JPH0538882U - Circuit connection method - Google Patents
Circuit connection methodInfo
- Publication number
- JPH0538882U JPH0538882U JP087690U JP8769091U JPH0538882U JP H0538882 U JPH0538882 U JP H0538882U JP 087690 U JP087690 U JP 087690U JP 8769091 U JP8769091 U JP 8769091U JP H0538882 U JPH0538882 U JP H0538882U
- Authority
- JP
- Japan
- Prior art keywords
- light
- adhesive
- circuit
- liquid crystal
- crystal panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/074—Connecting or disconnecting of anisotropic conductive adhesives
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/321—Structures or relative sizes of die-attach connectors
- H10W72/325—Die-attach connectors having a filler embedded in a matrix
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/352—Materials of die-attach connectors comprising metals or metalloids, e.g. solders
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/353—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics
- H10W72/354—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
Landscapes
- Wire Bonding (AREA)
Abstract
(57)【要約】
本考案は、相対峙して形成された接続用回路の間に絶縁
性接着剤あるいは絶縁性接着剤中に導電性微粒子を分散
させた接着剤を狭持して接合する回路の接続方法におい
て、一方の回路基板が透明であり、接着剤を狭持しなが
ら上記相対峙する接続用回路のうち透明な回路基板の裏
面から光を照射し、上記光はレンズを通して照射され、
上記光は透明な基板の臨界角よりも大きな角度でななめ
から照射され、上記光の照射により上記接着剤を硬化さ
せることにより、上記相対峙する接続用回路を導通接合
せしめて接合固定することを特徴とする回路の接続方
法。
(57) [Summary] The present invention sandwiches and bonds an insulating adhesive or an adhesive in which conductive fine particles are dispersed in an insulating adhesive between connecting circuits formed by facing each other. In the circuit connecting method, one of the circuit boards is transparent, and light is emitted from the back surface of the transparent circuit board among the connecting circuits that sandwich the adhesive and the light is emitted through a lens. ,
The light is irradiated from the lick at an angle larger than the critical angle of the transparent substrate, and by curing the adhesive by the irradiation of the light, it is possible to conduct the conductive bonding of the connection circuit for the relative surface to bond and fix. Characteristic circuit connection method.
Description
【0001】[0001]
本考案はポケットテレビ、壁掛けテレビ、プロジェクションテレビ、ラップト ップパソコン、ゲーム機、等に持ちいられる液晶パネルやその他の回路部品の実 装方法に関する。 The present invention relates to a method for mounting a liquid crystal panel and other circuit parts that can be carried in a pocket TV, a wall-mounted TV, a projection TV, a laptop computer, a game console, etc.
【0002】[0002]
従来よりポケットテレビなど液晶パネルを組み込むためには小型、高密度実装 の液晶パネルを構成する必要がある。その対策の一例として液晶パネルを構成し ているガラス基板上にICチップを直接搭載する方法が提案されている。 Conventionally, in order to incorporate a liquid crystal panel such as a pocket TV, it is necessary to construct a small-sized, high-density mounted liquid crystal panel. As an example of such measures, there has been proposed a method of directly mounting an IC chip on a glass substrate forming a liquid crystal panel.
【0003】 以下図面を参照しながら、従来の液晶パネルについて説明する。図5、6は従 来の液晶パネルの一例を示すものである。図5は相対峙して形成された接続用回 路すなわちICチップと液晶パネルガラスの電極パターンの間に絶縁性接着剤あ るいは絶縁性接着剤中に導電性微粒子を分散させた接着剤を狭持して上記相対峙 する接続用回路を位置合わせする工程、図6は液晶パネルガラスの裏面から光を 照射して接着剤を加熱し硬化してICチップと液晶パネルガラスの電極パターン を本圧着接合した様子を示す。A conventional liquid crystal panel will be described below with reference to the drawings. 5 and 6 show an example of a conventional liquid crystal panel. FIG. 5 shows an insulating adhesive or an adhesive in which conductive fine particles are dispersed in an insulating adhesive between the IC chip and the electrode pattern of the liquid crystal panel glass, which is a connection circuit formed by facing each other. The process of squeezing and holding the above-mentioned connecting circuits relative to each other is shown in Fig. 6. In Fig. 6, the adhesive is heated and cured by irradiating light from the back surface of the liquid crystal panel glass, and the electrode pattern of the IC chip and liquid crystal panel glass The state of pressure bonding is shown.
【0004】 図5、5において21はICチップ、22は液晶パネル、23は液晶パネルの 基板上に形成された電極パターン、24は導電性微粒子を絶縁性接着剤中に分散 させた接着剤層、25はAuバンプ、26は圧着ツールを示す、27は光、28 はレンズをしめす。ICチップ上には電極パッドが形成されている。その電極パ ッド上にはAuバンプが形成されている。液晶パネルの基板上には上記ICチッ プの接続電極と相対峙して接続用回路が形成されている。In FIGS. 5 and 5, 21 is an IC chip, 22 is a liquid crystal panel, 23 is an electrode pattern formed on the substrate of the liquid crystal panel, and 24 is an adhesive layer in which conductive fine particles are dispersed in an insulating adhesive. , 25 indicates Au bumps, 26 indicates a crimping tool, 27 indicates light, and 28 indicates a lens. Electrode pads are formed on the IC chip. Au bumps are formed on the electrode pads. A connection circuit is formed on the substrate of the liquid crystal panel, facing the connection electrodes of the IC chip.
【0005】[0005]
図5において、絶縁性接着剤あるいは絶縁性接着剤中に導電性微粒子を分散さ せた接着剤は相対峙して形成された接続用回路すなわちICチップと液晶パネル ガラスの電極パターンの間に加熱や加圧無しに狭持される、この時相対峙して形 成された接続用回路すなわちICチップと液晶パネルガラスの電極パターンは純 粋に位置合わせされる。その後、図6においてICチップの上から比較的低温の ツールによって加圧されながら液晶パネルの裏面から光が照射され接着剤層が加 熱され、上記接着剤を加熱硬化してICチップと液晶パネルガラスの電極パター ンは導通接続される。この時、一般的に用いられる接着剤としてのエポキシ系の 接着剤は完全硬化する。 In FIG. 5, an insulating adhesive or an adhesive in which conductive fine particles are dispersed in the insulating adhesive is used for heating a connection circuit formed by facing each other, that is, between the IC chip and the electrode pattern of the liquid crystal panel glass. At this time, the circuit for connection, which is sandwiched without pressure and formed relative to each other, that is, the electrode pattern of the IC chip and the liquid crystal panel glass is simply aligned. After that, in FIG. 6, the adhesive layer is heated by irradiating light from the back surface of the liquid crystal panel while being pressed from above the IC chip by a tool at a relatively low temperature, and the adhesive layer is heat-cured to cure the IC chip and the liquid crystal panel. The glass electrode pattern is electrically connected. At this time, the epoxy-based adhesive that is generally used as an adhesive is completely cured.
【0006】 しかし、従来の回路の接続用接着剤を用いた接続構造体は図5、6より明らか なように光は白色光の場合、そのままでは一般的には散乱してしまう。そのため 集光レンズを用いて、光を接着剤層に集光している。すると、接着剤の光による 温度分布が図7の様に焦点中央で高く、その周辺で序々に低くなるという問題が 生じてしまう。図7は横軸にICの断面方向の位置を示し、縦軸にその部位の温 度を示す。この様にICの部位による温度ばらつきが大きいと、接着剤の硬化進 度が異なることとなってしまう。However, as is clear from FIGS. 5 and 6, the connection structure using the conventional adhesive for connecting a circuit generally scatters when the light is white light. Therefore, the light is focused on the adhesive layer using a condenser lens. Then, there arises a problem that the temperature distribution due to the light of the adhesive is high at the center of the focal point and gradually becomes low around the focal point as shown in FIG. In FIG. 7, the horizontal axis represents the position in the cross-sectional direction of the IC, and the vertical axis represents the temperature of that portion. If there is a large temperature variation depending on the IC portion, the curing rate of the adhesive will be different.
【0007】 昨今、この様なパネルへのICの実装コストの低減対策は急を極めており、特 にIC自身のコストダウンが急である。IC自身のコストダウン対策としては、 ICの外形アスペクト比を大きくし、細長くする事によって、ICのスペース的 なロスを最低限にし、1ウエハ内からのICの取り個数を最高にするという方法 が盛んに試みられている。この様に、ICのアスペクト比を大きくすると、IC を直接パネルに取り付けるCOG実装方式にはパネルの外形寸法が小さくなると いう効果がある。しかし、この様にICの外形寸法が細長くなると、IC下の接 着剤の温度バラツキはますます大きくなり、ICのコーナー部とICの中央部の 接着剤の硬化進度が違ってくる。このように接着剤の硬化進度が異なると、IC 接合の信頼性が著しく低減してしまうものであった。特にICコーナー部の接着 剤材中の残留応力は大きいのにもかかわらず、ICのコーナー部の接着剤の硬化 進度が低くなりがちであるため、ICのコーナー部の接続信頼性はきわめて低減 してしまうものであった。[0007] Recently, there is an urgent need to take measures to reduce the mounting cost of an IC on such a panel, and especially the cost of the IC itself is urgently reduced. As a measure to reduce the cost of the IC itself, the method of increasing the aspect ratio of the IC and making it slender to minimize the space loss of the IC and maximize the number of ICs taken from one wafer. Has been actively tried. As described above, when the aspect ratio of the IC is increased, the COG mounting method in which the IC is directly attached to the panel has an effect of reducing the outer dimension of the panel. However, when the external dimensions of the IC are elongated in this way, the temperature variation of the adhesive under the IC becomes even greater, and the curing progress of the adhesive at the corners of the IC and at the center of the IC differs. As described above, if the curing progress of the adhesive is different, the reliability of IC bonding is significantly reduced. In particular, even though the residual stress in the adhesive material at the IC corner is large, the curing progress of the adhesive at the IC corner tends to be low, so the connection reliability at the IC corner is extremely reduced. It was something that would end up.
【0008】 そこで、本考案は従来のこのような欠点を解決し相対峙して形成された接続回 路の接合の信頼性を高くするものである。Therefore, the present invention solves the above-mentioned drawbacks of the related art and improves the reliability of the connection of the connection circuits formed by facing each other.
【0009】[0009]
本考案による回路の接続方法は、相対峙して形成された接続用回路の間に絶縁 性接着剤あるいは絶縁性接着剤中に導電性微粒子を分散させた接着剤を狭持して 接合する回路の接続方法において、一方の回路基板が透明であり、接着剤を狭持 しながら上記相対峙する接続用回路のうち透明な回路基板の裏面から光を照射し 、上記光はレンズを通して照射され、上記光は透明な基板の臨界角よりも大きな 角度でななめから照射され、上記光の照射により上記接着剤を硬化させることに より、上記相対峙する接続用回路を導通接合せしめて接合固定することを特徴と する。 The circuit connecting method according to the present invention is a circuit in which an insulating adhesive or an adhesive in which conductive fine particles are dispersed in an insulating adhesive is sandwiched and bonded between connecting circuits formed by facing each other. In the connection method, one of the circuit boards is transparent, and light is radiated from the back surface of the transparent circuit board among the connecting circuits that hold the adhesive while holding the adhesive, and the light is radiated through the lens. The light is emitted from the lick at an angle larger than the critical angle of the transparent substrate, and the adhesive is cured by the irradiation of the light, so that the connection circuit for the relative surface is electrically connected and fixed. Is characterized by.
【0010】[0010]
図1〜3は本考案による回路の接続工程を示す。図1は相対峙して形成された 接続用回路すなわちICチップと液晶パネルガラスの電極パターンの間に絶縁性 接着剤あるいは絶縁性接着剤中に導電性微粒子を分散させた接着剤を狭持して上 記相対峙する接続用回路を位置合わせする工程を示し、また図2,3はICの上 から圧力が加えられながら上記狭持された接着剤に対し、液晶パネルのガラスの 裏面よりレンズを通した光が斜めから照射されている。 1 to 3 show a circuit connecting process according to the present invention. FIG. 1 shows a connection circuit formed by facing each other, that is, an insulating adhesive or an adhesive in which conductive fine particles are dispersed in the insulating adhesive is sandwiched between the IC chip and the electrode pattern of the liquid crystal panel glass. Fig. 2 and 3 show the process of aligning the above-mentioned connection circuits that are relatively facing each other, and Figs. The light passing through is radiated obliquely.
【0011】 図1、2、3に於て、1はICチップ、2は液晶パネル、3は液晶パネルの基 板上に形成された電極パターン、4は接着剤、5は光、6はAuバンプ、7はレ ンズ、8は圧着ツールを示す。In FIGS. 1, 2, and 3, 1 is an IC chip, 2 is a liquid crystal panel, 3 is an electrode pattern formed on a substrate of the liquid crystal panel, 4 is an adhesive, 5 is light, and 6 is Au. Bumps, 7 are lenses, and 8 is a crimping tool.
【0012】 また図4は本考案において接着剤を硬化する場合のIC下の温度分布をICの 断面について図示したものである。Further, FIG. 4 is a diagram showing a temperature distribution under the IC when the adhesive is cured in the present invention with respect to a cross section of the IC.
【0013】 図1、2、3においてICを液晶パネルの上に載置し強度のつよい光を液晶パ ネルの裏面から照射すれば、光の熱によってICと液晶パネルのあいだに挟持し た接着剤は硬化しICと液晶パネルを基本的に接合硬化する事ができる。In FIGS. 1, 2 and 3, when the IC is placed on the liquid crystal panel and strong light is irradiated from the back surface of the liquid crystal panel, the heat of the light causes adhesion between the IC and the liquid crystal panel. The agent cures and can basically bond and cure the IC and the liquid crystal panel.
【0014】 図2および図3に示すように、光をレンズをとうして斜めからガラス裏面に照 射すると、IC裏面の接着剤層に照射される光の範囲は円状ではなく、横に細長 くなる。すると、ICの外形が細長くても、光の照射範囲をIC下面全面にする ことができる。すると、IC下面の光照射による接着剤層の温度上昇を比較的均 一にする事が出来る。図2は光を斜め一方向から照射したものであり、図3は光 を斜め二方向から照射したものである。図2では光のIC下面での照射強度がや や光の照射側が強く、その反対側が弱くなりやや光の強度のアンバランスが生じ るが、図3ではICの長手方向の両方から光を斜めに照射しているためICの下 面での光強度のアンバランスは極めて少なくなっている。例えば、可視光を照射 光線として採用する場合、光を接着剤の硬化温度にまで引き上げるために、一般 的にはレンズを用いて集光している。レンズの口径から考えて、光をガラス裏面 からIC下面に2個並行してならべることは難しい。従って、レンズを斜めにし て光を斜めから照射することがさらに有効となる。As shown in FIG. 2 and FIG. 3, when light is radiated obliquely through the lens to the back surface of the glass, the range of light radiated to the adhesive layer on the back surface of the IC is not circular, but is horizontal. It becomes slender. Then, even if the outer shape of the IC is long and slender, the light irradiation range can be the entire lower surface of the IC. Then, the temperature rise of the adhesive layer due to the light irradiation on the lower surface of the IC can be made relatively uniform. FIG. 2 shows that light is emitted from one oblique direction, and FIG. 3 shows that light is emitted from two oblique directions. In Fig. 2, the irradiation intensity of light on the bottom of the IC is slightly high on the light irradiation side and weak on the opposite side, causing a slight imbalance in the light intensity, but in Fig. 3, the light is oblique from both the longitudinal direction of the IC. Since the light is radiated onto the IC, the imbalance of the light intensity on the lower surface of the IC is extremely small. For example, when using visible light as the irradiation light, a lens is generally used to collect the light in order to raise the light to the curing temperature of the adhesive. Considering the aperture of the lens, it is difficult to direct two lights from the glass back surface to the IC bottom surface in parallel. Therefore, it is more effective to make the lens oblique and irradiate the light obliquely.
【0015】 図4はICの長手方向の両方から光を斜めに照射した場合のICの下面の温度 分布と1方向からの光照射による場合のICの下面の温度分布をしめすものであ る。図4より明らかなようにICの下面の温度分布はほぼ均一になっている。光 をななめ1方向から照射している場合は図4に示すようにややかたよりが見られ るが、この反対方向からもう1個の光を斜めから照射することにより、上記第1 灯の光強度分布とは線対称のややかたよりのある光が加算され、全体として光の 強度分布はほぼ均一となる。FIG. 4 shows the temperature distribution of the lower surface of the IC when light is obliquely irradiated from both the longitudinal direction of the IC and the temperature distribution of the lower surface of the IC when light is irradiated from one direction. As is clear from FIG. 4, the temperature distribution on the lower surface of the IC is almost uniform. When the light is radiated from one direction, a slight distortion can be seen as shown in Fig. 4, but by irradiating another light obliquely from the opposite direction, the light of the first lamp can be seen. Light with a little symmetric line-symmetry is added to the intensity distribution, and the light intensity distribution is almost uniform as a whole.
【0016】 この様に、ICの下面の温度分布が均一になると、接着剤の硬化進度もIC下 面全域で均一となる。すなわち、光照射による硬化後の接着剤の硬化度合のばら つきが極めてすなくなる 。このように、IC下面の接着剤の硬化度合のばらつ きが小さくなると、部分的に接着強度が弱いところもなくなる。従って、接続信 頼性を大幅に向上する事が出来るものである。特に、ICコーナー部はもともと 接合による残留応力が大きいところであり、この様に、残留応力の大きいところ に光が充分照射され接着剤の硬化進度が他の所に引けをとらずに充分であると信 頼性がますます向上することとなる。As described above, when the temperature distribution on the lower surface of the IC becomes uniform, the curing progress of the adhesive also becomes uniform over the entire lower surface of the IC. That is, there is very little variation in the curing degree of the adhesive after curing by light irradiation. In this way, when the variation in the degree of curing of the adhesive on the lower surface of the IC becomes small, there is no portion where the adhesive strength is weak. Therefore, the connection reliability can be greatly improved. In particular, the IC corner is originally a place where the residual stress due to the joining is large, and thus it is said that the place where the residual stress is large is sufficiently irradiated with light and the curing progress of the adhesive is not inferior to other places. The reliability will be further improved.
【0017】 特に、ICの外形形状がアスペクト比が大きくて、長細い場合、上記する様な 光強度均一化策はさらに有効となる。In particular, when the outer shape of the IC has a large aspect ratio and a long and thin shape, the above-described measure for uniforming the light intensity becomes more effective.
【0018】[0018]
本考案は以上説明したように、ICチップと液晶パネルの電極を接着剤シート を狭持して接合する回路の接続方法において、IC下面全域の接着剤の硬化進度 を均一にし、接合の信頼性を向上させる効果がある。 As described above, the present invention provides a method of connecting a circuit in which an IC chip and an electrode of a liquid crystal panel are sandwiched and bonded with an adhesive sheet, so that the curing progress of the adhesive on the entire lower surface of the IC is made uniform and the bonding reliability is improved. Has the effect of improving.
【図1】 本考案の実施例において液晶パネルとICチ
ップの間に接着剤シートを狭持した工程図。FIG. 1 is a process diagram in which an adhesive sheet is sandwiched between a liquid crystal panel and an IC chip in an embodiment of the present invention.
【図2】 本考案の実施例において液晶パネルの裏面に
光を照射して接着剤を硬化せしめ、ICを液晶パネルに
固定している工程図。FIG. 2 is a process diagram of fixing the IC to the liquid crystal panel by irradiating the back surface of the liquid crystal panel with light to cure the adhesive in the embodiment of the present invention.
【図3】 本考案の実施例において液晶パネルの裏面に
光を照射して接着剤を硬化せしめ、ICを液晶パネルに
固定している他の工程例を示す図。FIG. 3 is a diagram showing another example of steps of fixing the IC to the liquid crystal panel by irradiating the back surface of the liquid crystal panel with light to cure the adhesive in the embodiment of the present invention.
【図4】 本考案におけるICの下面の圧着時の温度分
布図。すなわち光強度分布図。FIG. 4 is a temperature distribution diagram at the time of crimping the lower surface of the IC in the present invention. That is, a light intensity distribution map.
【図5】 従来の実施例において、液晶パネルとICチ
ップの間に接着剤シートを狭持した工程図。FIG. 5 is a process diagram in which an adhesive sheet is sandwiched between a liquid crystal panel and an IC chip in a conventional example.
【図6】 従来の実施例における、ICを液晶パネルに
固定している工程図。FIG. 6 is a process diagram of fixing an IC to a liquid crystal panel in a conventional example.
【図7】 従来の実施例におけるICの下面の圧着時の
温度分布図。FIG. 7 is a temperature distribution diagram when the lower surface of the IC is pressure bonded in the conventional example.
1,21 ICチップ 2,22 液晶パネル 3,23 電極パターン 4,24 接着剤 5,27 光 6,25 Auバンプ 7,28 レンズ 8,26 圧着ツール 9 光を右斜めから照射した場合の光強度分布 10 光を左斜めから照射した場合の光強度分布 11 光を両側斜めから照射した場合の光強度分
布1,21 IC chip 2,22 Liquid crystal panel 3,23 Electrode pattern 4,24 Adhesive 5,27 Light 6,25 Au bump 7,28 Lens 8,26 Crimping tool 9 Light intensity when irradiating light obliquely to the right Distribution 10 Light intensity distribution when light is applied obliquely from the left 11 Light intensity distribution when light is applied obliquely from both sides
Claims (1)
絶縁性接着剤あるいは絶縁性接着剤中に導電性微粒子を
分散させた接着剤を狭持して接合する回路の接続方法に
おいて、一方の回路基板が透明であり、接着剤を狭持し
ながら上記相対峙する接続用回路のうち透明な回路基板
の裏面から光を照射し、上記光はレンズを通して照射さ
れ、上記光は透明な基板の臨界角よりも大きな角度でな
なめから照射され、上記光の照射により上記接着剤を硬
化させることにより、上記相対峙する接続用回路を導通
接合せしめて接合固定することを特徴とする回路の接続
方法。1. A method for connecting a circuit in which an insulating adhesive or an adhesive in which conductive fine particles are dispersed in the insulating adhesive is sandwiched and bonded between the connecting circuits formed by facing each other. , One of the circuit boards is transparent, and light is radiated from the back surface of the transparent circuit board among the connecting circuits that face each other while sandwiching an adhesive, the light is radiated through a lens, and the light is transparent. A circuit characterized by irradiating from a lick at an angle larger than a critical angle of a substrate, and curing the adhesive by irradiating the light to electrically connect and bond the relative connecting connection circuit. Connection method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP087690U JPH0538882U (en) | 1991-10-25 | 1991-10-25 | Circuit connection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP087690U JPH0538882U (en) | 1991-10-25 | 1991-10-25 | Circuit connection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0538882U true JPH0538882U (en) | 1993-05-25 |
Family
ID=13921925
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP087690U Pending JPH0538882U (en) | 1991-10-25 | 1991-10-25 | Circuit connection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0538882U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011082582A (en) * | 2011-01-25 | 2011-04-21 | Sony Chemical & Information Device Corp | Method of manufacturing connection structure, method of anisotropic conductive connection, and connection structure |
| JP2014039016A (en) * | 2012-07-06 | 2014-02-27 | Hitachi Chemical Co Ltd | Semiconductor device manufacturing method and semiconductor device |
-
1991
- 1991-10-25 JP JP087690U patent/JPH0538882U/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011082582A (en) * | 2011-01-25 | 2011-04-21 | Sony Chemical & Information Device Corp | Method of manufacturing connection structure, method of anisotropic conductive connection, and connection structure |
| JP2014039016A (en) * | 2012-07-06 | 2014-02-27 | Hitachi Chemical Co Ltd | Semiconductor device manufacturing method and semiconductor device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6284086B1 (en) | Apparatus and method for attaching a microelectronic device to a carrier using a photo initiated anisotropic conductive adhesive | |
| KR970066683A (en) | Liquid crystal device, manufacturing method and electronic device of liquid crystal device | |
| JP3552422B2 (en) | Ball grid array semiconductor device and its mounting method | |
| JPH1187429A (en) | Semiconductor chip mounting method | |
| JP2006253665A (en) | Joining method and joining apparatus | |
| JPH0538882U (en) | Circuit connection method | |
| JPH08146451A (en) | Circuit device manufacturing equipment | |
| TW200847874A (en) | A method of packaging body, packaging body and substrate | |
| JPH0529145U (en) | Circuit connection method | |
| TWI282007B (en) | Equipment and method for fabricating a liquid crystal display | |
| JP3269136B2 (en) | Liquid crystal device and method of manufacturing liquid crystal device | |
| JPH0845988A (en) | Circuit connection method | |
| JPH0529028U (en) | Circuit connection method | |
| JPH0870200A (en) | Circuit connection method | |
| JPH067243U (en) | Circuit connection method | |
| JP2008227409A (en) | Joining apparatus and joining method | |
| JPH0577939U (en) | Circuit connection method | |
| JPH0845989A (en) | Circuit connection method | |
| JPH0538881U (en) | Circuit connection method | |
| JP2002289644A (en) | Semiconductor device joining method and joining device | |
| JP2863426B2 (en) | Semiconductor device mounting structure and mounting method thereof | |
| JP2003249530A (en) | Semiconductor device mounting apparatus and substrate alignment method using the same | |
| JPH06163746A (en) | Hybrid integrated circuit device | |
| JPH0564832U (en) | Circuit connection structure | |
| CN103531437B (en) | Method for manufacturing semiconductor device and semiconductor device |