JPH0572276A - Lsi tester and automatic programing appratus for lsi testing program - Google Patents

Abstract

(57) [Summary] [Purpose] To provide an LSI test device and an LSI test program automatic creation device for easily and quickly changing or adding test contents of common specification parts of a plurality of types of LSIs. According to a first aspect of the present invention, a common test procedure storage unit 4 for storing a common test procedure for the common specification portion and an individual test for storing an individual test procedure for an individual specification portion corresponding to each type of the LSI. The procedure storage means 4 and the common test procedure change adding means 2 and 3 for changing and adding the common test procedure, the common test procedure changed and added, and the individual test procedure corresponding to the LSI under test 15 are read out and tested. A test control means 3 for controlling the test of the LSI 15;
Equipped with. The second aspect of the invention is to replace the test control means 3 with the modified and added common test procedure and L to be tested.
It is provided with a program creation control means for reading out individual test procedures corresponding to SI15 and combining them to automatically create a test program.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an LSI test apparatus and an LSI test program automatic generation apparatus, and more particularly to an LSI test apparatus for testing a plurality of LSIs of the same series having a common specification part under different test conditions. And LS
The present invention relates to an LSI test program automatic creation apparatus that automatically creates a test program for an I test.

It is desired to facilitate LSI testing and speed up test program creation in response to the recent trend of higher integration and higher variety of LSIs.

[0003]

2. Description of the Related Art A test for discriminating good and bad LSIs is carried out by inputting a test pattern generated by CAD or by operating a test program, and an LSI for which normal operation has been confirmed can be confirmed. It is a good product.

By the way, among conventional LSIs, there is a series LSI including a plurality of types of LSIs of the same series having a common specification portion. As a test program for testing each LSI configuring this series LSI, one test program is assigned to one product.

[0005]

Therefore, even if the test contents of the common specification part are changed or added to all of the respective LSI types constituting the series LSI described above, each of the individual test programs is to be changed. It is necessary to change, and it is not possible to change the test program for all types of multiple LSIs in the same series.
There was a problem that it took a huge amount of time and effort.

Therefore, an object of the present invention is to change the test contents of the common specification portion of a plurality of types of LSIs belonging to the same series,
L can be added easily and quickly when adding
An object of the present invention is to provide an SI test apparatus and an LSI test program automatic creation apparatus that automatically creates a test program.

[0007]

In order to solve the above-mentioned problems, the first invention is an LS under different test conditions for each product type.
In an LSI test apparatus for performing the I test, a common test procedure storage unit (4) for storing a common test procedure for common specification parts of a plurality of types of LSI belonging to the same series, and an individual specification part of the plurality of types of LSI The individual test procedure storage means (4) for storing the individual test procedure corresponding to each type of the above and the common test procedure change addition for changing or adding the common test procedure stored in the common test procedure storage means (4) The means (2, 3), the modified or added common test procedure and the individual test procedure corresponding to the LSI under test (15) are read out, and the LSI under test (1) is read.
And 5) a test control means (3) for controlling the test of 5).

A second aspect of the present invention is an LSI test program automatic creation apparatus for automatically creating a test program for testing an LSI under different test conditions for each product type, which is common to a plurality of product types belonging to the same series. A common test procedure storage means (19) for storing a common test procedure for a specification part, and an individual test procedure storage means (19) for storing an individual test procedure corresponding to each kind of individual specification part of the plurality of kinds of LSIs. And a common test procedure change addition means (17, 18) for changing or adding the common test procedure stored in the common test procedure storage means (19).
And a program creation control means (17) for automatically creating a test program for the LSI under test by reading and combining the changed or added common test procedure and the individual test procedure corresponding to the LSI under test. Is configured.

[0009]

According to the first aspect of the invention, the common test procedure storage means (4) stores the common test procedure for common specification portions of a plurality of types of LSIs belonging to the same series. The individual test procedure storage means (4) stores the individual test procedure corresponding to each type of individual specification part of the plurality of types of LSIs. The common test procedure change addition means (2, 3) changes or adds the common test procedure stored in the common test procedure storage means (4). As a result, the test control means (3) reads the changed or added common test procedure and the individual test procedure corresponding to the LSI under test (15), and controls the test of the LSI under test (15). ..

Therefore, the test control means (3) is
Even when a different test is performed for each I product type, the common test procedure is always read for the test items and test standards for the common specification part of the LSIs of the plurality of product types belonging to the same series. The device (1) can easily deal with changes and additions of test items and test standards for common specification parts.

According to the second aspect of the invention, the common test procedure storage means (19) stores the common test procedure for the common specification part of the LSIs of a plurality of types belonging to the same series. The individual test procedure storage means (19) stores the individual test procedure corresponding to each product for the individual specification part of the LSIs of the plurality of products. Common test procedure change addition means (17, 18)
Changes or adds the common test procedure stored in the common test procedure storage means (19). This allows
The program creation control means (17) automatically creates the test program for the LSI under test by reading and combining the changed or added common test procedure and the individual test procedure corresponding to the LSI under test.

Therefore, the program creation control means (1
In 7), even when a different test program is created for each type of LSI, L of a plurality of types belonging to the same series is used.
For the test items and test standards for the SI common specification part, the common test procedure is always read and a program is automatically created. Therefore, the LSI test program automatic creation device (16) It is possible to easily respond to changes and additions to test standards.

[0013]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, an embodiment of the present invention will be described with reference to FIGS. The LSI test apparatus 1 according to the first embodiment of the present invention includes a minicomputer 3 for checking a test program, controlling test execution, controlling the input / output device 2, analyzing a test result, and the like. Under the control of the minicomputer 3, the user inputs test data from the input / output device 2 and outputs test result data. Examples of the data input device include a keyboard and a card reader, and examples of the data output device include a line printer and C.
RT (Cathode-Ray-Tube) etc. are mentioned. Further, the mass storage device 4 such as a magnetic disk or a magnetic tape may be an LSI.
A system program of the test apparatus 1, a test program, a test pattern, measurement data, etc. are stored. Further, the interface controller 5 performs an interface operation of passing control data and measurement data based on the test program.

Based on the control data from the minicomputer 3, the pattern generator 6 generates input pattern data used for a functional test by hardware such as a microprogram control system, outputs it to the waveform shaper 8, and outputs it to the waveform shaper 8. The data pattern expected to be output from the measurement (DUT: Device Under Test) LSI 15 is output to the logical comparison controller 9 as expected value pattern data. Further, the timing signal generator 7 outputs a driver timing signal for determining the rising and falling of the input pattern data applied to the LSI under test 15 to the waveform shaper 8 based on the control data of the minicomputer 3, and at the same time, under test. A comparison timing signal corresponding to the comparison timing of the output pattern data of the LSI and the expected value pattern data is output to the logical comparison controller 9.

The waveform shaper 8 generates a signal waveform to be actually applied to the LSI under test 15 based on the input pattern data and the driver timing signal, and outputs it to the pin electronics 14. Logical comparison controller 9
Compares the input expected value pattern data with the output pattern data of the measured LSI 15 input via the pin electronics 14, determines whether the measured LSI 15 is good or bad, and outputs the result to the failure analysis memory 10. ..
The failure analysis memory 10 is a memory for storing a failure occurrence state, and stores a test pattern in which a failure has occurred at the time of executing a test and the position of an output pin of the LSI to be measured, and a defective cell position for repairing a defective bit. I memorize it.

The AC measuring unit 11 is used for an AC characteristic test, and accurately measures the input / output timing of the LSI to be measured 15. The DC measurement unit 12 is used for a DC characteristic test, and precisely measures the voltage, current, etc. of a designated output pin while applying a predetermined voltage, current to the LSI to be measured 15. The measured LSI power supply constant voltage generator 13 is a programmable power supply that applies a specified voltage and current to the measured LSI 15.

The pin electronics 14 gives a voltage necessary for testing to the signal waveform output from the waveform shaper 8 and outputs the signal waveform, and converts the output pattern data of the LSI 15 to be measured into digital data for logical comparison control. Output to the container 9.

In this case, the mass storage device 4 is
The minicomputer 3 and the input / output device 2 function as common test procedure storage means and individual test procedure storage means.
The minicomputer 3 functions as a common test procedure change addition means, and the minicomputer 3 functions as a control means.

The storage status of the test program stored in the mass storage device 4 will now be described with reference to FIG.
The test program 20 is configured to include a common test program 21 for the series LSI and individual test programs 22A, 22B, 22C specific to individual product types of the series LSI.

The common test program 21 describes test items and test contents such as AC characteristic measurement and function measurement, and test standards such as power supply voltage, set value and standard value.
The individual test program describes the measurement points when performing the DC characteristic test, the pin attributes such as the pin arrangement and functions, and the like. When the common test program 21 is changed or added, the user changes or adds only the common test program 21 via the input / output device 2 and the minicomputer 3, so that the individual test programs 22A, 22
It does not affect B and 22C.

When actually testing a specific LSI using the test program 20, the minicomputer 3
First, referring to the common test program 21, conduct a test related to the common specifications, and further execute this common test program 2
In 1, the reference is made to any of the individual test programs 22A, 22B, and 22C, and the test relating to the individual specifications is performed. Alternatively, the common test program 21 and a necessary individual test program, for example, the individual test program 22B are simultaneously read to perform the test.

As described above, since the test items and test standards that can be reflected in all series LSI products are described in the common test program, the test items and test standards that can be reflected in all series LSI products are changed, Alternatively, when adding, the common test program may be changed or added. Therefore, since it is not necessary to change the individual test program, it is possible to easily change and add the test items, test standards, etc. of the series LSI, and to easily deal with these changes and additions.

Embodiment of Second Invention Next, an embodiment of the second invention will be described with reference to FIGS. 3 and 2. The LSI test program automatic generation device 16
As shown in FIG. 3, a mini computer 17 is provided for checking the test program, controlling the execution of the test, controlling the input / output device, and analyzing the test result. Under the control of the minicomputer 17, the user inputs data for a test program from the input / output device 18 and outputs a test program list or the like. Examples of the data input device include a keyboard and a card reader, and examples of the data output device include a line printer and a CRT. In addition, in the mass storage device 19 such as a magnetic disk or a magnetic tape,
A system program, a test program, a test pattern, etc. of the SI test program automatic generation device 17 are stored. In this case, the mass storage device 19 functions as common test procedure storage means and individual test procedure storage means, the minicomputer 17 and the input / output device 18 function as common test procedure change addition means, and the minicomputer 17 Functions as program creation control means.

When actually creating a test program for a specific LSI using the test program 20,
First of all, the minicomputer 17 starts the common test program 2
1 is read out and one of the individual test programs 22A, 22B and 22C is read out and combined with the common test program 21 to automatically create the test program according to the individual specification. Alternatively, the common test program 21 and a necessary individual test program, for example, the individual test program 22B are read at the same time and are combined to automatically create an LSI test program.

As described above, since the test items and test standards that can be reflected in all series LSI products are described in the common test program, the test items and test standards that can be reflected in all series LSI products must be changed. , Or in the case of addition, the common test program may be changed or added by controlling the minicomputer 17 via the input / output device 18. Therefore, it is not necessary to change the individual test program that is different for each product type, so you can easily change and add the test items and test standards of the series LSI to create the test program, and easily change and add these. Can be dealt with.

In each of the above embodiments, the common test program and the individual test program are stored in the same mass storage device, but it is also possible to store them separately in a plurality of mass storage devices. ..

The common test program and the individual test program may be further composed of a plurality of subroutines. In this case, if the common test program is divided into subroutines for each function, the series LS
It is possible to more easily change and add the test item I, test standard, and the like.

[0028]

According to the first aspect of the present invention, the common test procedure change adding means changes or adds the common test procedure stored in the common test procedure storing means, and the test control means changes the above. The common test procedure added or added and the individual test procedure corresponding to the LSI under test are read out to control the test of the LSI under test.

Therefore, the LSI test apparatus always performs common tests on test items, test standards, etc. for common specification parts of a plurality of LSIs belonging to the same series even if different tests are performed for each LSI type. Since the procedure is read out and performed, it is possible to easily deal with changes and additions of test items and test standards for the common specification part.

According to the second invention, the common test procedure change addition means changes or adds the common test procedure stored in the common test procedure storage means, and the program creation control means changes the change. Alternatively, the added common test procedure and the individual test procedure corresponding to the LSI under test are read and combined to automatically create a test program for the LSI under test.

Therefore, the LSI test program automatic generation apparatus can generate a plurality of LSs belonging to the same series even when a different test program is generated for each LSI type.
Since the common test procedure is always read out for the test items and test standards for the common specification part of I, it is possible to easily deal with changes and additions to the test items and test standards for the common specification part.

[Brief description of drawings]

FIG. 1 is a block diagram showing a basic configuration of an LSI test apparatus.

FIG. 2 is an explanatory diagram of a storage state of a mass storage device.

FIG. 3 is a block diagram showing a basic configuration of an LSI test program automatic creation apparatus.

[Explanation of symbols]

 1 ... LSI test device 2 ... Input / output device 3 ... Mini computer 4 ... Mass storage device 5 ... Interface controller 6 ... Pattern generator 7 ... Timing signal generator 8 ... Waveform shaper 9 ... Logical comparison controller 10 ... Failure analysis Memory 11 ... AC measurement unit 12 ... DC measurement unit 13 ... Low voltage generator for LSI power supply under test 14 ... Pin electronics 15 ... LSI under test 16 ... LSI test program automatic generation device 17 ... Minicomputer 18 ... Input / output device 19 ... Mass storage device 20 ... Test program 21 ... Common test program 22A, 22B, 22C ... Individual test program

Claims (2)

[Claims] 1. An LSI test apparatus for testing an LSI under different test conditions for each product type, a common test procedure storing means (4) for storing a common test procedure for a common specification part of LSIs of a plurality of product types belonging to the same series. ), An individual test procedure storage unit (4) for storing an individual test procedure corresponding to each type of the individual specification part of the plurality of types of LSIs, and a common test procedure stored in the common test procedure storage unit. Common test procedure change addition means (2, 3) to be changed or added, and the changed or added common test procedure and the individual test procedure corresponding to the LSI under test (15) are read out,
An LSI test apparatus comprising: a test control unit (3) for controlling a test of the LSI under test. 2. An LSI for automatically creating a test program for performing an LSI test under different test conditions for each product type.
In the automatic test program creating apparatus, a common test procedure storage unit (19) for storing a common test procedure for common specification parts of LSIs of a plurality of types belonging to the same series, and each kind of individual specification part of the LSIs of a plurality of types. Individual test procedure storage means (19) for storing the individual test procedure corresponding to the above, and common test procedure change addition means (17, 18) for changing or adding the common test procedure stored in the common test procedure storage means. And a program creation control means (17) for automatically creating a test program for the LSI under test by reading and combining the changed or added common test procedure and the individual test procedure corresponding to the LSI under test, An LSI test program automatic generation apparatus comprising: