JPH0562032B2 - - Google Patents
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- Publication number
- JPH0562032B2 JPH0562032B2 JP62248767A JP24876787A JPH0562032B2 JP H0562032 B2 JPH0562032 B2 JP H0562032B2 JP 62248767 A JP62248767 A JP 62248767A JP 24876787 A JP24876787 A JP 24876787A JP H0562032 B2 JPH0562032 B2 JP H0562032B2
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- Japan
- Prior art keywords
- welding
- waveform
- limit value
- lower limit
- sample value
- Prior art date
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- Arc Welding Control (AREA)
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、抵抗溶接やパーカツシヨン溶接等に
おいて、溶接時の溶接波形を監視する溶接監視装
置に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a welding monitoring device for monitoring welding waveforms during welding in resistance welding, percussion welding, and the like.
(従来の技術)
従来、この種の装置に関連する装置としては、
例えば特開昭61−49793号公報に示すものが知ら
れている。(Prior art) Conventionally, devices related to this type of device include:
For example, one disclosed in Japanese Unexamined Patent Publication No. 61-49793 is known.
この装置は、あらかじめ溶接電圧波形を読み取
り、それをもとに上限値および下限値の各基準波
形で定まる許容範囲を決め、溶接時における検出
溶接電圧波形がその許容範囲に入つているか否か
によつて溶接の良否判断を行うようにしたもので
ある。 This device reads the welding voltage waveform in advance, determines the tolerance range determined by each reference waveform of the upper limit value and the lower limit value based on it, and checks whether the detected welding voltage waveform during welding is within the tolerance range. Therefore, it is possible to judge the quality of welding.
また、溶接電圧波形や電流波形は、一般に複雑
な曲線からなる。 Further, welding voltage waveforms and current waveforms generally consist of complicated curves.
(発明が解決しようとする問題点)
このように従来装置では、溶接時における検出
溶接電圧の波形が上限値と下限値の各基準波形で
定まる許容範囲内に入つているか否かによつて溶
接の良否のみしか知ることができなかつた。(Problems to be Solved by the Invention) In this way, in the conventional device, welding is performed based on whether the waveform of the detected welding voltage during welding is within the allowable range determined by each reference waveform of the upper limit value and lower limit value. All I could know was whether it was good or bad.
従つて、検出溶接電圧の波形が許容範囲内とな
つて溶接が良好であつても、その検出波形を上述
の上下の基準波形との関連で知ることができず、
しかもその各検出波形の傾向を的確に知ることが
できないので、溶接条件を適正な状態に変更でき
ず、もつて溶接の適正化が図れないという欠点が
あつた。 Therefore, even if the waveform of the detected welding voltage is within the allowable range and the welding is good, the detected waveform cannot be known in relation to the above-mentioned upper and lower reference waveforms.
Moreover, since the trends of each detected waveform cannot be accurately known, the welding conditions cannot be changed to an appropriate state, resulting in the disadvantage that welding cannot be optimized.
さらに、検出溶接電圧の波形が許容範囲外とな
つて溶接不良のときには、その検出波形の全体が
許容範囲から全く外れてしまつたのか、または検
出波形の一部が許容範囲内に含まれるのかという
ようにその状態を基準波形との関連で知ることが
できないので、溶接不良時にその不良の内容や原
因を容易に知り得ず、その不良に的確かつ迅速に
対処できないという欠点があつた。 Furthermore, when the waveform of the detected welding voltage is outside the allowable range and a welding defect occurs, it is necessary to determine whether the entire detected waveform is completely outside the allowable range, or whether part of the detected waveform is within the allowable range. Since the condition cannot be known in relation to the reference waveform, when a welding defect occurs, the content and cause of the defect cannot be easily known, and the defect cannot be dealt with accurately and quickly.
そこで、本発明は、溶接時における溶接波形を
許容範囲の上限値および下限値を定める各基準波
形との関連で直接画面上で知ることができるよう
にし、もつて溶接の適正化を図るとともに、溶接
不良時にをの不良に的確かつ迅速に対処すること
を目的とする。 Therefore, the present invention enables the welding waveform during welding to be directly known on the screen in relation to each reference waveform that determines the upper and lower limits of the allowable range, thereby improving the welding process. The purpose is to accurately and quickly deal with welding defects.
(問題点を解決するための手段)
かかる目的を達成するために本発明は、以下の
ような構成とした。(Means for Solving the Problems) In order to achieve the above object, the present invention has the following configuration.
すなわち、本発明は、溶接波形を検出する溶接
波形検出手段Aと、
その検出した溶接波形を所定の周期で標本化し
て各標本値を求める標本値算出手段Bと、
複数の正常な溶接波形についてあらかじめ前記
標本値算出手段Bで標本値を求め、その求めた標
本値に基いて上限値および下限値を設定する上下
限値設定手段Cと、
その求めた上限値および下限値を記憶する記憶
手段Dと、
溶接時における前記溶接波形検出手段Aの検出
波形より前記標本値算出手段Bが求めた標本値
と、前記記憶手段Dから読み出した上限値および
下限値とを時間軸で重ならないように所定の順序
で周期的に配列する出力信号配列手段Eとからな
る。 That is, the present invention includes: a welding waveform detection means A for detecting a welding waveform; a sample value calculation means B for sampling the detected welding waveform at a predetermined period to obtain each sample value; and regarding a plurality of normal welding waveforms. Upper and lower limit value setting means C that obtains a sample value in advance by the sample value calculation means B and sets an upper limit value and a lower limit value based on the obtained sample value; and a storage means that stores the obtained upper limit value and lower limit value. D, the sample value calculated by the sample value calculation means B from the detected waveform of the welding waveform detection means A during welding, and the upper and lower limit values read from the storage means D so that they do not overlap on the time axis. and an output signal arrangement means E that periodically arranges the output signals in a predetermined order.
(作用)
本発明では、溶接波形の観測に先立つて、複数
の正常な溶接波形についてあらかじめ標本値算出
手段Bで標本値を求め、その求めた標本値に基
き、上下限値設定手段Cが観測波形の許容範囲の
上下限に対応する上限値および下限値を設定す
る。この上限値および下限値は、記憶手段Dにあ
らかじめ記憶しておく。(Function) In the present invention, prior to observing the welding waveform, sample values are obtained in advance by the sample value calculation means B for a plurality of normal welding waveforms, and based on the obtained sample values, the upper and lower limit value setting means C performs the observation. Set the upper and lower limits corresponding to the upper and lower limits of the waveform's allowable range. These upper limit values and lower limit values are stored in the storage means D in advance.
そして、溶接波形の観測時には、出力信号配列
手段Eは、溶接波形検出手段Aの検出波形から標
本値算出手段Bが求めた標本値と、記憶手段Dか
ら読み出した上限値および下限値とを時間軸で重
ならないように所定の順序で周期的に配列する。 Then, when observing the welding waveform, the output signal array means E calculates the sample value calculated by the sample value calculation means B from the detected waveform of the welding waveform detection means A, and the upper and lower limit values read from the storage means D over time. They are arranged periodically in a predetermined order so that they do not overlap along the axis.
従つて、出力信号配列手段Eからの出力信号を
オシロスコープ等に供給すれば、観測波形を、そ
の許容範囲の上限値および下限値を定める各基準
波形と同時に同一画面で観測することができる。 Therefore, by supplying the output signal from the output signal array means E to an oscilloscope or the like, the observed waveform can be observed on the same screen at the same time as each reference waveform that defines the upper and lower limits of its permissible range.
(実施例) 第2図は本発明実施例のブロツク図である。(Example) FIG. 2 is a block diagram of an embodiment of the present invention.
図において、1はマイクロプロセツサ形態の
CPU(中央処理装置)であり、例えば第3図およ
び第4図に示すようにあらかじめ定められた手順
により各構成要素を制御する。 In the figure, 1 is in the form of a microprocessor.
It is a CPU (central processing unit), and controls each component according to a predetermined procedure as shown in FIGS. 3 and 4, for example.
2はメモリであり、CPU1が各構成要素を制
御するための制御手順を記憶するリード・オン
リ・メモリ(ROM)と、後述のように溶接波形
にかかるデータなどを記憶するランダム・アクセ
ス・メモリ(RAM)とからなる。 2 is memory, which includes a read-only memory (ROM) that stores control procedures for the CPU 1 to control each component, and a random access memory (ROM) that stores data related to welding waveforms as described later. RAM).
3は電気溶接の際に溶接装置で発生する溶接電
流または溶接電圧を検出する溶接波形検出器であ
り、この検出器3で検出された電流または電圧は
サンプルホールダ4に供給する。サンプルホール
ダ4は、CPU1からの指令による所定のサンプ
リング周期で標本化を行い、その標本値をA/D
変換器5に供給する。 A welding waveform detector 3 detects a welding current or welding voltage generated by a welding device during electric welding, and the current or voltage detected by this detector 3 is supplied to a sample holder 4. The sample holder 4 performs sampling at a predetermined sampling period according to a command from the CPU 1, and sends the sampled value to the A/D.
Converter 5 is supplied.
6はD/A変換器であり、後述のように処理さ
れた本発明にかかるデジタルデータをオシロスコ
ープ7で観測するためにD/A変換する。また、
オシロスコープ7には、後述のようにブランキン
グパルス発生回路からのブランキングパルスを供
給する。 Reference numeral 6 denotes a D/A converter, which converts the digital data according to the present invention, which has been processed as will be described later, from D/A in order to be observed with an oscilloscope 7. Also,
The oscilloscope 7 is supplied with blanking pulses from a blanking pulse generation circuit as described later.
10は電気溶接が後述のように不良であると判
定されたときに、その不良品を排除するための不
良品排除用アクチユエータであり、このアクチユ
エータ10は駆動回路9によつて駆動する。 Reference numeral 10 denotes a defective product removal actuator for removing a defective product when the electric welding is determined to be defective as described later. This actuator 10 is driven by a drive circuit 9.
次に以上のように構成される実施例の動作例に
ついて第3図および第4図等を参照して説明す
る。 Next, an example of the operation of the embodiment configured as described above will be explained with reference to FIGS. 3 and 4.
本実施例では、溶接波形の観測に先立つて第3
図に示すような手順によりサンプルデータを収録
および処理して記憶する。 In this example, the third
Sample data is recorded, processed, and stored according to the procedure shown in the figure.
すなわち、溶接波形検出器3で正常な溶接波形
を検出し、その検出波形をサンプルホールダ4が
例えば0.1μsecの周期で標本化するとともに、そ
の標本値をA/D変換器5でA/D変換してデジ
タル信号化する。これらの各処理を例えば溶接波
形の24個について行う(ステツプS1)。 That is, the welding waveform detector 3 detects a normal welding waveform, the sample holder 4 samples the detected waveform at a cycle of, for example, 0.1 μsec, and the sample value is A/D converted by the A/D converter 5. and convert it into a digital signal. Each of these processes is performed on, for example, 24 welding waveforms (step S1).
次に、この24個のサンプル波形から求めた各標
本点における24個の標本値の中から最大値と最小
値とをそれぞれ選択するとともに、例えばこれら
各値に±αの加算を行う(ステツプS2)。これに
より、例えば第5図に示すように観測波形の許容
範囲の上下限に対応する上限値aと下限値bとが
決まる。 Next, the maximum value and minimum value are selected from among the 24 sample values at each sample point obtained from the 24 sample waveforms, and, for example, ±α is added to each of these values (step S2 ). As a result, as shown in FIG. 5, for example, an upper limit value a and a lower limit value b corresponding to the upper and lower limits of the allowable range of the observed waveform are determined.
そして、その上限値aに対応する各デジタルデ
ータをメモリ2に記憶するとともに、下限値bに
対応する各デジタルデータをメモリ2に記憶する
(ステツプS3、S4)。 Then, each digital data corresponding to the upper limit value a is stored in the memory 2, and each digital data corresponding to the lower limit value b is stored in the memory 2 (steps S3 and S4).
次に、溶接が開始されてその溶接波形を観測す
るときには、第4図に示すような処理を行う。 Next, when welding is started and the welding waveform is observed, processing as shown in FIG. 4 is performed.
まず、溶接波形検出器3が観測波形を検出し、
その検出波形をサンプルホールダ4が例えば
0.1μsecの周期で標本化し、その標本値をA/D
変換器5でA/D変換してメモリ2に記憶する
(ステツプS11)。 First, the welding waveform detector 3 detects the observed waveform,
The sample holder 4 receives the detected waveform, for example.
Sample at a cycle of 0.1 μsec and convert the sample value to A/D
The converter 5 performs A/D conversion and stores it in the memory 2 (step S11).
次に、このように求めた観測波形にかかる各標
本点における各標本値が、第5図で示すように上
限値aと下限値bとの間で形成される許容範囲に
あるか否かを判定する。許容範囲にないときに
は、不良品排除用アクチユエータ10を作動させ
てその不良品を排除する等、所定の処理を行う
(ステツプS12)。 Next, it is determined whether each sample value at each sample point of the observed waveform obtained in this way is within the tolerance range formed between the upper limit value a and the lower limit value b, as shown in Figure 5. judge. If the defective product is not within the allowable range, predetermined processing is performed, such as activating the defective product exclusion actuator 10 to eliminate the defective product (step S12).
次に、上限値aに対応するデジタルデータ、下
限値bに対応するデジタルデータ、および観測波
形cにかかる各標本値に対応するデジタルデータ
を順次周期的に読み出し(ステツプS13〜S15)、
これらデータをD/A変換器6でD/A変換して
アナログ信号化する。このようにD/A変換され
た波形は、第6図Aに示すように時間軸で重なら
ないように所定の順序で周期的に配列された波形
となる。 Next, the digital data corresponding to the upper limit value a, the digital data corresponding to the lower limit value b, and the digital data corresponding to each sample value of the observed waveform c are sequentially and periodically read out (steps S13 to S15).
These data are converted into analog signals by D/A converter 6. The waveforms D/A converted in this manner become waveforms that are periodically arranged in a predetermined order so as not to overlap on the time axis, as shown in FIG. 6A.
そして、これら各データを所定回数であるX回
読み出したときに(ステツプS13〜S18)、オシロ
スコープ7の表示画面には、第5図に示すように
上限値a、下限値b、および観測波形cの3つが
同時に表示される。 When each of these data is read out a predetermined number of times (steps S13 to S18), the display screen of the oscilloscope 7 displays the upper limit value a, the lower limit value b, and the observed waveform c, as shown in FIG. All three are displayed at the same time.
なお、第6図Bに示すように、観測波形cにか
かるデータの各出力時にブランキングパルス発生
器8からブランキングパルスを発生させ、このパ
ルスをオシロスコープ7のZ軸に加えることによ
り観測波形にコントラストを与えるようにしたの
で、他の波形と識別しやすい。 As shown in FIG. 6B, a blanking pulse is generated from the blanking pulse generator 8 at each output of data related to the observed waveform c, and this pulse is applied to the Z axis of the oscilloscope 7 to generate the observed waveform. Since it provides contrast, it is easy to distinguish it from other waveforms.
以上説明した実施例は、第4図に示すように溶
接波形の観測時にデータをソフトウエア的に処理
し、観測波形等を同時に表示する場合について説
明した。しかし、第4図で示す制御手順を第7図
または第8図に示すようにハードウエアで構成す
ることも可能であり、以下にこれらの実施例につ
いて説明する。 In the embodiment described above, as shown in FIG. 4, data is processed by software when observing a welding waveform, and the observed waveform etc. are displayed at the same time. However, it is also possible to configure the control procedure shown in FIG. 4 using hardware as shown in FIG. 7 or FIG. 8, and these embodiments will be described below.
第7図の実施例は、上限値aに対応するデジタ
ルデータを記憶する上限値メモリ11と、下限値
bに対応するデジタルデータを記憶する下限値メ
モリ12と、観測時に観測波形を増幅およびA/
D変換するA/D変換器13とを有し、これらメ
モリ11,12およびA/D変換器13からのデ
ジタルデータを、電子スイツチ14で選択出力し
てD/A変換器15に供給するように構成する。
また、スキヤンニング発生器16の出力をメモリ
11,12、A/D変換器13、および電子スイ
ツチ14にそれぞれ供給する。 The embodiment shown in FIG. 7 includes an upper limit value memory 11 that stores digital data corresponding to an upper limit value a, a lower limit value memory 12 that stores digital data that corresponds to a lower limit value b, and amplifies and A amplifies the observed waveform during observation. /
The digital data from the memories 11, 12 and the A/D converter 13 is selectively outputted by an electronic switch 14 and supplied to the D/A converter 15. Configure.
Further, the output of the scanning generator 16 is supplied to the memories 11 and 12, the A/D converter 13, and the electronic switch 14, respectively.
このような構成の実施例では、溶接波形の観測
に先立つて第3図に示す手順により求めたデータ
をメモリ11,12にそれぞれ記憶する。そし
て、溶接波形の観測時には、メモリ11,12に
格納されているデジタルデータおよび観測波形を
A/D変換器13でA/D変換したデジタルデー
タを、電子スイツチ14によつて所定の周期で順
次選択し、これら各データをD/A変換器15で
D/A変換すると、その出力は第9図に示すよう
な波形となる。従つて、第7図の実施例では、第
5図で示すと同様に3つの波形を同時に表示する
ことが可能である。 In the embodiment having such a configuration, prior to observing the welding waveform, data obtained by the procedure shown in FIG. 3 is stored in the memories 11 and 12, respectively. When observing the welding waveform, the digital data stored in the memories 11 and 12 and the digital data obtained by A/D converting the observed waveform by the A/D converter 13 are sequentially transmitted at a predetermined period by the electronic switch 14. When these data are selected and subjected to D/A conversion by the D/A converter 15, the output has a waveform as shown in FIG. Therefore, in the embodiment shown in FIG. 7, it is possible to display three waveforms simultaneously, similar to that shown in FIG.
次に、第8図に示す他の実施例について説明す
ると、この実施例は、観測時に観測波形をA/D
変換器13でA/D変換していつたん観測波形メ
モリ19に記憶し、メモリ11,12,19の各
デジタルデータをD/A変換器17,18,20
でそれぞれD/A変換してアナログ化し、これら
各アナログ信号を電子スイツチ14によつて所定
の周期で順次選択するようにしたものである。 Next, another embodiment shown in FIG. 8 will be explained. In this embodiment, the observed waveform is converted to A/D at the time of observation.
The converter 13 performs A/D conversion and stores it in the observed waveform memory 19, and the digital data in the memories 11, 12, and 19 is converted to D/A converters 17, 18, and 20.
Each signal is converted into an analog signal through D/A conversion, and each of these analog signals is sequentially selected at a predetermined period by an electronic switch 14.
従つて、この実施例によれば、電子スイツチ1
4からの出力波形は第9図に示すようになり、こ
れは第7図におけるD/A変換器15の出力波形
と同様となる。 Therefore, according to this embodiment, the electronic switch 1
The output waveform from D/A converter 4 becomes as shown in FIG. 9, which is similar to the output waveform of D/A converter 15 in FIG.
(発明の効果)
以上のように本発明では、溶接波形の観測時に
おいて、観測波形にかかる標本値のデータ、およ
びその観測波形の許容範囲を決定する上下限デー
タを、時間軸で重ならないように所定の順序で周
期的に配列して出力信号を形成するようにしたの
で、この出力信号をオシロスコープに供給すれ
ば、観測波形を、上限値および下限値を定める各
基準波形と同時に同一画面で観測することができ
る。(Effects of the Invention) As described above, in the present invention, when observing a welding waveform, the sample value data for the observed waveform and the upper and lower limit data that determine the allowable range of the observed waveform are arranged so that they do not overlap on the time axis. are arranged periodically in a predetermined order to form an output signal, so that by feeding this output signal to an oscilloscope, the observed waveform can be viewed on the same screen at the same time as each reference waveform that defines the upper and lower limits. It can be observed.
従つて、本発明では、溶接検出波形が許容範囲
内にあつて溶接が良好のときであつても、その検
出波形を上下の基準波形との関連で監視でき、し
かもその各検出波形の傾向から溶接状態を的確に
知ることができるので、溶接条件を適正な状態に
変更でき、もつて溶接の適正化が図れるという効
果を奏する。 Therefore, in the present invention, even when the welding detection waveform is within the allowable range and the welding is good, the detected waveform can be monitored in relation to the upper and lower reference waveforms, and moreover, it is possible to monitor the detected waveform from the trend of each detected waveform. Since the welding state can be accurately known, the welding conditions can be changed to an appropriate state, which has the effect of making it possible to optimize the welding.
また、本発明では、溶接検出波形が許容範囲外
となつて溶接不良のときには、その不良波形を上
下の基準波形との関連で観察できるので、溶接不
良時にはその不良内容や原因を容易に把握でき、
もつてその不良に的確かつ迅速に対処でき作業性
が向上するという効果を奏する。 Furthermore, in the present invention, when the welding detection waveform is outside the allowable range and there is a welding defect, the defective waveform can be observed in relation to the upper and lower reference waveforms, so when the welding defect occurs, the content and cause of the defect can be easily understood. ,
As a result, the defect can be dealt with accurately and quickly, resulting in improved work efficiency.
第1図は本発明の機能図、第2図は本発明実施
例のブロツク図、第3図および第4図はそれぞれ
その制御手段の一例を示すフローチヤート、第5
図は本発明にかかる観測波形等の表示例を示す
図、第6図は第2図における各部の波形図、第7
図および第8図はそれぞれ本発明の他の実施例を
示すブロツク図、第9図は第7図の出力波形を示
す波形図である。
Aは溶接波形検出手段、Bは標本値算出手段、
Cは上下限値設定手段、Dは記憶手段、Eは出力
信号配列手段。
FIG. 1 is a functional diagram of the present invention, FIG. 2 is a block diagram of an embodiment of the present invention, FIGS. 3 and 4 are flowcharts showing an example of the control means, and FIG.
The figures are diagrams showing examples of displaying observed waveforms, etc. according to the present invention, FIG. 6 is a waveform diagram of each part in FIG. 2, and FIG.
8 and 8 are block diagrams showing other embodiments of the present invention, respectively, and FIG. 9 is a waveform diagram showing the output waveform of FIG. 7. A is welding waveform detection means, B is sample value calculation means,
C is upper and lower limit value setting means, D is storage means, and E is output signal arrangement means.
Claims (1)
て各標本値を求める標本値算出手段と、 複数の正常な溶接波形についてあらかじめ前記
標本値算出手段で標本値を求め、その求めた標本
値に基づいて上限値および下限値を設定する上下
限値設定手段と、 その求めた上限値および下限値を記憶する記憶
手段と、 溶接時における前記溶接波形検出手段の検出波
形より前記標本値算出手段が求めた標本値と、前
記記憶手段から読み出した上限値および下限値と
を時間軸で重ならないように所定の順序で周期的
に配列する出力信号配列手段とからなる溶接監視
装置。[Scope of Claims] 1 Welding wave detection means for detecting a welding waveform; sample value calculation means for sampling the detected welding waveform at a predetermined period to obtain each sample value; and determining in advance about a plurality of normal welding waveforms. upper and lower limit value setting means for determining a sample value by the sample value calculation means and setting an upper limit value and a lower limit value based on the determined sample value; a storage means for storing the determined upper limit value and lower limit value; The sample value calculated by the sample value calculation means from the detected waveform of the welding waveform detection means at the time and the upper limit value and lower limit value read from the storage means are periodically determined in a predetermined order so as not to overlap on the time axis. A welding monitoring device comprising output signal array means for arranging output signals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24876787A JPH0191978A (en) | 1987-09-30 | 1987-09-30 | welding monitoring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24876787A JPH0191978A (en) | 1987-09-30 | 1987-09-30 | welding monitoring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0191978A JPH0191978A (en) | 1989-04-11 |
| JPH0562032B2 true JPH0562032B2 (en) | 1993-09-07 |
Family
ID=17183073
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24876787A Granted JPH0191978A (en) | 1987-09-30 | 1987-09-30 | welding monitoring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0191978A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2801034B2 (en) * | 1989-08-09 | 1998-09-21 | 株式会社テトラック | Resistance welding machine |
| JP2003080372A (en) * | 2001-09-07 | 2003-03-18 | Miyachi Technos Corp | Insulation equipment for covered wire |
| JP5036058B2 (en) * | 2007-12-06 | 2012-09-26 | 日本アビオニクス株式会社 | Resistance welding power source and resistance welding method |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0732956B2 (en) * | 1985-06-15 | 1995-04-12 | 株式会社 東京ウエルズ | Method and device for determining quality of welding work in resistance welding |
| JPS6149793A (en) * | 1985-07-24 | 1986-03-11 | Toshiba Corp | Quality discriminating device of electric welding |
-
1987
- 1987-09-30 JP JP24876787A patent/JPH0191978A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0191978A (en) | 1989-04-11 |
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