JPH0573584B2 - - Google Patents
Info
- Publication number
- JPH0573584B2 JPH0573584B2 JP60016919A JP1691985A JPH0573584B2 JP H0573584 B2 JPH0573584 B2 JP H0573584B2 JP 60016919 A JP60016919 A JP 60016919A JP 1691985 A JP1691985 A JP 1691985A JP H0573584 B2 JPH0573584 B2 JP H0573584B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- pair
- optical sensor
- defect
- digital signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41F—PRINTING MACHINES OR PRESSES
- B41F33/00—Indicating, counting, warning, control or safety devices
- B41F33/0036—Devices for scanning or checking the printed matter for quality control
Landscapes
- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Image Analysis (AREA)
- Inking, Control Or Cleaning Of Printing Machines (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
Description
(発明の技術分野)
この発明は、紙、アルミニユーム及びプラスチ
ツク等の包装材料に対し絵柄が周期的に連続して
印刷される際に、インキの飛散、ドクターすじ等
の欠陥及びゴミの付着を自動的に印刷稼働中でも
検知する方法に関する。
(発明の技術的背景とその問題点)
一般に絵柄等を印刷する際のスポツト的に現わ
れる欠陥に対しては、検知は難しい。このため、
巻き始めや巻き終り等に装置を停止させて、ごく
一部のみの目視検査が行なわれている。しかし全
数検査でないことから、場合によつては欠陥品が
混入することもあり、しばしば問題が生じてい
る。この問題を解決するため、最近、第6図のよ
うに同一の連続した絵柄を印刷したシートN上の
1対の絵柄N1及びN2(この場合隣接した絵柄
とは限らない)を1対の光センサヘツドA及びB
で同時に測光し、光電変換した後に1対の光セン
サヘツドA及びBの出力電圧の差を制限ボツクス
14で演算処理することにより、絵柄上の欠陥を
求める装置が提案されている。
この具体的実施例を第7図に示して説明する。
図示のように絵柄N1及びN2からの反射光は、
光フアイバ等の受光素子15A及び15Bを通じ
て光センサ素子16A及び16Cに入力され電圧
に変換された後、増幅器16B及び16Dにより
適正にゲイン調整され、それらの出力電圧は差動
増幅器17に入力される。ここで、受光素子15
A及び15Bは同じ絵柄N1及びN2上に位置し
ているので、絵柄が正常であればその反射光は等
しく、差動増幅器17の出力は零となるはずであ
る。しかし、全く等しくなるということは物理的
に不可能であるので、許容範囲内でその量を予め
設定しておき、この設定値をここでは上限を
dmazとおくと共に下限をdminとおき、コンパレ
ータ18に差動増幅器17の出力と共に入力す
る。もし、片方の絵柄にインキが飛散してしま
い、これが設定された許容範囲を超えるものだと
すると、コンパレータ18の出力は“NO”とな
り、例えば“1”信号を出力してエラーを示すこ
とになる。上限、下限の範囲内であれば良品の
“GO”となり、“0”信号が出力されることにな
る。このようにして印刷物等の欠陥を求める方法
が実現されている。
しかしながら上述の方法では、1対の光センサ
ヘツドの光学的検知条件を常に一定に保つことが
必要である。このため、種々の準備作業を必要と
し装置製作時には、特性一致のための光センサ素
子の選別、出力特性の良い差動増幅器の利用及び
検知稼動時には光センサ素子の経年変化による劣
化、センサヘツドのよごれ及び差動増幅器のドリ
フト等による特性不一致に対する補正をあらかじ
め人為的に行なう必要がある。これが煩雑な上に
熟練を要し、これを軽減するため検知精度を犠牲
にして前記上限dmax、下限dminの許容範囲であ
る不感帯幅を拡大する必要を生じなければならな
いといつた欠点があり、稼動時の光学的検知条件
を自動的に一定にする1対の光センサヘツドを用
いた印刷物の欠陥検知方法の開発が要望されてい
た。
(発明の目的)
この発明は上述の事情からなされたものであ
り、ドリフトや経時変化等で検知特性上不一致が
生じた場合でも、自動的に光学的検知条件を補償
して一定にする1対の光センサヘツドを用いた印
刷物の欠陥検知方法を提供することにある。
(発明の概要)
この発明は印刷物の欠陥検知方法に関するもの
で、同一の絵柄が周期的に連続して印刷されてい
る印刷物の欠陥を検知する印刷物の欠陥検知方法
において、1対の光センサが前記絵柄のサイズに
応じてまとめられて配設されている1対の光セン
サヘツドを、隣接した1対の同一の絵柄に対向し
て前記印刷物の移動方向と直角に配設すると共
に、前記1対の光センサヘツドを同時に使用する
ようにし、版胴の駆動部に連結されたパルス発生
器からパルスを出力するようにし、前記1対の光
センサヘツド内の各1対の光センサから得られる
各アナログ信号の出力電圧差を前記同一の絵柄が
1周期搬送される毎に前記版胴の1シリンダ分の
1回転に相当する前記パルス及びその分周パルス
に対応させて処理し、前記アナログ信号の出力電
圧差をデイジタル化した後、前記絵柄の1つのデ
イジタル信号を1周期分だけ記憶し、次の絵柄の
1周期分のデイジタル信号と前記記憶したデイジ
タル信号との差を求め、この差を周期的に搬送さ
れる前記絵柄に対応して連続的にパターン化して
抽出し、予め登録してあるパターンとの符号判定
と比率判定を行ない、欠陥と判定された場合には
欠陥箇所の前記パルス又は分周パルスの数を計数
することによつて欠陥の種類を識別すると共に、
前記符号判定、前記比率判定及び前記欠陥の種類
を表示するようにしたものである。
(発明の実施例)
第1図はこの発明の方法を実現する装置の一例
を示すブロツク図であり、全体にコンピユータ化
されており、キーボード1の所定キーを操作する
と開始信号SS1に基づく情報がCRT2に映出さ
れると共に、メインCPU4に信号SS2が入力さ
れる。これにより、同一の連続した絵柄N1,N
2…が印刷されたシートNを所定のピツチで巻上
げるためのモータ等から成る駆動部6が駆動さ
れ、絵柄N1,N2…を印刷したシートNの巻上
げが開始される。所定量巻上げられると検知スタ
ートを指示する見当マークがスキヤニングヘツド
5で検出され、見当マーク信号SS3が出力され
ると共に、駆動部6に連動したパルスエンコーダ
等より成るパルス発生器7から1周期分の絵柄に
対応して駆動部6に連結された版胴の1シリンダ
分の1回転に相当するパルスと、それを分周した
パルス信号SS5がメインCPU4に入力され、更
に記憶部3に記憶されることになる。一方、隣接
した1対の絵柄N1及びN2に対向した1対の光
センサヘツド内の1対の光センサA1及びB1
(絵柄の大きさに応じて光センサAN及びBNまで
ある)は、1対の絵柄N1及びN2内の担当検出
エリアが正常か否かを検知するため、絵柄からの
反射光を集光し電圧信号SS7及びSS8に変換さ
れる。その後、IC等から成る差動増幅器8に入
力され両者の出力電圧差がアナログ量で計算処理
され、A/D変換器9でその差分のアナログ量が
これに相当するデイジタル量のデイジタル信号
SS10に変換され、ローカルCPU11に入力さ
れて内部処理された後、信号SS11を記憶部1
0に出力すると共にメインCPU4に処理信号SS
12が入力され、総括処理されることになる。こ
の場合、前記デイジタル信号を1絵柄の1周期分
(1シリンダ分)記憶しておき、常に1絵柄の1
周期分(シリンダ分)遅れたデイジタル信号同士
の差をとることにより、差は常に2倍に拡大され
ることになる。従つて、この差の時間的パターン
をメインCPU4で認識処理することにより、絵
柄の検知情報(例えばある箇所の濃度・色彩はど
の程度の欠陥か等)を得ることができる。又1対
の光センサヘツドA及びB内には絵柄N1及びN
2の大きさに応じて1対の光センサA1,B1〜
AN,BNが多数まとめられており、これらの印
刷物の絵柄N1及びN2に対する検知情報をロー
カルCPU11で一旦処理した後、メインCPU4
で吸上げ総括処理することにより不測の事態、例
えば稼動中に1対の光センサヘツドA及びBの片
方が故障し検知できない場合、或いは何らかの原
因で1対の光センサヘツドA及びBの出力が変動
した場合でも、この方法を用いることで常に検知
できCRT2でその内容を映像化し逐一監視でき
るシステムになつている。
このような構成において、その動作を第2図〜
第5図を参照して説明する。
第2図A〜Cはその動作を説明するフローチヤ
ートであり、第3図はこのフローチヤートに従つ
て絵柄が検知されている状況を示すタイムチヤー
トである。稼動前は第3図Aのように周期的に連
続する同一の絵柄N1,N2,N3,…を印刷し
たシートNが、モータ等で成る駆動部6のシリン
ダに連結され1絵柄の周期(1シリンダ)毎に搬
送される状態で置かれている。このような状態
で、始めにキーボード1の所定のキーを操作して
開始信号SS1を送り駆動部6が駆動されシート
Nが巻取られ、絵柄N1,N2,N3,…がS方
向に逐次1絵柄の1周期分(1シリンダ分)移動
し、検知開始を指示する見当マークが識別される
とパルスがカウントされ、図示のように絵柄N1
及びN2上に位置付けされた1対の光センサヘツ
ドA及びBにより検知が開始される(ステツプ
S1)。この場合1対の光センサヘツドA及びBの
検知エリアを各々1絵柄の1周期分で設定できる
よう図示の通り1対の光センサヘツドA及びBを
隣接する絵柄N1及びN2上に対向して配置する
ことにより、光センサA1,B1〜AN,BNか
らのアナログ信号の出力波形A(t)及びB(t)も同様
に1絵柄の1周期分だけ位相がずれることにな
る。この発明の方法はこの点に着眼したものであ
る。ところで、一般に絵柄が絵柄N1の如く良品
であればその被検出面の濃淡に応じ、例えば第3
図Bのt0〜t1間A(t)のような標準波形が出力され
るが、絵柄N2の如く一部にスポツト的な欠陥箇
所a及びbがあれば、良品に比して明るい部分a
では同図Bt1〜t2間A(t)の如く凸形に、暗い部分
bは凹形に出力される(第3図A,B及びC参
照)。
以下、任意のi番目の絵柄Niに対して数式を
参照して説明する。
このようにして、光センサヘツドA上にi番目
の絵柄Ni、光センサヘツドB上に絵柄(Ni−1)
が送られ、1対の光センサAi及びBiで反射光が
光電変換されti−(ti−1)間の出力波形ai(t)及び
bi(t)が求められ(ステツプS1,S3、第3図B及
びC)、その後差動増幅器8の演算処理により出
力波形の差bi(t)−ai(t)が求められることになる
(ステツプ4、第3図D)。次に1絵柄を1周期と
してこれをN分割し(従つて1パルスの大きさは
時間単位でなく、長さの単位となる)、分割区間
ごとにサンプリングを行ない(ステツプS5)、上
記アナログ量である出力波形の差をデイジタル化
し、i番目の絵柄Niのn分割中のj分割区間と
してデイジタル量の差C=Cij(Pj)を求める(ス
テツプS7、第3図E)。これを一旦、次の演算に
使用するため記憶部10のRAMに書込み記憶
し、これをD=−1(Pj)(以下、記憶された
後再生される場合は を付ける)とした状態で
(ステツプS8,S9、第3図F)、次に1絵柄の1
周期分(1シリンダ分)シートNが搬送され、光
センサヘツドB上に先ほど光センサヘツドAで検
知した絵柄Niが配置されると、上記と同様にデ
イジタル量の差C=Cij(Pj)が計算され、前記記
憶部10に記憶されたDとこのCとをローカル
CPU11内で演算処理し、差C−D=dij(Pj)=
Cij(Pj)−(−1)(Pj)が求められること
になる(ステツプS11、第3図G)。次に絵柄が
正常かの許容範囲の上限値を不感帶上限値dmax
として決め、E:eij(Pj)=|dij(Pj)|−dmax≧
0ならば処理対象として続行し、≦0ならば対象
外としてステツプS5にリターンし−1,を
dijとする(ステツプS12,S13,S14)。その後、
絵柄N1に対して1対のセンサヘツドA及びBで
同一の検知を行なつた結果が等しいか否か各々j
番目のパルス数の比較をして、パルス番号の判定
を行なう。即ちPi=ならば処理を続行し、Pj≠
Pjならば検知の位置ずれ等が生じたとして繰越す
(ステツプS15)。このようにして絵柄Niが良品か
もしくはどの程度の欠陥品かを調べるため、符号
判定と比率判定を行なう。即ち欠陥品ならば必ず
正負の符号が入れ違いに出力されるため、例えば
下表のパターン判定が行なわれる(ステツプ
S16,S17)。
(Technical Field of the Invention) This invention automatically eliminates defects such as ink scattering, doctor streaks, and dust when patterns are periodically and continuously printed on packaging materials such as paper, aluminum, and plastic. The present invention relates to a method for detecting data even when printing is in progress. (Technical background of the invention and its problems) Generally, it is difficult to detect defects that appear in spots when printing patterns, etc. For this reason,
The equipment is stopped at the beginning or end of winding, and only a small portion is visually inspected. However, since it is not a 100% inspection process, defective products may sometimes be mixed in, which often causes problems. In order to solve this problem, recently a pair of patterns N1 and N2 (not necessarily adjacent patterns in this case) on a sheet N printed with the same continuous pattern as shown in FIG. Sensor head A and B
An apparatus has been proposed in which defects on a picture are determined by simultaneously performing photometry and photoelectric conversion, and then calculating the difference between the output voltages of a pair of photosensor heads A and B in a limit box 14. A concrete example of this will be explained with reference to FIG.
As shown in the figure, the reflected light from the patterns N1 and N2 is
After being input to optical sensor elements 16A and 16C through light receiving elements 15A and 15B such as optical fibers and converted into voltage, the gain is appropriately adjusted by amplifiers 16B and 16D, and the output voltage is input to differential amplifier 17. . Here, the light receiving element 15
Since A and 15B are located on the same patterns N1 and N2, if the patterns are normal, their reflected lights should be equal and the output of the differential amplifier 17 should be zero. However, it is physically impossible for them to be exactly equal, so we set the amount in advance within the allowable range, and here we set this value as the upper limit.
dmaz and the lower limit is set as dmin, and input to the comparator 18 together with the output of the differential amplifier 17. If ink is scattered on one of the patterns and this exceeds the set tolerance range, the output of the comparator 18 will be "NO" and, for example, will output a "1" signal to indicate an error. If it is within the range of the upper and lower limits, it will be a "GO" of a good product and a "0" signal will be output. In this way, a method for determining defects in printed matter, etc. is realized. However, the method described above requires that the optical sensing conditions of the pair of optical sensor heads remain constant. For this reason, various preparatory work is required when manufacturing the device, such as selecting optical sensor elements to match their characteristics, using a differential amplifier with good output characteristics, and deterioration of the optical sensor element due to aging and dirt on the sensor head during detection operation. In addition, it is necessary to manually perform correction for characteristic mismatch due to drift of the differential amplifier, etc. This is complicated and requires skill, and in order to reduce this, it is necessary to sacrifice detection accuracy and expand the dead band width, which is the allowable range of the upper limit dmax and lower limit dmin. It has been desired to develop a method for detecting defects in printed matter using a pair of optical sensor heads that automatically maintains constant optical detection conditions during operation. (Objective of the Invention) This invention was made in view of the above-mentioned circumstances, and it is a pair of optical detection conditions that automatically compensate and keep the optical detection conditions constant even if there is a discrepancy in the detection characteristics due to drift or changes over time. An object of the present invention is to provide a method for detecting defects in printed matter using an optical sensor head. (Summary of the Invention) The present invention relates to a method for detecting defects in printed matter. In the method for detecting defects in printed matter in which the same pattern is periodically and continuously printed, a pair of optical sensors are used. A pair of optical sensor heads arranged in groups according to the size of the picture are arranged perpendicularly to the moving direction of the printed matter, facing a pair of adjacent identical pictures, and A plurality of optical sensor heads are used simultaneously, and pulses are output from a pulse generator connected to a drive section of the plate cylinder, and each analog signal obtained from each pair of optical sensors in the pair of optical sensor heads is The output voltage difference of the analog signal is processed so as to correspond to the pulse corresponding to one rotation of one cylinder of the plate cylinder and its frequency division pulse every time the same picture is conveyed one cycle, and the output voltage of the analog signal is After digitizing the difference, one period of the digital signal of the pattern is stored, and the difference between the digital signal of the next pattern and the stored digital signal is calculated periodically. The pattern is continuously extracted in accordance with the picture to be conveyed, and the sign and ratio with the previously registered pattern are determined. If it is determined to be defective, the pulse or frequency division of the defective part is determined. Identifying the type of defect by counting the number of pulses,
The sign determination, the ratio determination, and the type of defect are displayed. (Embodiment of the Invention) FIG. 1 is a block diagram showing an example of a device for realizing the method of the present invention, which is entirely computerized, and when a predetermined key on a keyboard 1 is operated, information based on a start signal SS1 is displayed. At the same time as being displayed on the CRT 2, a signal SS2 is input to the main CPU 4. As a result, the same consecutive patterns N1, N
2... is printed at a predetermined pitch, and the driving unit 6, which includes a motor or the like, is driven, and winding of the sheet N on which the patterns N1, N2... are printed is started. When the winding is completed by a predetermined amount, the scanning head 5 detects a register mark that instructs the start of detection, and the register mark signal SS3 is outputted, and at the same time, a pulse generator 7 consisting of a pulse encoder etc. linked to the drive unit 6 outputs a signal for one cycle. A pulse corresponding to one rotation of one cylinder of the plate cylinder connected to the drive unit 6 corresponding to the picture and a pulse signal SS5 obtained by dividing the pulse are input to the main CPU 4 and further stored in the storage unit 3. That will happen. On the other hand, a pair of photosensors A1 and B1 in a pair of photosensor heads facing a pair of adjacent patterns N1 and N2
(There are up to optical sensors AN and BN depending on the size of the picture.) In order to detect whether the detection area in charge of the pair of pictures N1 and N2 is normal, the light sensor collects the reflected light from the picture and creates a voltage. It is converted into signals SS7 and SS8. Thereafter, the output voltage difference between the two is inputted to a differential amplifier 8 composed of an IC, etc., and is calculated and processed as an analog quantity, and the analog quantity of the difference is converted into a digital signal of a digital quantity corresponding to the analog quantity in the A/D converter 9.
After being converted to SS10 and input to the local CPU 11 for internal processing, the signal SS11 is sent to the storage unit 1.
Output to 0 and send processing signal SS to main CPU 4
12 will be input and will be collectively processed. In this case, the digital signal is stored for one period (one cylinder) of one picture, and the digital signal is always stored for one cycle of one picture.
By taking the difference between digital signals delayed by a period (cylinder), the difference is always doubled. Therefore, by recognizing and processing the temporal pattern of this difference in the main CPU 4, it is possible to obtain pattern detection information (for example, how much of a defect is the density and color of a certain area). Also, there are patterns N1 and N in the pair of photosensor heads A and B.
A pair of optical sensors A1, B1~
A large number of AN and BN are grouped together, and after the detection information for the patterns N1 and N2 of these printed materials is once processed by the local CPU 11, the main CPU 4
By collecting and processing the data collectively, it is possible to detect unforeseen circumstances, such as when one of a pair of optical sensor heads A and B fails during operation and cannot be detected, or when the output of a pair of optical sensor heads A and B fluctuates for some reason. However, by using this method, the system can always detect the situation, visualize the contents on CRT2, and monitor the situation one by one. In such a configuration, its operation is shown in Figure 2~
This will be explained with reference to FIG. 2A to 2C are flowcharts for explaining the operation, and FIG. 3 is a time chart showing a situation in which a pattern is detected according to this flowchart. Before operation, a sheet N on which the same patterns N1, N2, N3, etc. are printed periodically as shown in FIG. It is placed in a state where it is transported by cylinder. In this state, first, a predetermined key on the keyboard 1 is operated to send a start signal SS1, and the drive unit 6 is driven to wind up the sheet N, and the patterns N1, N2, N3, ... are sequentially 11 in the S direction. When the pattern moves for one period (one cylinder) and the register mark instructing the start of detection is identified, pulses are counted, and as shown in the figure, the pattern N1
Detection is started by a pair of optical sensor heads A and B positioned on
S1). In this case, the pair of optical sensor heads A and B are arranged facing each other on the adjacent patterns N1 and N2 as shown in the figure so that the detection area of the pair of optical sensor heads A and B can be set for one cycle of one pattern each. As a result, the output waveforms A(t) and B(t) of the analog signals from the optical sensors A1, B1 to AN, BN are also shifted in phase by one cycle of one picture. The method of this invention focuses on this point. By the way, in general, if the pattern is good like pattern N1, depending on the shading of the detection surface, for example, the third
A standard waveform such as A(t) between t0 and t1 in Figure B is output, but if there are spot-like defects a and b in some parts like pattern N2, the part a is brighter than the non-defective part.
Then, the dark portion b is output in a convex shape as shown in A(t) between Bt1 and t2 in the figure, and the dark portion b is output in a concave shape (see A, B, and C in FIG. 3). Hereinafter, an arbitrary i-th pattern Ni will be explained with reference to a mathematical formula. In this way, the i-th pattern Ni is placed on photosensor head A, and the pattern (Ni-1) is placed on photosensor head B.
is sent, and the reflected light is photoelectrically converted by a pair of photosensors Ai and Bi, resulting in output waveforms ai(t) and ti-(ti-1).
bi(t) is obtained (steps S1 and S3, FIG. 3 B and C), and then the difference between the output waveforms bi(t) - ai(t) is obtained by the arithmetic processing of the differential amplifier 8 ( Step 4, Figure 3D). Next, one picture is divided into N parts (the size of one pulse is not a unit of time, but a unit of length), and sampling is performed for each divided section (step S5). The difference between the output waveforms is digitized, and the difference in digital amount C=Cij (Pj) is obtained as the j division section of the n divisions of the i-th picture Ni (step S7, FIG. 3E). This is temporarily written and stored in the RAM of the storage unit 10 for use in the next calculation, and this is set to D=-1 (Pj) (hereinafter, when it is to be played back after being stored, is added). Steps S8, S9, Figure 3 F), then 1 of 1 picture
When the sheet N is conveyed for one cycle (for one cylinder) and the pattern Ni detected earlier by the optical sensor head A is placed on the optical sensor head B, the difference in digital amount C = Cij (Pj) is calculated in the same way as above. , locally store D stored in the storage unit 10 and this C.
Processing is performed within the CPU 11, and the difference C-D=dij(Pj)=
Cij(Pj)-(-1)(Pj) is obtained (step S11, FIG. 3G). Next, set the upper limit of the allowable range for whether the pattern is normal or not by using the insensitive upper limit dmax.
E: eij (Pj) = |dij (Pj) | −dmax≧
If it is 0, it continues as a processing target, and if ≦0, it is not considered and returns to step S5, and -1 is set.
dij (steps S12, S13, S14). after that,
Whether the results of performing the same detection on the pattern N1 with a pair of sensor heads A and B are equal or not, respectively.
The pulse number is determined by comparing the number of pulses. In other words, if Pi=, processing continues, Pj≠
If Pj, it is assumed that a positional shift in detection has occurred and is carried over (step S15). In this way, in order to check whether the pattern Ni is a good product or how defective it is, sign determination and ratio determination are performed. In other words, if it is a defective product, the positive and negative signs are always output with the wrong sign, so the pattern judgment shown in the table below is performed (step
S16, S17).
【表】
ここで、種々の欠陥に対応するパターンをメイ
ンCPU4の内部記憶部にあらかじめ登録してお
き、どのパターンに該当するか否かを判定する
(ステツプS18)。これにより絵柄Niがどのような
欠陥があるか識別されることになる。該当なしの
場合、繰越し分の記憶更新準備をする(ステツプ
S19)。該当する場合(ステツプS20)は判定に不
必要な部分、例えば表1の符号判定における−
a,2a,−aの出力パターンの最後の−aは判
定に不必要であり、誤処理をなくすためこれを消
去して記憶部10のRAMをクリアし、次の絵柄
(Ni+1)に対する記憶更新準備をする(ステツ
プS21)。次に、この欠陥検知システム全体が正
常に稼動しているか否かを調べるため、一定数の
絵柄N1〜Niを検知した後欠陥の発生件数がどの
位かを検出する。即ち前記|dij|のトータル量
Σ|eij|をあらかじめメインCPU4の内部記憶
部に登録し設定しておいたトータル上限値eとの
比較処理Σ|ei|−eを行なう(ステツプS23)、
Σ|ei|−e≧0ならば欠陥の異常発生であり、
これは印刷ミスでなく、シートNの位置ずれ或い
は蛇行等に起因すると判断され、機械の再点検が
行なわれる(ステツプS24)。またΣ|ei|−e<
0ならば通常の印刷ミスと判断されてメイン
CPU4に伝達され、この情報がCRT2に映し出
されることになる(ステツプS25)。これと並行
して、絵柄N1,N2…の欠陥が商品として許さ
れる範囲なのか、いわゆる大ヤレ、中ヤレ、小ヤ
レのどの種類なのか、即ち欠陥が連続しているか
或いは単発なのかを判断するため、前記絵柄を7
分割したj分割区間を中心に隣接する区間のパル
ス…Pj−1,Pj,Pj+1…について欠陥箇所のチ
エツクを行ない(ステツプS26)、欠陥があれば
その隣接するパルス数をカウントし(ステツプ
S27)、スポツト的欠陥、例えばゴミ等の付着に
よりPjのみがカウントされる場合(ステツプ
S29)か、又は狭域的欠陥、例えばドクターすじ
等によりPj−1,Pj,Pj+1がカウントされる場
合(ステツプS30)なのか、或いは広域的欠陥、
例えばインキ等のしみが広範囲におよび、…Pj−
1,Pj,Pj+1…が連結して多数カウントされる
場合なのか等いずれの種類に属する欠陥かを判別
し、1絵柄の1周期分で欠陥の発生件数をカウン
トし(ステツプ32,S33,S34)、欠陥箇所及び種
類をCRT2に表示し絵柄の欠陥情報を知らせる
(ステツプS35)。更に次の絵柄(Ni+1)を検知
するためメインCPU4に信号を送り総括処理を
し(ステツプS36)、駆動部6が1シリンダ分回
転することになる。ところで、これと並行して上
述の記憶更新準備をした後(ステツプS21)の処
理は、1絵柄の1周期分連続して行なうことにな
るが、途中で異常が発生し処理できないときはリ
ターンしてサンプリング分割(ステツプS5)に
戻り、処理できたときは絵柄Niの繰越し分・消
去のデータを記憶部3のRAMからクリアし、次
の絵柄(Ni+1)を検知するため始めの見当マ
ークの識別(ステツプS1)にリターンし、絵柄
Niと同一の処理が行なわれることになる。この
ようにしてすべての絵柄N1,N2,N3…,
NNについて各々第2図A〜Cのフローチヤート
のステツプS1からステツプS38迄を繰返し処理す
ることにより、即ち1対の光センサヘツドA及び
Bで次々に1絵柄の1周期分記憶し、比較・更新
処理することによりシートNに連続して印刷され
た絵柄N1,N2,…NNの欠陥情報がCRT2
等により表示されることになる。
さて上述の検知の場合は、1対の光センサヘツ
ドA及びBの検知出力が変動しない場合である
が、装置の稼動中に差動増幅器8のドリフト或い
は光センサA1,B1〜AN,BNの経年化等に
より検知特性の変動があつた場合でも、上記方法
を用いることで自動的に変動を補正し、正確な検
知出力が得られることになる。即ち第4図は上述
の状況を説明するためのタイムチヤートであり、
図示のように仮に光センサヘツドA及びBが基準
量に対してfだけ持ち上がり、gだけ下がつたと
すると、通常次々に演算していくことによりこの
ずれf,gが誤差として蓄積され拡大された従来
の方法では過大評価の原因となつていた。しかし
ながら、この発明の方法によると第2図AからC
のフローチヤートによりステツプS11のC−Dの
演算処理を行なうことにより、この差動増幅器8
のドリフト或いは光センサA1,B1〜AN,
BNの経年変化等によるずれf,gが打消され自
動的に補正され絵柄の欠陥(第4図Gのa,b及
びc等)だけが抽出されることになる。即ち、
光センサヘツドA:出力波形A(t)
…(ステツプS2)
光センサヘツドB:出力波形B(t)
…(ステツプS3)
C=B−A:B(t)−A(t) …(ステツプS4)
D:(t)−(t) …(ステツプS10)
C−D:{B(t)−A(t)}−{B(t)−A(t)}
…(ステツプS11)
であり、ここでずれf,gが生じて
A(t)→A(t)+f,B(t)→B(t)−g
となりステツプS4により
C−D=[{B(t)−g}−{A(t)+f}]
−[{B(t)−g}−{A(t)+f}]
={B(t)−A(t)}−{B(t)−A(t)}
…(ステツプS11)
であるから、どんな要因のずれf,gで検知特性
が変動しても演算処理過程で打ち消され、所望の
絵柄の欠陥a,b及びc等だけが求められること
になる。
これを第4図のタイムチヤートを参照して説明
すれば、例えばt1〜t2間では、ずれf,g分だけ
出力波形は全体に各々A(t)+f及びB(t)−gだけ
変動し、絵柄の欠陥a及びbも同様に、演算処理
B(t)−A(t)(ステツプS4)で−f−gだけ移動
して−a−f−g及びb−f−gとなる(第4図
D)。図示の通りA/D変換後はデイジタル化さ
れ(第4図E)、さらに演算処理C−D(ステツプ
S11)で第4図Gのように前述の変動のない場合
の第3図Gと同一の絵柄の欠陥情報だけが得られ
ることになる。従つて、装置の稼動中に差動増幅
器8のドリフト或いは光センサA1,B1…
AN,BNの経年変化等により、検知特性の変動
があつた場合でも、この発明の方法によれば内部
処理で自動的に補正され正確な検知が行なわれる
ことになる。さらに、1対の光センサA及びBの
うち1つが故障し使用不能になつた場合、例えば
光センサヘツドBが故障し出力波形B(t)が得られ
ない場合(第5図C)でも、同一の絵柄Niを検
知して時間をずらして比較するこの発明の方法に
よれば、光センサヘツドAから出力波形A(t)が得
られるので絵柄の欠陥の検知を行なうことができ
る。第5図はこれを説明するためのタイムチヤー
トであり、演算処理B(t)−A(t)(ステツプS4)
は光センサヘツドAの出力波形となり(第5図
D)、A/D変換後はデイジタル化され(第5図
E)、演算処理C−D(ステツプS11)により第5
図Gのように絵柄の欠陥a,b及びc等だけで抽
出されるが、この場合前述の二つのケースと異な
り、パターン判定(ステツプS16,S17)は下表
(表2)の如くなる。[Table] Here, patterns corresponding to various defects are registered in advance in the internal storage section of the main CPU 4, and it is determined which pattern corresponds to the defect (step S18). This makes it possible to identify what kind of defects the pattern Ni has. If not applicable, prepare to update the memory of the carried forward amount (step
S19). If applicable (step S20), parts unnecessary for the determination, such as - in the sign determination in Table 1, are
-a at the end of the output pattern of a, 2a, -a is unnecessary for judgment, so in order to eliminate erroneous processing, it is deleted and the RAM of the storage unit 10 is cleared, and the memory is updated for the next pattern (Ni + 1). Prepare (step S21). Next, in order to check whether the entire defect detection system is operating normally, after detecting a certain number of patterns N1 to Ni, the number of defects is detected. That is, the total amount Σ|eij| of the aforementioned |dij| is compared with the total upper limit value e that has been registered and set in the internal storage section of the main CPU 4 in advance (step S23).
If Σ|ei|−e≧0, it is an abnormal occurrence of a defect,
It is determined that this is not a printing error but is caused by a misalignment or meandering of the sheet N, and the machine is re-inspected (step S24). Also Σ|ei|−e<
If it is 0, it is considered a normal printing error and the main
This information is transmitted to the CPU 4 and displayed on the CRT 2 (step S25). At the same time, it is determined whether the defects in the patterns N1, N2, etc. are within the acceptable range for the product, and whether they are major, medium, or minor defects; in other words, whether the defects are continuous or one-off. In order to
Defects are checked for pulses...Pj-1, Pj, Pj+1, etc. in adjacent sections centering around the divided j-divided section (step S26), and if there is a defect, the number of adjacent pulses is counted (step S26).
S27), if only Pj is counted due to spot defects, such as dust, etc. (step
S29), or is it a case where Pj-1, Pj, Pj+1 are counted due to a narrow-area defect, such as a doctor's line (step S30), or a wide-area defect,
For example, ink stains are spread over a wide area...Pj−
1, Pj, Pj+1, etc. are connected and counted in large numbers, etc. It is determined to which type the defect belongs, and the number of occurrences of defects is counted in one cycle of one pattern (steps 32, S33, S34). ), the defect location and type are displayed on the CRT 2 to notify defect information of the picture (step S35). Furthermore, in order to detect the next pattern (Ni+1), a signal is sent to the main CPU 4 for general processing (step S36), and the drive unit 6 rotates by one cylinder. By the way, in parallel with this, the process after the above-mentioned memory update preparation (step S21) is performed continuously for one cycle of one picture, but if an abnormality occurs during the process and the process cannot be performed, the process returns. Then, the process returns to sampling division (step S5), and when the processing is completed, the carried over/erased data of the pattern Ni is cleared from the RAM of the storage unit 3, and the first register mark is identified in order to detect the next pattern (Ni + 1). Return to (step S1) and
The same treatment as for Ni will be performed. In this way, all the patterns N1, N2, N3...,
By repeatedly processing steps S1 to S38 in the flowchart of FIGS. 2A to C for each NN, a pair of photosensor heads A and B sequentially memorize one period of one picture, and compare and update the images. By processing, defect information of patterns N1, N2,...NN printed continuously on sheet N is transferred to CRT2.
etc. will be displayed. Now, in the case of the above-mentioned detection, the detection output of the pair of optical sensor heads A and B does not change, but the drift of the differential amplifier 8 or the aging of the optical sensors A1, B1 to AN, BN may occur during operation of the device. Even if there is a variation in the detection characteristics due to changes in the detection characteristics, by using the above method, the variation can be automatically corrected and an accurate detection output can be obtained. That is, FIG. 4 is a time chart for explaining the above situation.
As shown in the figure, if optical sensor heads A and B are raised by f and lowered by g relative to the reference amount, the deviations f and g are normally accumulated and magnified as errors by performing calculations one after another. Conventional methods caused overestimation. However, according to the method of this invention, FIG.
By performing the calculation process of C-D in step S11 according to the flowchart of
drift or optical sensors A1, B1 to AN,
The deviations f and g due to aging of the BN are canceled and automatically corrected, and only the defects in the pattern (a, b, c, etc. in Fig. 4G) are extracted. That is, Optical sensor head A: Output waveform A(t)
...(Step S2) Optical sensor head B: Output waveform B(t)
...(Step S3) C=B-A:B(t)-A(t) ...(Step S4) D:(t)-(t)...(Step S10) C-D: {B(t)-A (t)}−{ B (t)− A (t)}
...(Step S11), and here the deviations f and g occur, A(t)→A(t)+f, B(t)→B(t)-g, and by step S4, C-D=[{B (t)−g}−{A(t)+f}] −[{ B (t)−g}−{ A (t)+f}] = {B(t)−A(t)}−{ B ( t)− A (t)}
(Step S11) Therefore, even if the detection characteristics vary due to the deviations f and g caused by any factors, they are canceled out in the calculation process, and only the defects a, b, c, etc. of the desired pattern are found. To explain this with reference to the time chart in Figure 4, for example, between t1 and t2, the output waveform fluctuates overall by A(t)+f and B(t)-g by the deviations f and g, respectively. Similarly, the picture defects a and b are moved by -fg in the calculation process B(t)-A(t) (step S4) to become -a-f-g and b-f-g ( Figure 4D). As shown in the figure, after A/D conversion, it is digitized (Fig. 4E), and further arithmetic processing C-D (step
In step S11), only the defect information of the same pattern as shown in FIG. 4G, which is the same as that shown in FIG. 3G without the above-mentioned variation, is obtained. Therefore, during operation of the device, the drift of the differential amplifier 8 or the optical sensors A1, B1...
Even if there is a change in the detection characteristics due to changes in AN and BN over time, the method of the present invention automatically corrects it through internal processing to ensure accurate detection. Furthermore, if one of the pair of photosensors A and B fails and becomes unusable, for example, if photosensor head B fails and the output waveform B(t) cannot be obtained (Fig. 5C), the same According to the method of the present invention, which detects the pattern Ni and compares the images at different times, since the output waveform A(t) is obtained from the optical sensor head A, defects in the pattern can be detected. FIG. 5 is a time chart for explaining this, and shows calculation processing B(t)-A(t) (step S4).
becomes the output waveform of the optical sensor head A (Fig. 5D), is digitized after A/D conversion (Fig. 5E), and is converted into the 5th waveform by arithmetic processing C-D (step S11).
As shown in Figure G, only the picture defects a, b, and c are extracted, but in this case, unlike the two cases described above, the pattern determination (steps S16 and S17) is as shown in the table below (Table 2).
【表】
上記表2は前述の1対の光センサヘツドA及び
Bを用いた場合のパターン判定の表(表1)と異
なるが、これは絵柄の欠陥の種類により符号判定
及び比率判定のパターン判定基準が異なるためで
あり、絵柄の欠陥に対応して判定するにはメイン
CPU4の内部記憶を代えることで容易に絵柄の
欠陥を正確に検知でき、CRT2等でその情報を
画像処理できるようになつている。
このように1対の光センサヘツドA及びBを上
記3ケースの場合のいずれも使用し、その出力差
をアナログ量として差動増幅器で適当にゲイン調
整することにより絵柄の欠陥を所望の量に拡大或
いは縮少するこも可能となる。又、演算処理中に
変動等によるノイズ成分が混入しても、最終的に
絵柄の欠陥情報だけが得られるので、印刷物の欠
陥検知装置として高精度化が計れることになる。
(発明の効果)
以上のようにこの発明の方法によれば、同一の
絵柄が周期的に連続して印刷される印刷物の欠陥
を検知する印刷物の欠陥検知装置において、その
装置の性能の良否によらず或いは稼動時のメンテ
ナンスも要せず、自動的に印刷物の欠陥の種類を
精度良く検知し、視覚的に表示することができる
といつた極めて多くの長所を有する。[Table] The above Table 2 is different from the pattern judgment table (Table 1) when using a pair of photosensor heads A and B described above, but this differs from the pattern judgment table (Table 1) for sign judgment and ratio judgment depending on the type of pattern defect. This is because the standards are different, and the main
By replacing the internal memory of the CPU 4, it is possible to easily and accurately detect defects in patterns, and this information can be processed into images using a CRT 2 or the like. In this way, by using a pair of photosensor heads A and B in each of the three cases above, and adjusting the gain appropriately with a differential amplifier using the output difference as an analog quantity, the defect in the pattern can be enlarged to the desired amount. Alternatively, it is also possible to reduce the size. Furthermore, even if noise components due to fluctuations or the like are mixed in during arithmetic processing, only pattern defect information can be obtained in the end, resulting in a highly accurate printed matter defect detection device. (Effects of the Invention) As described above, according to the method of the present invention, in a printed matter defect detection device for detecting defects in printed matter in which the same pattern is periodically and continuously printed, the quality of the performance of the device is determined. It has many advantages, such as being able to automatically detect and visually display the types of defects in printed matter with high precision without requiring maintenance during operation.
第1図はこの発明の方法を実現する装置の一例
を示すブロツク図、第2図A,B及びCはこの発
明の方法を説明するためのフローチヤート、第3
図、第4図及び第5図はこの発明の方法を説明す
るためのタイムチヤート、第6図及び第7図は同
一の絵柄を連続して印刷する場合の印刷物の欠陥
を検知する印刷物の欠陥検知装置を説明するため
の図である。
1……キーボード、2……CRT、3……記憶
部、4……メインCPU、5……スキヤニングヘ
ツド、6……駆動部、7……パルス発生器、A
1,A2,〜AN及びB1,B2,〜BN……光
センサ、8……差動増幅器、9……A/D変換
器、10……記憶部、11……ローカルCPU、
N1,N2,〜NN……絵柄、N……絵柄が印刷
されたシート、A及びB……光センサヘツド、1
4……制御ボツクス、15A及び15B……受光
素子、16A及び16C……光センサ素子、16
B及び16D……増幅器、17……差動増幅器、
18……コンパレータ。
FIG. 1 is a block diagram showing an example of an apparatus for implementing the method of the present invention, FIG. 2 A, B, and C are flowcharts for explaining the method of the present invention, and FIG.
Figures 4 and 5 are time charts for explaining the method of the present invention, and Figures 6 and 7 are for detecting defects in printed matter when the same pattern is printed continuously. FIG. 2 is a diagram for explaining a detection device. 1...Keyboard, 2...CRT, 3...Storage unit, 4...Main CPU, 5...Scanning head, 6...Drive unit, 7...Pulse generator, A
1, A2, ~AN and B1, B2, ~BN... optical sensor, 8... differential amplifier, 9... A/D converter, 10... storage section, 11... local CPU,
N1, N2, ~NN...Picture, N...Sheet with the picture printed on it, A and B...Photo sensor head, 1
4... Control box, 15A and 15B... Light receiving element, 16A and 16C... Light sensor element, 16
B and 16D...amplifier, 17...differential amplifier,
18...Comparator.
Claims (1)
る印刷物の欠陥を検知する印刷物の欠陥検知方法
において、1対の光センサが前記絵柄のサイズに
応じてまとめられて配設されている1対の光セン
サヘツドを、隣接した1対の同一の絵柄に対向し
て前記印刷物の移動方向と直角に配設すると共
に、前記1対の光センサヘツドを同時に使用する
ようにし、版胴の駆動部に連結されたパルス発生
器からパルスを出力するようにし、前記1対の光
センサヘツド内の各1対の光センサから得られる
各アナログ信号の出力電圧差を前記同一の絵柄が
1周期搬送される毎に前記版胴の1シリンダ分の
1回転に相当する前記パルス及びその分周パルス
に対応させて処理し、前記アナログ信号の出力電
圧差をデイジタル化した後、前記絵柄の1つのデ
イジタル信号を1周期分だけ記憶し、次の絵柄の
1周期分のデイジタル信号と前記記憶したデイジ
タル信号との差を求め、この差を周期的に搬送さ
れる前記絵柄に対応して連続的にパターン化して
抽出し、予め登録してあるパターンとの符号判定
と比率判定を行ない、欠陥と判定された場合には
欠陥箇所の前記パルス又は分周パルスの数を計数
することによつて欠陥の種類を識別すると共に、
前記符号判定、前記比率判定及び前記欠陥の種類
を表示するようにしたことを特徴とする印刷物の
欠陥検知方法。1. In a method for detecting defects in printed matter in which the same pattern is periodically and continuously printed, a pair of optical sensors are arranged in groups according to the size of the pattern. 1 A pair of optical sensor heads are disposed perpendicularly to the moving direction of the printed matter, facing a pair of adjacent identical patterns, and the pair of optical sensor heads are used simultaneously, and the driving unit of the plate cylinder is connected to the optical sensor head. Pulses are output from the connected pulse generators, and the output voltage difference of each analog signal obtained from each pair of optical sensors in the pair of optical sensor heads is calculated every time the same picture is conveyed one cycle. After processing the pulse corresponding to one rotation of one cylinder of the plate cylinder and its frequency divided pulse, and digitizing the output voltage difference of the analog signal, one digital signal of the picture is converted into one digital signal. Only the period is stored, the difference between the digital signal for one period of the next pattern and the stored digital signal is determined, and this difference is continuously patterned and extracted in correspondence with the pattern that is periodically conveyed. Then, it performs sign and ratio judgments with the pre-registered pattern, and if it is determined to be a defect, the type of defect is identified by counting the number of the pulses or frequency-divided pulses at the defective location. With,
A method for detecting defects in printed matter, characterized in that the code determination, the ratio determination, and the type of defect are displayed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60016919A JPS61175043A (en) | 1985-01-31 | 1985-01-31 | How to detect defects in printed matter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60016919A JPS61175043A (en) | 1985-01-31 | 1985-01-31 | How to detect defects in printed matter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61175043A JPS61175043A (en) | 1986-08-06 |
| JPH0573584B2 true JPH0573584B2 (en) | 1993-10-14 |
Family
ID=11929534
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60016919A Granted JPS61175043A (en) | 1985-01-31 | 1985-01-31 | How to detect defects in printed matter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61175043A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011033391A (en) * | 2009-07-30 | 2011-02-17 | Nec Corp | Printed matter inspection apparatus, printed matter inspection system, method of inspecting printed matter and printed matter inspection program |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2541209B2 (en) * | 1987-03-17 | 1996-10-09 | 凸版印刷株式会社 | Plate inspection device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59198156A (en) * | 1983-04-27 | 1984-11-09 | Konan Camera Kenkyusho:Kk | Method and apparatus for detection of inferior printing part in rotary printing |
-
1985
- 1985-01-31 JP JP60016919A patent/JPS61175043A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011033391A (en) * | 2009-07-30 | 2011-02-17 | Nec Corp | Printed matter inspection apparatus, printed matter inspection system, method of inspecting printed matter and printed matter inspection program |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61175043A (en) | 1986-08-06 |
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