JPH0534576U - Circuit board inspection device - Google Patents

Abstract

(57) [Summary] [Purpose] To destroy the insulating impurities adhering to the measurement site of the circuit board to be inspected, and to ensure that the contact pin contacts the measurement site. [Structure] The contact pin 13 is slidably inserted into the probe insertion hole 14 of the pin board 10, and an air chamber 15 is formed below the probe insertion hole 14 to form the air chamber 1.
By pressurizing and depressurizing the inside of 5, the contact pin 13
Move up and down. [Effect] With the circuit board to be inspected fixed by the fixture, insulating impurities and the like adhering to the measurement site can be destroyed.

Description

[Detailed description of the device]

[0001]

[Industrial application]

 The present invention relates to a circuit board inspection device, and more particularly, to a pin board having a large number of contact probes.

[0002]

[Prior Art]

 When the circuit board has many measurement sites to be inspected, a pin board is used to inspect them at one time.

That is, as illustrated in FIG. 3, the pinboard 1 made of an acrylic resin plate or the like is positionally corresponded to the measurement parts (for example, soldering parts) 2a and 2b of the circuit board 2 to be inspected. The contact probes 1a and 1b are planted as described above, and the circuit board 2 to be inspected is pushed down by a press-type or vacuum-type fixture so that the measurement portions 2a and 2b contact the contact probes 1a and 1b almost at the same time. I am trying to let you do it.

Each of the contact probes 1a and 1b includes a tubular sleeve 3 and a pin body 4 slidably held by the sleeve 3, and in this case, the pin body 4 is a sleeve 3 formed by a coil spring (not shown). It is urged in a direction projecting from.

[0005]

[Problems to be solved by the device]

 Therefore, the pin body 4 comes into contact with the measurement portions 2a and 2b with a predetermined spring pressure, but insulation impurities such as flux adhere to the measurement portions 2a and 2b, resulting in poor contact. In this case, the circuit board 2 to be inspected is separated from the contact probes 1a and 1b to be contacted again.

However, in order to do so, the circuit board 2 to be inspected has to be pulled up once more than the movement stroke of the pin body 4 of the contact probe, which takes time and poses a problem in terms of positional accuracy at the time of re-contact. .

In order to reduce the contact failure due to the insulating impurities as described above, it suffices to increase the spring pressure, but a large coil spring is required for that.

However, if so, the diameter of the contact probe itself becomes large, and when arranging the contact probe on the pin board, the arrangement interval between them becomes wide and it becomes impossible to apply it to a high-density mounting substrate.

Further, if the spring load is increased, as shown in FIG. 4A, even if the lead terminal 5a of the mounting component 5 is originally poorly soldered, the spring pressure of the pin body 4 causes As shown in FIG. 6B, there is a situation in which the product is forcibly contacted and is mistaken for a non-defective product.

Further, the spring contact probe has different spring loads depending on the stroke when the pin body 4 is pushed in, so that the height of the measurement site on the board is set in the pin board 1. There was an annoyance that I had to do it.

[0011]

[Means for Solving the Problems]

 The present invention has been made in order to solve the above-mentioned conventional drawbacks, and its characteristic feature is that it has a pin board in which a contact probe is arranged at a position corresponding to a measurement portion of a circuit board to be inspected. In a circuit board inspecting device in which the pin board and the circuit board to be inspected are relatively brought close to and away from each other to bring the contact probe into contact with the measurement site of the circuit board to be inspected, one end of the contact probe is the measurement site. The contact hole consists of a contact pin that has a stopper member that has a large diameter at the other end and that has a predetermined shape that contacts with the contact pin, and the contact pin is slidably inserted into the pin board. And an air chamber coaxially connected to the probe insertion hole with a diameter larger than that of the stopper member, and an air passage for connecting the air chamber to the air pressure increasing / decreasing means. , A connector member for extracting a signal connected to the contact pin via a lead wire is provided, and the contact pin is moved forward and backward with respect to the circuit board to be inspected by the air pressure in the air chamber. Especially.

[0012]

[Action]

 According to the above structure, the contact pin is reciprocated in the axial direction by air pressure. Therefore, it is possible to eliminate contact failure due to insulating impurities by moving only the contact pins a required number of times while the circuit board to be inspected is fixed by the fixture.

Further, since the coil spring is not required, the diameter of the probe can be further reduced.

Furthermore, because of air pressure, it is possible to set the contact pressure to the measurement site almost uniformly regardless of the moving stroke of the contact pin.

[0015]

【Example】

 FIG. 1 shows an enlarged cross-sectional view of a main part of a pin board 10 applied to a circuit board inspection apparatus according to the present invention.

In this embodiment, the pin board 10 is made up of a laminate of two boards 11 and 12 both made of an acrylic resin plate.

A probe insertion hole 14 through which a contact pin 13 is slidably inserted is formed in the upper first board 11 facing the circuit board 2 to be inspected (see FIG. 3). In this embodiment, a guide tube 14a made of a stainless material is fitted in the probe insertion hole 14 in order to enhance the airtightness with the contact pin 13.

The contact pin 13 is made of, for example, tool steel in the form of a rod having a predetermined diameter. The contact pin 13 has a sharp tip in contact with the measurement site, and a rear end as a stopper member having a large diameter. Is provided with a flange 13a.

In the first board 11, an air chamber 15 having a diameter larger than that of the flange 13 a of the contact pin 13 is coaxially formed below the probe insertion hole 14.

Referring also to FIG. 2, an air chamber 15 is connected to an unillustrated air pressurizing / depressurizing means such as an air pump on the joint surface of the lower second board 12 to the first board 11. A groove 17 is provided which forms an air passage 16 for the operation.

Further, on the side of the second board 12 is formed a hole 18 that is coaxially opposed to the air chamber 15 and is a part of the air chamber 15. The hole 18 is provided at the bottom for signal extraction. A terminal pin 19 is provided so as to penetrate the second board 12.

The contact pin 13 is connected to the terminal pin 19 via the lead wire 20, and the measurement signal detected by the contact pin 13 is passed through the terminal pin 19 and the lead wire 21 connected to the terminal pin 19. It is supplied to a measuring unit (not shown).

An example of the measurement work will be described. First, the air pump is operated to supply air to the air chamber 15 through the air passage 16, and the pressure causes the contact pin 13 to project upward.

Next, the circuit board to be inspected is pushed down to a predetermined position by a press-type or vacuum-type fixture, and the contact pin 13 is brought into contact with the measurement site of the board.

Then, the pressurization and depressurization of the air chamber 15 are repeated by the air pump, the contact pin 13 is moved up and down several times to destroy the insulating impurities, and then the actual inspection process starts.

Unlike the above embodiment, the circuit board to be inspected may be pushed down to a predetermined position by the fixture, and then the air pump may be operated to bring the contact pin 13 into contact with the measurement site.

Further, the contact pin 13 may be moved up and down several times during the inspection process to destroy the insulating impurities.

The shapes of the contact pins 13, the air chambers 15, the air passages 16 and the like are not limited to those in the above embodiment, but various modifications are possible.

[0029]

[Effect of the device]

 As described above, according to the present invention, since the contact pin is reciprocally moved in the axial direction by the air pressure, only the contact pin remains fixed while the circuit board to be inspected is fixed by the fixture. By moving it a required number of times, it is possible to eliminate contact failure due to insulating impurities.

Further, since the coil spring is not required, the diameter of the probe can be made smaller and the life of the probe can be made longer.

Furthermore, because of the air pressure, it is possible to set the contact pressure to the measurement site almost uniformly regardless of the movement stroke of the contact pin.

[Brief description of drawings]

FIG. 1 is a cross-sectional view of an essential part showing an example of a pin board applied to a circuit board inspection apparatus of the present invention.

FIG. 2 is a sectional view taken along the line AA of FIG.

FIG. 3 is an explanatory diagram for explaining a conventional example.

FIG. 4 is an explanatory diagram for explaining a defect of a conventional example.

[Explanation of symbols]

 2 circuit board to be inspected 10 pin board 11 first board 12 second board 13 contact pin 13a flange 14 probe insertion hole 15 air chamber 16 air passage 17 groove 19 terminal pin 20 lead wire

Claims (1)

[Scope of utility model registration request] 1. A pin board having a contact probe arranged at a position corresponding to a measurement portion of a circuit board to be inspected, the pin board and the circuit board to be inspected being relatively approached and separated from each other to provide the contact. In the circuit board inspection device for bringing a probe into contact with a measurement site of the circuit board to be inspected, the contact probe has a stopper member having one end formed in a predetermined shape in contact with the measurement site and the other end having a large diameter. The pin board has a probe insertion hole through which the contact pin is slidably inserted, and an air chamber coaxially connected to the probe insertion hole with a diameter larger than that of the stopper member. And an air passage for connecting the air chamber to the air pressure increasing / decreasing means, and a signal extracting connector connected to the contact pin via a lead wire. Motor and the member is provided, the circuit board testing apparatus, characterized in that the contact pins so as to advance and retreat with respect to the circuit board to be inspected by the air pressure in the air chamber.