JPH0537470Y2 - - Google Patents
Info
- Publication number
- JPH0537470Y2 JPH0537470Y2 JP6674490U JP6674490U JPH0537470Y2 JP H0537470 Y2 JPH0537470 Y2 JP H0537470Y2 JP 6674490 U JP6674490 U JP 6674490U JP 6674490 U JP6674490 U JP 6674490U JP H0537470 Y2 JPH0537470 Y2 JP H0537470Y2
- Authority
- JP
- Japan
- Prior art keywords
- processing chamber
- wafer
- processing
- mounting table
- passage space
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Description
【考案の詳細な説明】
[産業上の利用分野]
この考案は、半導体の原材料であるウエハの加
工処理工程における現像や洗浄工程に使用される
ウエハ等の現像・洗浄装置に関するものである。[Detailed Description of the Invention] [Industrial Field of Application] This invention relates to a developing/cleaning device for wafers, etc., which is used in developing and cleaning steps in the processing of wafers, which are raw materials for semiconductors.
[従来の技術]
従来、ウエハに半導体のパターンを焼き付ける
ための加工処理工程においては、その表面の洗浄
処理、現像剤の塗布工程、現像剤の洗流し工程な
どウエハの表面に処理液を塗布した後、それを乾
燥させる工程やその処理液の不要部分を洗流し洗
浄する工程が多く含まれている。これらの工程を
処理する装置として第2図にその断面を示すよう
な装置が知られている。[Prior Art] Conventionally, in the processing process for printing semiconductor patterns on wafers, a processing liquid is applied to the surface of the wafer, such as cleaning the surface, applying developer, and rinsing the developer. After that, it includes many steps of drying it and washing away unnecessary portions of the processing solution. As an apparatus for performing these steps, an apparatus whose cross section is shown in FIG. 2 is known.
第2図において、処理室21は上蓋22と下蓋
23とで形成されている。この処理室21の中に
は被処理物であるウエハ24を載置保持する回転
載置台25が設けられており、この回転載置台2
5は軸25aを中心にした回転が可能になつてい
る。また上蓋22の上部には回転載置台25に載
置されたウエハ24の上に例えば現像剤を滴下す
るための処理液供給用の供液パイプ26が設けら
れている。 In FIG. 2, the processing chamber 21 is formed by an upper lid 22 and a lower lid 23. As shown in FIG. A rotary mounting table 25 is provided in the processing chamber 21 for mounting and holding a wafer 24 as an object to be processed.
5 is rotatable around an axis 25a. Further, a liquid supply pipe 26 for supplying a processing liquid for dropping, for example, a developer onto the wafer 24 placed on the rotary mounting table 25 is provided at the upper part of the upper lid 22 .
通常、下蓋23は図示しない上下駆動機構によ
り上下方向(矢印UまたはD方向)に移動可能で
あつて、下蓋23が破線にて示すようにその上縁
が上蓋22の下縁に接する位置にあるときは処理
室21を閉鎖状態にしてこの室内を洗浄や現像等
の処理工程を可能にしている。また実線に示す位
置にあるときは処理室21を開放状態にして、図
示しない搬送機構により、ウエハ24の処理室2
1への搬入(矢印R方向)または、処理が終わつ
た回転載置台25上のウエハ24を外部へ搬出
(矢印L方向)できる状態にしている。 Normally, the lower lid 23 is movable in the vertical direction (direction of arrow U or D) by a vertical drive mechanism (not shown), and the lower lid 23 is at a position where its upper edge touches the lower edge of the upper lid 22, as shown by the broken line. When the processing chamber 21 is in the closed state, processing steps such as cleaning and development can be performed inside this chamber. Further, when the position is shown by the solid line, the processing chamber 21 is opened and the wafer 24 is transferred to the processing chamber 21 by a transport mechanism (not shown).
1 (in the direction of arrow R), or the wafer 24 on the rotary mounting table 25 that has been processed can be carried out (in the direction of arrow L).
ウエハ24が処理室21へ搬送されて回転載置
台25上に保持され、かつ処理室21が閉鎖状態
になると、供液パイプ26より処理液例えば現像
液がウエハ24上に滴下される。同時に回転載置
台25は回転を始めて、この回転が、滴下された
処理液をウエハ24の表面に一様に塗布するよう
に作用する。この後、処理液の滴下を停止して塗
布工程は終了するが、回転載置台25の回転は継
続させて処理液に対するスピン乾燥を行い、ウエ
ハ24を乾燥させる。 When the wafer 24 is transported to the processing chamber 21 and held on the rotary mounting table 25 and the processing chamber 21 is closed, a processing liquid such as a developer is dripped onto the wafer 24 from the liquid supply pipe 26. At the same time, the rotary mounting table 25 starts rotating, and this rotation acts to uniformly apply the dropped processing liquid to the surface of the wafer 24. Thereafter, the dropping of the processing liquid is stopped and the coating process is completed, but the rotation of the rotary mounting table 25 is continued to spin dry the processing liquid and dry the wafer 24.
この乾燥工程後に処理室21を開放してウエハ
24を搬出して次の処理工程へ送る。 After this drying step, the processing chamber 21 is opened and the wafer 24 is taken out and sent to the next processing step.
[考案が解決しようとする課題]
上記したような従来の装置において、塗布工程
にある時、余分の処理液はウエハ24の上から周
囲に飛散し、その一部は上蓋22,下蓋23の内
周壁に付着する。上蓋22に付着したものはその
蓋22の壁を伝わつてひさし22a上に溜まる
が、乾燥工程後に処理室21を開放してウエハ2
4を搬出する際、ひさし22a上に溜つた処理液
が搬出中のウエハ24の上に落ちて、この処理工
程を無駄にしたり、製品歩留まりを悪くしてしま
うことがある。これを避けるため上蓋22,下蓋
23や上下方向の移動寸法を大きくする等の方法
がとられていた。しかし、これらの寸法を大きく
とることは、装置の小形化を困難にしていた。[Problems to be solved by the invention] In the conventional apparatus as described above, during the coating process, excess processing liquid scatters from above to the surroundings of the wafer 24, and some of it spills onto the upper lid 22 and lower lid 23. Adheres to the inner peripheral wall. The matter adhering to the upper lid 22 travels along the wall of the lid 22 and accumulates on the eaves 22a, but after the drying process, the processing chamber 21 is opened and the wafers 2 are removed.
When the wafer 4 is being carried out, the processing liquid that has accumulated on the eaves 22a may fall onto the wafer 24 that is being carried out, resulting in a waste of this processing step or a poor product yield. In order to avoid this, methods have been taken, such as increasing the upper and lower lids 22, 23, and their vertical movement dimensions. However, increasing these dimensions makes it difficult to downsize the device.
この考案は、このような問題を解決するために
なされたもので、処理室からのウエハ等の被処理
物搬出に当たつて処理液等の滴下を防止して、効
率的なウエハ等の現像・洗浄装置を提供すること
を目的としている。 This invention was made to solve this problem, and it prevents the processing liquid from dripping when carrying out processing objects such as wafers from the processing chamber, and enables efficient development of wafers, etc.・The purpose is to provide cleaning equipment.
[課題を解決するための手段]
この考案は、上蓋と下蓋で形成される処理室
と、上蓋と下蓋の少なくとも一方を上下させて処
理室を開放もしくは密封する上下手段と、処理室
内に設けられてウエハ等を載置保持する回転載置
台と、この回転載置台を回転させる回転手段と、
回転載置台に載置されたウエハ等の上に所用の処
理液を滴下する処理液供給手段と、処理室の開放
時にウエハ等を移送する搬送手段とを備えたウエ
ハ等の現像・洗浄装置において、上蓋はその下部
壁内に周縁を囲繞して設けられる通路空間と、こ
の通路空間に沿つて設けられ通路空間から記処理
室へ通ずるスリツトと、通路空間に通じる少なく
とも一つの排出口とを外側に有し、かつこの排出
口に接続され処理室内を吸引するバキユーム手段
とを具備したことを特徴としている。[Means for Solving the Problems] This invention consists of a processing chamber formed by an upper lid and a lower lid, a vertical means for opening or sealing the processing chamber by raising and lowering at least one of the upper lid and the lower lid, and a a rotary mounting table provided for mounting and holding a wafer, etc.; a rotating means for rotating the rotary mounting table;
In a developing/cleaning apparatus for wafers, etc., which is equipped with a processing liquid supply means for dropping a required processing liquid onto a wafer, etc. placed on a rotating mounting table, and a transport means for transferring the wafer, etc. when a processing chamber is opened. , the upper lid has a passage space provided in the lower wall thereof surrounding the periphery, a slit provided along the passage space and communicating from the passage space to the processing chamber, and at least one outlet communicating with the passage space. The apparatus is characterized in that it has a vacuum means connected to the discharge port and sucks the inside of the processing chamber.
[作用]
このように構成することにより、回転載置台に
保持されたウエハ等から飛散し、上蓋に付着する
処理液をバキユーム手段で上蓋の下縁で吸引し、
外部に排出させることができ、被処理物の搬出時
においてウエハ等の被処理物の上に処理液が滴下
することを防止できる。[Function] With this configuration, the processing liquid that is scattered from the wafer etc. held on the rotary mounting table and adheres to the upper lid is sucked by the lower edge of the upper lid by the vacuum means.
Since the processing liquid can be discharged to the outside, it is possible to prevent the processing liquid from dripping onto the processing object such as a wafer when the processing object is being carried out.
[実施例]
以下、図面を参照しながらこの考案の一実施例
を説明する。[Example] Hereinafter, an example of this invention will be described with reference to the drawings.
第1図a,bはこの実施例の断面図であり、同
図aは同図bのB−B切断面の断面図で、同図b
は同図aのA−A切断面の断面図である。 Figures 1a and 1b are sectional views of this embodiment; Figure 1a is a sectional view taken along line B-B in Figure 1b;
1 is a sectional view taken along line A-A in FIG.
同図a,bにおいて、処理室1は上蓋2と下蓋
3とで形成されている。この処理室1の中には被
処理物である例えばウエハ4を載置保持する回転
載置台5が設けられており、この回転載置台5は
図示しない回転駆動機構により、軸5aを中心に
した回転が可能になつている。また上蓋2の上部
には回転載置台5に載置されたウエハ4の上に図
示しない処理液供給装置より送られる処理液、例
えば現像剤を滴下するための供液パイプ6が設け
られている。 In figures a and b, a processing chamber 1 is formed of an upper lid 2 and a lower lid 3. A rotary mounting table 5 is provided in the processing chamber 1 for mounting and holding an object to be processed, such as a wafer 4. Rotation is now possible. Further, a liquid supply pipe 6 is provided at the upper part of the upper lid 2 for dripping a processing liquid, such as a developer, sent from a processing liquid supply device (not shown) onto the wafer 4 placed on the rotary mounting table 5. .
また、上蓋2の最下縁のひさし2aに接する壁
内にはその周縁を囲繞して通路空間2bが設けら
れており、さらに通路空間2bから処理室1に通
じるスリツト2cがひさし2aの上に設けられて
いる。通路空間2bは上蓋2の外側に設けられて
いる排出口2dにも側路2eを介して接続されて
いる。 In addition, a passage space 2b is provided in the wall that is in contact with the eaves 2a at the lowermost edge of the upper lid 2, surrounding the periphery thereof, and a slit 2c leading from the passage space 2b to the processing chamber 1 is provided above the eaves 2a. It is provided. The passage space 2b is also connected to a discharge port 2d provided on the outside of the upper lid 2 via a side passage 2e.
この実施例は排出口2dが上蓋2の外側に三個
設けられている実施例であるが、これらの排出口
2dは図示しないバキユーム装置にパイプ等を介
して接続されている。 In this embodiment, three discharge ports 2d are provided on the outside of the upper lid 2, and these discharge ports 2d are connected to a vacuum device (not shown) via a pipe or the like.
下蓋3は図示しない上下駆動機構により上下方
向(矢印UまたはD方向)に移動可能であつて、
下蓋3が破線にて示すその上縁が上蓋2の下縁に
接する位置にあるときは処理室1を閉鎖状態にし
てこの室内を洗浄や現像等の処理工程を可能にし
ている。また実線に示す位置にあるときは処理室
1を開放状態にして、図示しない搬送機構によ
り、ウエハ4の処理室1への搬入(矢印R方向)
または、処理が終わつた回転載置台5上のウエハ
4を外部に搬出(矢印L方向)できる状態にして
いる。 The lower lid 3 is movable in the vertical direction (direction of arrow U or D) by a vertical drive mechanism (not shown),
When the lower lid 3 is in a position where its upper edge, indicated by the broken line, is in contact with the lower edge of the upper lid 2, the processing chamber 1 is closed, allowing processing steps such as cleaning and development to be carried out within this chamber. When the wafer 4 is in the position indicated by the solid line, the processing chamber 1 is opened and the wafer 4 is carried into the processing chamber 1 (in the direction of arrow R) by a transport mechanism (not shown).
Alternatively, the wafer 4 on the rotary mounting table 5 that has been processed can be carried out (in the direction of arrow L).
このように構成された実施例の装置は、ウエハ
4が処理室1へ搬入されて回転載置台5上に保持
され、かつ処置室1が閉鎖状態になると、供液パ
イプ6より処理液例えば現像液がウエハ4上に滴
下される。同時に回転載置台5は回転を始めて、
この回転が、滴下された処理液をウエハ4の表面
に一様に塗布するように作用する。 In the apparatus of the embodiment configured in this way, when the wafer 4 is carried into the processing chamber 1 and held on the rotary mounting table 5, and the processing chamber 1 is closed, a processing liquid such as a developing liquid is supplied from the liquid supply pipe 6. A liquid is dropped onto the wafer 4. At the same time, the rotating mounting table 5 starts rotating,
This rotation acts to uniformly apply the dropped processing liquid to the surface of the wafer 4.
このとき、回転載置台5の回転により余分の処
理液はウエハ4の上から周囲に飛散し、その一部
は上蓋2,下蓋3の内周壁に付着し、上蓋2に付
着したものは壁を伝わつてひさし2a上に溜まる
が、溜まつた処理液にはバキユーム装置の吸引力
が排出口2d、通路空間2b、スリツト2cを介
して作用し、処理液はスリツト2cからバキユー
ム装置側に吸引される。つまり処理液はひさし2
a上に実際には溜まることなく排出されて、ひさ
し2a付近は常時乾燥に近い状態になつている。 At this time, due to the rotation of the rotary mounting table 5, the excess processing liquid is scattered from above the wafer 4 to the surrounding area, and some of it adheres to the inner circumferential walls of the upper lid 2 and lower lid 3, and the excess processing liquid that adheres to the upper lid 2 is scattered around the wafer 4. The suction force of the vacuum device acts on the accumulated processing liquid through the outlet 2d, the passage space 2b, and the slit 2c, and the processing liquid is sucked from the slit 2c toward the vacuum device side. be done. In other words, the processing liquid is
It is discharged without actually accumulating on the eaves 2a, and the area around the eaves 2a is always in a nearly dry state.
このため、ウエハ4を外部に搬出するに当たつ
て上蓋2の壁の下を通過する際に処理液がウエハ
4に落ちることを防止できる。 Therefore, it is possible to prevent the processing liquid from falling onto the wafer 4 when the wafer 4 passes under the wall of the upper lid 2 when being carried out.
なお、この考案は上記実施例に限定されるもの
でなく、要旨を変更しない範囲で変形して実施で
きる。 Note that this invention is not limited to the above-mentioned embodiments, and can be modified and implemented without changing the gist.
例えば、上記実施例は下蓋3を上下させても処
理室1を閉鎖または開放させるものを説明した
が、上蓋2を上下させてもよく、また実施例では
排出口を三個設けたものを説明したが、一個でも
また必要に応じて複数個のものが実施できる。 For example, in the above embodiment, the processing chamber 1 is closed or opened even if the lower lid 3 is moved up or down, but the upper lid 2 may also be moved up or down, and in the embodiment, three discharge ports are provided. Although described, one or more may be implemented as required.
また、この考案の装置は現像剤の塗布だけでな
く、その前工程であるウエハ等の洗浄にも、パタ
ーン焼き付け後の現像処理等この考案の要旨の範
囲の用途のものに適用できる。 Furthermore, the apparatus of this invention can be applied not only to the application of developer, but also to cleaning of wafers, etc., which is a pre-process, and to development processing after pattern baking, and other uses within the scope of the gist of this invention.
[考案の効果]
この考案によれば、処理液の液垂れを防止でき
るので、その処理工程が無駄工程になることが無
く、液垂れによる製品歩留まりの低下をも防ぐこ
ともできる。[Effects of the invention] According to this invention, since dripping of the treatment liquid can be prevented, the treatment process does not become a wasted process, and a decrease in product yield due to dripping can also be prevented.
また、この考案よる装置は液垂れ防止機能が完
全であるので、処理液の上蓋への多量飛散にも対
応でき、回転載置台の高速回転が可能、つまり処
理工程の高速化が図れる。 Furthermore, since the device according to this invention has a complete liquid drip prevention function, it can cope with a large amount of processing liquid splashing onto the top lid, and the rotary mounting table can be rotated at high speed, thereby speeding up the processing process.
また、同じ理由で上蓋、下蓋の寸法や上下移動
寸法を小さく設定できるので、装置の小形化が期
待できる。 Furthermore, for the same reason, the dimensions of the upper and lower lids and the dimensions of their vertical movement can be set small, so it is expected that the device will be more compact.
第1図a,bはそれぞれこの考案一実施例の縦
縦断面図および横断面図、第2図は従来の装置の
縦断面図である。
1……処理室、2……上蓋、2a……ひさし、
2b……通路空間、2c……スリツト、2d……
排出口、2e……側路、3……下蓋、4……ウエ
ハ、5……回転載置台、6……供液パイプ。
1A and 1B are a longitudinal sectional view and a transverse sectional view, respectively, of an embodiment of this invention, and FIG. 2 is a longitudinal sectional view of a conventional device. 1...Processing chamber, 2...Top lid, 2a...Eaves,
2b... passage space, 2c... slit, 2d...
Discharge port, 2e... side channel, 3... lower lid, 4... wafer, 5... rotary mounting table, 6... liquid supply pipe.
Claims (1)
下蓋の少なくとも一方を上下させて前記処理室を
開放もしくは密封する上下手段と、前記処理室内
に設けられてウエハ等を載置保持する回転載置台
と、この回転載置台を回転させる回転手段と、前
記回転載置台に載置されたウエハ等の上に所用の
処理液を滴下する処理液供給手段と、処理室の開
放時にウエハ等を移送する搬送手段とを備えたウ
エハ等の現像・洗浄装置において、 前記上蓋はその下部壁内に周縁を囲繞して設け
られる通路空間と、この通路空間に沿つて設けら
れ通路空間から前記処理室へ通ずるスリツトと、
前記通路空間に通じる少なくとも一つの排出口と
を外側に有し、かつこの排出口に接続され前記処
理室内を吸引するバキユーム手段とを具備したこ
とを特徴とするウエハ等の現像・洗浄装置。[Claims for Utility Model Registration] A processing chamber formed by an upper lid and a lower lid, a vertical means for opening or sealing the processing chamber by raising and lowering at least one of the upper lid and the lower lid, and a device provided in the processing chamber. a rotating mounting table for mounting and holding a wafer, etc., a rotating means for rotating the rotating mounting table, and a processing liquid supply means for dropping a desired processing liquid onto the wafer, etc. placed on the rotating mounting table; In a developing/cleaning apparatus for wafers, etc., which is equipped with a transport means for transferring the wafers, etc. when the processing chamber is opened, the upper lid has a passage space surrounding the periphery in the lower wall thereof, and a passage space along the passage space. a slit that is provided along the line and communicates from the passage space to the processing chamber;
A developing/cleaning apparatus for wafers, etc., comprising at least one outlet communicating with the passage space on the outside, and vacuum means connected to the outlet for sucking the inside of the processing chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6674490U JPH0537470Y2 (en) | 1990-06-26 | 1990-06-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6674490U JPH0537470Y2 (en) | 1990-06-26 | 1990-06-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0426526U JPH0426526U (en) | 1992-03-03 |
| JPH0537470Y2 true JPH0537470Y2 (en) | 1993-09-22 |
Family
ID=31599712
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6674490U Expired - Lifetime JPH0537470Y2 (en) | 1990-06-26 | 1990-06-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0537470Y2 (en) |
-
1990
- 1990-06-26 JP JP6674490U patent/JPH0537470Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0426526U (en) | 1992-03-03 |
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