JPH0522868Y2 - - Google Patents

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Publication number
JPH0522868Y2
JPH0522868Y2 JP1986087408U JP8740886U JPH0522868Y2 JP H0522868 Y2 JPH0522868 Y2 JP H0522868Y2 JP 1986087408 U JP1986087408 U JP 1986087408U JP 8740886 U JP8740886 U JP 8740886U JP H0522868 Y2 JPH0522868 Y2 JP H0522868Y2
Authority
JP
Japan
Prior art keywords
environmental test
air supply
constant temperature
temperature air
tank
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1986087408U
Other languages
Japanese (ja)
Other versions
JPS62199682U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to JP1986087408U priority Critical patent/JPH0522868Y2/ja
Publication of JPS62199682U publication Critical patent/JPS62199682U/ja
Application granted granted Critical
Publication of JPH0522868Y2 publication Critical patent/JPH0522868Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Description

【考案の詳細な説明】 産業上の利用分野 本考案は、温度、湿度等の環境を変えながら半
導体等の電子部品の通電試験を行なうための装置
の関するものである。
[Detailed Description of the Invention] Industrial Application Field The present invention relates to an apparatus for carrying out a current conduction test on electronic components such as semiconductors while changing environments such as temperature and humidity.

従来技術 従来のライン型環境試験装置としては、第2図
に示すように断熱材で覆われた環境試験装置1内
にベルトコンベア等の搬送手段2と、試験装置3
などが配置されたものにおいて、該環境試験室1
に対してダクト4を介して恒温空気供給装置5か
ら恒温空気を導入し、排出用のダクト6を介して
恒温空気供給装置5に戻して循環させる方式の装
置が知られている。恒温空気供給装置5は恒温空
気の排出口7、吸入口8及び外気導入口9とを有
し、装置内には除湿乾燥器10、空気循環用フア
ン11、冷凍サイクルの蒸発器12、ヒーター1
3等が装着されている。
Prior Art As shown in FIG. 2, a conventional line-type environmental testing device includes a conveying means 2 such as a belt conveyor, and a testing device 3 in an environmental testing device 1 covered with a heat insulating material.
etc., the environmental test chamber 1
On the other hand, an apparatus is known in which constant temperature air is introduced from a constant temperature air supply device 5 via a duct 4, and returned to the constant temperature air supply device 5 via an exhaust duct 6 for circulation. The constant temperature air supply device 5 has a constant temperature air outlet 7, an inlet 8, and an outside air inlet 9, and includes a dehumidifying dryer 10, an air circulation fan 11, a refrigeration cycle evaporator 12, and a heater 1.
3rd class is installed.

以上の構成において、環境試験室1内には、恒
温空気供給装置5からダクト4を介して恒温空気
が供給され、再び恒温空気はダクト6から吸引さ
れて空気供給装置5に戻る。
In the above configuration, constant temperature air is supplied into the environmental test chamber 1 from the constant temperature air supply device 5 via the duct 4, and the constant temperature air is sucked through the duct 6 again and returned to the air supply device 5.

考案が解決しようとする問題点 しかしながら、かかる従来の環境試験装置の場
合は、恒温空気をダクトを介して恒温空気供給装
置から導入するように構成されているので、ダク
ト周辺において熱損失があると共に、ダクトの径
により空気の循環風量が決まつてしまうといつた
不都合があつた。さらに環境試験室と恒温空気供
給装置とを別々に製作しダクトで接続する方式な
ので設置スペースが大きくなるといつた不都合が
あつた。
Problems to be solved by the invention However, in the case of such conventional environmental test equipment, constant temperature air is introduced from a constant temperature air supply device through a duct, so there is heat loss around the duct. However, there was an inconvenience that the volume of air circulation was determined by the diameter of the duct. Furthermore, since the environmental test chamber and the constant temperature air supply device are manufactured separately and connected through a duct, there is the disadvantage that the installation space becomes large.

そこで、本考案はかかる従来技術の欠点に鑑み
設置説明が狭くて済み、かつ熱損失の少ない環境
試験装置を提供することを目的とする。
SUMMARY OF THE INVENTION In view of the drawbacks of the prior art, it is an object of the present invention to provide an environmental testing device that requires less detailed installation instructions and has less heat loss.

問題を解決するための手段 すなわち本考案は、断熱材で覆われた環境試験
室と、該環境試験室内に設置された試験装置を搬
送するためのベルトコンベア等の搬送手段と、試
験装置の通電試験を行なうための試験装置とから
なるライン型環境試験装置において、前記環境試
験室内を仕切板を介して環境試験槽と恒温空気供
給槽とに吸入口及び排出口により各槽間を通電さ
せつつ区画し、恒温空気供給槽内を排出口付近に
設置されたブロワーと、吸入口付近に装着された
冷凍サイクルの蒸発器と、蒸発器とブロワーの中
間の位置に装着された加熱装置とで構成したライ
ン型環境試験装置により本目的を達成する。
Means to Solve the Problem In other words, the present invention consists of an environmental test chamber covered with a heat insulating material, a conveyance means such as a belt conveyor for conveying the test equipment installed in the environmental test chamber, and energization of the test equipment. In a line-type environmental test device consisting of a test device for conducting a test, the environmental test chamber is connected to an environmental test chamber and a constant temperature air supply tank through a partition plate, while supplying electricity between each tank through an inlet and an outlet. The constant-temperature air supply tank is divided into sections, consisting of a blower installed near the outlet, a refrigeration cycle evaporator installed near the intake port, and a heating device installed between the evaporator and the blower. This purpose is achieved using a line-type environmental testing device.

作 用 本考案にかかる環境試験装置では、吸入口から
吸引された空気は冷凍サイクルの蒸発器で冷やさ
れる。冷やされた空気は、加熱装置で所定の温度
に加熱され、排出口付近に設けたブロワーから環
境試験槽内に吹き出され、ベルトコンベアの上に
載置された電子部品等を所定の温度に保つ。環境
試験槽内の空気は、仕切板に設けた吸入口から吸
引され再び冷却され、恒温空気供給槽、環境試験
槽と循環する。
Function: In the environmental test device according to the present invention, air sucked through the suction port is cooled by the evaporator of the refrigeration cycle. The chilled air is heated to a predetermined temperature by a heating device, and then blown into the environmental test chamber from a blower installed near the outlet to maintain the electronic components placed on the belt conveyor at a predetermined temperature. . The air in the environmental test tank is sucked in through the inlet provided in the partition plate, cooled again, and circulated through the constant temperature air supply tank and the environmental test tank.

実施例 以下に本考案を図面に示された一実施例に従つ
て詳細に説明する。
Embodiment The present invention will be explained in detail below according to an embodiment shown in the drawings.

第1図において、20aは断熱材21で覆われ
たライン型の環境試験装置の環境試験室であり、
環境試験室20内は仕切板22を介して環境試験
槽23と恒温空気供給槽24とに仕切られてい
る。環境試験槽23内は電子部品等を搬送するベ
ルトコンベアの搬送装置25が敷設されている。
環境試験槽23と恒温空気供給槽24とを仕切つ
ている仕切板22には中央部の搬送装置25の側
部に吸入口26、搬送装置25の出入口部にあた
る環境試験槽23の両端部には排出口27a,2
7bがあけられており、両槽は連通している。恒
温空気供給槽24内は、排出口27a,27b付
近にブロワー28a,28bが装着されており、
また吸入口26付近には圧縮機29、凝縮器3
0、キヤピラリーチユーブ31と循環接続された
蒸発器32が装着されている。蒸発器32の出口
付近には、空気を所定の温度まで加熱するための
ヒーター33a,33bが装着されている。そし
て、恒温空気供給槽24は、環境試験槽23内の
空気圧を陽圧にするための圧縮空気供給装置34
と接続されている。尚、35は、恒温空気供給槽
24内の空気の流れを導くための案内板である。
また20bは異なる温度環境を作る環境試験室で
あり、内部の構造は前述のものと同じである。3
7は通電試験を行なうための試験装置である。
In FIG. 1, 20a is an environmental test chamber of a line-type environmental test device covered with a heat insulating material 21,
The interior of the environmental test chamber 20 is partitioned into an environmental test tank 23 and a constant temperature air supply tank 24 via a partition plate 22. Inside the environmental test tank 23, a belt conveyor conveyor device 25 for conveying electronic components and the like is installed.
The partition plate 22 that partitions the environmental test tank 23 and the constant temperature air supply tank 24 has an inlet 26 at the side of the transport device 25 in the center, and an inlet 26 at both ends of the environmental test tank 23 corresponding to the entrance and exit of the transport device 25. Discharge port 27a, 2
7b is opened, and both tanks are in communication. Inside the constant temperature air supply tank 24, blowers 28a and 28b are installed near the discharge ports 27a and 27b.
In addition, a compressor 29 and a condenser 3 are located near the suction port 26.
0, an evaporator 32 connected for circulation to a capillary reach tube 31 is installed. Heaters 33a and 33b are installed near the outlet of the evaporator 32 to heat the air to a predetermined temperature. The constant temperature air supply tank 24 is connected to a compressed air supply device 34 for making the air pressure inside the environmental test tank 23 positive.
is connected to. Note that 35 is a guide plate for guiding the flow of air within the constant temperature air supply tank 24.
Further, 20b is an environmental test chamber that creates different temperature environments, and its internal structure is the same as that described above. 3
Reference numeral 7 is a test device for carrying out an energization test.

以上述べた構成において、本考案にかかる装置
では、環境試験槽23内を搬送装置であるベルト
コンベア25に載置された電子部品等36が移動
する。その際環境試験槽23内には恒温空気供給
槽24内に装着されたブロワー28a,28bか
ら所定の温度の恒温空気が供給される。供給され
た恒温空気は、電子部品36等の所定の温度とな
るように加熱又は冷却する。加熱又は冷却された
空気は、仕切板22の中央に設けた吸入口26か
ら吸引され、冷凍サイクルの蒸発器32で冷却さ
れ、ヒーター33a,33bで所定の温度に加熱
される。加熱された空気は、案内板35に沿つて
流れ、排出口27a,27b付近に装着されたブ
ロワー28a,28bによつて排出口から排出さ
れる。ただ単に空気を循環するだけでは環境試験
槽23内が常圧の状態にあり、搬送装置の出入口
から空気が入り込むおそれがあるので、本実施例
では、恒温空気供給槽24を圧縮空気供給装置3
4と接続して、乾燥空気を導入し環境試験槽23
内を陽圧に保つている。
In the configuration described above, in the apparatus according to the present invention, the electronic components and the like 36 placed on the belt conveyor 25, which is a transport device, move within the environmental test tank 23. At this time, constant temperature air at a predetermined temperature is supplied into the environmental test tank 23 from blowers 28a and 28b installed in the constant temperature air supply tank 24. The supplied constant temperature air is heated or cooled to a predetermined temperature of the electronic components 36 and the like. The heated or cooled air is sucked through the suction port 26 provided at the center of the partition plate 22, cooled by the evaporator 32 of the refrigeration cycle, and heated to a predetermined temperature by the heaters 33a, 33b. The heated air flows along the guide plate 35 and is discharged from the discharge ports by blowers 28a, 28b mounted near the discharge ports 27a, 27b. If the air is simply circulated, the inside of the environmental test tank 23 will be in a normal pressure state, and there is a risk that air will enter from the entrance/exit of the conveying device.
4 and introduce dry air into the environmental test chamber 23.
Maintains positive pressure inside.

尚本実施例では、環境試験槽23と恒温空気供
給槽24を仕切板22に穴をあけた吸入口26、
排出口27a,27bを介して連通させるように
構成しているが、これに限定されるものではなく
第3図に示すように、第1図において恒温空気供
給槽24内に設けた案内板35と同一の位置にの
み空気を導くための仕切板22を設置し、環境試
験槽の両端部を排出口27a,27bとし、中央
部を吸入口26としたような構成であつても差し
支えない。
In this embodiment, the environmental test tank 23 and the constant temperature air supply tank 24 are separated by an inlet 26 which is a hole in the partition plate 22,
Although the configuration is such that the communication is made through the discharge ports 27a and 27b, the present invention is not limited thereto.As shown in FIG. 3, the guide plate 35 provided in the constant temperature air supply tank 24 in FIG. It is also possible to install a partition plate 22 to guide air only to the same position, and to use a configuration in which both ends of the environmental test tank are used as exhaust ports 27a and 27b, and the center part is used as an intake port 26.

以上述べたように本考案にかかる実施例では、
恒温空気供給装置自体が、断熱材で覆われた環境
試験装置内に装着されているので、エネルギーロ
スが少ない。また恒温空気供給槽内は案内板で空
気を導くように構成しているのでダクトは必要な
い。
As described above, in the embodiments of the present invention,
Since the constant-temperature air supply device itself is installed inside the environmental testing device covered with insulation, there is little energy loss. Furthermore, since the inside of the constant temperature air supply tank is configured to guide air with a guide plate, no duct is required.

効 果 本考案にかかるかかる装置では、ダクトを介し
て恒温空気を環境試験装置内に導いた従来の装置
と異なり、恒温空気供給装置を断熱材で覆われた
環境試験装置内に装着するように構成したので、
ダクトによる熱損失がなくなり、エネルギー効率
が良い。
Effects Unlike conventional devices in which constant-temperature air is guided into the environmental test device through a duct, the device according to the present invention has a constant-temperature air supply device installed inside the environmental test device covered with a heat insulating material. Since I configured it,
Heat loss through ducts is eliminated, resulting in high energy efficiency.

ダクトを介せずに空気を送風するように構成し
ているので従来の環境試験装置に比較して風量の
制限がなくなり、空気の循環率がきわめてよくな
る。さらに、外気を導入せずに圧縮空気除湿装置
等から乾燥空気を導入するように構成した場合に
は、低温状態から常温状態に戻す時に環境試験装
置内での結露がない。
Since it is configured to blow air without going through a duct, there is no restriction on air volume compared to conventional environmental test equipment, and the air circulation rate is extremely high. Furthermore, if the configuration is such that dry air is introduced from a compressed air dehumidifier or the like without introducing outside air, there is no dew condensation inside the environmental test apparatus when returning from a low temperature state to a room temperature state.

全体としてのエネルギー効率が上昇するので、
従来の装置に比較して、電力消費量が減少し、経
済的な装置を提供することができる。また従来の
環境試験装置が、環境試験槽と恒温空気供給装置
とを別個に設けていたが一体化したので、設置ス
ペースが小さくてよい。
As overall energy efficiency increases,
Compared to conventional devices, power consumption is reduced and an economical device can be provided. In addition, the conventional environmental test device had an environmental test tank and a constant temperature air supply device provided separately, but since they are integrated, the installation space can be small.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案にかかる一実施例を示す装置の
平面断面図、第2図は従来技術を示す装置の平面
断面図、第3図は本考案にかかる他の実施例を示
す装置の平面断面図である。 1……断熱材、2……搬送装置、3……環境試
験槽、4,6……ダクト、5……恒温空気供給装
置、7……排出口、8……吸入口、9……外気導
入口、10……除湿乾燥機、11……空気循環用
フアン、12……冷凍サイクルの蒸発器、13…
…ヒーター、20……環境試験室、21……断熱
材、22……仕切板、23……環境試験槽、24
……恒温空気供給槽、25……搬送装置、26…
…吸入口、27a,27b……排出口、28a,
28b……ブロワー、29……圧縮機、30……
凝縮器、31……キヤピラリーチユーブ、32…
…蒸発器、33a,33b……ヒーター、34…
…圧縮空気供給装置。
FIG. 1 is a plan sectional view of a device showing one embodiment of the present invention, FIG. 2 is a plan sectional view of a device showing a prior art, and FIG. 3 is a plan view of a device showing another embodiment of the present invention. FIG. 1... Insulation material, 2... Conveying device, 3... Environmental test tank, 4, 6... Duct, 5... Constant temperature air supply device, 7... Outlet, 8... Inlet, 9... Outside air Inlet, 10... Dehumidifying dryer, 11... Air circulation fan, 12... Refrigeration cycle evaporator, 13...
... Heater, 20 ... Environmental test chamber, 21 ... Insulation material, 22 ... Partition plate, 23 ... Environmental test chamber, 24
... Constant temperature air supply tank, 25 ... Conveyance device, 26 ...
...Intake port, 27a, 27b...Outlet port, 28a,
28b...Blower, 29...Compressor, 30...
Condenser, 31... Capillary reach tube, 32...
...Evaporator, 33a, 33b...Heater, 34...
...Compressed air supply device.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 断熱材で覆われた環境試験室と、該環境試験室
内に設置された電子部品等を搬送するためのベル
トコンベア等の搬送手段と、電子部品の通電試験
を行うための試験装置とからなるライン型環境試
験装置において、前記環境試験室内が仕切板を介
して環境試験槽と恒温空気供給槽とに2つに区画
され、前記恒温空気供給槽が環境試験槽の搬送手
段の出入口付近に設けた2つの排出口と仕切板の
中央に設けた吸入口とで環境試験槽と連通してお
り、前記排出口付近にブロワーを吸入口付近に冷
凍サイクルの蒸発器を装着すると共に該蒸発器と
ブロワーとを連通する恒温空気供給槽内に2つの
ヒーターを設置し、さらに前記恒温空気供給槽を
圧縮空気供給装置と接続したことを特徴とするラ
イン型環境試験装置。
A line consisting of an environmental test chamber covered with a heat insulating material, conveyance means such as a belt conveyor for conveying electronic components installed in the environmental test chamber, and testing equipment for conducting electrical conduction tests on electronic components. In the type environmental test apparatus, the environmental test chamber is divided into two parts, an environmental test tank and a constant temperature air supply tank, through a partition plate, and the constant temperature air supply tank is provided near the entrance and exit of the conveyance means of the environmental test tank. It communicates with the environmental test tank through two outlets and an inlet provided in the center of the partition plate, and a blower is installed near the outlet, and an evaporator of the refrigeration cycle is installed near the inlet, and the evaporator and blower are connected to each other. 1. A line-type environmental testing device, characterized in that two heaters are installed in a constant temperature air supply tank that communicates with the constant temperature air supply tank, and the constant temperature air supply tank is further connected to a compressed air supply device.
JP1986087408U 1986-06-09 1986-06-09 Expired - Lifetime JPH0522868Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986087408U JPH0522868Y2 (en) 1986-06-09 1986-06-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986087408U JPH0522868Y2 (en) 1986-06-09 1986-06-09

Publications (2)

Publication Number Publication Date
JPS62199682U JPS62199682U (en) 1987-12-19
JPH0522868Y2 true JPH0522868Y2 (en) 1993-06-11

Family

ID=30944590

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986087408U Expired - Lifetime JPH0522868Y2 (en) 1986-06-09 1986-06-09

Country Status (1)

Country Link
JP (1) JPH0522868Y2 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58196025A (en) * 1982-05-12 1983-11-15 Hitachi Ltd Aging device for semiconductor, etc.
JPS59147278A (en) * 1983-02-14 1984-08-23 Tsubakimoto Chain Co Load tester for electronic component
JPS59167642A (en) * 1983-03-11 1984-09-21 Orion Mach Co Ltd Constant temperature environmental device provided with dehumidifying mechanism

Also Published As

Publication number Publication date
JPS62199682U (en) 1987-12-19

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