JPH05201048A - Thick film type thermal head and manufacture thereof - Google Patents
Thick film type thermal head and manufacture thereofInfo
- Publication number
- JPH05201048A JPH05201048A JP1444192A JP1444192A JPH05201048A JP H05201048 A JPH05201048 A JP H05201048A JP 1444192 A JP1444192 A JP 1444192A JP 1444192 A JP1444192 A JP 1444192A JP H05201048 A JPH05201048 A JP H05201048A
- Authority
- JP
- Japan
- Prior art keywords
- conductor
- glaze
- substrate
- thermal head
- thick film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 16
- 239000004020 conductor Substances 0.000 claims abstract description 71
- 238000007639 printing Methods 0.000 claims abstract description 11
- 239000011521 glass Substances 0.000 claims abstract description 9
- 238000000034 method Methods 0.000 claims abstract description 7
- 239000000758 substrate Substances 0.000 claims description 41
- 239000010931 gold Substances 0.000 claims description 32
- 238000010438 heat treatment Methods 0.000 claims description 10
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 7
- 238000010304 firing Methods 0.000 claims description 6
- 238000007650 screen-printing Methods 0.000 claims description 4
- 230000007547 defect Effects 0.000 abstract description 9
- 239000011148 porous material Substances 0.000 abstract description 9
- 230000001681 protective effect Effects 0.000 abstract description 7
- 239000000919 ceramic Substances 0.000 abstract description 5
- 230000008719 thickening Effects 0.000 abstract description 3
- 239000000470 constituent Substances 0.000 abstract 1
- 238000000206 photolithography Methods 0.000 description 6
- 229920002120 photoresistant polymer Polymers 0.000 description 6
- 238000005530 etching Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
Landscapes
- Electronic Switches (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、ファクシミリ、プリン
タ、ワープロ等の印字装置に用いる厚膜型サーマルヘッ
ド及びその製造方法に関し、詳細には基板上に在る導体
の膜厚がグレーズ上にある導体の膜厚よりも厚いことに
特徴がある厚膜型サーマルヘッド及びその製造方法に関
する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thick film type thermal head used in a printing apparatus such as a facsimile, a printer, a word processor, etc., and a method for manufacturing the same. The present invention relates to a thick film type thermal head characterized by being thicker than the film thickness of a conductor and a manufacturing method thereof.
【0002】[0002]
【従来の技術】印字装置に用いられる厚膜型サーマルヘ
ッドは、一般に図3(一部外観斜視図)及び図4(要部
断面図)に示す構造になっている。ここに示す厚膜型サ
ーマルヘッドは、セラミック等からなる絶縁基板30
と、絶縁基板30上に印字走査方向に設けられたグレー
ズ31と、このグレーズ31から一定間隔を置いて設け
られた別のグレーズ31aと、グレーズ31を互い違い
に横切るように基板30及びグレーズ31上に延設され
た一方の導体32及び他方の導体33と、グレーズ31
上に設けられた発熱抵抗体34と、これらの構成要素を
被覆する保護ガラス35(図4参照)とを備える。導体
32、33は、Auからなるのが一般的であり、発熱抵
抗体34の下部に等間隔で交互に接触し、それぞれ基板
30上からグレーズ31上の途中まで延びている。2. Description of the Related Art A thick film type thermal head used in a printing apparatus generally has a structure shown in FIG. 3 (partial external perspective view) and FIG. 4 (main part sectional view). The thick film type thermal head shown here is an insulating substrate 30 made of ceramic or the like.
A glaze 31 provided on the insulating substrate 30 in the print scanning direction, another glaze 31a provided at a constant interval from the glaze 31, and the substrate 30 and the glaze 31 so as to cross the glaze 31 alternately. The one conductor 32 and the other conductor 33 which are extended to the glaze 31
The heating resistor 34 provided above and the protective glass 35 (see FIG. 4) covering these components are provided. The conductors 32 and 33 are generally made of Au, and alternately contact the lower portion of the heating resistor 34 at equal intervals, and extend from the substrate 30 to the middle of the glaze 31.
【0003】このようなサーマルヘッドでは、任意の一
方の導体32とこれに隣接する他方の導体33との間に
通電すれば、この導体32、33間に在る1ドット分の
発熱抵抗体が発熱し、印字が行われる。In such a thermal head, when one conductor 32 and the other conductor 33 adjacent thereto are energized, a heating resistor for one dot located between the conductors 32, 33 is generated. Heat is generated and printing is performed.
【0004】[0004]
【発明が解決しようとする課題】前記サーマルヘッドで
は、発熱抵抗体34がグレーズ31によって基板30か
ら盛り上がる様相を呈するが、これはプラテンローラに
対する発熱抵抗体34の当接具合を良くするためであ
る。この場合、導体32は、基板30上に在る部分32
aと、グレーズ31上に在る部分32bとに分かれるこ
とになる(導体33も同様である)。In the above-mentioned thermal head, the heating resistor 34 is raised from the substrate 30 by the glaze 31. This is to improve the contact condition of the heating resistor 34 with the platen roller. . In this case, the conductor 32 is the portion 32 on the substrate 30.
a and a portion 32b existing on the glaze 31 (the same applies to the conductor 33).
【0005】ところで、Au導体32、33は印刷・焼
成により基板30とグレーズ31の表面に全体的に薄く
形成された後、フォトリソグラフィにより図3に示すよ
うなパターンに形成されるが、セラミック基板30の表
面には、突起や気孔(窪み)が存在することが多い。こ
のような場合、フォトリソグラフィにおけるエッチング
時に突起や気孔の影響を受けて、導体パターン以外の箇
所にAuが残留したり、導体パターンの一部が欠損した
りする不都合が生ずる。特に、導体パターンの間隔を一
層狭くして高密度にすると、突起や気孔により導体パタ
ーンが短絡する可能性が高くなる。By the way, the Au conductors 32 and 33 are thinly formed on the surfaces of the substrate 30 and the glaze 31 by printing and firing, and then are formed by photolithography into a pattern as shown in FIG. The surface of 30 often has protrusions and pores (recesses). In such a case, during etching in photolithography, due to the influence of projections and pores, there arises a disadvantage that Au remains in a portion other than the conductor pattern or a part of the conductor pattern is lost. In particular, if the intervals between the conductor patterns are made narrower and the density is higher, the conductor patterns are more likely to be short-circuited due to the protrusions and pores.
【0006】上記問題点を解決するために、導体の膜厚
を全体的に厚くすることも行われているが、単にAu膜
を厚くするだけでは、厚膜になり過ぎた部分(特に図3
に点線で囲んだ部分)でAuが発泡してしまい、所定の
導体パターンを形成することが不可能になる。従って、
本発明の目的は、基板の表面状態の影響を受けることな
く、導体の欠陥を少なくすることができると共に、所定
の導体を容易に形成することができる厚膜型サーマルヘ
ッド、並びにその製造方法を提供することにある。In order to solve the above problems, it has been attempted to increase the film thickness of the conductor as a whole. However, if the Au film is simply thickened, the portion becomes too thick (particularly in FIG. 3).
Au foams at the portion surrounded by the dotted line), and it becomes impossible to form a predetermined conductor pattern. Therefore,
An object of the present invention is to provide a thick film type thermal head capable of reducing defects of a conductor and easily forming a predetermined conductor without being affected by the surface condition of a substrate, and a manufacturing method thereof. To provide.
【0007】[0007]
【課題を解決するための手段】前記目的を達成するため
に、本発明の厚膜型サーマルヘッドは、従来の厚膜型サ
ーマルヘッドにおいて、基板上に在る導体の膜厚がグレ
ーズ上に在る導体の膜厚よりも厚いことを特徴とする。
又、このサーマルヘッドの製造方法は、従来の製造方法
において、基板上に在る導体の膜厚を、グレーズ上に在
る導体の膜厚よりも厚くする工程を有することを特徴と
する。In order to achieve the above object, the thick film type thermal head of the present invention is a conventional thick film type thermal head in which the thickness of the conductor on the substrate is on the glaze. It is characterized by being thicker than the film thickness of the conductor.
This thermal head manufacturing method is characterized in that, in the conventional manufacturing method, there is a step of making the film thickness of the conductor on the substrate larger than the film thickness of the conductor on the glaze.
【0008】この構成により、基板表面の突起や気孔に
よる凹凸が平滑化されるため、導体膜の形成後に行うフ
ォトリソグラフィにおいて、基板表面の突起に起因する
レジストの塗布不良によってエッチング時に導体パター
ンもエッチングされてしまうことがなくなるばかりか、
気孔(窪み)にレジストが必要以上に塗布され、現像に
よってレジストが剥離せず、エッチング後もAuが気孔
に残留してしまうことがなくなる。With this structure, the projections and irregularities due to the pores on the surface of the substrate are smoothed. Therefore, in photolithography performed after the formation of the conductor film, the conductor pattern is also etched at the time of etching due to resist coating failure due to the projections on the substrate surface. Not only will it not be done,
The resist is applied to the pores (recesses) more than necessary, the resist does not peel off due to development, and Au does not remain in the pores even after etching.
【0009】基板上の導体を厚膜にする具体的な工程と
しては、基板上に在る導体上に、ガラスフリット金をス
クリーン印刷すること、或いはレジネート金を繰り返し
印刷・焼成することが示される。但し、前者の工程では
1回の印刷で導体をかなり厚くすることができるが、後
者の工程では所定の導体膜厚を得るには印刷・焼成を何
回も繰り返す必要がある。As a specific step of thickening the conductor on the substrate, screen-printing glass frit gold on the conductor on the substrate or repeatedly printing and firing resinate gold is shown. .. However, in the former process, the conductor can be made considerably thicker by one printing, but in the latter process, printing and firing must be repeated many times to obtain a predetermined conductor film thickness.
【0010】なお、基板上の導体膜厚は、グレーズ上の
導体膜厚よりも厚ければ十分であるが、実際には以下の
実施例で図2のグラフに関して述べるように、導体を厚
くするほど導体パターンの欠陥数が減ることを考慮する
と、少なくとも1.0μm程度以上であることが好まし
い。It is sufficient that the conductor film thickness on the substrate is thicker than the conductor film thickness on the glaze, but actually the conductor film is thickened as described in the graph of FIG. 2 in the following embodiments. Considering that the number of defects in the conductor pattern decreases, it is preferable that the thickness is at least about 1.0 μm or more.
【0011】[0011]
【実施例】以下、本発明の厚膜型サーマルヘッド及びそ
の製造方法を実施例に基づいて説明する。但し、サーマ
ルヘッドの外観構造は図3に示す従来のものと変わらな
い。即ち、図1において、セラミック等からなる絶縁基
板10上にグレーズ11が印字走査方向に直線状に形成
されると共に、このグレーズ11から一定間隔を置いた
箇所にも別のグレーズ11aが形成されている。基板1
0上には、一方の導体12がグレーズ11を横切るよう
に設けられ、グレーズ11上には、このグレーズに沿っ
て発熱抵抗体14が設けられている。更に、これらの構
成要素は保護ガラス15で被覆されている。EXAMPLES A thick film type thermal head and a method of manufacturing the same according to the present invention will be described below based on examples. However, the external structure of the thermal head is the same as that of the conventional one shown in FIG. That is, in FIG. 1, a glaze 11 is linearly formed in the print scanning direction on an insulating substrate 10 made of ceramic or the like, and another glaze 11a is formed at a position spaced from the glaze 11 at a constant interval. There is. Board 1
On the 0, one conductor 12 is provided so as to cross the glaze 11, and on the glaze 11, a heating resistor 14 is provided along the glaze. Furthermore, these components are covered with a protective glass 15.
【0012】本発明の特徴である導体12は、Auから
なり、基板10上に在る部分12aの膜厚がグレーズ1
1上に在る部分12bの膜厚よりも厚くなっている。勿
論、一方の導体12と他方の導体(図1には示さず)
は、図3に示すように互い違いに等間隔でグレーズ11
を横切るようにパターン化されている。次に、上記厚膜
型サーマルヘッドの製造方法を簡潔に述べる。まず、セ
ラミック基板10の所定位置にグレーズ11を印字走査
方向に沿って設けた後、基板10及びグレーズ11の表
面全体に、従来通りにAuを印刷・焼成し、Au膜を形
成する。この段階で、グレーズ11上のAu導体12b
は所定の膜厚に成膜される。The conductor 12, which is a feature of the present invention, is made of Au, and the film thickness of the portion 12a on the substrate 10 is the glaze 1.
It is thicker than the film thickness of the portion 12b located above 1. Of course, one conductor 12 and the other conductor (not shown in FIG. 1)
Are staggered at equal intervals 11 as shown in FIG.
Is patterned to cross. Next, a method of manufacturing the thick film type thermal head will be briefly described. First, a glaze 11 is provided at a predetermined position on the ceramic substrate 10 along the print scanning direction, and then Au is printed and fired on the entire surfaces of the substrate 10 and the glaze 11 in the conventional manner to form an Au film. At this stage, the Au conductor 12b on the glaze 11
Is formed to have a predetermined film thickness.
【0013】次いで、基板10の表面に存在するAu膜
上に、このAu膜の厚さがグレーズ11の表面に存在す
るAu膜の厚さよりも厚くなるように、スクリーン印刷
によりガラスフリット金を印刷して硬化させる。これに
より、基板10の表面に在る突起や気孔による凹凸が平
滑化される。その後、フォトリソグラフィを行うため
に、所定厚になった基板10上のAu膜上にフォトレジ
ストを塗布し、適当な膜質に硬化させ、更に所定パター
ン(図3の導体32、33参照)を焼付けたフォトマス
クをフォトレジストの表面に密着させるか、或いは少し
離して位置合わせを行う。この後、UV光で露光し、現
像液で現像して、フォトマスクのパターンをフォトレジ
ストに転写する。Next, glass frit gold is printed on the Au film existing on the surface of the substrate 10 by screen printing so that the thickness of the Au film becomes thicker than the thickness of the Au film existing on the surface of the glaze 11. And cure. As a result, projections and depressions due to pores on the surface of the substrate 10 are smoothed. Then, in order to perform photolithography, a photoresist is applied onto the Au film on the substrate 10 having a predetermined thickness, the photoresist is cured to have an appropriate film quality, and a predetermined pattern (see the conductors 32 and 33 in FIG. 3) is baked. The photomask is brought into close contact with the surface of the photoresist, or is slightly separated for alignment. Then, it is exposed to UV light and developed with a developing solution to transfer the pattern of the photomask onto the photoresist.
【0014】残存するフォトレジストを保護マスクとし
て、保護マスクで覆われていないAu膜をパターン状に
エッチングした後、基板10上に残っているフォトレジ
ストを除去すれば、図3に示すようなAu導体パターン
が得られる。そして、グレーズ11上に発熱抵抗体14
を形成し、全体を保護ガラス15で被覆することによ
り、前記サーマルヘッドが製造される。Using the remaining photoresist as a protective mask, the Au film not covered with the protective mask is etched in a pattern, and then the remaining photoresist on the substrate 10 is removed. As shown in FIG. A conductor pattern is obtained. Then, the heating resistor 14 is formed on the glaze 11.
Is formed, and the whole is covered with the protective glass 15, whereby the thermal head is manufactured.
【0015】なお、上記製造方法は、ガラスフリット金
を用いたスクリーン印刷に関するものであるが、レジネ
ート金を用いた印刷・焼成の場合も殆ど同じであり、印
刷・焼成を繰り返して基板表面のAu膜を厚くした後、
フォトリソグラフィを前記と同様に行えばよい。本発明
の製造方法を用いれば欠陥の少ない導体が得られること
を図2にグラフで示す。このグラフは、導体幅20μm
で1700ラインにおけるAu導体の膜厚(μm)とそ
の導体パターンに発生した欠陥数(個)との関係を示
す。これによると、基板上の導体膜厚が厚くなるに従っ
て、パターンの欠陥数が減少することが分かる。従っ
て、このグラフからも、前述したように基板上に存在す
るAu膜の厚さは、少なくとも1.0μm程度以上であ
ることが好ましい。Although the above-mentioned manufacturing method relates to screen printing using glass frit gold, printing and firing using resinate gold is almost the same, and printing and firing are repeated to repeat Au on the substrate surface. After thickening the membrane,
Photolithography may be performed as described above. FIG. 2 is a graph showing that a conductor with few defects can be obtained by using the manufacturing method of the present invention. This graph shows a conductor width of 20 μm
Shows the relationship between the film thickness (μm) of the Au conductor in 1700 lines and the number of defects (pieces) generated in the conductor pattern. This shows that the number of pattern defects decreases as the conductor film thickness on the substrate increases. Therefore, also from this graph, as described above, the thickness of the Au film existing on the substrate is preferably at least about 1.0 μm or more.
【0016】[0016]
【発明の効果】以上説明したように、本発明の厚膜型サ
ーマルヘッドは、基板上に在る導体の膜厚がグレーズ上
に在る導体の膜厚よりも厚いため、基板の表面状態(突
起や気孔による凹凸)の影響を受けず、欠陥の少ない導
体を有し、信頼性が高い。又、本発明の製造方法は、基
板上に在る導体の膜厚を、グレーズ上に在る導体の膜厚
よりも厚くする工程を有するため、導体(Au膜)形成
後のフォトリソグラフィにおいて、所定パターン以外で
のAu残留や所定パターンでのAu欠損等の不都合が生
じず、欠陥の無い導体を容易に形成することができる。As described above, in the thick film type thermal head of the present invention, since the film thickness of the conductor on the substrate is thicker than the film thickness of the conductor on the glaze, the surface condition of the substrate ( It is not affected by projections and irregularities due to pores, has a conductor with few defects, and has high reliability. Further, since the manufacturing method of the present invention has a step of making the film thickness of the conductor on the substrate larger than the film thickness of the conductor on the glaze, in photolithography after the formation of the conductor (Au film), It is possible to easily form a conductor having no defect without causing inconvenience such as Au remaining in a pattern other than the predetermined pattern and Au loss in the predetermined pattern.
【図1】本発明の一実施例に係る厚膜型サーマルヘッド
の要部断面図である。FIG. 1 is a cross-sectional view of essential parts of a thick film thermal head according to an embodiment of the present invention.
【図2】Au導体の膜厚とその導体パターンの欠陥数と
の関係を示すグラフである。FIG. 2 is a graph showing the relationship between the film thickness of an Au conductor and the number of defects in its conductor pattern.
【図3】図1に示すサーマルヘッドの一部外観斜視図で
ある。FIG. 3 is a partial external perspective view of the thermal head shown in FIG.
【図4】従来例に係る厚膜型サーマルヘッドの要部断面
図である。FIG. 4 is a cross-sectional view of essential parts of a thick film thermal head according to a conventional example.
10 セラミック基板 11 グレーズ 12 Au導体 12a 基板表面上のAu導体 12b グレーズ上のAu導体 14 発熱抵抗体 15 保護ガラス 10 Ceramic Substrate 11 Glaze 12 Au Conductor 12a Au Conductor 12b on Substrate Surface Au Conductor on Glaze 14 Heating Resistor 15 Protective Glass
Claims (4)
したグレーズと、このグレーズを一定間隔を置いて横切
るように基板上からグレーズ上に延設した導体と、グレ
ーズ上にグレーズに沿って設けた発熱抵抗体とを備える
厚膜型サーマルヘッドにおいて、 基板上に在る導体の膜厚が、グレーズ上に在る導体の膜
厚よりも厚いことを特徴とする厚膜型サーマルヘッド。1. A substrate, a glaze formed in the print scanning direction on the substrate, a conductor extending from the substrate onto the glaze so as to cross the glaze at regular intervals, and along the glaze along the glaze. A thick-film thermal head comprising a heating resistor provided on the substrate, wherein the conductor on the substrate is thicker than the conductor on the glaze.
し、このグレーズを一定間隔を置いて横切るように基板
上からグレーズ上に導体を延設し、グレーズ上にグレー
ズに沿って発熱抵抗体を設けてなる厚膜型サーマルヘッ
ドの製造方法において、 基板上に在る導体の膜厚を、グレーズ上に在る導体の膜
厚よりも厚くする工程を有することを特徴とする厚膜型
サーマルヘッドの製造方法。2. A glaze is formed on a substrate in a print scanning direction, a conductor is extended from the substrate onto the glaze so as to cross the glaze at regular intervals, and a heating resistor is formed on the glaze along the glaze. In the method for manufacturing a thick film thermal head, the thick film thermal head is characterized by including the step of making the film thickness of the conductor on the substrate larger than the film thickness of the conductor on the glaze. Head manufacturing method.
スフリット金をスクリーン印刷することよりなることを
特徴とする請求項2記載の厚膜型サーマルヘッドの製造
方法。3. The method for manufacturing a thick film type thermal head according to claim 2, wherein said step comprises screen-printing glass frit gold on a conductor existing on the substrate.
ネート金を繰り返し印刷・焼成することよりなることを
特徴とする請求項2記載の厚膜型サーマルヘッドの製造
方法。4. The method for manufacturing a thick film type thermal head according to claim 2, wherein the step comprises repeatedly printing and firing resinate gold on a conductor existing on a substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1444192A JPH05201048A (en) | 1992-01-30 | 1992-01-30 | Thick film type thermal head and manufacture thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1444192A JPH05201048A (en) | 1992-01-30 | 1992-01-30 | Thick film type thermal head and manufacture thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH05201048A true JPH05201048A (en) | 1993-08-10 |
Family
ID=11861120
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1444192A Pending JPH05201048A (en) | 1992-01-30 | 1992-01-30 | Thick film type thermal head and manufacture thereof |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH05201048A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014201029A (en) * | 2013-04-08 | 2014-10-27 | アオイ電子株式会社 | Circuit board and thermal print head |
| JP2020085652A (en) * | 2018-11-26 | 2020-06-04 | 住友金属鉱山株式会社 | Conductive powder evaluation method |
-
1992
- 1992-01-30 JP JP1444192A patent/JPH05201048A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014201029A (en) * | 2013-04-08 | 2014-10-27 | アオイ電子株式会社 | Circuit board and thermal print head |
| JP2020085652A (en) * | 2018-11-26 | 2020-06-04 | 住友金属鉱山株式会社 | Conductive powder evaluation method |
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