JPH05345970A - Vacuum deposition device - Google Patents
Vacuum deposition deviceInfo
- Publication number
- JPH05345970A JPH05345970A JP19447592A JP19447592A JPH05345970A JP H05345970 A JPH05345970 A JP H05345970A JP 19447592 A JP19447592 A JP 19447592A JP 19447592 A JP19447592 A JP 19447592A JP H05345970 A JPH05345970 A JP H05345970A
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- growth chamber
- crucibles
- flakes
- vertical wall
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001771 vacuum deposition Methods 0.000 title abstract 2
- 239000000758 substrate Substances 0.000 claims description 10
- 238000007740 vapor deposition Methods 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 3
- 239000010409 thin film Substances 0.000 abstract description 6
- 238000010438 heat treatment Methods 0.000 abstract description 3
- 239000007858 starting material Substances 0.000 abstract 2
- 239000002994 raw material Substances 0.000 description 14
- 238000001704 evaporation Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 238000001451 molecular beam epitaxy Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000011364 vaporized material Substances 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は真空蒸着装置に関する。FIELD OF THE INVENTION The present invention relates to a vacuum vapor deposition apparatus.
【0002】[0002]
【従来の技術】真空蒸着装置たとえば分子線エピタキシ
装置は、超高真空のもとで原料を加熱蒸発させ、基板の
表面に単結晶の薄膜を成長させるもので、その一例を図
1により説明すると、1はステンレスなどからなるチャ
ンバーで、その内部には、内部に液体窒素2を封入した
シュラウド3によって囲まれた成長室4が構成されてあ
る。2. Description of the Related Art A vacuum vapor deposition apparatus such as a molecular beam epitaxy apparatus heats and evaporates a raw material under an ultrahigh vacuum to grow a single crystal thin film on the surface of a substrate. An example thereof will be described with reference to FIG. Reference numeral 1 denotes a chamber made of stainless steel or the like, and inside thereof, a growth chamber 4 surrounded by a shroud 3 in which liquid nitrogen 2 is enclosed is formed.
【0003】5は分子線源セルで、ケース1に取付けポ
ート6により取り付けられてある。分子線源セル5には
坩堝7を備えており、ここに原料8を入れ、適当な加熱
源により加熱して蒸発させる。9は原料8の蒸発物が表
面に単結晶の薄膜として形成される基板、10は基板8
を保持する保持機構である。A molecular beam source cell 5 is attached to the case 1 by an attachment port 6. The molecular beam source cell 5 is equipped with a crucible 7, into which a raw material 8 is placed and heated by a suitable heating source to evaporate. Reference numeral 9 denotes a substrate on which the evaporated material of the raw material 8 is formed as a single crystal thin film,
Is a holding mechanism for holding.
【0004】通常分子線源セル5は複数用意され、その
各坩堝7にはそれぞれ異なる原料8を収納している。ま
た原料8の蒸発物を基板9の表面に付着しやすくするた
め、基板9を成長室4の上方に設置するとともに、坩堝
7は成長室4の下方隅部にあって、基板9に向かって開
口するように設置するようにしている。Usually, a plurality of molecular beam source cells 5 are prepared, and each crucible 7 contains a different raw material 8. Further, in order to easily attach the evaporation material of the raw material 8 to the surface of the substrate 9, the substrate 9 is installed above the growth chamber 4, and the crucible 7 is located at the lower corner of the growth chamber 4 and faces the substrate 9. It is installed so that it opens.
【0005】図2は従来のこの種装置における分子線源
セル5の設置状態を示す。前記のように坩堝7を成長室
4の下方隅部に設置する関係上、シュラウド3の垂直な
壁面3Aの直下に坩堝7の開口面が存在するような位置
関係となる。FIG. 2 shows the installation state of the molecular beam source cell 5 in the conventional apparatus of this type. Since the crucible 7 is installed in the lower corner of the growth chamber 4 as described above, the positional relationship is such that the opening surface of the crucible 7 exists immediately below the vertical wall surface 3A of the shroud 3.
【0006】ところで各原料8の蒸発物すべてが基板9
の表面に付着するものではなく、その一部はシュラウド
3の壁面3Aにもフレークとなって付着する。このフレ
ークが矢印で示すように壁面3Aに沿って流下して、そ
の直下にある分子線源セル5の坩堝7に流入することが
ある。By the way, all the vaporized materials of each raw material 8 are converted into the substrate 9
Not attached to the surface of the shroud, but a part thereof also attaches to the wall surface 3A of the shroud 3 as flakes. The flakes may flow down along the wall surface 3A as shown by an arrow and flow into the crucible 7 of the molecular beam source cell 5 located immediately below the wall surface 3A.
【0007】この楊合その坩堝内と同じ原料のフレーク
であれば問題はないが、同じ成長室には前記のように原
料が異なる複数の分子線源セル5が設置されているの
で、異なる原料のフレークが分子線源セル5の坩堝7に
流入することがある。そのためその坩堝内の原料が加熱
されると、基板にはこれが不純物となって薄膜が形成さ
れるようになる。There is no problem as long as the flakes are the same raw material as in the crucible, but a plurality of molecular beam source cells 5 having different raw materials are installed in the same growth chamber as described above. Of flakes may flow into the crucible 7 of the molecular beam source cell 5. Therefore, when the raw material in the crucible is heated, it becomes an impurity and forms a thin film on the substrate.
【0008】[0008]
【発明が解決しようとする課題】本発明は、フレークの
流下による不純物の混入を防止し、良質の薄膜が得られ
るようにする目的とする。SUMMARY OF THE INVENTION It is an object of the present invention to prevent impurities from being mixed due to the flow of flakes and to obtain a thin film of good quality.
【0009】[0009]
【課題を解決するための手段】本発明は、坩堝を成長室
の下方隅部に設置するとともに、坩堝の開口面が、坩堝
の上方に位置する成長室の垂直壁面の下方に向かう延長
線に対して、成長室の外側に向かって位置するように構
成したことを特徴とする。According to the present invention, the crucible is installed in the lower corner of the growth chamber, and the opening surface of the crucible is an extension line extending downward from the vertical wall surface of the growth chamber located above the crucible. On the other hand, it is characterized in that it is configured to be positioned toward the outside of the growth chamber.
【0010】[0010]
【作用】垂直壁面に付着したフレークがその壁面を伝わ
って流下してきた場合、坩堝の開口面が垂直壁面の下方
に向かう延長線より、成長室の外側に位置することにな
り、フレークは坩堝の開口面より外側を流下し、その坩
堝の内部には入らない。これにより坩堝にフレークが不
鈍物となって入るのが阻止されるようになる。[Function] When flakes adhering to the vertical wall flow down along the wall, the opening surface of the crucible will be located outside the growth chamber from the extension line that extends downward of the vertical wall, and the flakes will form in the crucible. It flows out from the opening surface and does not enter the inside of the crucible. This prevents flakes from entering the crucible as a blunt substance.
【0011】[0011]
【実施例】本発明の実施例を図1によって説明する。坩
堝7を成長室4に設置するにあたり、本発明にしたが
い、坩堝7の開口面が、坩堝7の上方に位置する成長室
4の垂直壁面3Aの、下方に向かう延長線に対して成長
室4の外側に向かって位置するように構成する。Embodiment An embodiment of the present invention will be described with reference to FIG. According to the present invention, when the crucible 7 is installed in the growth chamber 4, the opening surface of the crucible 7 has a growth chamber 4 with respect to a downward extension line of the vertical wall surface 3A of the growth chamber 4 located above the crucible 7. It is configured to be located toward the outside of the.
【0012】このように構成すると、たとえば垂直壁面
3Aにフレークが付着してこれがその垂直壁面3Aに沿
って流下してきたとしても、その流下方向から外れて坩
堝7の開口面が存在しているため、フレークが坩堝7に
入るようなことはない。すなわちその坩堝7内の原料8
にフレークが混入することは、これをもって確実に防止
されることになる。According to this structure, even if flakes adhere to the vertical wall surface 3A and flow down along the vertical wall surface 3A, the opening surface of the crucible 7 exists outside the downward direction. , Flakes do not enter crucible 7. That is, the raw material 8 in the crucible 7
This will surely prevent the flakes from being mixed in.
【0013】なお図に示す構成は、分子線エピタキシ装
置に本発明を適用した例であるが、本発明はこの装置以
外の他の真空蒸着装置、すなわち坩堝を利用して原料を
加熱蒸発させる真空蒸着装置にも適用されることはいう
までもない。The structure shown in the drawing is an example in which the present invention is applied to a molecular beam epitaxy apparatus. However, the present invention is not limited to this apparatus but is a vacuum vapor deposition apparatus, that is, a vacuum for heating and evaporating a raw material using a crucible. It goes without saying that it is also applied to a vapor deposition device.
【0014】[0014]
【発明の効果】以上詳述したように本発明によれば、異
なる原料を入れた坩堝を使用して真空蒸着させるにあた
り、他の原料の蒸発物によるフレークが混入することは
これをもって確実に防止することができ、したがって良
質な蒸着薄膜が得られるようになるといった効果を奏す
る。As described above in detail, according to the present invention, when vacuum-depositing a crucible containing different raw materials, it is possible to reliably prevent the inclusion of flakes due to the evaporation of other raw materials. Therefore, it is possible to obtain a vapor-deposited thin film of high quality.
【図1】本発明の実施例を示す断面図である。FIG. 1 is a sectional view showing an embodiment of the present invention.
【図2】従来例の部分断面図である。FIG. 2 is a partial cross-sectional view of a conventional example.
3 シュラウド 3A 垂直壁面 4 成長室 7 坩堝 8 原料 9 基板 3 Shroud 3A Vertical wall 4 Growth chamber 7 Crucible 8 Raw material 9 Substrate
Claims (1)
向かって開口し、内部に加熱蒸発される原料を収納した
複数の坩堝を備えた成長室を有する真空蒸着装置におい
て、前記坩堝を前記成長室の下方隅部に設置するととも
に、その坩堝の開口面が、前記坩堝の上方に位置する前
記成長室の垂直壁面の下方に向かう延長線に対して、前
記成長室の外側に向かって位置するようにしてなる真空
蒸着装置。1. A vacuum vapor deposition apparatus having a growth chamber having a substrate installed on the upper side, an opening facing the substrate below, and a plurality of crucibles containing a material to be heated and vaporized therein, wherein the crucible is Installed in the lower corner of the growth chamber, the opening surface of the crucible, with respect to the downward extension of the vertical wall of the growth chamber located above the crucible, toward the outside of the growth chamber A vacuum vapor deposition device that is positioned.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19447592A JPH05345970A (en) | 1992-06-11 | 1992-06-11 | Vacuum deposition device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19447592A JPH05345970A (en) | 1992-06-11 | 1992-06-11 | Vacuum deposition device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH05345970A true JPH05345970A (en) | 1993-12-27 |
Family
ID=16325170
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19447592A Pending JPH05345970A (en) | 1992-06-11 | 1992-06-11 | Vacuum deposition device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH05345970A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013012543A (en) * | 2011-06-28 | 2013-01-17 | Fujitsu Ltd | Molecular beam crystal growth apparatus and semiconductor device manufacturing method |
-
1992
- 1992-06-11 JP JP19447592A patent/JPH05345970A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013012543A (en) * | 2011-06-28 | 2013-01-17 | Fujitsu Ltd | Molecular beam crystal growth apparatus and semiconductor device manufacturing method |
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