JPH0529129B2 - - Google Patents
Info
- Publication number
- JPH0529129B2 JPH0529129B2 JP61275976A JP27597686A JPH0529129B2 JP H0529129 B2 JPH0529129 B2 JP H0529129B2 JP 61275976 A JP61275976 A JP 61275976A JP 27597686 A JP27597686 A JP 27597686A JP H0529129 B2 JPH0529129 B2 JP H0529129B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- scanning
- distortion
- exposure
- mask
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61275976A JPS63128713A (ja) | 1986-11-19 | 1986-11-19 | 走査型露光装置のデイスト−シヨン補正方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61275976A JPS63128713A (ja) | 1986-11-19 | 1986-11-19 | 走査型露光装置のデイスト−シヨン補正方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63128713A JPS63128713A (ja) | 1988-06-01 |
| JPH0529129B2 true JPH0529129B2 (de) | 1993-04-28 |
Family
ID=17563043
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61275976A Granted JPS63128713A (ja) | 1986-11-19 | 1986-11-19 | 走査型露光装置のデイスト−シヨン補正方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63128713A (de) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0752712B2 (ja) * | 1989-12-27 | 1995-06-05 | 株式会社東芝 | 露光装置 |
| JP2830492B2 (ja) | 1991-03-06 | 1998-12-02 | 株式会社ニコン | 投影露光装置及び投影露光方法 |
| US5477304A (en) | 1992-10-22 | 1995-12-19 | Nikon Corporation | Projection exposure apparatus |
| USRE38113E1 (en) | 1993-04-02 | 2003-05-06 | Nikon Corporation | Method of driving mask stage and method of mask alignment |
| US6753948B2 (en) | 1993-04-27 | 2004-06-22 | Nikon Corporation | Scanning exposure method and apparatus |
| US5854671A (en) | 1993-05-28 | 1998-12-29 | Nikon Corporation | Scanning exposure method and apparatus therefor and a projection exposure apparatus and method which selectively chooses between static exposure and scanning exposure |
| US5729331A (en) | 1993-06-30 | 1998-03-17 | Nikon Corporation | Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus |
| JP3477838B2 (ja) | 1993-11-11 | 2003-12-10 | 株式会社ニコン | 走査型露光装置及び露光方法 |
| USRE37762E1 (en) | 1994-04-12 | 2002-06-25 | Nikon Corporation | Scanning exposure apparatus and exposure method |
| US5850280A (en) | 1994-06-16 | 1998-12-15 | Nikon Corporation | Stage unit, drive table, and scanning exposure and apparatus using same |
| US6721034B1 (en) | 1994-06-16 | 2004-04-13 | Nikon Corporation | Stage unit, drive table, and scanning exposure apparatus using the same |
| JP3484684B2 (ja) * | 1994-11-01 | 2004-01-06 | 株式会社ニコン | ステージ装置及び走査型露光装置 |
| US6235438B1 (en) | 1997-10-07 | 2001-05-22 | Nikon Corporation | Projection exposure method and apparatus |
| TW396395B (en) | 1998-01-07 | 2000-07-01 | Nikon Corp | Exposure method and scanning-type aligner |
| KR20170018113A (ko) | 2003-04-09 | 2017-02-15 | 가부시키가이샤 니콘 | 노광 방법 및 장치, 그리고 디바이스 제조 방법 |
| TWI569308B (zh) | 2003-10-28 | 2017-02-01 | 尼康股份有限公司 | 照明光學裝置、曝光裝置、曝光方法以及元件製造 方法 |
| TWI512335B (zh) | 2003-11-20 | 2015-12-11 | 尼康股份有限公司 | 光束變換元件、光學照明裝置、曝光裝置、以及曝光方法 |
| TWI505329B (zh) | 2004-02-06 | 2015-10-21 | 尼康股份有限公司 | 光學照明裝置、曝光裝置、曝光方法以及元件製造方法 |
| KR101544336B1 (ko) | 2005-05-12 | 2015-08-12 | 가부시키가이샤 니콘 | 투영 광학계, 노광 장치 및 노광 방법 |
| JP5267029B2 (ja) | 2007-10-12 | 2013-08-21 | 株式会社ニコン | 照明光学装置、露光装置及びデバイスの製造方法 |
| US8379187B2 (en) | 2007-10-24 | 2013-02-19 | Nikon Corporation | Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| US9116346B2 (en) | 2007-11-06 | 2015-08-25 | Nikon Corporation | Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58108745A (ja) * | 1981-12-23 | 1983-06-28 | Canon Inc | 転写装置 |
| US4549084A (en) * | 1982-12-21 | 1985-10-22 | The Perkin-Elmer Corporation | Alignment and focusing system for a scanning mask aligner |
| JPS60182444A (ja) * | 1984-03-01 | 1985-09-18 | Canon Inc | 半導体露光装置 |
| JPS6125102A (ja) * | 1984-07-16 | 1986-02-04 | Akai Electric Co Ltd | 光学膜形成方法 |
| JPS61247026A (ja) * | 1985-04-25 | 1986-11-04 | Canon Inc | 露光装置 |
| JPS61251025A (ja) * | 1985-04-30 | 1986-11-08 | Canon Inc | 投影露光装置 |
| JPH0732111B2 (ja) * | 1985-06-10 | 1995-04-10 | 日本電信電話株式会社 | 荷電ビ−ム投影露光装置 |
-
1986
- 1986-11-19 JP JP61275976A patent/JPS63128713A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63128713A (ja) | 1988-06-01 |
Similar Documents
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|---|---|---|
| JPS63128713A (ja) | 走査型露光装置のデイスト−シヨン補正方法 | |
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| JPH0584663B2 (de) | ||
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |