で
示すように1次の関係式にあることが実験により
見い出された。 On the other hand, it has been experimentally found that the relationship between k=αρ and emissivity ε is a linear relational expression as shown in the following equation.
ε=A−Bk=A−B(αρ) ……(4)
この関係を図示すると、第3図で示すように、
物体M1,M2の種別等により異なつた直線とな
る。係数A(A1,A2,……)、B(B1,B2,……)
は測定物体の種別ごとにあらかじめ実験で求めて
おく。 ε=A-Bk=A-B(αρ)...(4) To illustrate this relationship, as shown in Figure 3,
The straight lines differ depending on the types of objects M 1 and M 2 . Coefficients A (A 1 , A 2 , ...), B (B 1 , B 2 , ...)
is determined in advance through experiments for each type of object to be measured.
そこで、ε+ρ=1であることから、(2)式より
E(T)=E(S2)−(1−ε)E(Tw)/ε ……(5)
となり、この(5)式に(4)式から求めた放射率εを代
入し、測定物体1の真温度Tが求まる。 Therefore, since ε+ρ=1, E(T)=E(S 2 )−(1−ε)E(Tw)/ε ……(5) from equation (2), and this equation (5) By substituting the emissivity ε obtained from equation (4), the true temperature T of the measurement object 1 is found.
なお、以上の式で、背景放射板4の温度Twが
十分小さければ、Twは省略できる。 Note that in the above equation, if the temperature Tw of the background radiation plate 4 is sufficiently small, Tw can be omitted.
つまり、測定前に、演算手段6に含まれる記憶
手段に、放射源31,32の放射率εr、測定物体
1の種別に対応した係数A1,A2,……、B1,
B2,……をあらかじめ記憶させておき、測定物
体1の種別に従つて選択して読み出すことができ
るようにしておく。 That is, before measurement, the emissivity εr of the radiation sources 31 and 32 and the coefficients A 1 , A 2 , ..., B 1 , which correspond to the type of the measurement object 1 are stored in the storage means included in the calculation means 6.
B 2 , . . . are stored in advance so that they can be selected and read out according to the type of the measurement object 1.
測定時、走査形放射温度計2は、測定物体1を
走査し、各々走査位置Xiに対応した出力信号Ei
を演算手段6に供給する。このとき、たとえば、
E2,E5を走査位置X2,X5で放射源31,32を
走査したときの出力信号、E1,E3,E4,E6を放
射源31,32の放射エネルギーが測定物体1で
反射される位置X2,X5の両側の位置からの出力
信号とする。また、放射源31,32の温度信号
Tr、背景放射板4の温度Twを検出する温度検出
器5の出力信号も演算手段6に供給される。 During measurement, the scanning radiation thermometer 2 scans the measurement object 1 and outputs an output signal Ei corresponding to each scanning position Xi.
is supplied to the calculation means 6. At this time, for example,
E 2 and E 5 are the output signals when the radiation sources 31 and 32 are scanned at scanning positions X 2 and Let the output signals be from the positions on both sides of the positions X 2 and X 5 that are reflected at 1. In addition, temperature signals of the radiation sources 31 and 32
The output signal of the temperature detector 5 which detects the temperature Tw of the background radiation plate 4 is also supplied to the calculation means 6.
演算手段6は、
E2−E1+E3/2、E5−E4+E6/2のよな演算を行つて
(3)式の分子とし、Tr,Twを演算してE(Tr),
E(Tw)とし、εrを利用してεrE(Tr)−E(Tw)
の演算を行い(3)式の分母とし、(3)式からαρ=k
を求め、この2つのkとA,Bの値を用いて、(4)
式から2つの放射率εを求める。この2つの放射
率εの平均値を測定物体の放射率とし、各点Xi
の放射エネルギー検出信号Eiとともに(5)式に代入
し、各点の温度Tを求め、演算手段6の出力とす
ることができる。 The calculation means 6 performs calculations such as E 2 −E 1 +E 3 /2 and E 5 −E 4 +E 6 /2 to obtain the numerator of equation (3), and calculates Tr and Tw to obtain E(Tr). ,
E(Tw) and using εr, εrE(Tr)−E(Tw)
is calculated as the denominator of equation (3), and from equation (3) αρ=k
, and using these two values of k and A, B, (4)
Find the two emissivities ε from the formulas. The average value of these two emissivities ε is taken as the emissivity of the measurement object, and each point Xi
The temperature T at each point can be determined by substituting it into equation (5) together with the radiant energy detection signal Ei, and can be used as the output of the calculation means 6.
このように、放射源31,32を利用して、測
定物体1の放射率εを求め、各点の温度を求める
ことができる。あらかじめ放射率εを求めた後
は、放射源31,32の開口にシヤツタをし、連
続測定を行うようにしてもよい。 In this way, by using the radiation sources 31 and 32, the emissivity ε of the measurement object 1 can be determined, and the temperature at each point can be determined. After determining the emissivity ε in advance, the apertures of the radiation sources 31 and 32 may be shuttered to perform continuous measurements.
第4図は、他の実施例をしめし、第1図と同一
符号は同一構成要素を示す。この例では、3個の
放射源31,32,33は、測定物体1の法線に
対して走査形放射温度計2と互いに所定の角度を
もたせて設けられており、温度調節計71,7
2,73により所定の温度Trとなるように制御
されている。また、演算手段6の出力は、CRT
デイスプレイ74、アナログ記録計75に表示、
記録されるようになつている。また、放射率ε
は、放射源31,32,33の平均値ではなく、
測定物体1の走行方向に沿つて3ゾーンに分割
し、ゾーン毎の放射率としてもよい。 FIG. 4 shows another embodiment, in which the same reference numerals as in FIG. 1 indicate the same components. In this example, the three radiation sources 31, 32, 33 are provided at a predetermined angle to the scanning radiation thermometer 2 with respect to the normal to the measurement object 1, and the temperature controllers 71, 7
2 and 73, the temperature is controlled to a predetermined temperature Tr. In addition, the output of the calculation means 6 is
Displayed on display 74, analog recorder 75,
It is beginning to be recorded. Also, emissivity ε
is not the average value of radiation sources 31, 32, 33,
The measuring object 1 may be divided into three zones along the traveling direction, and the emissivity may be determined for each zone.
第5図は、他の実施例を示し、第1図、第4図
と同一符号は同一構成要素を示す。この例では、
1個の放射源31を、平行移動あるいは首振り走
査して、放射エネルギーを走査形放射温度計2の
走査線l上に沿つて放射する構成とし、ほぼ同一
点について放射源31からの放射エネルギーが入
射したときとしないときの走査形放射温度計2の
検出値に基いて走査線l上の各点毎の放射率εを
求め、この各点毎の放射率εから各点毎の温度T
の連続値が得られる。これらの演算は、記憶手段
を持つ演算手段6により行われる。このことによ
り、測定物体1の放射率の分布、変動に対しても
正確な温度測定ができる。 FIG. 5 shows another embodiment, in which the same reference numerals as in FIGS. 1 and 4 indicate the same components. In this example,
One radiation source 31 is configured to radiate radiant energy along the scanning line l of the scanning radiation thermometer 2 by moving in parallel or swinging, and the radiant energy from the radiation source 31 is radiated at approximately the same point. The emissivity ε of each point on the scanning line l is calculated based on the detected value of the scanning radiation thermometer 2 when the radiation is incident and when it is not, and the temperature T of each point is calculated from the emissivity ε of each point.
Continuous values are obtained. These calculations are performed by calculation means 6 having storage means. As a result, accurate temperature measurement can be performed even with respect to the distribution and fluctuation of the emissivity of the measurement object 1.
なお、走査形放射温度計2が面(二次元)走査
タイプの場合、その走査領域内に放射エネルギー
を放射する少くとも1個の放射源31、または、
その走査領域内に放射エネルギーを放射して走査
する放射源31を用いて、同様の演算で、放射
率、温度分布が得られる。 In addition, when the scanning radiation thermometer 2 is a surface (two-dimensional) scanning type, at least one radiation source 31 that emits radiant energy within the scanning area, or
Emissivity and temperature distribution can be obtained by similar calculations using a radiation source 31 that scans by emitting radiant energy into the scanning area.
(6) 発明の効果
あらかじめ、放射率と補正係数とが所定の関係
にあることを利用し、走査形放射温度計を用い
て、放射率、温度を測定するようにしているの
で、簡単な構成で、測定物体の広い範囲について
の放射率補正がされた正しい温度分布を測定する
ことができる。また、関係式の補正係数を変える
ことにより種々の物体に対応でき、複数の放射源
や放射源を走査することにより、より、正確で、
連続的な放射率、温度分布を測定できる。(6) Effects of the invention The emissivity and temperature are measured using a scanning radiation thermometer by taking advantage of the predetermined relationship between the emissivity and the correction coefficient, so the configuration is simple. With this, it is possible to measure the correct temperature distribution with emissivity correction over a wide range of the measurement object. In addition, by changing the correction coefficient of the relational expression, it can be applied to various objects, and by scanning multiple radiation sources and radiation sources, it can be more accurate and
Can measure continuous emissivity and temperature distribution.
第1図,第4図,第5図は、この発明の一実施
例を示す構成説明図、第2図は、動作説明用波形
図、第3図は、放射率と補正係数の関係図であ
る。
1……測定物体、2……走査形放射温度計、3
1,32,33……放射源、4……背景放射板、
5……温度検出器、6……演算手段。
1, 4, and 5 are configuration explanatory diagrams showing one embodiment of the present invention, FIG. 2 is a waveform diagram for explaining operation, and FIG. 3 is a relationship diagram between emissivity and correction coefficient. be. 1...Measurement object, 2...Scanning radiation thermometer, 3
1, 32, 33...radiation source, 4...background radiation plate,
5...Temperature detector, 6...Calculating means.
Claims (1)
ルギーを検出する走査形放射温度計と、この走査
形放射温度計の走査領域内の測定物体に放射エネ
ルギーを放射する少くとも1個の放射率εr、温度
Trの放射源と、背景放射板.温度Twを検出する
温度検出器とを備えるとともに、前記走査形放射
温度計に前記測定物体で反射した前記放射源から
の放射エネルギーが入射したときと入射しないと
きの2つの検出値の差E(S1)−E(S2)と温度検
出器などから求めた放射源および背景放射板が放
射する2つの放射エネルギーに関連する値の差
εrE(Tr)−E(Tw)との比である補正係数kを
求め、この補正係数kと測定物体の放射率εとが
あらかじめ実験で求めた1次の関係ε=A−Bk
(A、Bは定数)にあることに基いて放射率εを
求め、この放射率εから測定物体の温度Tを求め
る演算手段とを備えたことを特徴とする物体の放
射率および温度の測定装置。 2 前記放射率と補正係数との1次の関係式の係
数を測定物体の種別毎に少くとも1組記憶し選択
して演算する演算手段を備えたことを特徴とする
特許請求の範囲第1項記載の物体の放射率および
温度の測定装置。 3 前記放射源からの放射エネルギーが測定物体
で反射して走査形放射温度計に入射したときの検
出値と放射源からの放射エネルギーが測定物体で
反射するその反射位置近くからの放射エネルギー
の検出値との差を用いて放射率の演算を行うよう
にしたことを特徴とする特許請求の範囲第1項ま
たは第2項記載の物体の放射率および温度の測定
装置。 4 前記測定物体を垂直に走査する前記走査形放
射温度計の走査線上、または、前記測定物体の法
線に対して走査形放射温度計と互いに所定の角度
をもたせて放射源を設けたことを特徴とする特許
請求の範囲第1項から第3項のいずれかに記載の
物体の放射率および温度の測定装置。 5 前記測定物体に放射エネルギーを放射する複
数の前記放射源、または測定物体に放射エネルギ
ーを走査して放射する放射源を用いたことを特徴
とする特許請求の範囲第1項から第4項のいずれ
かに記載の物体の放射率および温度の測定装置。 6 前記放射源が放射エネルギーを放射する開口
を有する背景放射板を備えたことを特徴とする特
許請求の範囲第1項から第5項のいずれかに記載
の物体の放射率および温度の測定装置。[Claims] 1. A scanning radiation thermometer that scans a measurement object to detect radiant energy from the measurement object, and at least a scanning radiation thermometer that radiates radiant energy to the measurement object within the scanning area of the scanning radiation thermometer. One emissivity εr, temperature
Tr radiation source and background radiation plate. a temperature detector that detects a temperature Tw, and a difference E( A correction coefficient that is the ratio of S1) - E (S2) and the difference εrE (Tr) - E (Tw) between the values related to the two radiant energies emitted by the radiation source and the background radiation plate obtained from a temperature detector etc. k is calculated, and this correction coefficient k and the emissivity ε of the measurement object have a linear relationship ε=A−Bk determined in advance by experiment.
Measuring the emissivity and temperature of an object, comprising: calculation means for determining the emissivity ε based on the fact that (A and B are constants) and calculating the temperature T of the object to be measured from this emissivity ε. Device. 2. Claim 1, characterized in that it is equipped with a calculation means for storing, selecting and calculating at least one set of coefficients of the linear relational expression between the emissivity and the correction coefficient for each type of measurement object. Apparatus for measuring the emissivity and temperature of the object described in Section 1. 3 Detection value when the radiant energy from the radiation source is reflected by the measurement object and enters the scanning radiation thermometer, and detection of radiant energy from near the reflection position where the radiant energy from the radiation source is reflected by the measurement object. 3. An apparatus for measuring the emissivity and temperature of an object according to claim 1 or 2, characterized in that the emissivity is calculated using the difference between the emissivity and the emissivity. 4. A radiation source is provided on the scanning line of the scanning radiation thermometer that vertically scans the measurement object, or at a predetermined angle with respect to the scanning radiation thermometer with respect to the normal to the measurement object. An apparatus for measuring emissivity and temperature of an object according to any one of claims 1 to 3. 5. Claims 1 to 4, characterized in that a plurality of the radiation sources that radiate radiant energy to the measurement object or a radiation source that scans and radiates radiant energy to the measurement object are used. A device for measuring emissivity and temperature of an object according to any one of the above. 6. The device for measuring the emissivity and temperature of an object according to any one of claims 1 to 5, characterized in that the radiation source includes a background radiation plate having an aperture that emits radiant energy. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59202818A JPS6179123A (en) | 1984-09-27 | 1984-09-27 | Measuring instrument for emissivity and temperature of body |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59202818A JPS6179123A (en) | 1984-09-27 | 1984-09-27 | Measuring instrument for emissivity and temperature of body |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6179123A JPS6179123A (en) | 1986-04-22 |
| JPH0514852B2 true JPH0514852B2 (en) | 1993-02-26 |
Family
ID=16463705
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59202818A Granted JPS6179123A (en) | 1984-09-27 | 1984-09-27 | Measuring instrument for emissivity and temperature of body |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6179123A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0605055B1 (en) * | 1992-12-29 | 1997-08-06 | Koninklijke Philips Electronics N.V. | Pyrometer including an emissivity meter |
| JP4552735B2 (en) * | 2005-04-06 | 2010-09-29 | パナソニック株式会社 | Cooker |
| JP7396328B2 (en) * | 2021-05-14 | 2023-12-12 | Jfeスチール株式会社 | Temperature measurement method, temperature measurement device, and manufacturing method for zinc-based hot-dip coated steel sheet |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5876127U (en) * | 1981-11-19 | 1983-05-23 | 株式会社チノ− | Temperature measuring device for objects inside the heating furnace |
| JPS6060B2 (en) * | 1982-06-16 | 1985-01-05 | フランスベッド株式会社 | Bed device with toilet bowl |
-
1984
- 1984-09-27 JP JP59202818A patent/JPS6179123A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6179123A (en) | 1986-04-22 |
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