JPH0570200B2 - - Google Patents

Info

Publication number: JPH0570200B2
Authority: JP; Japan
Prior art keywords: test signal; magnitude; measurement system; syndrome; measured
Prior art date: 1983-02-04
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

JP1697183A

Other languages

English (en)

Japanese (ja)

Other versions

JPS59161797A (ja

Inventor

Shinichi Fujitani

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Hitachi Systems Ltd

Original Assignee

Hitachi Information Systems Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1983-02-04

Filing date

1983-02-04

Publication date

1993-10-04

1983-02-04 Application filed by Hitachi Information Systems Ltd filed Critical Hitachi Information Systems Ltd

1983-02-04 Priority to JP1697183A priority Critical patent/JPS59161797A/ja

1983-07-20 Priority to US06/515,911 priority patent/US4580234A/en

1983-07-27 Priority to CA000433291A priority patent/CA1205196A/fr

1983-07-27 Priority to GB08320232A priority patent/GB2125545B/en

1983-07-28 Priority to DE19833327263 priority patent/DE3327263A1/de

1983-08-01 Priority to FR8312666A priority patent/FR2531229B1/fr

1984-09-12 Publication of JPS59161797A publication Critical patent/JPS59161797A/ja

1993-10-04 Publication of JPH0570200B2 publication Critical patent/JPH0570200B2/ja

Status Granted legal-status Critical Current

Links

238000005259 measurement Methods 0.000 claims description 74
238000012360 testing method Methods 0.000 claims description 51
238000000034 method Methods 0.000 claims description 47
230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 45
230000003287 optical effect Effects 0.000 claims description 45
239000013307 optical fiber Substances 0.000 claims description 27
208000011580 syndromic disease Diseases 0.000 claims description 17
239000013598 vector Substances 0.000 claims description 14
239000002131 composite material Substances 0.000 claims 1
238000010586 diagram Methods 0.000 description 45
230000005540 biological transmission Effects 0.000 description 37
238000007689 inspection Methods 0.000 description 16
238000004590 computer program Methods 0.000 description 15
230000008569 process Effects 0.000 description 15
239000011159 matrix material Substances 0.000 description 14
230000000694 effects Effects 0.000 description 10
238000012545 processing Methods 0.000 description 9
239000000463 material Substances 0.000 description 8
230000010287 polarization Effects 0.000 description 5
238000009529 body temperature measurement Methods 0.000 description 4
238000001514 detection method Methods 0.000 description 3
230000008439 repair process Effects 0.000 description 3
230000005684 electric field Effects 0.000 description 2
238000004519 manufacturing process Methods 0.000 description 2
BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
238000004804 winding Methods 0.000 description 2
230000005697 Pockels effect Effects 0.000 description 1
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238000009530 blood pressure measurement Methods 0.000 description 1
238000006243 chemical reaction Methods 0.000 description 1
239000004020 conductor Substances 0.000 description 1
239000012050 conventional carrier Substances 0.000 description 1
238000007796 conventional method Methods 0.000 description 1
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238000005516 engineering process Methods 0.000 description 1
239000000835 fiber Substances 0.000 description 1
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230000006872 improvement Effects 0.000 description 1
238000009413 insulation Methods 0.000 description 1
238000000691 measurement method Methods 0.000 description 1
229910052697 platinum Inorganic materials 0.000 description 1
230000000644 propagated effect Effects 0.000 description 1
239000002994 raw material Substances 0.000 description 1
230000009467 reduction Effects 0.000 description 1
230000004044 response Effects 0.000 description 1
239000004065 semiconductor Substances 0.000 description 1
239000000126 substance Substances 0.000 description 1
239000012780 transparent material Substances 0.000 description 1

Landscapes

Testing Or Calibration Of Command Recording Devices (AREA)
Arrangements For Transmission Of Measured Signals (AREA)

JP1697183A 1982-08-02 1983-02-04 計測システムの耐障害化方式 Granted JPS59161797A (ja)

Priority Applications (6)

Application Number	Priority Date	Filing Date	Title
JP1697183A JPS59161797A (ja)	1983-02-04	1983-02-04	計測システムの耐障害化方式
US06/515,911 US4580234A (en)	1982-08-02	1983-07-20	Measurement system of enhanced reliability
CA000433291A CA1205196A (fr)	1982-08-02	1983-07-27	Systeme mesureur a fiabilite accrue
GB08320232A GB2125545B (en)	1982-08-02	1983-07-27	Measurement system of enhanced reliability
DE19833327263 DE3327263A1 (de)	1982-08-02	1983-07-28	Messsystem mit verbesserter zuverlaessigkeit
FR8312666A FR2531229B1 (fr)	1982-08-02	1983-08-01	Systeme de mesure a fiabilite amelioree

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP1697183A JPS59161797A (ja)	1983-02-04	1983-02-04	計測システムの耐障害化方式

Publications (2)

Publication Number	Publication Date
JPS59161797A JPS59161797A (ja)	1984-09-12
JPH0570200B2 true JPH0570200B2 (fr)	1993-10-04

Family

ID=11930961

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP1697183A Granted JPS59161797A (ja)	1982-08-02	1983-02-04	計測システムの耐障害化方式

Country Status (1)

Country	Link
JP (1)	JPS59161797A (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US7805245B2 (en) *	2007-04-18	2010-09-28	Honeywell International Inc.	Inertial measurement unit fault detection isolation reconfiguration using parity logic
JP2018132439A (ja) *	2017-02-16	2018-08-23	Tdk株式会社	磁気センサ装置

1983
- 1983-02-04 JP JP1697183A patent/JPS59161797A/ja active Granted

Also Published As

Publication number	Publication date
JPS59161797A (ja)	1984-09-12

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