JPH0519012A - Burn-in tester - Google Patents

Abstract

PURPOSE:To process numerous integrated circuit devices (LSIs) and make a burn-in tester inexpensive and simple by providing a burn-in test board (BT board) on which only a plurality of are to be mounted, a BT board on which only a signal generator is to be mounted and common signal terminals on an inner wall of a BT furnace. CONSTITUTION:A burn-in tester comprises a burn-in test (BT) furnace 1 for setting inside to a test temperature equipped with a plurality of common power supply terminals A and a plurality of common single terminals B, C on an inner wall, a constant voltage power source 2 outside the furnace 1 to be connected to the terminal A via a wire, a signal generator board 6 equipped with signal generators 3a, 3b and having terminals to be connected to the terminal A and the terminals B, C, which is to be housed in the furnace 1, and BT boards 4 equipped with a plurality of LSIs 15 and connected to the terminal A and the terminals B, C via input/output lines of the LSI 15, which is housed in the furnace 4, wherein the boards 4 are connected in parallel. By thus mounting generators 3a, 3b on a single signal generation board 6 and wiring them inside the furnace, complex wiring outside and inside the furnace is not needed.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a burn-in test apparatus for removing an integrated circuit device having an intrinsic defect and a potential failure factor, and more particularly to a burn-in test apparatus having a signal generator for operating near an actual operating condition. .

[0002]

2. Description of the Related Art Conventionally, this type of burn-in test device is called a dynamic burn-in test device.
A burn-in board (hereinafter simply referred to as BT board) having a large number of integrated circuit devices (hereinafter simply referred to as LSI) mounted in a burn-in test furnace (hereinafter simply referred to as BT furnace) set at a high temperature is housed in the burn-in test furnace (hereinafter simply referred to as BT board). It is operated in an actual state, and a defective LSI path device is found and removed early.

FIG. 2 is a block diagram of a burn-in test apparatus showing a conventional example. As shown in FIG. 2, this burn-in test apparatus includes a BT board 4a having a plurality of LSIs attached thereto, and a BT furnace 1a for housing the BT board 4a.
And a constant voltage power source 2 and signal generators 7a and 7b outside the BT furnace 1a and connected to the common power supply terminal A, the signal common terminals B and C of the BT furnace 1a by wiring. Also,
The BT board 4a is connected to the ground terminal D, and
Was grounded.

3A and 3B show another conventional example, FIG. 3A is a block diagram of the entire burn-in test apparatus, and FIG. 3B is a circuit diagram of a BT board. As another example, as shown in FIGS. 2A and 2B, the signal generators 3a and 3b may be provided on the BT board 4b to which the LSI 5a is attached.

In any of the burn-in test devices, the LSI actually operates by the signal generator and the defective LSI is extracted by inspecting the operating state.

[0006]

However, in the above-mentioned conventional burn-in test apparatus, in the former case, the power supply and the input / output of the signal are performed through the wiring longer than the outside of the BT furnace, and not only the resistance loss but also the crosstalk are caused. Alternatively, since the signal waveform is blunted due to an increase in capacity, there is a drawback that an expensive signal generator corresponding to the distortion is required.

On the other hand, in the latter burn-in test equipment,
Since the signal generator is incorporated in the BT board, the number of LSIs mounted by that amount is reduced, and the number of processes is reduced. An object of the present invention is to provide a cheap and simple burn-in test apparatus that processes a large number of LSIs in order to solve such a problem.

[0008]

SUMMARY OF THE INVENTION A burn-in test apparatus according to the present invention is a burn-in test furnace in which a plurality of common power supply terminals and a plurality of common signal terminals are attached to an inner wall while a test temperature is set inside. A burn-in test furnace, which has a constant voltage power supply outside the power supply terminal and which is connected to the common power supply terminal through wiring, and a terminal to which a signal generator is attached and which is connected to the common power supply terminal and the common signal terminal. A first burn-in board to be housed in, a plurality of integrated circuit devices are attached, and the common power supply terminal and the common signal terminal are connected via input / output lines of the integrated circuit device and housed in the burn-in test furnace. Second burn-in board.

[0009]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings.

1 (a) and 1 (b) show an embodiment of the present invention, (a) is a block diagram of an apparatus, and (b) is a circuit diagram of a BT board. As shown in the figure, this burn-in test apparatus includes a BT furnace 1 in which the inside is set to a test temperature and a plurality of common power supply terminals A and a plurality of common signal terminals B and C are attached to the inner wall, and the BT furnace 1. A constant voltage power supply 2 which is located outside of 1 and is connected to the common power supply terminal A through a wiring.
A signal generating plate 6 which is a BT plate housed in the BT furnace 1 and which has terminals to which the signal generators 3a and 3b are attached and which are connected to the common power supply terminal A and the common signal terminals B and C; The LSI 5 is attached to the common power terminal A and the common signal terminals B and C via the input / output lines of the LSI, and the BT board 4 housed in the BT furnace is provided.

Although not shown in the drawing, the common signal terminals B and C and the common power supply terminal A are provided in common in the terminal row sockets to be plugged into each BT board 4, respectively. The terminal row socket is attached to the inner wall of the BT furnace, and the BT plates 4 are connected in parallel.

As described above, if the signal generator is mounted on one BT plate and wired inside the BT furnace 1, complicated wiring between the outside and inside of the BT furnace 1 becomes unnecessary, resulting in resistance loss and unnecessary. It is not necessary to consider the rounding of the signal waveform due to the increase in capacity, and a very simple signal generator will suffice.

Further, in this embodiment, one signal generating plate drives the LSI of a plurality of BT plates, but two or three signal generating plates may drive the BT plate group. Further, the number of signal generators mounted on one signal generating plate is not particularly limited.

[0014]

As described above, according to the present invention, the BT board in which only a plurality of LSIs accommodated in the BT furnace are mounted, and the L
A BT board on which only a signal generator that drives SI is mounted,
By providing the power supply common terminal of each BT board and the common signal terminal for inputting / outputting signals on the inner wall of the BT furnace, shorter signal lines and power supply lines can be connected in the BT furnace, so that more LSIs can be processed and more There is an effect that an inexpensive and simple burn-in test device can be obtained.

[Brief description of drawings]

1A and 1B show an embodiment of the present invention, FIG. 1A is a block diagram of an apparatus, and FIG. 1B is a circuit diagram of a BT board.

FIG. 2 is a block diagram of a burn-in test apparatus showing a conventional example.

3A and 3B show another conventional example, FIG. 3A is a block diagram of an entire burn-in test apparatus, and FIG. 3B is a circuit diagram of a BT board.

[Explanation of symbols]

 1, 1a BT furnace 2 constant voltage power supply 3a, 3b, 7a, 7b signal generator 4, 4a, 4b BT board 5, 5a LSI 6 signal generation board

Claims (1)

Claim: What is claimed is: 1. A burn-in test furnace in which a plurality of common power supply terminals and a plurality of common signal terminals are attached to an inner wall while a test temperature is set inside, and a burn-in test furnace outside the burn-in test furnace. A constant voltage power supply connected to a common power supply terminal through a wiring, a signal generator mounted terminal having a terminal connected to the common power supply terminal and the common signal terminal, and housed in the burn-in test furnace Second burn-in board to which a plurality of integrated circuit devices are attached and which are connected to the common power supply terminal and the common signal terminal through the input / output lines of the integrated circuit device and are housed in the burn-in test furnace A burn-in test apparatus comprising: