JPH05271702A - Production of cu-w sintered compact - Google Patents

Production of cu-w sintered compact

Info

Publication number
JPH05271702A
JPH05271702A JP4068740A JP6874092A JPH05271702A JP H05271702 A JPH05271702 A JP H05271702A JP 4068740 A JP4068740 A JP 4068740A JP 6874092 A JP6874092 A JP 6874092A JP H05271702 A JPH05271702 A JP H05271702A
Authority
JP
Japan
Prior art keywords
sintered body
powder
density
mixed powder
atmosphere
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP4068740A
Other languages
Japanese (ja)
Inventor
Tadashi Okabe
正 岡部
Nobushi Goto
信志 後藤
Yasunao Kai
安直 甲斐
Jitsuo Matsumoto
実男 松本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Tungsten Co Ltd
Original Assignee
Nippon Tungsten Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Tungsten Co Ltd filed Critical Nippon Tungsten Co Ltd
Priority to JP4068740A priority Critical patent/JPH05271702A/en
Publication of JPH05271702A publication Critical patent/JPH05271702A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • H05K1/092Dispersed materials, e.g. conductive pastes or inks

Landscapes

  • Powder Metallurgy (AREA)

Abstract

(57)【要約】 【目的】 成分配合比を正確に行うことができる混合法
によるCu−W焼結体を得るに当たって、理想密度に近
い密度を得るための手段の提供。 【構成】 所定の組成割合のCu粉末とW粉末との混合
粉末を成形カプセル内に収納したもの、又はその混合粉
末を加圧成形後1000〜1400℃で焼結して形成し
た1〜50%の気孔率を有する中間焼結体を、1000
以上、不活性雰囲気の100気圧以上で熱間等方圧縮
(HIP)を行なう。これによって、密度が理想密度に
近く、しかもばらつきのない焼結体を得る。
(57) [Summary] [Object] To provide a means for obtaining a density close to an ideal density in obtaining a Cu-W sintered body by a mixing method capable of accurately mixing the components. [Structure] A mixed powder of Cu powder and W powder having a predetermined composition ratio is housed in a molding capsule, or 1 to 50% formed by press-molding the mixed powder and sintering at 1000 to 1400 ° C. An intermediate sintered body having a porosity of 1000
As described above, hot isotropic compression (HIP) is performed at 100 atm or more in an inert atmosphere. As a result, a sintered body having a density close to the ideal density and no variation can be obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体基板、ヒートシ
ンク材、電極材等に好適に使用できるCu−W焼結体の
製造法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing a Cu-W sintered body which can be suitably used for semiconductor substrates, heat sink materials, electrode materials and the like.

【0002】[0002]

【従来の技術】従来、Cu−W焼結体の一応用分野とし
て、特公平2−31863号公報にはWの焼結体中にC
uを溶浸せしめる半導体基板の製造法が開示されてお
り、このCu−W焼結体は、熱伝導性も高く、溶浸する
Cu量を調整することによって熱膨張率の制御が可能
で、また、混合法の場合よりも気密性において優れてい
るとされている。
2. Description of the Related Art Conventionally, as an application field of a Cu-W sintered body, Japanese Examined Patent Publication (Kokoku) No. 2-31863 discloses that C is contained in a W sintered body.
A method for manufacturing a semiconductor substrate in which u is infiltrated is disclosed. This Cu-W sintered body has high thermal conductivity, and the coefficient of thermal expansion can be controlled by adjusting the amount of Cu infiltrated. Further, it is said that it is superior in airtightness to the case of the mixing method.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、Wの焼
結スケルトンの空隙中への溶融Cuを溶浸する場合に
は、その溶融Cuの充填量はWの焼結スケルトンの気孔
率のコントロールが難しく一定になり難く、例えば、半
導体基板,ヒートシンク材用として使用する場合に、熱
膨張率がばらつき、Al2 3 セラミックスなどとの接
合信頼性が低下する問題が生じる。また、かかる溶浸法
によってCu含有量が20重量%未満のW焼結体を製造
する場合には、通常の焼結温度1000〜1400℃で
必要な密度をもつ中間焼結体が得られないために、N
i,Fe,Co,Pd等の焼結助材を混合粉末に配合し
て、通常の焼結温度で必要な密度をもつ中間焼結体を得
ている。しかし、焼結助材の効果で中間焼結体の密度は
上がるものの目的の組成割合となるための適正温度域が
狭くなり、更に露点等の焼結雰囲気状態にも大きく左右
されるために、組成コントロールが難しく、W結晶が大
きくなるという問題がある。
However, when the molten Cu is infiltrated into the voids of the W sintered skeleton, it is difficult to control the porosity of the W sintered skeleton by adjusting the filling amount of the molten Cu. For example, when used as a semiconductor substrate or a heat sink material, the coefficient of thermal expansion varies and the reliability of bonding with Al 2 O 3 ceramics decreases. Further, when a W sintered body having a Cu content of less than 20% by weight is produced by such an infiltration method, an intermediate sintered body having a required density cannot be obtained at a normal sintering temperature of 1000 to 1400 ° C. For N
A sintering aid such as i, Fe, Co or Pd is mixed with the mixed powder to obtain an intermediate sintered body having a required density at a normal sintering temperature. However, although the density of the intermediate sintered body is increased by the effect of the sintering aid, the appropriate temperature range for achieving the target composition ratio is narrowed, and the sintering atmosphere state such as the dew point is greatly influenced. There is a problem that the composition is difficult to control and the W crystal becomes large.

【0004】この溶浸法における問題を考えると、正確
に目的の組成割合を有するCu−W基体を焼結法によっ
て得るには、それぞれ、CuとWとを所定の割合に混合
した粉末を焼結する普通焼結法の方が優れていると言え
る。
Considering the problems in this infiltration method, in order to obtain a Cu-W substrate having the exact composition ratio by the sintering method, powders in which Cu and W are mixed in predetermined ratios are fired respectively. It can be said that the ordinary sintering method of binding is superior.

【0005】この場合には、この普通焼結法によって得
た焼結体の密度が低く、上記の半導体基板、ヒートシン
ク材、電極材等のように高密度が要求される場合に対応
できないという問題がある。
In this case, the density of the sintered body obtained by this ordinary sintering method is low, and it is not possible to cope with the case where high density is required such as the above-mentioned semiconductor substrate, heat sink material and electrode material. There is.

【0006】本発明によって解決すべき課題は、成分配
合比を正確に行うことができる混合法によってCu−W
焼結体を得るに当たって、理想密度に近い密度を得るた
めの手段を見出すことにある。
[0006] The problem to be solved by the present invention is to use Cu-W by a mixing method which can accurately carry out the component mixing ratio.
In obtaining a sintered body, it is to find a means for obtaining a density close to the ideal density.

【0007】[0007]

【課題を解決するための手段】本発明は、最終組成割合
のCu粉末とW粉末との混合粉末を熱間等方圧縮いわゆ
るHIPを適用することによってその課題を解決した。
The present invention has solved the problem by applying hot isotropic compression so-called HIP to a mixed powder of Cu powder and W powder having a final composition ratio.

【0008】HIPを適用するに当たっては、混合粉末
を高純度シリカガラス製のような成形用カプセル内に収
納して行う方法と、一旦混合粉末をプレスして予備焼結
し、これをカプセルを使用しない条件の下で行う方法が
任意採用できる。
When applying HIP, a method is used in which the mixed powder is stored in a molding capsule such as high-purity silica glass, and the mixed powder is once pressed and pre-sintered, and the capsule is used. The method performed under the condition not to use can be arbitrarily adopted.

【0009】前者の混合粉末をカプセル内に収納してH
IPを行う場合、CuとWとの混合粉末中のCuが20
重量%以下の場合が比較的適しており、その適用に際し
ては、1000℃以上、Ar雰囲気100気圧以上で行
うことが望ましい。温度が1000℃未満又は雰囲気が
100気圧未満では、十分な密度が得られない。
The former mixed powder is stored in a capsule and H
When performing IP, Cu in the mixed powder of Cu and W is 20
It is relatively suitable if the content is less than or equal to% by weight, and it is desirable that the application is performed at 1000 ° C. or higher and 100 atmospheres or more of Ar atmosphere. If the temperature is lower than 1000 ° C. or the atmosphere is lower than 100 atm, sufficient density cannot be obtained.

【0010】また、後者の予備焼結後、HIPを行う場
合には、Cuの配合量が20重量%以上の比較的多い場
合に適しており、混合粉末を100〜400MPaで加
圧成形したのち、H2 雰囲気中で1000〜1400℃
で焼結して、1〜50%の気孔率を有する中間焼結体を
形成し、この中間焼結体をAr雰囲気又はN2 雰囲気
中、100気圧以上で、1000℃以上でのHIP処理
を行う。
In the latter case where HIP is carried out after pre-sintering, it is suitable for a relatively large Cu content of 20% by weight or more, and the mixed powder is pressure-molded at 100 to 400 MPa. , 1000~1400 ℃ in an atmosphere of H 2
To form an intermediate sintered body having a porosity of 1 to 50%, and the intermediate sintered body is subjected to HIP treatment at 1000 ° C. or higher in Ar atmosphere or N 2 atmosphere at 100 atm or higher. To do.

【0011】[0011]

【作用】Cu−Wの混合粉末をカプセル中に収納してH
IP処理を施すことによって、Cu−Wの混合粉末は、
まずCuが溶融することにより、収納体の内部は閉鎖孔
となり、表面部は開放孔となるが、閉鎖孔は周囲からの
圧力により、開放孔はカプセルからの圧力により消失し
ていき、その際、W粒子径は混合時の状態を保ってお
り、その結果、高い密度で且つ細結晶粒を有するCu−
Wの焼結体が得られる。
Function: The mixed powder of Cu-W is housed in a capsule and H
By performing the IP treatment, the mixed powder of Cu-W becomes
First, by melting Cu, the inside of the container becomes a closed hole and the surface becomes an open hole, but the closed hole disappears due to the pressure from the surroundings and the open hole due to the pressure from the capsule. , W particle size was kept as it was mixed, and as a result, Cu- having high density and fine crystal grains was formed.
A sintered body of W is obtained.

【0012】また、予備焼結後のHIP処理を行うに当
たっては、H2 雰囲気中で1000〜1400℃での焼
結を行った中間焼結体で、その気孔率が10%以下の場
合は、気孔の殆どが閉鎖孔となっている。
Further, in performing the HIP treatment after the pre-sintering, when the intermediate sintered body is sintered at 1000 to 1400 ° C. in an H 2 atmosphere and the porosity is 10% or less, Most of the pores are closed pores.

【0013】また、中間焼結体の気孔率が10%より大
きい場合は、表面部が開放孔となっているが、HIPで
の温度が上がりCuの融点を超えると、焼結の進行と共
に、Cuが中間焼結体の表面を覆い開放孔が閉鎖される
ので、カプセルの必要はない。
When the porosity of the intermediate sintered body is larger than 10%, the surface portion is open, but when the temperature in HIP rises and exceeds the melting point of Cu, the sintering progresses, There is no need for capsules as Cu covers the surface of the intermediate sintered body and the open holes are closed.

【0014】HIP処理過程で温度が1000℃未満で
は、真空中又は100気圧未満の雰囲気下にし、100
0℃以上に昇温してから100気圧以上に増圧してもよ
い。
If the temperature is lower than 1000 ° C. in the HIP process, the temperature is set to 100 ° C. in a vacuum or an atmosphere lower than 100 atm.
The temperature may be raised to 0 ° C. or higher and then increased to 100 atm or higher.

【0015】[0015]

【実施例】【Example】

実施例1 本発明をCuが10重量%、残がWであるCu−W合金
の製造に適用した。
Example 1 The present invention was applied to the production of a Cu-W alloy containing 10 wt% Cu and the balance W.

【0016】平均粒度3μmのW粉末90重量%と、平
均粒度10μmのCu粉末10重量%との混合粉末を高
純度シリカガラス製カプセルに収納し、1700℃、A
r雰囲気、1500気圧の条件でHIPしたところ、密
度17.19g/cm3 (相対密度99.3%)で均一
組織の焼結体を得た。この方法により、100個の焼結
体を製造したところ、密度は、17.15〜17.20
g/cm3 の範囲に収まった。
A mixed powder of 90% by weight of W powder having an average particle size of 3 μm and 10% by weight of Cu powder having an average particle size of 10 μm was placed in a high-purity silica glass capsule and stored at 1700 ° C., A
When HIP was performed in an atmosphere of 1,500 atmospheres, a sintered body having a density of 17.19 g / cm 3 (relative density 99.3%) and a uniform structure was obtained. When 100 sintered bodies were manufactured by this method, the density was 17.15 to 17.20.
It was within the range of g / cm 3 .

【0017】同様な組成のCu−W合金を溶浸法により
製造したところ、密度は16.80〜17.10g/c
3 とばらつきが大きく、また、焼結助材の添加が必要
なため、W粒が粗大化した焼結体となった。
When a Cu-W alloy having the same composition was produced by the infiltration method, the density was 16.80 to 17.10 g / c.
Since the variation was large with m 3, and the addition of a sintering aid was required, a sintered body with coarse W grains was obtained.

【0018】実施例2 本発明をCuが30重量%、残がWであるCu−W合金
の製造に適用した。
Example 2 The present invention was applied to the production of a Cu-W alloy containing 30% by weight of Cu and the balance of W.

【0019】平均粒度3μmのW粉末70重量%と平均
粒度10μmのCu粉末30重量%との混合粉末を10
0MPaで加圧成形し、H2 雰囲気中、1400℃で予
備焼結を行った。その後、1700℃、Ar雰囲気、1
500気圧の条件でHIPしたところ、密度14.15
g/cm3 (相対密度98.9%)で均一組織の焼結体
を得た。この方法により100個の焼結体を製造したと
ころ、密度のばらつきは14.13〜14.18g/c
3 の範囲に収まった。
10% by weight of a mixed powder of 70% by weight of W powder having an average particle size of 3 μm and 30% by weight of Cu powder having an average particle size of 10 μm
Pressure molding was performed at 0 MPa, and preliminary sintering was performed at 1400 ° C. in an H 2 atmosphere. After that, 1700 ° C., Ar atmosphere, 1
HIPed under the condition of 500 atm, the density was 14.15
A sintered body having a uniform structure was obtained at g / cm 3 (relative density 98.9%). When 100 sintered bodies were manufactured by this method, the variation in density was 14.13 to 14.18 g / c.
It was within the range of m 3 .

【0020】同様な組成のCu−W合金を溶浸法により
製造したところ、密度のばらつきは13.07〜14.
56g/cm3 と大きく、Cu偏析のある組織の焼結体
となった。
When a Cu--W alloy having the same composition was manufactured by the infiltration method, the density variation was 13.07 to 14.
The sintered body was as large as 56 g / cm 3 and had a structure with Cu segregation.

【0021】[0021]

【発明の効果】本発明によって以下の効果を奏する。The present invention has the following effects.

【0022】(1)混合粉末の調整時に成分コントロー
ルができ、これが最終焼結製品の組成となり成分のばら
つきのないものを得ることができる。
(1) The components can be controlled at the time of adjusting the mixed powder, and the composition of the final sintered product can be obtained without variation of the components.

【0023】(2)Cu成分の多少に関係なく、Cuが
均一に分布した高い密度の製品を得ることができる。
(2) Regardless of the amount of Cu component, it is possible to obtain a high-density product in which Cu is uniformly distributed.

【0024】(3)結晶粒の成長がない、機械的性質が
優れたCu−W焼結体とすることができる。
(3) A Cu-W sintered body having no crystal grain growth and excellent mechanical properties can be obtained.

【0025】(4)成分のばらつきがないために、熱膨
張率のコントロールが容易となる。
(4) Since there is no variation in the components, it is easy to control the coefficient of thermal expansion.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 松本 実男 福岡県福岡市南区清水2丁目20番31号 日 本タングステン株式会社内 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Mio Matsumoto Nihon Tungsten Co., Ltd. 2-2031 Shimizu, Minami-ku, Fukuoka-shi, Fukuoka

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 所定の組成割合のCu粉末とW粉末との
混合粉末を成形カプセル内に収納して1000℃以上、
不活性雰囲気の100気圧以上で熱間等方圧縮を施すC
u−W焼結体の製造法。
1. A mixed powder of Cu powder and W powder having a predetermined composition ratio is housed in a molding capsule and heated to 1000 ° C. or higher,
Hot isostatic pressing at 100 atm or more in an inert atmosphere C
Method for manufacturing u-W sintered body.
【請求項2】 所定の組成割合のCu粉末とW粉末との
混合粉末を加圧成形後、1000℃以上で焼結して、1
〜50%の気孔率を有する中間焼結体を形成し、この中
間焼結体をAr雰囲気又はN2 雰囲気中、100気圧以
上で、1000℃以上での熱間等方圧縮処理を行うCu
−W焼結体の製造法。
2. A mixed powder of Cu powder and W powder having a predetermined composition ratio is pressure-molded and then sintered at 1000 ° C. or higher to
Cu which forms an intermediate sintered body having a porosity of ˜50%, and which is subjected to hot isotropic compression treatment at 1000 ° C. or higher at 100 atm or more in Ar atmosphere or N 2 atmosphere.
-A method for producing a W sintered body.
JP4068740A 1992-03-26 1992-03-26 Production of cu-w sintered compact Withdrawn JPH05271702A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4068740A JPH05271702A (en) 1992-03-26 1992-03-26 Production of cu-w sintered compact

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4068740A JPH05271702A (en) 1992-03-26 1992-03-26 Production of cu-w sintered compact

Publications (1)

Publication Number Publication Date
JPH05271702A true JPH05271702A (en) 1993-10-19

Family

ID=13382488

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4068740A Withdrawn JPH05271702A (en) 1992-03-26 1992-03-26 Production of cu-w sintered compact

Country Status (1)

Country Link
JP (1) JPH05271702A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997001187A1 (en) * 1995-06-23 1997-01-09 Toho Kinzoku Co., Ltd. Method of manufacture of material for semiconductor substrate, material for semiconductor substrate, and package for semiconductor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997001187A1 (en) * 1995-06-23 1997-01-09 Toho Kinzoku Co., Ltd. Method of manufacture of material for semiconductor substrate, material for semiconductor substrate, and package for semiconductor
US5905938A (en) * 1995-06-23 1999-05-18 Toho Kinzoku Co., Ltd. Method of manufacturing a semiconductor substrate material

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