JPH055181A - Reactor for mocvd - Google Patents

Reactor for mocvd

Info

Publication number
JPH055181A
JPH055181A JP18185991A JP18185991A JPH055181A JP H055181 A JPH055181 A JP H055181A JP 18185991 A JP18185991 A JP 18185991A JP 18185991 A JP18185991 A JP 18185991A JP H055181 A JPH055181 A JP H055181A
Authority
JP
Japan
Prior art keywords
reactor
oxide superconducting
superconducting film
gas
reaction substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18185991A
Other languages
Japanese (ja)
Inventor
Yoshinori Takada
善典 高田
Hidekazu Uchida
英一 内田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Cable Industries Ltd
Original Assignee
Mitsubishi Cable Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Cable Industries Ltd filed Critical Mitsubishi Cable Industries Ltd
Priority to JP18185991A priority Critical patent/JPH055181A/en
Publication of JPH055181A publication Critical patent/JPH055181A/en
Pending legal-status Critical Current

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  • Chemical Vapour Deposition (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To prevent modification of an oxide superconducting film due to floating fine particles which are produced by deposition of the source gas on the inner wall of reactor. CONSTITUTION:A reactor 1 is equipped with a supply port 11 to introduce the source gas for the formation of thin oxide superconducting film, and with a discharge port 16 for the residual gas. A high frequency heater coil 4 is provided around this reactor in the area corresponding to the reaction substrate 2 which accepts deposition of the thin oxide superconducting film. Also, a resistor-type heating means 3 is provided in the area where no high frequency heater coil is disposed around the reactor 1. Thereby, a thin oxide superconducting film having excellent uniformly of compsn. and stable super-conductivity can be formed with this cold wall-type MOCVD reactor.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、MOCVD方式により
反応器沈着物質の混入なく酸化物超電導膜を形成できる
ようにした反応器に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a reactor capable of forming an oxide superconducting film by the MOCVD method without mixing a reactor deposit.

【0002】[0002]

【従来の技術】Y、Ba、Cuのβ−ジケトンキレート化
合物の如き粉末原料をガス化してなる、酸化物超電導体
の形成元素を含有する原料ガスを、反応器内に配置した
高温の反応基板上に供給して分解反応させ、酸化物超電
導膜を付設するMOCVD法が知られている。
2. Description of the Related Art A high temperature reaction substrate in which a raw material gas containing an element for forming an oxide superconductor, which is obtained by gasifying a powder raw material such as a β-diketone chelate compound of Y, Ba or Cu, is placed in a reactor. There is known a MOCVD method in which an oxide superconducting film is attached by supplying it on top to cause a decomposition reaction.

【0003】従来、前記の反応基板を配置する反応器と
しては、原料ガスの供給口と残余ガスの排気口を有する
反応器の外周に高周波加熱コイルが、酸化物超電導膜の
付設を受ける反応基板に対応して部分的に配置されたコ
ールドウォール型のものが知られていた。しかしなが
ら、反応器内に原料ガスが沈着して微粉末となり、それ
が浮遊して反応基板上に形成される酸化物超電導膜を変
質させ、超電導特性を低下させる問題点があった。
Conventionally, as a reactor for arranging the above reaction substrate, a high frequency heating coil is attached to the outer periphery of the reactor having a source gas supply port and a residual gas exhaust port to which an oxide superconducting film is attached. There was known a cold wall type that was partially arranged corresponding to. However, there has been a problem that the raw material gas is deposited in the reactor to form fine powder, which floats to deteriorate the oxide superconducting film formed on the reaction substrate and deteriorate the superconducting property.

【0004】[0004]

【発明が解決しようとする課題】本発明は、前記した原
料ガスの沈着微粉末の浮遊問題を生じないコールドウォ
ール型の反応器を得ることを目的とする。
SUMMARY OF THE INVENTION It is an object of the present invention to obtain a cold wall type reactor which does not cause the above-mentioned floating problem of deposited fine powder of raw material gas.

【0005】[0005]

【課題を解決するための手段】本発明は、酸化物超電導
膜を形成するための原料ガスの供給口と残余ガスの排気
口を有する反応器の外周に高周波加熱コイルが、酸化物
超電導膜の付設を受ける反応基板に対応して部分的に配
置されており、かつ前記反応器の外周の高周波加熱コイ
ルが配置されていない部分に電気抵抗式加熱手段が配置
されていることを特徴とするMOCVD用反応器を提供
するものである。
According to the present invention, a high-frequency heating coil is provided on the outer periphery of a reactor having a supply port for a raw material gas for forming an oxide superconducting film and an exhaust port for a residual gas. MOCVD, which is partially arranged corresponding to a reaction substrate to be attached, and in which an electric resistance type heating means is arranged in a portion where the high frequency heating coil is not arranged on the outer periphery of the reactor. A reactor for use is provided.

【0006】[0006]

【作用】通常、減圧状態とした反応器内における反応基
板を高周波加熱コイルを介し加熱しつつ原料ガスを供給
口より供給し、反応基板上で加熱分解させて反応させ、
酸化物超電導膜を反応基板上に形成付設する。反応器の
外周における高周波加熱コイルを配置した部分以外の部
分における電気抵抗式加熱手段で反応器を加熱すること
により、原料ガスの沈着による微粉末の発生が防止され
る。原料ガスの分解ガス等からなる残余ガスは、排気口
を介して反応器の外に排気される。
[Function] Usually, the reaction substrate in the reactor in a depressurized state is heated through the high-frequency heating coil while the source gas is supplied from the supply port, and the reaction substrate is thermally decomposed and reacted.
An oxide superconducting film is formed and attached on the reaction substrate. By heating the reactor by the electric resistance type heating means in a portion other than the portion where the high frequency heating coil is arranged on the outer circumference of the reactor, generation of fine powder due to deposition of the raw material gas is prevented. The residual gas, which is a decomposition gas of the raw material gas, is exhausted to the outside of the reactor through the exhaust port.

【0007】[0007]

【実施例】図1にバッチ式の実施例を示し、図2に連続
成膜式の実施例を示した。1が反応器、2が反応基板、
3が電気抵抗式加熱手段、4が高周波加熱コイルであ
る。なお、11は原料ガスの供給口、12は保持台、1
4は導入路、16は残余ガスの排気口、5はファイバー
式の放射温度計である。
EXAMPLE FIG. 1 shows a batch type embodiment, and FIG. 2 shows a continuous film forming type example. 1 is a reactor, 2 is a reaction substrate,
3 is an electric resistance type heating means and 4 is a high frequency heating coil. In addition, 11 is a source gas supply port, 12 is a holding stand, 1
Reference numeral 4 is an introduction path, 16 is an exhaust port for residual gas, and 5 is a fiber-type radiation thermometer.

【0008】図1、図2に例示の如く反応器1として
は、酸化物超電導膜を形成するための原料ガスの供給口
11と、残余ガスの排気口16を有するものが用いられ
る。複数の供給口や排気口を有するものであってもよ
い。反応器は限定するものではないが、石英ガラスの如
き透視が可能な耐熱性材料で形成することが好ましい。
As shown in FIGS. 1 and 2, a reactor 1 having a source gas supply port 11 for forming an oxide superconducting film and a residual gas exhaust port 16 is used. It may have a plurality of supply ports and exhaust ports. The reactor is not limited, but is preferably formed of a transparent heat-resistant material such as quartz glass.

【0009】図1に例示のバッチ式の反応器1では、保
持台12を介して単品の反応基板2を保持できるように
なっている。保持台12は支持板13を介して反応器の
中央に配置固定されている。
In the batch type reactor 1 illustrated in FIG. 1, a single reaction substrate 2 can be held via a holding table 12. The holding table 12 is arranged and fixed at the center of the reactor via a support plate 13.

【0010】図2に例示の連続成膜式の反応器1では、
導入路14を介してテープや線材等の長尺体からなる反
応基板2を矢印の如く順次連続的に導入して、反応器1
内を通過する間に、その反応基板2上に酸化物超電導膜
を連続的に成膜できるようになっている。なお、15は
反応器1内の減圧状態の維持率を高めるためや、不純物
の侵入を抑制するために導入路14内に設けた隔壁であ
る。
In the continuous film forming type reactor 1 illustrated in FIG.
The reaction substrate 2 made of a long body such as a tape or a wire is continuously and sequentially introduced through the introduction path 14 as shown by an arrow, and the reactor 1
An oxide superconducting film can be continuously formed on the reaction substrate 2 while passing through the inside. Reference numeral 15 is a partition wall provided in the introduction passage 14 in order to increase the maintenance rate of the reduced pressure state in the reactor 1 and to suppress the intrusion of impurities.

【0011】図1、図2より明らかな如く、反応器1の
外周には高周波加熱コイル4が部分的に配置されてい
る。高周波加熱コイル4は、反応基板2を加熱してその
上で原料ガスを分解・反応させて酸化物超電導膜を形成
させるためのものである。従って高周波加熱コイル4
は、反応基板2の配置に対応する位置に部分的に設けら
れる。反応基板2の加熱温度は、原料ガスの分解・反応
温度に応じて適宜に決定される。その温度は、放射温度
計5等を介して精密に制御することが、超電導特性に優
れる酸化物超電導膜を安定して形成する点より好まし
い。
As is apparent from FIGS. 1 and 2, a high frequency heating coil 4 is partially arranged on the outer periphery of the reactor 1. The high frequency heating coil 4 is for heating the reaction substrate 2 and decomposing and reacting the raw material gas on the reaction substrate 2 to form an oxide superconducting film. Therefore, the high frequency heating coil 4
Are partially provided at positions corresponding to the arrangement of the reaction substrate 2. The heating temperature of the reaction substrate 2 is appropriately determined according to the decomposition / reaction temperature of the raw material gas. It is preferable that the temperature is precisely controlled via the radiation thermometer 5 or the like in order to stably form an oxide superconducting film having excellent superconducting properties.

【0012】本発明においては、高周波加熱コイル4に
加えて電気抵抗式加熱手段3が反応器1の外周に配置さ
れる。電気抵抗式加熱手段3は、反応器1をその内壁に
原料ガスが沈着して微粉末が発生することを防止するた
めに加熱するためのものである。
In the present invention, in addition to the high frequency heating coil 4, an electric resistance type heating means 3 is arranged on the outer periphery of the reactor 1. The electric resistance type heating means 3 is for heating the reactor 1 in order to prevent the raw material gas from being deposited on the inner wall of the reactor 1 to generate fine powder.

【0013】従って電気抵抗式加熱手段3は、高周波加
熱コイル4では前記微粉末の発生を防止できる温度に達
しない反応器の外周部分に設けられる。その加熱温度
は、原料ガスのガス状態を維持できる温度とされ、原料
のガス化温度(蒸発温度)に応じて適宜に決定される。
一般には200℃以上、就中230℃以上であり、各原
料のガス化温度の内の最も高い温度よりも若干高い温度
とされる。なお電気抵抗式加熱手段は、例えば抵抗体テ
ープや抵抗線等を反応器の外周に巻回する方式など、適
宜に形成してよい。
Therefore, the electric resistance type heating means 3 is provided in the outer peripheral portion of the reactor which does not reach the temperature capable of preventing the generation of the fine powder in the high frequency heating coil 4. The heating temperature is a temperature at which the gas state of the raw material gas can be maintained, and is appropriately determined according to the gasification temperature (evaporation temperature) of the raw material gas.
Generally, the temperature is 200 ° C. or higher, and particularly 230 ° C. or higher, which is a temperature slightly higher than the highest gasification temperature of each raw material. The electric resistance type heating means may be appropriately formed by, for example, a method of winding a resistor tape or a resistance wire around the outer circumference of the reactor.

【0014】本発明のMOCVD用反応器においては矢
印の如く、供給口11から排気口16に向かって原料ガ
スが供給されて、反応基板2上に酸化物超電導膜が形成
されると共に、残余ガス等が排気される。その原料ガス
の供給・残余ガス等の排気には必要に応じてキャリアガ
スが用いられる。キャリアガスとしては、アルゴンガ
ス、窒素ガス、ヘリウムガスの如き不活性ガスが一般に
用いられる。
In the MOCVD reactor of the present invention, the source gas is supplied from the supply port 11 to the exhaust port 16 as shown by the arrow to form the oxide superconducting film on the reaction substrate 2 and the residual gas. Etc. are exhausted. A carrier gas is used as needed to supply the source gas and exhaust the residual gas. As the carrier gas, an inert gas such as argon gas, nitrogen gas or helium gas is generally used.

【0015】前記の反応基板としては例えば、各種のセ
ラミック、あるいは銀やその合金、就中、銀・白金合
金、銀・パラジウム合金の如き高融点合金等の種々の金
属などからなる基板やテープ、線材等の適宜な形態のも
のが用いられる。
Examples of the above-mentioned reaction substrate include substrates and tapes made of various ceramics or various metals such as silver and its alloys, especially high melting point alloys such as silver-platinum alloys and silver-palladium alloys, and the like. A wire rod or the like having an appropriate form is used.

【0016】本発明においては種々の酸化物超電導膜を
形成することができる。その超電導体の種類については
特に限定はない。その例としては、YBa2Cu3yやY
Ba2Cu4yの如きY系酸化物超電導体、Ba1-xxBi
3の如きBa系酸化物超電導体、Nd2-xCexCuOyの如
きNd系酸化物超電導体、Bi2Sr2CaCu2y、Bi2-x
PbxSr2Ca2Cu3yの如きBi系酸化物超電導体、その
他La系酸化物超電導体、Tl系酸化物超電導体、Pb系
酸化物超電導体などがあげられる。また、前記のY等の
成分を他の希土類元素で置換したものや、Ba等の成分
を他のアルカリ土類金属で置換したものなどもあげられ
る。
In the present invention, various oxide superconducting films can be formed. There is no particular limitation on the type of the superconductor. For example, YBa 2 Cu 3 O y or Y
Y-based oxide superconductors such as Ba 2 Cu 4 O y , Ba 1-x K x Bi
Such Ba-based oxide superconductor O 3, Nd 2-x Ce such Nd-based oxide superconductor x CuO y, Bi 2 Sr 2 CaCu 2 O y, Bi 2-x
Examples thereof include Bi-based oxide superconductors such as Pb x Sr 2 Ca 2 Cu 3 O y , La-based oxide superconductors, Tl-based oxide superconductors, Pb-based oxide superconductors, and the like. Further, there may be mentioned those obtained by substituting the above-mentioned components such as Y with other rare earth elements and those obtained by substituting the above-mentioned components such as Ba with other alkaline earth metals.

【0017】[0017]

【発明の効果】本発明によれば、反応器の内壁に原料ガ
スが沈着して微粉末化することを防止でき、かかる微粉
末が浮遊して形成される酸化物超電導膜の組成を変化さ
せて変質させることを防止することができる。従って、
組成の均一性に優れて超電導特性が安定した酸化物超電
導膜が形成されるコールドウォール型のMOCVD用反
応器を得ることができる。
According to the present invention, it is possible to prevent the raw material gas from depositing on the inner wall of the reactor to be made into fine powder, and to change the composition of the oxide superconducting film formed by floating the fine powder. It is possible to prevent the deterioration. Therefore,
It is possible to obtain a cold wall type MOCVD reactor in which an oxide superconducting film having excellent composition uniformity and stable superconducting properties is formed.

【図面の簡単な説明】[Brief description of drawings]

【図1】実施例の部分断面側面図。FIG. 1 is a partial cross-sectional side view of an embodiment.

【図2】他の実施例の部分断面側面図。FIG. 2 is a partial cross-sectional side view of another embodiment.

【符号の説明】[Explanation of symbols]

1:反応器 11:原料ガスの供給口 16:残余ガスの排気口 2:反応基板 3:電気抵抗式加熱手段 4:高周波加熱コイル 1: Reactor 11: Source gas supply port 16: Residual gas exhaust port 2: Reaction substrate 3: Electric resistance type heating means 4: High frequency heating coil

Claims (1)

【特許請求の範囲】 【請求項1】 酸化物超電導膜を形成するための原料ガ
スの供給口と残余ガスの排気口を有する反応器の外周に
高周波加熱コイルが、酸化物超電導膜の付設を受ける反
応基板に対応して部分的に配置されており、かつ前記反
応器の外周の高周波加熱コイルが配置されていない部分
に電気抵抗式加熱手段が配置されていることを特徴とす
るMOCVD用反応器。
Claim: What is claimed is: 1. A high-frequency heating coil is provided on the outer periphery of a reactor having a supply port for a raw material gas for forming an oxide superconducting film and an exhaust port for a residual gas, and an oxide superconducting film is attached to the reactor. A MOCVD reaction characterized in that an electric resistance type heating means is arranged in a portion which is partially arranged corresponding to a reaction substrate to be received and in which a high frequency heating coil is not arranged on the outer periphery of the reactor. vessel.
JP18185991A 1991-06-25 1991-06-25 Reactor for mocvd Pending JPH055181A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18185991A JPH055181A (en) 1991-06-25 1991-06-25 Reactor for mocvd

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18185991A JPH055181A (en) 1991-06-25 1991-06-25 Reactor for mocvd

Publications (1)

Publication Number Publication Date
JPH055181A true JPH055181A (en) 1993-01-14

Family

ID=16108085

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18185991A Pending JPH055181A (en) 1991-06-25 1991-06-25 Reactor for mocvd

Country Status (1)

Country Link
JP (1) JPH055181A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100474535B1 (en) * 2002-07-18 2005-03-10 주식회사 하이닉스반도체 Manufacturing apparatus of semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100474535B1 (en) * 2002-07-18 2005-03-10 주식회사 하이닉스반도체 Manufacturing apparatus of semiconductor device

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