JPH0555334A - Defect detection method for lead terminals of surface mount components - Google Patents

Defect detection method for lead terminals of surface mount components

Info

Publication number
JPH0555334A
JPH0555334A JP24036091A JP24036091A JPH0555334A JP H0555334 A JPH0555334 A JP H0555334A JP 24036091 A JP24036091 A JP 24036091A JP 24036091 A JP24036091 A JP 24036091A JP H0555334 A JPH0555334 A JP H0555334A
Authority
JP
Japan
Prior art keywords
lead terminal
lead
floating
image
electronic component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24036091A
Other languages
Japanese (ja)
Inventor
Akira Minoguchi
昭 美濃口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Communication Equipment Co Ltd
Original Assignee
Toyo Communication Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Communication Equipment Co Ltd filed Critical Toyo Communication Equipment Co Ltd
Priority to JP24036091A priority Critical patent/JPH0555334A/en
Publication of JPH0555334A publication Critical patent/JPH0555334A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】 【目的】 簡単な方法によりリ−ド端子の浮きを判定す
ることができる表面実装部品のリ−ド端子の不良個所の
検出方法を提供すること。 【構成】 電子部品のリ−ド端子に少なくとも2以上の
異なる角度より光線を照射し該照射により得られるリ−
ド端子の投影像の変動量からリ−ド部材の浮きを検出す
る方法において、電子部品を透光性基台上に載置した状
態で上方から前記光線群を照射するとともに該透光性基
台下方に配置した撮像手段によって該透光性基台上に結
像した投影像を撮像し、投影像の変動量をS1 、リード
端子先端部を照射して透光性基台上に投影する一方の光
線と透光性基台面との間で形成される角度をθとした場
合、h=S1 tanθ によって前記リード端子先端部
の浮き量hを検出する。
(57) [Abstract] [Purpose] To provide a method for detecting a defective portion of a lead terminal of a surface mount component capable of determining the floating of the lead terminal by a simple method. A reader obtained by irradiating a lead terminal of an electronic component with light rays from at least two or more different angles.
In the method of detecting the floating of the lead member from the variation amount of the projected image of the lead terminal, the light ray group is irradiated from above while the electronic component is placed on the light transmitting base, and the light transmitting base is irradiated. A projection image formed on the translucent base is picked up by an image pickup means arranged below the table, and the variation amount of the projected image is S1, and the tip portion of the lead terminal is irradiated and projected onto the translucent base. When the angle formed between one light beam and the transparent base surface is θ, the floating amount h of the tip portion of the lead terminal is detected by h = S1 tan θ.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は表面実装用プリント配線
パターン上にハンダ接続される実装部品のリード端子に
関し、特に浮き等の不良がある場合にこれを精度よく検
出できる表面実装部品のリード端子の不良検出方法に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a lead terminal of a mounting component soldered on a surface mounting printed wiring pattern, and particularly to a lead terminal of a surface mounting component capable of accurately detecting a defect such as floating. The present invention relates to a defect detection method.

【0002】[0002]

【従来の技術】基板上のプリントパターンにフラットパ
ッケージIC等の電子部品を実装する場合には、IC等
の周辺部から外部に向けて導出された多数のリード端子
と夫々対応するように矩形の配線パターンをプリント基
板上に予め形成しておき、各リード端子先端と各パター
ンとをハンダ接続する方法が一般に採用されている。
2. Description of the Related Art When an electronic component such as a flat package IC is mounted on a printed pattern on a board, a rectangular shape is formed so as to correspond to a large number of lead terminals led out from the peripheral portion of the IC or the like. A method in which a wiring pattern is formed in advance on a printed circuit board and the tip of each lead terminal and each pattern are connected by soldering is generally adopted.

【0003】ハンダ付けの方法としては、各パターン上
に所定量のクリームハンダを印刷形成しておき、クリー
ムハンダ上にリード端子を載置しながら加熱溶融させ、
その後冷却固化させるリフロー方式が多用されている。
As a soldering method, a predetermined amount of cream solder is printed and formed on each pattern, and a lead terminal is placed on the cream solder to heat and melt it.
A reflow method of cooling and solidifying after that is often used.

【0004】ところで、実装前における実装部品のリー
ド端子の形状にはバラツキがあり、このバラツキがハン
ダ接続不良の原因となっている。即ち、リード端子の下
方への突出長のバラツキや上下方向への屈曲による浮
き、更にはリード端子先端部の横方向への屈曲等に起因
してリード端子がパターン部分やハンダから浮いた状態
で固化する接続不良状態が発生することがある。
By the way, there is a variation in the shape of the lead terminal of the mounted component before the mounting, and this variation causes the solder connection failure. That is, the lead terminal may float from the pattern part or the solder due to the variation in the downward protrusion length of the lead terminal, the floating due to the bending in the vertical direction, and the lateral bending of the tip of the lead terminal. A poor connection state that solidifies may occur.

【0005】このため、実装前にリード端子の状態をチ
ェックすることが必要となるが、極小化された電子部品
のリード端子の良否を肉眼で判定することは困難且つ非
効率的であり、しかも自動実装工程における作業効率を
低下させないためには認識機械による不良リードの検出
が必要となる。
For this reason, it is necessary to check the state of the lead terminals before mounting, but it is difficult and inefficient to visually judge the quality of the lead terminals of the miniaturized electronic component, and In order not to reduce the work efficiency in the automatic mounting process, it is necessary to detect defective leads by the recognition machine.

【0006】図3は実装前に電子部品のリード端子の良
否を判定する従来方式の説明図であり、この方式はIC
部品1を吸引具3によって吸着保持してプリント基板上
に搬送する前に、カメラ5によってリード端子2の形状
の良否をチェックするものである。即ち、この従来方式
はIC部品1の上方にスクリーン7を配置するととも
に、IC部品1の左右両側に配置した照明手段9からの
照射光をスクリーン7で反射させ、この反射光をカメラ
5に導くことよって得られた画像情報に所定の画像処理
に基づいて良否を判定する。
FIG. 3 is an explanatory view of a conventional method for judging the quality of a lead terminal of an electronic component before mounting, which is an IC.
Before the component 1 is sucked and held by the suction tool 3 and conveyed onto the printed circuit board, the camera 5 checks whether the shape of the lead terminal 2 is good or bad. That is, in this conventional method, the screen 7 is arranged above the IC component 1, and the irradiation light from the illumination means 9 arranged on both the left and right sides of the IC component 1 is reflected by the screen 7, and the reflected light is guided to the camera 5. The quality is determined based on the image information thus obtained based on predetermined image processing.

【0007】図4(a) 及び(b) は従来の画像処理方法に
よって得られた画像の説明図であり、(a) は2値処理に
よって得た2値画像、(b) は多値処理によって得た多値
画像を示している。
FIGS. 4 (a) and 4 (b) are explanatory views of an image obtained by a conventional image processing method. FIG. 4 (a) is a binary image obtained by binary processing, and FIG. The multi-valued image obtained by is shown.

【0008】なお、ここでリード端子が浮いた状態と
は、載置面に対して垂直方向に曲がった状態を云い、ま
た、リード端子が曲った状態とは、載置面に対して水平
方向に曲がった状態を云う。
Here, the floating state of the lead terminals means a state in which the lead terminals are bent in a vertical direction with respect to the mounting surface, and the bending state of the lead terminals is in a horizontal direction with respect to the mounting surface. It is a bent state.

【0009】リード端子2が浮いている場合に2値処理
では、浮いているリード端子2aの長さが図4(a) に示
すように正常なリード端子に比して短い映像となって表
われる。
In the binary processing when the lead terminal 2 is floating, the length of the floating lead terminal 2a is shorter than that of a normal lead terminal as shown in FIG. 4 (a). Be seen.

【0010】一方、多値処理では図4(b) に示すように
レンズの焦点深度を外れてボケとなり、異常なリード端
子の映像は正常なリード端子に対して濃度差となって表
われる。
On the other hand, in the multi-value processing, as shown in FIG. 4B, the depth of focus of the lens is deviated to cause blurring, and an abnormal lead terminal image appears as a density difference with respect to a normal lead terminal.

【0011】従って、これらの出力を検出することによ
り正常な電子部品はプリント基板の所定の位置に装着さ
れ、リ−ド曲りが許容値以上の場合、該電子部品は破棄
され、次の電子部品を吸着具が吸着し、リ−ド曲がりを
検出する。
Therefore, by detecting these outputs, a normal electronic component is mounted at a predetermined position on the printed circuit board, and if the lead bending is more than the allowable value, the electronic component is discarded and the next electronic component is discarded. Is sucked by the suction tool and the lead bend is detected.

【0012】しかしながら、前述した従来の方法では平
面的な画像処理となるためリ−ド浮きのような奥行方向
の認識処理にはカメラ等の検出器における精度上の問題
によりおのずと限界が生じるという問題点があった。
However, since the above-mentioned conventional method uses planar image processing, the recognition processing in the depth direction such as the lead floating is naturally limited due to the accuracy problem in the detector such as a camera. There was a point.

【0013】[0013]

【発明の目的】本発明は上述したごとき従来の電子部品
のリ−ド曲がり検出装置に於ける問題を解決すべくなさ
れたものであって、簡単な方法によりリ−ド端子の浮き
を判定することができる表面実装部品のリ−ド端子の不
良個所の検出方法を提供することを目的としている。
SUMMARY OF THE INVENTION The present invention has been made to solve the problems in the conventional lead bend detecting device for electronic parts as described above, and determines whether the lead terminals are floating or not by a simple method. It is an object of the present invention to provide a method for detecting a defective portion of a lead terminal of a surface mount component that can be used.

【0014】[0014]

【発明の概要】上述の目的を達成するため、本発明に係
るリ−ド状態検出方法は、リ−ド部材に少なくとも2以
上の光源から異なる角度より光線を照射し、該照射によ
り得られるリ−ドの投影像の変動量からリ−ド部材の浮
きを検出し、更に電子部品を透光性基台上に載置した状
態で上方から前記光線群を照射するとともに該透光性基
台下方に配置した撮像手段によって該透光性基台上に結
像した投影像を撮像し、該投影像の変動量をS1 、リー
ド端子先端部を照射して透光性基台上に投影する一方の
光線と透光性基台面との間で形成される角度をθとした
場合に、式 h=S1 tanθによって前記リード端子
先端部の浮き量hを検出することを特徴としている。
SUMMARY OF THE INVENTION In order to achieve the above object, a method for detecting a lead state according to the present invention irradiates a lead member with light rays from at least two light sources at different angles and obtains the light obtained by the irradiation. -The floating of the lead member is detected from the variation of the projected image of the lead, and the light ray group is irradiated from above while the electronic component is placed on the transparent base, and the transparent base is also irradiated. The projection image formed on the translucent base is picked up by the image pickup means arranged below, and the variation amount of the projected image is S1, and the tip of the lead terminal is irradiated and projected onto the translucent base. When the angle formed between one light beam and the light-transmitting base surface is θ, the floating amount h of the tip portion of the lead terminal is detected by the formula h = S1 tan θ.

【0015】[0015]

【実施例】以下、添付図面に示した実施例に基づいて本
発明を詳細に説明する。図1は本発明に係る電子部品形
状検査装の概略構成を示す図であって、IC部品11を
オプティックファイバプレート(透光性基台)12上に
載置した状態でリ−ド端子13の形状をチェックするも
のである。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail below with reference to the embodiments shown in the accompanying drawings. FIG. 1 is a diagram showing a schematic configuration of an electronic component shape inspection apparatus according to the present invention, in which an IC component 11 is mounted on an optic fiber plate (translucent base) 12 and a lead terminal 13 is provided. The shape is checked.

【0016】即ち、IC部品11から延びるリード端子
13の上方に所定の角度θ1を有するように配置した第
1の光源15と、リ−ド端子13の導出方向に対して所
定の角度θ2をもつように配置した第2の光源17によ
り夫々リ−ド端子の先端部へ向けて光を照射し、オプテ
ィックファイバプレート12を透過した投影像をリード
端子の垂直下方に設けられたカメラ19(撮像手段)に
より撮像する。なお、この実施例では角度θ1は90度
であり、θ2は60度である。カメラ19はCCDカメ
ラであり、光源1、2からの光によってオプティックフ
ァイバプレート12に投影されたリード端子先端部の像
を下側から撮像できる位置に設置する。このように構成
した装置において光源15により光を照射して得た投影
像を影像A、一方、光源17より光を照射して得た投影
像を影像Bとすると、該2つの影像A、Bによりリ−ド
の浮きの有無及び浮きの量を判定することができる。
That is, the first light source 15 is arranged above the lead terminal 13 extending from the IC component 11 so as to have a predetermined angle .theta.1, and has a predetermined angle .theta.2 with respect to the lead-out direction of the lead terminal 13. The second light sources 17 arranged in this way respectively irradiate light toward the tip of the lead terminal, and the projected image transmitted through the optic fiber plate 12 is provided in a camera 19 (imaging means) provided vertically below the lead terminal. ). In this embodiment, the angle θ1 is 90 degrees and the angle θ2 is 60 degrees. The camera 19 is a CCD camera and is installed at a position where an image of the tip of the lead terminal projected onto the optic fiber plate 12 by the light from the light sources 1 and 2 can be captured from below. When the projection image obtained by irradiating light from the light source 15 in the apparatus configured as described above is a shadow image A and the projection image obtained by irradiating light from the light source 17 is a shadow image B, the two shadow images A and B are obtained. Thus, it is possible to determine whether or not the lead is floating and the amount of floating.

【0017】以下、判定方法について詳細に説明する。The determination method will be described in detail below.

【0018】まず、図3(a) に示すように影像Aより各
リード端子の先端中央部を検出して各端子の中央部をC
1 、C2 、C3 ・・・とし、各中央部C1 、C2 、C3
・・・の間隔P1 、P2 を計測することによりリードの
ピッチが規定通りであるか否かを検出する。続いて、例
えば図2に示すようにいずれのリード端子にも浮きがな
い場合には図3(a) (b) に示すように影像A、Bに現れ
るリード端子はいずれも均等な長さを有している。とこ
ろが、図4に示すようにリード端子12が浮いている場
合には光源17により光を照射して得た投影像B(図
5)は正常な位置にリ−ドが存在する場合に結像する投
影像に対してS1 だけ結像位置が移動する。従って、例
えば中央のリード端子のみに浮きがある場合には図5に
示すように当該リード端子がS1 だけ短くなって映る。
First, as shown in FIG. 3A, the center portion of the tip of each lead terminal is detected from the image A, and the center portion of each terminal is detected by C.
1, C2, C3 ... And each central portion C1, C2, C3
By measuring the intervals P1 and P2 of ..., it is detected whether or not the lead pitch is as specified. Then, for example, when there is no floating in any of the lead terminals as shown in FIG. 2, the lead terminals appearing in the images A and B have equal lengths as shown in FIGS. 3 (a) and 3 (b). Have However, as shown in FIG. 4, when the lead terminal 12 is floating, the projected image B (FIG. 5) obtained by irradiating the light from the light source 17 is formed when the lead exists at the normal position. The image forming position moves by S1 with respect to the projected image. Therefore, for example, when only the lead terminal at the center has a float, the lead terminal is shortened by S1 as shown in FIG.

【0019】リード端子先端部の結像位置の変動はリ−
ド端子の浮きを原因として生じるものであり、リード先
端部の浮き量hは結像位置の変動量をS1 、第2光源1
7から出射されリード端子先端部を照射してファイバー
プレート12上に投影する光とファイバープレート12
との間で形成される角度をθとした場合、次の式によっ
て表される。
The fluctuation of the image forming position at the tip of the lead terminal is relieved.
This is caused by the floating of the lead terminal, and the floating amount h of the tip of the lead is determined by the fluctuation amount of the image forming position S1 and the second light source 1
And the fiber plate 12 which is emitted from 7 and is projected onto the fiber plate 12 by irradiating the tip of the lead terminal.
When the angle formed between and is θ, it is expressed by the following equation.

【0020】h=S1 tanθ 即ち、浮きによる結像位置の変動量は、投影像A、Bの
移動量S1 と角度θを測定することにより容易に求める
ことができる。
H = S1 tan θ That is, the amount of change in the image forming position due to floating can be easily obtained by measuring the amount of movement S1 of the projected images A and B and the angle θ.

【0021】なお、リ−ド端子が単に曲がりのみを生じ
ている場合に、曲がり量を検出するためには光源は一つ
で十分である。曲がりが浮きを伴っている場合には前記
式によって浮き量を検出することができること勿論であ
る。
When the lead terminal is merely bent, one light source is enough to detect the amount of bending. Of course, when the bend is accompanied by floating, the floating amount can be detected by the above formula.

【0022】以上のように2方向から光を照射しその際
に結像される投影像を1台のカメラを用いて処理するこ
とによりリ−ドの浮きの有無及び浮き量を検出すること
ができる。
As described above, by irradiating light from two directions and processing the projected images formed at that time by using one camera, it is possible to detect the presence or absence and the amount of floating of the lead. it can.

【0023】[0023]

【発明の効果】以上のように本発明によれば、電子部品
のリ−ド端子の導出方向に対して所定の角度の2方向よ
り光を照射し、それによりオプティックファイバ上に結
像した投影像からリ−ド端子の浮きの有無及び浮きの量
を検出することができ、確実なリ−ド状態を把握するう
えで著しい効果を発揮する。
As described above, according to the present invention, light is emitted from two directions at a predetermined angle with respect to the lead-out direction of the lead terminal of the electronic component, and as a result, a projection image is formed on the optic fiber. Whether or not the lead terminal is floating and the amount of floating can be detected from the image, which is extremely effective in grasping the reliable lead state.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る電子部品形状検査装置の外観構成
を示す図。
FIG. 1 is a diagram showing an external configuration of an electronic component shape inspection apparatus according to the present invention.

【図2】リード端子が正常な場合を示す説明図。FIG. 2 is an explanatory diagram showing a case where a lead terminal is normal.

【図3】(a) 及び(b) は正常なリード端子の影像A及び
Bを示す図。
3A and 3B are views showing images A and B of a normal lead terminal.

【図4】リード端子に浮きがある場合の状態を示す図。FIG. 4 is a view showing a state in which the lead terminal has a float.

【図5】リード端子に浮きがある場合の影像Bを示す図
である。
FIG. 5 is a diagram showing a shadow image B in the case where the lead terminal is floating.

【図6】従来の検出方法を示す説明図。FIG. 6 is an explanatory diagram showing a conventional detection method.

【図7】(a) 及び(b) 従来の画像処理方法によって得ら
れた画像の説明図。
7A and 7B are explanatory diagrams of an image obtained by a conventional image processing method.

【符号の説明】[Explanation of symbols]

11・・・IC部品、12・・・オプティックファイバ
プレート(透光性基台) 13・・・リ−ド端子、15・・・第1の光源、17・
・・第2の光源、19・・・カメラ(撮像手段)、A、
B・・・影像、
11 ... IC parts, 12 ... Optic fiber plate (translucent base) 13 ... Lead terminals, 15 ... First light source, 17 ...
..Second light source, 19 ... Camera (imaging means), A,
B ... image,

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 電子部品のリ−ド端子の状態を検出する
リ−ド端子の不良検出方法であって、リ−ド端子に少な
くとも2以上の異なる角度より光線を照射し該照射によ
り得られるリ−ド端子の投影像の変動量からリ−ド部材
の浮きを検出する方法において、 前記電子部品を透光性基台上に載置した状態で上方から
前記光線群を照射するとともに該透光性基台下方に配置
した撮像手段によって該透光性基台上に結像した投影像
を撮像し、 前記投影像の変動量をS1 、リード端子先端部を照射し
て透光性基台上に投影する一方の光線と透光性基台面と
の間で形成される角度をθとした場合、次式 h=S1 tanθ によって前記リード端子先端部の浮き量hを検出するこ
とを特徴とする表面実装部品のリ−ド端子の不良検出方
法。
1. A method for detecting a failure of a lead terminal for detecting a state of a lead terminal of an electronic component, which is obtained by irradiating a light beam to the lead terminal from at least two different angles. In a method of detecting the floating of a lead member from the variation amount of a projected image of a lead terminal, the electronic component is placed on a translucent base, and the light beam group is irradiated from above while the electronic component is radiated. A projection image formed on the translucent base is imaged by an image pickup means disposed below the translucent base, and the variation amount of the projected image is S1, and the tip of the lead terminal is irradiated to illuminate the translucent base. When the angle formed between one light ray projected on the upper surface and the transparent base surface is θ, the floating amount h of the lead terminal tip portion is detected by the following equation: h = S1 tan θ Detecting lead terminal defects of surface mount components.
JP24036091A 1991-08-27 1991-08-27 Defect detection method for lead terminals of surface mount components Pending JPH0555334A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24036091A JPH0555334A (en) 1991-08-27 1991-08-27 Defect detection method for lead terminals of surface mount components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24036091A JPH0555334A (en) 1991-08-27 1991-08-27 Defect detection method for lead terminals of surface mount components

Publications (1)

Publication Number Publication Date
JPH0555334A true JPH0555334A (en) 1993-03-05

Family

ID=17058336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24036091A Pending JPH0555334A (en) 1991-08-27 1991-08-27 Defect detection method for lead terminals of surface mount components

Country Status (1)

Country Link
JP (1) JPH0555334A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010271131A (en) * 2009-05-20 2010-12-02 Ckd Corp Inspection device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010271131A (en) * 2009-05-20 2010-12-02 Ckd Corp Inspection device

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